Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy

Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yoshitaka Naitoh, Y. J. Li, Yasuhiro Sugawara

Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy　Vol. 122　p. 17395-17399　2018/07　Research paper (scientific journal)

Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM

Yanjun Li, Huanfei Wen, Q. Zhang, Y. Adachi, Eiji Arima, Yukinori Kinoshita, Hikaru Nomura, Zongmin Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara, Rui Xu, Zhihai Cheng

Ultramicroscopy　Vol. 191　p. 51-55　2018/04　Research paper (scientific journal)

KPFM/AFM imaging on TiO2(110) surface in O2 gas

Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yanjun Li, Yasuhiro Sugawara

Nanotechnology　Vol. 29　p. 105504(1)-105504(8)　2018/02　Research paper (scientific journal)

Photoinduced force microscopy imaging using heterodyne-FM technique

Junsuke Yamanishi, Masaaki Tsujii, Yoshitaka Naitoh, Yanjun Li, Yasuhiro Sugawara

Proceedings of SPIE - The International Society for Optical Engineering　Vol. 10712　2018　Research paper (international conference proceedings)

Separation of atomic-scale spin contrast on NiO(001) by magnetic resonance force microscopy

Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

JOURNAL OF PHYSICS-CONDENSED MATTER　Vol. 29　No. 40　2017/10　Research paper (scientific journal)

Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy

Yoshitaka Naitoh, Robert Turansky, Jan Brndiar, Yan Jun Li, Ivan Stich, Yasuhiro Sugawara

NATURE PHYSICS　Vol. 13　No. 7　p. 663-+　2017/07　Research paper (scientific journal)

Heterodyne technique in photoinduced force microscopy with photothermal effect

J. Yamanishi, Y. Naitoh, Y. J. Li, Y. Sugawara

APPLIED PHYSICS LETTERS　Vol. 110　No. 12　2017/03　Research paper (scientific journal)

Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K

Huan Fei Wen, Yan Jun Li, Eiji Arima, Yoshitaka Naitoh, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng

Nanotechnology　Vol. 28　No. 10　2017/02/06　Research paper (scientific journal)

Investigation of the surface potential of TiO2 (110) by frequency-modulation Kelvin probe force microscopy

Lili Kou, Yan Jun Li, Takeshi Kamijyo, Yoshitaka Naitoh, Yasuhiro Sugawara

NANOTECHNOLOGY　Vol. 27　No. 50　2016/12　Research paper (scientific journal)

Promoting Atoms into Delocalized Long-Living Magnetically Modified State Using Atomic Force Microscopy

Y. Kinoshita, R. Turansky, J. Brndiar, Y. Naitoh, Y. J. Li, L. Kantorovich, Y. Sugawara, I. Stich

NANO LETTERS　Vol. 16　No. 12　p. 7490-7494　2016/12　Research paper (scientific journal)

Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

REVIEW OF SCIENTIFIC INSTRUMENTS　Vol. 87　No. 9　2016/09　Research paper (scientific journal)

Growth models of coexistingp(2 × 1) andc(6 × 2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K

Yan Jun Li, Seung Hwan Lee, Yukinori Kinoshita, Zong Min Ma, Huanfei Wen, Hikaru Nomura, Yoshitaka Naitoh, Yasuhiro Sugawara

Nanotechnology　Vol. 27　No. 20　p. 205702-205702　2016/05/20　Research paper (scientific journal)

Distance dependence of atomic-resolution near-field imaging on alpha-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip

Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

NANO RESEARCH　Vol. 9　No. 2　p. 530-536　2016/02　Research paper (scientific journal)

Development of the Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance to Image Surface Spin with Atomic Resolution

ARIMA Eiji, NAITOH Yoshitaka, YAN JUN Li, SUGAWARA Yasuhiro

Hyomen Kagaku　Vol. 37　No. 9　p. 416-421　2016

Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film

Yan Jun Li, J Brndiar, Y Naitoh, Y Sugawara, I Štich

Nanotechnology　Vol. 26　p. 505704 (1)-505704 (5)　2015/10　Research paper (scientific journal)

Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Lili Kou, Zongmin Ma, Yan Jun Li, Yoshitaka Naitoh, Masaharu Komiyama, Yasuhiro Sugawara

NANOTECHNOLOGY　Vol. 26　No. 19　2015/05　Research paper (scientific journal)

Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance

Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani, Yasuhiro Sugawara

Nanotechnology　Vol. 26　2015/04　Research paper (scientific journal)

Development of nevel SPM technique for observing the surface magnetism at the atomic scale

SUAGAWARA YASUHIRO, ARIMA EIJI, NAITOH YOSHITAKA, LI YANJUN

Abstract of annual meeting of the Surface Science of Japan　Vol. 35　p. 27-27　2015

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

J. Bamidele, S. H. Lee, Y. Kinoshita, R. Turansky, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, L. Kantorovich

NATURE COMMUNICATIONS　Vol. 5　2014/07　Research paper (scientific journal)

Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces

J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, L. Kantorovich

PHYSICAL REVIEW B　Vol. 90　No. 3　2014/07　Research paper (scientific journal)

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

NANOTECHNOLOGY　Vol. 24　No. 22　2013/06　Research paper (scientific journal)

Quantification of Atomic-Scale Elasticity on Ge(001)-c(4 x 2) Surfaces via Noncontact Atomic Force Microscopy with a Tungsten-Coated Tip

Y. Naitoh, T. Kamijo, Y. J. Li, Y. Sugawara

PHYSICAL REVIEW LETTERS　Vol. 109　No. 21　2012/11　Research paper (scientific journal)

Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface

J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, L. Kantorovich

PHYSICAL REVIEW B　Vol. 86　No. 15　2012/10　Research paper (scientific journal)

Force mapping of the NaCl(100)/Cu(111) surface by atomic force microscopy at 78K

Yan Jun Li, Yukinori Kinoshita, Keita Tenjin, Zong Min Ma, Li Li Kou, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Japanese Journal of Applied Physics　Vol. 51　No. 3　2012/03　Research paper (scientific journal)

Complex design of dissipation signals in non-contact atomic force microscopy

J. Bamidele, Y. J. Li, S. Jarvis, Y. Naitoh, Y. Sugawara, L. Kantorovich

PHYSICAL CHEMISTRY CHEMICAL PHYSICS　Vol. 14　No. 47　p. 16250-16257　2012　Research paper (scientific journal)

Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition

Yukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

REVIEW OF SCIENTIFIC INSTRUMENTS　Vol. 82　No. 11　2011/11　Research paper (scientific journal)

Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules

Yoshihiro Aburaya, Hikaru Nomura, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

JOURNAL OF APPLIED PHYSICS　Vol. 109　No. 6　2011/03　Research paper (scientific journal)

High force sensitivity in Q-controlled phase-modulation atomic force microscopy

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

APPLIED PHYSICS LETTERS　Vol. 97　No. 1　2010/07　Research paper (scientific journal)

Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticity

Tatsuya Ogawa, Shinkichi Kurachi, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Ultramicroscopy　Vol. 110　No. 6　p. 612-617　2010/05　Research paper (scientific journal)

Multifrequency high-speed phase-modulation atomic force microscopy in liquids

Yan Jun Li, Kouhei Takahashi, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

ULTRAMICROSCOPY　Vol. 110　No. 6　p. 582-585　2010/05　Research paper (scientific journal)

Development of high-speed actuator for scanning probe microscopy

Yasuhiro Sugawara, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima

Next-Generation Actuators Leading Breakthroughs　p. 45-54　2010　Part of collection (book)

Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy

Yoshitaka Naitoh, Zongmin Ma, Yan Jun Li, Masami Kageshima, Yasuhiro Sugawara

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics　Vol. 28　No. 6　p. 1210-1214　2010　Research paper (scientific journal)

Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K

Yoshitaka Naitoh, Yan Jun Li, Hikaru Nomura, Masami Kageshima, Yasuhiro Sugawara

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN　Vol. 79　No. 1　2010/01　Research paper (scientific journal)

The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surface

Yoshitaka Naitoh, Yukinori Kinoshita, Yan Jun Li, Masami Kageshima, Yasuhiro Sugawara

Nanotechnology　Vol. 20　No. 26　2009　Research paper (scientific journal)

Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics

Masami Kageshima, Takuma Chikamoto, Tatsuya Ogawa, Yoshiki Hirata, Takahito Inoue, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Review of Scientific Instruments　Vol. 80　No. 2　2009　Research paper (scientific journal)

Development of Noncontact Atomic Force Microscopy Operating at Low Temperatures

SUGAWARA Yasuhiro, NAITOH Yoshitaka, KAGESHIMA Masami, LI Yan Jun

Shinku　Vol. 51　No. 12　p. 789-795　2008/12/20

Atomic-Scale Imaging of B/Si(111) √3 x √3 Surface by Noncontact Aromic Force Microscopy

Masaharu KINOSHITA, Yoshitaka NAITOH, Y. J. Li, Masami KAGESHIMA, Yasuhiro SUGAWARA

Jpn. J. Appl. Phys.　Vol. 47　No. 10　p. 8218-8220　2008/10　Research paper (scientific journal)

High-speed Phase-Modulation Atomic Force Microscopy (PM-AFM) in Constant-Amplitude (CA) Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

Y. J. Li, Naritaka Kobayashi, Hikaru Nomura, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Jpn. J. Appl. Phys. 47(7)　Vol. 47　No. 7　p. 6121-6124　2008/07　Research paper (scientific journal)

Study of oxidized Cu(110) surface using noncontact atomic force microscopy

Shohei Kishimoto, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Surface Science　Vol. 602　No. 13　p. 2175-2182　2008/07　Research paper (scientific journal)

Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation

Yan Jun Li, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

APPLIED PHYSICS LETTERS　Vol. 92　No. 12　2008/03　Research paper (scientific journal)

Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

JOURNAL OF APPLIED PHYSICS　Vol. 103　No. 5　2008/03　Research paper (scientific journal)

Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode

Yasuhiro Sugawara, Naritaka Kobayashi, Masayo Kawakami, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima

APPLIED PHYSICS LETTERS　Vol. 90　No. 19　2007/05　Research paper (scientific journal)

Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage

Hikaru Nomura, Kenichiro Kawasaki, Takuma Chikamoto, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Applied Physics Letters　Vol. 90　No. 3　2007　Research paper (scientific journal)

High-sensitivity force detection by phase-modulation atomic force microscopy

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　Vol. 45　No. 29-32　p. L793-L795　2006/08　Research paper (scientific journal)

Origin of p (2 × 1) Phase on Si(001) by Noncontact Atomic Force Microscopy at 5 K

Yan Jun Li, Hikaru Nomura, Naoyuki Ozaki, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara, Chris Hobbs, Lev Kantorovich

Physical Review Letters　Vol. 96　No. 10　2006/03/16　Research paper (scientific journal)

Wideband and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy

Masami Kageshima, Shinsuke Togo, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara

Review of Scientific Instruments　Vol. 77　No. 10　2006　Research paper (international conference proceedings)