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Naitou Yoshitaka

内藤 賀公

Graduate School of Engineering Division of Precision Science & Technology and Applied Physics, Assistant Professor

Education

  • - 2000, Tokyo Institute of Technology, Interdisciplinary Science and Engineering
  • - 2000, Tokyo Institute of Technology, Graduate School, Division of Integrated Science and Engineering
  • - 1995, Tokyo Institute of Technology, School of Science

Research History

  • 2001 - 2002, オーフス大学(デンマーク) 博士研究員
  • 2000 - 2001, 科学技術振興事業団 戦略的基礎研究推進事業 「量子効果等の物理現象」博士研究員

Research Areas

  • Nanotechnology/Materials, Thin-film surfaces and interfaces

Professional Memberships

  • 日本物理学会

Papers

  • Nanoscale optical imaging with photoinduced force microscopy in heterodyne amplitude modulation and heterodyne frequency modulation modes, Junsuke Yamanishi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara, Journal of Photochemistry and Photobiology C: Photochemistry Reviews, Elsevier BV, Vol. 52, p. 100532-100532, 2022/09
  • Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy, Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Applied Physics Letters, AIP Publishing, Vol. 120, No. 16, p. 161601-161601, 2022/04/18
  • Study of high–low KPFM on a pn-patterned Si surface, Ryo Izumi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara, Microscopy, Oxford University Press (OUP), Vol. 71, No. 2, p. 98-103, 2022/04/01
  • Optical force mapping at the single-nanometre scale, Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Nobuhiko Yokoshi,Tatsuya Kameyama,Seiya Koyama,Tsukasa Torimoto,Hajime Ishihara,Yasuhiro Sugawara, NATURE COMMUNICATIONS, NATURE RESEARCH, Vol. 12, No. 1, 2021/06
  • Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy, Huan Fei Wen,Quanzhen Zhang,Yuuki Adachi,Masato Miyazaki,Yoshitaka Naitoh,Y. J. Li,Yasuhiro Sugawara, Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy, Vol. 122, p. 17395-17399, 2018/07
  • Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM, Yanjun Li,Huanfei Wen,Q. Zhang,Y. Adachi,Eiji Arima,Yukinori Kinoshita,Hikaru Nomura,Zongmin Ma,Lili Kou,Yoshitaka Naitoh,Yasuhiro Sugawara,Rui Xu,Zhihai Cheng, Ultramicroscopy, Vol. 191, p. 51-55, 2018/04
  • KPFM/AFM imaging on TiO2(110) surface in O2 gas, Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara, Nanotechnology, Vol. 29, p. 105504(1)-105504(8), 2018/02
  • Photoinduced force microscopy imaging using heterodyne-FM technique, Junsuke Yamanishi,Masaaki Tsujii,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara, Proceedings of SPIE - The International Society for Optical Engineering, SPIE, Vol. 10712, 2018
  • Separation of atomic-scale spin contrast on NiO(001) by magnetic resonance force microscopy, Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, JOURNAL OF PHYSICS-CONDENSED MATTER, IOP PUBLISHING LTD, Vol. 29, No. 40, 2017/10
  • Subatomic-scale force vector mapping above a Ge(001) dimer using bimodal atomic force microscopy, Yoshitaka Naitoh,Robert Turansky,Jan Brndiar,Yan Jun Li,Ivan Stich,Yasuhiro Sugawara, NATURE PHYSICS, NATURE PUBLISHING GROUP, Vol. 13, No. 7, p. 663-+, 2017/07
  • Heterodyne technique in photoinduced force microscopy with photothermal effect, J. Yamanishi,Y. Naitoh,Y. J. Li,Y. Sugawara, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 110, No. 12, 2017/03
  • Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K, Huan Fei Wen,Yan Jun Li,Eiji Arima,Yoshitaka Naitoh,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng, Nanotechnology, Institute of Physics Publishing, Vol. 28, No. 10, 2017/02/06
  • Investigation of the surface potential of TiO2 (110) by frequency-modulation Kelvin probe force microscopy, Lili Kou,Yan Jun Li,Takeshi Kamijyo,Yoshitaka Naitoh,Yasuhiro Sugawara, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 27, No. 50, 2016/12
  • Promoting Atoms into Delocalized Long-Living Magnetically Modified State Using Atomic Force Microscopy, Y. Kinoshita,R. Turansky,J. Brndiar,Y. Naitoh,Y. J. Li,L. Kantorovich,Y. Sugawara,I. Stich, NANO LETTERS, AMER CHEMICAL SOC, Vol. 16, No. 12, p. 7490-7494, 2016/12
  • Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces, Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, REVIEW OF SCIENTIFIC INSTRUMENTS, AMER INST PHYSICS, Vol. 87, No. 9, 2016/09
  • Growth models of coexistingp(2 × 1) andc(6 × 2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K, Yan Jun Li,Seung Hwan Lee,Yukinori Kinoshita,Zong Min Ma,Huanfei Wen,Hikaru Nomura,Yoshitaka Naitoh,Yasuhiro Sugawara, Nanotechnology, IOP Publishing, Vol. 27, No. 20, p. 205702-205702, 2016/05/20
  • Distance dependence of atomic-resolution near-field imaging on alpha-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip, Junsuke Yamanishi,Takashi Tokuyama,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, NANO RESEARCH, TSINGHUA UNIV PRESS, Vol. 9, No. 2, p. 530-536, 2016/02
  • Development of the Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance to Image Surface Spin with Atomic Resolution, ARIMA Eiji,NAITOH Yoshitaka,YAN JUN Li,SUGAWARA Yasuhiro, Hyomen Kagaku, The Surface Science Society of Japan, Vol. 37, No. 9, p. 416-421, 2016
  • Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film, Yan Jun Li,J Brndiar,Y Naitoh,Y Sugawara,I Štich, Nanotechnology, Vol. 26, p. 505704 (1)-505704 (5), 2015/10
  • Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback, Lili Kou,Zongmin Ma,Yan Jun Li,Yoshitaka Naitoh,Masaharu Komiyama,Yasuhiro Sugawara, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 26, No. 19, 2015/05
  • Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance, Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Satoru Yoshimura,Hitoshi Saito,Hikaru Nomura,Ryoichi Nakatani,Yasuhiro Sugawara, Nanotechnology, Vol. 26, 2015/04
  • Development of nevel SPM technique for observing the surface magnetism at the atomic scale, SUAGAWARA YASUHIRO,ARIMA EIJI,NAITOH YOSHITAKA,LI YANJUN, Abstract of annual meeting of the Surface Science of Japan, The Surface Science Society of Japan, Vol. 35, p. 27-27, 2015
  • Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism, J. Bamidele,S. H. Lee,Y. Kinoshita,R. Turansky,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich, NATURE COMMUNICATIONS, NATURE PUBLISHING GROUP, Vol. 5, 2014/07
  • Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces, J. Bamidele,Y. Kinoshita,R. Turansky,S. H. Lee,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich, PHYSICAL REVIEW B, AMER PHYSICAL SOC, Vol. 90, No. 3, 2014/07
  • The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes, Zong Min Ma,Lili Kou,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 24, No. 22, 2013/06
  • Quantification of Atomic-Scale Elasticity on Ge(001)-c(4 x 2) Surfaces via Noncontact Atomic Force Microscopy with a Tungsten-Coated Tip, Y. Naitoh,T. Kamijo,Y. J. Li,Y. Sugawara, PHYSICAL REVIEW LETTERS, AMER PHYSICAL SOC, Vol. 109, No. 21, 2012/11
  • Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface, J. Bamidele,Y. Kinoshita,R. Turansky,S. H. Lee,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Stich,L. Kantorovich, PHYSICAL REVIEW B, AMER PHYSICAL SOC, Vol. 86, No. 15, 2012/10
  • Complex design of dissipation signals in non-contact atomic force microscopy, J. Bamidele,Y. J. Li,S. Jarvis,Y. Naitoh,Y. Sugawara,L. Kantorovich, PHYSICAL CHEMISTRY CHEMICAL PHYSICS, ROYAL SOC CHEMISTRY, Vol. 14, No. 47, p. 16250-16257, 2012
  • Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter deposition, Yukinori Kinoshita,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, REVIEW OF SCIENTIFIC INSTRUMENTS, AMER INST PHYSICS, Vol. 82, No. 11, 2011/11
  • Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules, Yoshihiro Aburaya,Hikaru Nomura,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 109, No. 6, 2011/03
  • High force sensitivity in Q-controlled phase-modulation atomic force microscopy, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 97, No. 1, 2010/07
  • Multifrequency high-speed phase-modulation atomic force microscopy in liquids, Yan Jun Li,Kouhei Takahashi,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, ULTRAMICROSCOPY, ELSEVIER SCIENCE BV, Vol. 110, No. 6, p. 582-585, 2010/05
  • Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5 K, Yoshitaka Naitoh,Yan Jun Li,Hikaru Nomura,Masami Kageshima,Yasuhiro Sugawara, JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, PHYSICAL SOC JAPAN, Vol. 79, No. 1, 2010/01
  • Development of Noncontact Atomic Force Microscopy Operating at Low Temperatures, SUGAWARA Yasuhiro,NAITOH Yoshitaka,KAGESHIMA Masami,LI Yan Jun, Shinku, The Vacuum Society of Japan, Vol. 51, No. 12, p. 789-795, 2008/12/20
  • Atomic-Scale Imaging of B/Si(111) √3 x √3 Surface by Noncontact Aromic Force Microscopy, Masaharu KINOSHITA,Yoshitaka NAITOH,Y. J. Li,Masami KAGESHIMA,Yasuhiro SUGAWARA, Jpn. J. Appl. Phys., INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 47, No. 10, p. 8218-8220, 2008/10
  • High-speed Phase-Modulation Atomic Force Microscopy (PM-AFM) in Constant-Amplitude (CA) Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation, Y. J. Li,Naritaka Kobayashi,Hikaru Nomura,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Jpn. J. Appl. Phys. 47(7), INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 47, No. 7, p. 6121-6124, 2008/07
  • Study of oxidized Cu(110) surface using noncontact atomic force microscopy, Shohei Kishimoto,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Surface Science, Elsevier BV, Vol. 602, No. 13, p. 2175-2182, 2008/07
  • Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation, Yan Jun Li,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 92, No. 12, 2008/03
  • Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 103, No. 5, 2008/03
  • Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode, Yasuhiro Sugawara,Naritaka Kobayashi,Masayo Kawakami,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 90, No. 19, 2007/05
  • Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage, Hikaru Nomura,Kenichiro Kawasaki,Takuma Chikamoto,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Applied Physics Letters, Vol. 90, No. 3, 2007
  • High-sensitivity force detection by phase-modulation atomic force microscopy, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, JAPAN SOC APPLIED PHYSICS, Vol. 45, No. 29-32, p. L793-L795, 2006/08

Misc.

  • Improvement of the Sensitivity of Phase-Modulation Atomic Force Microscopy using Q-control Technique, KOBAYASHI Naritaka,LI Yan Jun,NAITOH Yoshitaka,KAGESHIMA Masami,SUGAWARA Yasuhiro, Hyomen Kagaku, The Surface Science Society of Japan, Vol. 28, No. 9, p. 532-535, 2007/09/10