EN

基本情報

研究

社会活動

その他の活動

内藤 賀公

Naitou Yoshitaka

工学研究科 物理学系専攻,助教

keyword 表面・界面

学歴

  • ~ 2000年,東京工業大学,総合理工学研究科,材料物理科学
  • ~ 2000年,東京工業大学
  • ~ 1995年,東京工業大学,理学部,物理学

経歴

  • 2001年 ~ 2002年,オーフス大学(デンマーク) 博士研究員
  • 2000年 ~ 2001年,科学技術振興事業団 戦略的基礎研究推進事業 「量子効果等の物理現象」博士研究員

研究内容・専門分野

  • ナノテク・材料,薄膜、表面界面物性

所属学会

  • 日本物理学会

論文

  • Nanoscale optical imaging with photoinduced force microscopy in heterodyne amplitude modulation and heterodyne frequency modulation modes,Junsuke Yamanishi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara,Journal of Photochemistry and Photobiology C: Photochemistry Reviews,Elsevier BV,Vol. 52,p. 100532-100532,2022年09月,研究論文(学術雑誌)
  • Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy,Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,Applied Physics Letters,AIP Publishing,Vol. 120,No. 16,p. 161601-161601,2022年04月18日,研究論文(学術雑誌)
  • Study of high–low KPFM on a pn-patterned Si surface,Ryo Izumi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara,Microscopy,Oxford University Press (OUP),Vol. 71,No. 2,p. 98-103,2022年04月01日,研究論文(学術雑誌)
  • Optical force mapping at the single-nanometre scale,Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Nobuhiko Yokoshi,Tatsuya Kameyama,Seiya Koyama,Tsukasa Torimoto,Hajime Ishihara,Yasuhiro Sugawara,NATURE COMMUNICATIONS,NATURE RESEARCH,Vol. 12,No. 1,2021年06月,研究論文(学術雑誌)
  • Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy,Huan Fei Wen,Quanzhen Zhang,Yuuki Adachi,Masato Miyazaki,Yoshitaka Naitoh,Y. J. Li,Yasuhiro Sugawara,Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy,Vol. 122,p. 17395-17399,2018年07月,研究論文(学術雑誌)
  • Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM,Yanjun Li,Huanfei Wen,Q. Zhang,Y. Adachi,Eiji Arima,Yukinori Kinoshita,Hikaru Nomura,Zongmin Ma,Lili Kou,Yoshitaka Naitoh,Yasuhiro Sugawara,Rui Xu,Zhihai Cheng,Ultramicroscopy,Vol. 191,p. 51-55,2018年04月,研究論文(学術雑誌)
  • KPFM/AFM imaging on TiO2(110) surface in O2 gas,Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara,Nanotechnology,Vol. 29,p. 105504(1)-105504(8),2018年02月,研究論文(学術雑誌)
  • Photoinduced force microscopy imaging using heterodyne-FM technique,Junsuke Yamanishi,Masaaki Tsujii,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara,Proceedings of SPIE - The International Society for Optical Engineering,SPIE,Vol. 10712,2018年,研究論文(国際会議プロシーディングス)
  • Separation of atomic-scale spin contrast on NiO(001) by magnetic resonance force microscopy,Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,JOURNAL OF PHYSICS-CONDENSED MATTER,IOP PUBLISHING LTD,Vol. 29,No. 40,2017年10月,研究論文(学術雑誌)
  • Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy,Yoshitaka Naitoh,Robert Turansky,Jan Brndiar,Yan Jun Li,Ivan Stich,Yasuhiro Sugawara,NATURE PHYSICS,NATURE PUBLISHING GROUP,Vol. 13,No. 7,p. 663-+,2017年07月,研究論文(学術雑誌)
  • Heterodyne technique in photoinduced force microscopy with photothermal effect,J. Yamanishi,Y. Naitoh,Y. J. Li,Y. Sugawara,APPLIED PHYSICS LETTERS,AMER INST PHYSICS,Vol. 110,No. 12,2017年03月,研究論文(学術雑誌)
  • Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K,Huan Fei Wen,Yan Jun Li,Eiji Arima,Yoshitaka Naitoh,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng,Nanotechnology,Institute of Physics Publishing,Vol. 28,No. 10,2017年02月06日,研究論文(学術雑誌)
  • Investigation of the surface potential of TiO2 (110) by frequency-modulation Kelvin probe force microscopy,Lili Kou,Yan Jun Li,Takeshi Kamijyo,Yoshitaka Naitoh,Yasuhiro Sugawara,NANOTECHNOLOGY,IOP PUBLISHING LTD,Vol. 27,No. 50,2016年12月,研究論文(学術雑誌)
  • Promoting Atoms into Delocalized Long-Living Magnetically Modified State Using Atomic Force Microscopy,Y. Kinoshita,R. Turansky,J. Brndiar,Y. Naitoh,Y. J. Li,L. Kantorovich,Y. Sugawara,I. Stich,NANO LETTERS,AMER CHEMICAL SOC,Vol. 16,No. 12,p. 7490-7494,2016年12月,研究論文(学術雑誌)
  • Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces,Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,REVIEW OF SCIENTIFIC INSTRUMENTS,AMER INST PHYSICS,Vol. 87,No. 9,2016年09月,研究論文(学術雑誌)
  • Growth models of coexistingp(2 × 1) andc(6 × 2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K,Yan Jun Li,Seung Hwan Lee,Yukinori Kinoshita,Zong Min Ma,Huanfei Wen,Hikaru Nomura,Yoshitaka Naitoh,Yasuhiro Sugawara,Nanotechnology,IOP Publishing,Vol. 27,No. 20,p. 205702-205702,2016年05月20日,研究論文(学術雑誌)
  • Distance dependence of atomic-resolution near-field imaging on alpha-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip,Junsuke Yamanishi,Takashi Tokuyama,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,NANO RESEARCH,TSINGHUA UNIV PRESS,Vol. 9,No. 2,p. 530-536,2016年02月,研究論文(学術雑誌)
  • 原子レベルで表面磁性を可視化する強磁性共鳴を用いた磁気交換力顕微鏡の開発,有馬 英司,内藤 賀公,李 艶君,菅原 康弘,表面科学,公益社団法人 日本表面科学会,Vol. 37,No. 9,p. 416-421,2016年
  • Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film,Yan Jun Li,J Brndiar,Y Naitoh,Y Sugawara,I Štich,Nanotechnology,Vol. 26,p. 505704 (1)-505704 (5),2015年10月,研究論文(学術雑誌)
  • Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback,Lili Kou,Zongmin Ma,Yan Jun Li,Yoshitaka Naitoh,Masaharu Komiyama,Yasuhiro Sugawara,NANOTECHNOLOGY,IOP PUBLISHING LTD,Vol. 26,No. 19,2015年05月,研究論文(学術雑誌)
  • Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance,Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Satoru Yoshimura,Hitoshi Saito,Hikaru Nomura,Ryoichi Nakatani,Yasuhiro Sugawara,Nanotechnology,Vol. 26,2015年04月,研究論文(学術雑誌)
  • 原子レベルでの表面磁性を可視化する新規SPM計測法の開発,菅原 康弘,有馬 英司,内藤 賀公,李 艶君,表面科学学術講演会要旨集,公益社団法人 日本表面科学会,Vol. 35,p. 27-27,2015年
  • Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism,J. Bamidele,S. H. Lee,Y. Kinoshita,R. Turansky,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich,NATURE COMMUNICATIONS,NATURE PUBLISHING GROUP,Vol. 5,2014年07月,研究論文(学術雑誌)
  • Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces,J. Bamidele,Y. Kinoshita,R. Turansky,S. H. Lee,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich,PHYSICAL REVIEW B,AMER PHYSICAL SOC,Vol. 90,No. 3,2014年07月,研究論文(学術雑誌)
  • The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes,Zong Min Ma,Lili Kou,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,NANOTECHNOLOGY,IOP PUBLISHING LTD,Vol. 24,No. 22,2013年06月,研究論文(学術雑誌)
  • Quantification of Atomic-Scale Elasticity on Ge(001)-c(4 x 2) Surfaces via Noncontact Atomic Force Microscopy with a Tungsten-Coated Tip,Y. Naitoh,T. Kamijo,Y. J. Li,Y. Sugawara,PHYSICAL REVIEW LETTERS,AMER PHYSICAL SOC,Vol. 109,No. 21,2012年11月,研究論文(学術雑誌)
  • Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface,J. Bamidele,Y. Kinoshita,R. Turansky,S. H. Lee,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich,PHYSICAL REVIEW B,AMER PHYSICAL SOC,Vol. 86,No. 15,2012年10月,研究論文(学術雑誌)
  • Complex design of dissipation signals in non-contact atomic force microscopy,J. Bamidele,Y. J. Li,S. Jarvis,Y. Naitoh,Y. Sugawara,L. Kantorovich,PHYSICAL CHEMISTRY CHEMICAL PHYSICS,ROYAL SOC CHEMISTRY,Vol. 14,No. 47,p. 16250-16257,2012年,研究論文(学術雑誌)
  • Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition,Yukinori Kinoshita,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,REVIEW OF SCIENTIFIC INSTRUMENTS,AMER INST PHYSICS,Vol. 82,No. 11,2011年11月,研究論文(学術雑誌)
  • Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules,Yoshihiro Aburaya,Hikaru Nomura,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,JOURNAL OF APPLIED PHYSICS,AMER INST PHYSICS,Vol. 109,No. 6,2011年03月,研究論文(学術雑誌)
  • High force sensitivity in Q-controlled phase-modulation atomic force microscopy,Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,APPLIED PHYSICS LETTERS,AMER INST PHYSICS,Vol. 97,No. 1,2010年07月,研究論文(学術雑誌)
  • Multifrequency high-speed phase-modulation atomic force microscopy in liquids,Yan Jun Li,Kouhei Takahashi,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,ULTRAMICROSCOPY,ELSEVIER SCIENCE BV,Vol. 110,No. 6,p. 582-585,2010年05月,研究論文(学術雑誌)
  • Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K,Yoshitaka Naitoh,Yan Jun Li,Hikaru Nomura,Masami Kageshima,Yasuhiro Sugawara,JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN,PHYSICAL SOC JAPAN,Vol. 79,No. 1,2010年01月,研究論文(学術雑誌)
  • 極低温環境における原子分解能非接触原子間力顕微鏡計測技術,菅原 康弘,内藤 賀公,影島 賢巳,李 艶君,真空,The Vacuum Society of Japan,Vol. 51,No. 12,p. 789-795,2008年12月20日
  • Atomic-Scale Imaging of B/Si(111) √3 x √3 Surface by Noncontact Aromic Force Microscopy,Masaharu KINOSHITA,Yoshitaka NAITOH,Y. J. Li,Masami KAGESHIMA,Yasuhiro SUGAWARA,Jpn. J. Appl. Phys.,Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,Vol. 47,No. 10,p. 8218-8220,2008年10月,研究論文(学術雑誌)
  • High-speed Phase-Modulation Atomic Force Microscopy (PM-AFM) in Constant-Amplitude (CA) Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation,Y. J. Li,Naritaka Kobayashi,Hikaru Nomura,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,Jpn. J. Appl. Phys.47(7),Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,Vol. 47,No. 7,p. 6121-6124,2008年07月,研究論文(学術雑誌)
  • Study of oxidized Cu(110) surface using noncontact atomic force microscopy,Shohei Kishimoto,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara,Surface Science,Elsevier BV,Vol. 602,No. 13,p. 2175-2182,2008年07月,研究論文(学術雑誌)
  • Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation,Yan Jun Li,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,APPLIED PHYSICS LETTERS,AMER INST PHYSICS,Vol. 92,No. 12,2008年03月,研究論文(学術雑誌)
  • Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode,Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,JOURNAL OF APPLIED PHYSICS,AMER INST PHYSICS,Vol. 103,No. 5,2008年03月,研究論文(学術雑誌)
  • Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode,Yasuhiro Sugawara,Naritaka Kobayashi,Masayo Kawakami,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,APPLIED PHYSICS LETTERS,AMER INST PHYSICS,Vol. 90,No. 19,2007年05月,研究論文(学術雑誌)
  • Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage,Hikaru Nomura,Kenichiro Kawasaki,Takuma Chikamoto,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,Applied Physics Letters,Vol. 90,No. 3,2007年,研究論文(学術雑誌)
  • High-sensitivity force detection by phase-modulation atomic force microscopy,Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS,JAPAN SOC APPLIED PHYSICS,Vol. 45,No. 29-32,p. L793-L795,2006年08月,研究論文(学術雑誌)

MISC

  • Q値制御法による位相変調方式原子間力顕微鏡の感度向上,小林 成貴,李 艶君,内藤 賀公,影島 賢巳,菅原 康弘,表面科学 = Journal of The Surface Science Society of Japan,公益社団法人 日本表面科学会,Vol. 28,No. 9,p. 532-535,2007年09月10日