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基本情報

研究

社会活動

その他の活動

若家 冨士男

Wakaya Fujio

基礎工学研究科 附属極限科学センター,准教授

経歴

  • 2007年 ~ ,- 大阪大学・極限量子科学研究センター・准教授

研究内容・専門分野

  • ナノテク・材料,薄膜、表面界面物性

論文

  • Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry,Satoshi Abo,Albert Seidl,Fujio Wakaya,Mikio Takai,Nuclear Instruments and Methods in Physics Research Section B,Vol. 456,p. 12-15,2019年10月
  • Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence,Satoshi Abo,Kenichi Tani,Fujio Wakaya,Shinobu Onoda,Yuji Miyato,Hayato Yamashita,Masayuki Abe,Proceedings of the International Conference on Ion Implantation Technology,Vol. 2018-September,p. 156-159,2018年09月
  • Detection of nonmagnetic metal thin film using magnetic force microscopy,Fujio Wakaya,Kenta Oosawa,Masahiro Kajiwara,Satoshi Abo,Mikio Takai,Applied Physics Letters,Vol. 113,2018年,研究論文(学術雑誌)
  • Dependence of light polarization on electron emission from gated silicon field emitter arrays,p. 286-287,2017年09月26日,研究論文(国際会議プロシーディングス)
  • Electron emission properties of gated silicon field emitter arrays driven by laser pulses,Vol. 109,No. 18,2016年10月31日,研究論文(学術雑誌)
  • Field emission from gated silicon field emitter array induced by sub-nanosecond laser pulses,2016年08月24日,研究論文(国際会議プロシーディングス)
  • Characterization of X-ray charge neutralizer using carbon-nanotube field emitter,Vol. 55,No. 6,2016年06月01日,研究論文(国際会議プロシーディングス)
  • Photoresponse of p-type silicon emitter array,p. 200-201,2015年08月26日,研究論文(国際会議プロシーディングス)
  • X-ray source using carbon-nanotube field emitter with side-gate electrode,S. Okawaki,S. Abo,F. Wakaya,M. Abe,M. Takai,Japanese Journal of Applied Physics,2015年05月,研究論文(学術雑誌)
  • Maskless laser processing of graphene,F. Wakaya,T. Kurihara,N. Yurugi,S. Abo,M. Abe,M. Takai,Microelectronic Engineering,2015年04月,研究論文(学術雑誌)
  • Soft errors in silicon-on-insulator static random access memory induced by high-energy heavy-ion irradiation,Satoshi Abo,Masatoshi Hazama,Fujio Wakaya,Takahiro Makino,Shinobu Onoda,Takeshi Ohshima,Hidekazu Oda,Mikio Takai,Proceedings of the 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (11th-RASEDA), 11-13 November 2015, Gunma, Japan,p. 105-108,2015年,研究論文(国際会議プロシーディングス)
  • Analysis technique for ultra shallow junction using medium energy ion scattering time-of-flight elastic recoil detection analysis,Satoshi Abo,Ri Pei,Yao Xin Yuan,Fujio Wakaya,Mikio Takai,Surface and Interface Analysis,Vol. 46,p. 1192-1195,2015年,研究論文(学術雑誌)
  • Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry,Vol. 348,p. 29-33,2015年,研究論文(学術雑誌)
  • A preparation method for atomically clean sapphire surfaces and high resolution topographic method for their imaging by non-contact atomic force microscopy,Vol. 56,No. 8,p. 1310-1313,2015年,研究論文(学術雑誌)
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light,Vol. 32,No. 2,2014年03月,研究論文(学術雑誌)
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light,Vol. 32,No. 2,2014年,研究論文(学術雑誌)
  • Electron emission from pyroelectric crystal excited using high power infra-red laser light and its x-ray source application,2014年,研究論文(国際会議プロシーディングス)
  • Spreading Resistance Profiling of Ultra Shallow Junction Fabricated with Low Energy As Implantation and Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy,2014年,研究論文(国際会議プロシーディングス)
  • Laser-induced electron emission from p-type silicon emitters,p. 196-197,2014年,研究論文(国際会議プロシーディングス)
  • Photoassisted electron emission from metal-oxide-semiconductor cathodes based on nanocrystalline silicon,Vol. 113,No. 15,2013年04月,研究論文(学術雑誌)
  • CNT cold cathode with side-gate electrode for flat panel X-ray source,2013年,研究論文(国際会議プロシーディングス)
  • Fabrication of titanium oxide field emitter array on glass substrate,2013年,研究論文(国際会議プロシーディングス)
  • Effect of electron focusing in X-ray source using LiTaO3 crystal excited by Nd:YLF laser light,2013年,研究論文(国際会議プロシーディングス)
  • 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用,阿保智,中浜弘介,高橋理明,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2013-60,p. 41-45,2013年,研究論文(研究会,シンポジウム資料等)
  • Influence of Generated Charge by High Energy Ion Irradiation on Soft Error Rate in SOI SRAM,M. Hazama,S. Abo,F. Wakaya,T. Makino,S. Onoda,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2013-059,2013年,研究論文(大学,研究機関等紀要)
  • Ultra-violet laser processing of graphene on SiO2/Si,Vol. 110,p. 358-360,2013年,研究論文(学術雑誌)
  • グラフェンエッジ冷陰極の作製と電子放出特性の評価,村上, 勝久,山口, 尚登,若家, 冨士男,高井, 幹夫,CHHOWALLA, Manish,電子情報通信学会技術研究報告. ED, 電子デバイス,一般社団法人電子情報通信学会,Vol. 112,No. 303,p. 7-10,2012年11月,研究論文(学術雑誌)
  • Effects of ultra-violet laser irradiation on graphene,Vol. 97,p. 144-146,2012年09月,研究論文(学術雑誌)
  • Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling,Vol. 44,No. 6,p. 732-735,2012年06月,研究論文(国際会議プロシーディングス)
  • Difference of soft error rates in SOI SRAM induced by various high energy ion species,Vol. 273,p. 262-265,2012年02月15日,研究論文(国際会議プロシーディングス)
  • Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe,Vol. 273,p. 266-269,2012年02月15日,研究論文(国際会議プロシーディングス)
  • Patterning of Titanium-Oxide Nanostructures on Glass Substrate and Their Field Emission Properties,p. 248-249,2012年,研究論文(国際会議プロシーディングス)
  • Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application,p. 44-45,2012年,研究論文(国際会議プロシーディングス)
  • Development of a tiny X-ray source controlled by laser light for medical application,p. 68-+,2012年,研究論文(国際会議プロシーディングス)
  • Selective-Area Growth and Field Emission Properties of Titanium-Oxide Nanowires on Glass Substrate,Vol. 19,p. 1795-1798,2012年,研究論文(国際会議プロシーディングス)
  • Photoresponse of nanocrystalline silicon based MOS cathodes,p. 324-+,2012年,研究論文(国際会議プロシーディングス)
  • Photoassisted Electron Emission from MOS Cathodes based on Nanocrystalline Silicon,Vol. 19,p. 1811-1813,2012年,研究論文(国際会議プロシーディングス)
  • Field Emission Property of Carbon Nanotube Electron Source Using Side-Gate Electrode,Vol. 19,p. 1765-1767,2012年,研究論文(国際会議プロシーディングス)
  • 電子ビーム誘起堆積三極構造Pt冷陰極からの縞状電子放出パターンの観測,北山智久,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2012-62,p. 41-44,2012年,研究論文(研究会,シンポジウム資料等)
  • Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes,Masatoshi Hazama,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai,Proceedings of the 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA), 10-12 December 2012, Ibaraki, Japan,p. 115-118,2012年,研究論文(国際会議プロシーディングス)
  • Active dopant profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscopy,Vol. 1496,p. 164-166,2012年,研究論文(国際会議プロシーディングス)
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition,Vol. 31,p. 186-187,2012年,研究論文(国際会議プロシーディングス)
  • Development of planar X-ray source using gated CNT emitter,Vol. 31,p. 122-123,2012年,研究論文(国際会議プロシーディングス)
  • Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe,Vol. 269,No. 20,p. 2233-2236,2011年10月15日,研究論文(国際会議プロシーディングス)
  • Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes,Vol. 269,No. 20,p. 2360-2363,2011年10月15日,研究論文(国際会議プロシーディングス)
  • Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy,Vol. 88,No. 8,p. 2778-2780,2011年08月,研究論文(国際会議プロシーディングス)
  • Field emission from atomically thin edges of reduced graphene oxide,Vol. 5,No. 6,p. 4945-4952,2011年06月28日,研究論文(学術雑誌)
  • Electron transport properties of Pt nanoarch fabricated by electron-beam-induced deposition,Vol. 50,No. 6,p. 06GG14-1-06GG14-3,2011年06月,研究論文(学術雑誌)
  • Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray source application,p. 109-+,2011年,研究論文(国際会議プロシーディングス)
  • Electron emission from nanocrystalline silicon based MOS cathode under laser irradiation,p. 175-+,2011年,研究論文(国際会議プロシーディングス)
  • レーザ誘起焦電結晶からの電子放出とX線源への応用,加賀英一,中浜弘介,木佐俊哉,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2011-70,p. 53-57,2011年,研究論文(研究会,シンポジウム資料等)
  • ゲート付電子源を用いたX線源の開発,真鍋知哉,新田翔吾,沖宏吏,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2011-71,p. 59-63,2011年,研究論文(研究会,シンポジウム資料等)
  • Field Emission Property of Titanium-Oxide Nanostructure Fabricated on Glass Substrate with Control of Density and Lengt,Fujio Wakaya,Takuo Nakatani,Satoshi Abo,Mikio Takai,Proceedings of the International Display Workshop 11 (IDW ’11), 16-19 November 2011, Jeju, Korea,p. 1783-1786,2011年,研究論文(国際会議プロシーディングス)
  • Effect of Body-tie Structure Fabricated by Partial Trench Isolation for Suppression of Soft Errors in SOI SRAM Investigated by Helium and Oxygen Ion Probes,S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2011-043,2011年,研究論文(大学,研究機関等紀要)
  • 11.2: Electron emission properties of coherent field emitter for electron wave interference,p. 209-210,2010年,研究論文(国際会議プロシーディングス)
  • Enhanced Electron Emission from nc-Si MOS Cathode by Laser Irradiation,p. 2033-2035,2010年,研究論文(国際会議プロシーディングス)
  • Robust Carbon Nanotube Cathode with Various CNT Diameters and Post Treatments,Takai Mikio,Takikawa Tomoaki,Oki Hiroshi,Murakami Katsuhisa,Abo Satoshi,Wakaya Fujio,ITE/SID,Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3,p. 2025-2028,2010年
  • Enhancement of Electron Field Emission from Titanium-Oxide Nanostructure by Ultraviolet Light Irradiation,Wakaya Fujio,Tatsumi Tomohiko,Murakami Katsuhisa,Abo Satoshi,Takimoto Tadahiko,Takaoka Yoichi,Takai Mikio,ITE/SID,Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3,p. 2045-2048,2010年
  • Evaluation of Soft Errors using Nuclear Probes in SOI SRAM with Body-tie Structure Fabricated by Partial Trench Isolation,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai,Proceedings of the 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (9th-RASEDA), 27-29 October 2010, Gunma, Japan,p. 72-75,2010年,研究論文(国際会議プロシーディングス)
  • Evaluation of Soft Error Rates in SOI SRAM with a Technology Node of 90 nm Using Oxygen Ion Probe,S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2010-065,2010年,研究論文(大学,研究機関等紀要)
  • Local resistance profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscope,Vol. 1321,p. 229-232,2010年,研究論文(国際会議プロシーディングス)
  • P1-23: Effect of ultra-violet light irradiation on electron field emission from titanium-oxide nanostructure,Vol. 29,p. 72-73,2010年,研究論文(国際会議プロシーディングス)
  • In situ transmission-electron-microscope observation of electron-beam-deposited Pt field emitter under field emission and field evaporation,p. 171-172,2009年,研究論文(国際会議プロシーディングス)
  • The electron field emission from the Si nanostructures formed by laser irradiation,Vol. 28,No. (num),p. 135-136,2009年,研究論文(国際会議プロシーディングス)
  • Local resistance profiling of ultra shallow junction with spike lamp and laser annealing using scanning spreading resistance microscopy,Satoshi Abo,Kazuhisa Nishikawa,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai,Proceedings of 17th International Conference on Ion Implantation Technology (IIT2008), AIP Conference Proceedings 1066, 8-13 June 2008, Monterey, California, USA,Vol. 1066,p. 83-86,2009年,研究論文(国際会議プロシーディングス)
  • Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser,W. S. Kim,H. Oki,A. Kinoshita,K. Murakami,S. Abo,F. Wakaya,M. Takai,Journal of Vacuum Science and Technology B,Vol. 26,p. 760-763,2008年,研究論文(学術雑誌)
  • Improvement of emission efficiency of nanocrystalline silicon planar cathodes,p. 106-107,2007年,研究論文(国際会議プロシーディングス)
  • Emission properties of nanocrystalline silicon planar cathodes,p. 2217-+,2007年,研究論文(国際会議プロシーディングス)
  • The relationship between field emission characteristics and defects measured by RAMAN scattering in carbon nanotube cathode treated by plasma and laser irradiation,p. 123-124,2007年,研究論文(国際会議プロシーディングス)
  • Observation of fringelike electron-emission pattern in field emission from Pt field emitter fabricated by electron-beam-induced deposition,Murakami K,Wakaya F,Takai M,Journal of Vacuum Science & Technology B,Vol. 25,No. 4,p. 1310-1314,2007年
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer laser,Kinoshita A,Kim W. S,Murakami K,Abo S,Wakaya F,Takai M,ITE,Idw '07: Proceedings of the 14th International Display Workshops, Vols 1-3,p. 2177-+,2007年
  • Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition,p. 26-27,2007年,研究論文(国際会議プロシーディングス)
  • Detection of magnetic field for measuring current distribution in metal nanostructure,K. Tanaka,Y. Mori,H. Yamagiwa,S. Abo,F. Wakaya,M. Takai,Microelectronic Engineering,Vol. 84,p. 1416-1418,2007年,研究論文(学術雑誌)
  • Improved field emission characteristics of multi-walled carbon nanotube cathode by plasma treatment with a help of krypton fluoride laser irradiation,p. 313-314,2006年,研究論文(国際会議プロシーディングス)
  • KrF laser surface treatment of CNT cathodes with and without reactive ion etching,p. 73-74,2006年,研究論文(国際会議プロシーディングス)
  • Observation of electron wave interference in field emission from two adjacent different points,p. 37-38,2006年,研究論文(国際会議プロシーディングス)
  • Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes,Ohsumi K,Honda T,Kim W. S,Oh C. B,Murakami K,Abo S,Wakaya F,Takai M,Hosono A,Nakata S,Okuda S,ITE,Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3,p. 1837-+,2006年
  • Field emission characteristics of carbon nanotubes treated by plasma and laser,Kim W. S,Honda T,Oh C. B,Ohmmi K,Murakami K,Abo S,Wakaya F,Takai M,ITE,Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3,p. 1841-1844,2006年
  • KrF laser surface treatment of CNT cathodes,Vol. 2005,p. 300-301,2005年,研究論文(国際会議プロシーディングス)
  • Fabrication and characterization of Pt nanosplit emitter using electron beam induced deposition,Vol. 2005,p. 157-158,2005年,研究論文(国際会議プロシーディングス)
  • Influence of the Pt cathode resistance on the field emission properties of field emitters fabricated using beam induced deposition,Vol. 2005,p. 246-247,2005年,研究論文(国際会議プロシーディングス)
  • Ultra shallow As profiling before and after spike annealing using medium energy ion scattering,p. 49-50,2005年,研究論文(国際会議プロシーディングス)
  • Transport properties of Pt nanowires fabricated by beam-induced deposition,Tsukatani Y,Yamasaki N,Murakami K,Wakaya F,Takai M,Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers,Vol. 44,No. 7B,p. 5683-5686,2005年
  • Surface treatment of CNT cathodes using KrF excimer laser for field emission displays,Honda T,Oh C. B,Murakami K,Ohsumi K,Abo S,Wakaya F,Takai M,ITE,Idw/ad '05: Proceedings of the 12th International Display Workshops in Conjunction With Asia Display 2005, Vols 1 and 2,p. 1647-1650,2005年
  • Observation of electron emission pattern from nanosplit emitter fabricated using beam assisted process,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,Journal of Vacuum Science and Technology B,Vol. 23,p. 735-740,2005年,研究論文(学術雑誌)
  • Effect of thermal annealing on emission characteristics of nanoelectron source fabricated using beam-assisted process,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,Journal of Vacuum Science and Technology B,Vol. 23,p. 759-761,2005年,研究論文(学術雑誌)
  • Influence of gas atmosphere during laser surface treatment of CNT cathode,W. Rochanachirapar,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,A. Hosono,S. Okuda,Journal of Vacuum Science and Technology B,Vol. 23,p. 762-764,2005年,研究論文(学術雑誌)
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size,W. Rochanachirapar,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,A. Hosono,S. Okuda,Journal of Vacuum Science and Technology B,Vol. 23,p. 765-768,2005年,研究論文(学術雑誌)
  • Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering,S. Abo,S. Ichihara,T. Lohner,F. Wakaya,T. Eimori,Y. Inoue,M. Takai,Nuclear Instruments and Methods in Physics Research Section B,Vol. 237,p. 72-76,2005年,研究論文(学術雑誌)
  • Laser surface treatment of CNT cathodes for large diagonal FEDs,p. 246-247,2004年,研究論文(国際会議プロシーディングス)
  • Influence of gas atmosphere during laser surface treatment of CNT cathode,Rochanachirapar W,Murakami K,Yamasaki N,Abo S,Wakaya F,Takai M,Hosono A,Okuda S,Technical Digest of the 17th International Vacuum Nanoelectronics Conference,p. 144-145,2004年
  • Fabrication of a carbon nanotube device using a patterned electrode and a local electric field,Vol. 34,No. 3-6,p. 401-405,2003年09月,研究論文(学術雑誌)
  • In situ Si doping in GaAs using low-energy focused Si ion beam/molecular beam epitaxy combined system,Vol. 680,p. 662-665,2003年,研究論文(国際会議プロシーディングス)
  • Fabrication of spin-current-induced domain-wall-nucleation device in planar configuration,Vol. 20,No. 6,p. 2814-2818,2002年11月,研究論文(学術雑誌)
  • Carrier activation in in situ Si-doped GaAs layers fabricated by a focused Si ion beam and molecular beam epitaxy combined system,Vol. 175,p. 751-755,2001年04月,研究論文(学術雑誌)
  • Carrier distribution profiles in Si-doped layers in GaAs formed by focused ion beam implantation and successive overlayer growth,Vol. 18,No. 6,p. 3158-3161,2000年11月,研究論文(学術雑誌)
  • Transport of coupled double quantum dots in series,Vol. 7,No. 3-4,p. 420-424,2000年05月,研究論文(学術雑誌)
  • Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system,Vol. 17,No. 6,p. 3072-3074,1999年11月,研究論文(学術雑誌)
  • Focused ion beam etching of resist Ni multilayer films and applications to metal island structure formation,Vol. 16,No. 4,p. 2511-2514,1998年07月,研究論文(学術雑誌)
  • Interface states induced in GaAs by growth interruption during an in situ process,Vol. 16,No. 4,p. 2313-2316,1998年07月,研究論文(学術雑誌)
  • Effects of growth interruption in in situ process for buried quantum structures,Vol. 42,p. 591-594,1998年03月,研究論文(学術雑誌)
  • Electron-beam-induced oxidation for single-electron devices,Vol. 36,No. 12B,p. 7782-7785,1997年12月,研究論文(学術雑誌)
  • Characterization of Si-doped layer in GaAs fabricated by a focused ion beam molecular beam epitaxy combined system,Vol. 15,No. 6,p. 2930-2933,1997年11月,研究論文(学術雑誌)
  • Characterization of laterally selected Si doped layer formed in GaAs using a low-energy FIB-MBE combined system,Vol. 438,p. 187-192,1997年,研究論文(国際会議プロシーディングス)
  • Fabrication of laterally selected Si doped layer in GaAs using a low-energy focused ion beam molecular beam epitaxy combined system,Vol. 14,No. 6,p. 3938-3941,1996年11月,研究論文(学術雑誌)
  • Novel class of low molecular-weight organic resists for nanometer lithography,Vol. 69,No. 17,p. 2605-2607,1996年10月,研究論文(学術雑誌)
  • Effects of growth interruption and FIB implantation in the UHV total vacuum process for the buried mesoscopic structures,Vol. 227,No. 1-4,p. 268-270,1996年09月,研究論文(学術雑誌)
  • Confinement potential in an asymmetrically biased quantum point contact,Vol. 35,No. 2B,p. 1329-1332,1996年02月,研究論文(学術雑誌)
  • Formation of buried two-dimensional electron gas in GaAs by Si ion doping using MBE-FIB combined system,Vol. 396,p. 701-705,1996年,研究論文(国際会議プロシーディングス)
  • LOW-ENERGY FOCUSED ION-BEAM AND BURIED ELECTRON WAVE-GUIDES FABRICATION,Vol. 23,No. 1-4,p. 123-126,1994年01月,研究論文(学術雑誌)
  • TRANSPORT-PROPERTIES OF COUPLED ELECTRON WAVE-GUIDES BURIED IN HETEROSTRUCTURE,Vol. 32,No. 12B,p. 6242-6245,1993年12月,研究論文(学術雑誌)
  • ELECTRON FOCUSING EFFECTS IN THE INPLANE GATED STRUCTURES,Vol. 11,No. 3,p. 273-275,1992年,研究論文(学術雑誌)
  • FABRICATION OF GAAS/GAALAS QUANTUM WIRES WITH SIDE GATES,Vol. 8,No. 6,p. 1794-1797,1990年11月,研究論文(学術雑誌)

MISC

  • 還元した単層酸化グラフェンエッジからの電界電子放出,山口尚登,村上勝久,江田剛輝,藤田武志,GUAN P,WANG W,GONG C,BOISSE J,MILLER S,ACIK M,CHO K,CHABAL Y. J,CHEN M,若家冨士男,高井幹夫,CHHOWALLA M,応用物理学会学術講演会講演予稿集(CD-ROM),Vol. 72nd,2011年08月16日
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm,Vol. 268,No. 11-12,p. 2074-2077,2010年06月
  • Study on time resolution of single event TOF-RBS measurement,Vol. 268,No. 11-12,p. 2019-2022,2010年06月
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm,Vol. 268,No. 11-12,p. 2074-2077,2010年06月
  • Study on time resolution of single event TOF-RBS measurement,Vol. 268,No. 11-12,p. 2019-2022,2010年06月
  • Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition,Vol. 28,No. 2,p. C2A9-C2A12,2010年03月
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,Vol. 28,No. 2,p. C2B24-C2B26,2010年03月
  • Evaluation of emission uniformity of nanocrystalline silicon planar cathodes,Vol. 28,No. 2,p. C2-C52,2010年
  • Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition,J. Vac. Sci. Technol.,Vol. B 28, pp.C2A9-C2A12,2010年
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,J. Vac. Sci. Technol.,Vol. B 28, pp.C2B24-C2B26,2010年
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,J. Vac. Sci. Technol.,Vol. B 28, pp.C2B27-C2B29,2010年
  • In situ transmission electron microscopy observation of electron-beam-deposited Pt field emitter during field emission and field evaporation,Vol. 28,No. 2,p. C2-C15,2010年
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2-C44,2010年
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,Vol. B 28, pp.C2B27-C2B29,2010年
  • In situ transmission electron microscopy observation of electron-beam-deposited Pt field emitter during field emission and field evaporation,Vol. B 28, pp.C2C13-C2C15,2010年
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2-C44,2010年
  • Evaluation of emission uniformity of nanocrystalline silicon planar cathodes,Vol. B 28, pp.C2C49-C2C52,2010年
  • Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition,Vol. 48,No. 6,2009年06月
  • Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition,Vol. 48,No. 6,2009年06月
  • Superposition of fringelike-electron-emission pattern from radical-oxygen-gas exposed Pt field emitter fabricated by electron-beam-induced deposition,Vol. 27,No. 2,p. 721-724,2009年03月
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission,Vol. 27,No. 2,p. 775-777,2009年03月
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission,Vol. 27,No. 2,p. 775-777,2009年03月
  • Superposition of fringelike-electron-emission pattern from radical-oxygen-gas exposed Pt field emitter fabricated by electron-beam-induced deposition,Vol. 27,No. 2,p. 721-724,2009年03月
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser,The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan,Vol. pp.151-152,2009年
  • Electron-wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition,Vol. pp.9-10,p. 9-10,2009年
  • Fabrication and electron field emission properties of titanium-oxide nanowire,Vol. pp.145-146,p. 145-146,2009年
  • Emission uniformity of nanocrystalline silicon based metal-oxide- semiconductor cathodes,Vol. pp.307-308,p. 307-308,2009年
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics,Vol. pp.291-202,p. 291-292,2009年
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics,International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009),Vol. pp. ???,2009年
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties,International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009),Vol. pp. ???,2009年
  • Intensity Distribution of Electron Emission from nc-Si MOS Cathode,International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009),Vol. pp. ???,2009年
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,J. Vac. Sci. Technol.,Vol. B 27, pp.761-765,2009年
  • Electron-wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition,Vol. pp.9-10,p. 9-10,2009年
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser,Vol. pp.151-152,2009年
  • Fabrication and electron field emission properties of titanium-oxide nanowire,Vol. pp.145-146,p. 145-146,2009年
  • Emission uniformity of nanocrystalline silicon based metal-oxide-semiconductor cathodes,Vol. pp.307-308,2009年
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics,Vol. pp.291-202,2009年
  • Intensity Distribution of Electron Emission from nc-Si MOS Cathode,Vol. pp. ???,2009年
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties,Vol. pp. ???,2009年
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics,Vol. pp. ???,2009年
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,Vol. 27,No. 2,p. 761-765,2009年
  • Electron emission from nanocrystalline silicon based metal-oxide-semiconductor cathode arrays,2008年
  • Improvement of emission efficiency of nanocrystalline silicon planar cathodes,Vol. 26,No. 2,p. 864-867,2008年
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment,International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008),Vol. 2061-2063,2008年
  • Field Emission Lifetime after Aging of CNT Cathodes,International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008),Vol. 2037-2040,2008年
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment,Vol. 2061-2063,2008年
  • Field Emission Lifetime after Aging of CNT Cathodes,Vol. 2037-2040,2008年
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures,Vol. 261,No. 1-2,p. 466-469,2007年08月
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures,Vol. 261,No. 1-2,p. 466-469,2007年08月
  • Development of time-of-flight RBS system using multi microchannel plates,Vol. 260,No. 1,p. 105-108,2007年07月
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation,Vol. 25,No. 2,p. 566-569,2007年03月
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching,Vol. 25,No. 2,p. 557-560,2007年03月
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching,Vol. 25,No. 2,p. 557-560,2007年03月
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation,Vol. 25,No. 2,p. 566-569,2007年03月
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser,Vol. 2173-2176,p. 2173-+,2007年
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser,Vol. 2173-2176,2007年
  • Compositional analysis of HfxSiyO1-x-y thin films by medium energy ion scattering (MEIS) analysis,Nucl. Instr. and Meth.,Vol. 249,p. 246-249,2006年08月
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy,Vol. 89,No. 6,2006年08月
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis,Vol. 249,p. 246-249,2006年08月
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy,Vol. 89,No. 6,2006年08月
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays,Vol. 24,No. 2,p. 1013-1016,2006年03月
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays,Vol. 24,No. 2,p. 1013-1016,2006年03月
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing,Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30 – February 1, 2006, Osaka University,Vol. 1,2006年
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy,Vol. 866,p. 542-+,2006年
  • Transport properties of beam-deposited Pt nanowires,Vol. 38,p. 120-+,2006年
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy,Vol. 866,p. 542-+,2006年
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing,Vol. 1,2006年
  • Transport properties of beam-deposited Pt nanowires,Vol. 38,p. 120-+,2006年
  • Reliability study of bulk and SOISRAMs using high energy nuclear probes,Vol. 231,p. 482-485,2005年04月
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy,Vol. pp. 973 -975,p. 973-975,2005年
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy,Vol. pp. 973 -975,p. 973-975,2005年
  • Fabrication of carbon nanotube devices by electroplating with in situ observation,Vol. 73-4,p. 559-563,2004年06月
  • Laser irradiation to CNT cathodes for large diagonal FEDs,2004年
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices,2004年
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices,2004年
  • Laser irradiation to CNT cathodes for large diagonal FEDs,2004年
  • Maskless Mn implantation in GaAs using focused Mn ion beam,Vol. 206,p. 1013-1017,2003年05月
  • Carrier profiles and electron traps at a growth - interrupted layer in GaAs fabricated by a focused ion beam and molecular beam epitaxy combined system(共著),GOTO T,HADA T,YANAGISAWA J,WAKAYA F,YUBA Y,GAMO K,Applied Surface Science,Vol. 159/160,p. 277-281,2000年
  • Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system(共著),YANAGISAWA J,GOTO T,HADA T,NAKAI M,WAKAYA F,YUBA Y,GAMO K,Journal of Vacuum Science and Technology B,Vol. 17,No. 6,p. 3072-3074,1999年
  • Focused ion beam process for formation of a metal/insulator/metal double tunnel junction(共著),Vol. 38,No. 12B,p. 7151-7154,1999年
  • Characterization of Si-doped layer in GaAs fabricated by a focused ion beam/molecular beam epitaxy combined system(共著),YANAGISAWA J,NAKAYAMA H,OKA K,NAKAI M,WAKAYA F,YUBA Y,TAKAOKA S,MURASE K,GAMO K,Journal of Vacuum Science and Technology B,Vol. 15,No. 6,p. 2930-2933,1997年
  • 1,3,5-Tris[4-(tert-Butoxycarbonylmethoxy)phenyl]benzene as a Novel Electron-beam Positive Resist for Nanometer Lithography,Vol. 9,No. 1,p. 57-58,1996年

著書

  • 第8回真空ナノエレクトロニクスシンポジウム 予稿集 2011年3月1日~2日 京都リサーチパーク,独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会,2011年
  • 第6回真空ナノエレクトロニクスシンポジウム 予稿集 2009年3月3日~4日 大阪大学中之島センター,独立行政法人日本学術振興会 真空ナノエレクトロニクスシ第158委員会,2009年
  • 第5回真空ナノエレクトロニクスシンポジウム 予稿集 2008年3月3日~4日 筑波大学東京キャンパス大塚地区,独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会,2008年
  • 第4回真空ナノエレクトロニクスシンポジウム 予稿集 2007年3月6日~7日 大阪大学中之島センター,独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会,2007年
  • カーボンナノチューブFEDプロジェクト公開シンポジウム・第3回真空ナノエレクトロニクスシンポジウム 予稿集 2006年3月6日~7日 東京 コクヨホール,独立行政法人 日本学術振興会 真空ナノエレクトロニクス第158委員会,2006年

作品

  • 非破壊3次元TOF-RBS分析装置の開発,2004年 ~