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Wakaya Fujio

若家 冨士男

Graduate School of Engineering Science Center for Science and Technology under Extreme Conditions, Associate Professor

Research History

  • 2007 - , - 大阪大学・極限量子科学研究センター・准教授

Research Areas

  • Nanotechnology/Materials, Thin-film surfaces and interfaces

Papers

  • Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry, Satoshi Abo,Albert Seidl,Fujio Wakaya,Mikio Takai, Nuclear Instruments and Methods in Physics Research Section B, Vol. 456, p. 12-15, 2019/10
  • Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence, Satoshi Abo,Kenichi Tani,Fujio Wakaya,Shinobu Onoda,Yuji Miyato,Hayato Yamashita,Masayuki Abe, Proceedings of the International Conference on Ion Implantation Technology, Vol. 2018-September, p. 156-159, 2018/09
  • Detection of nonmagnetic metal thin film using magnetic force microscopy, Fujio Wakaya,Kenta Oosawa,Masahiro Kajiwara,Satoshi Abo,Mikio Takai, Applied Physics Letters, Vol. 113, 2018
  • Dependence of light polarization on electron emission from gated silicon field emitter arrays, Hidetaka Shimawaki,Masayoshi Nagao,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, 2017 30th International Vacuum Nanoelectronics Conference, IVNC 2017, Institute of Electrical and Electronics Engineers Inc., p. 286-287, 2017/09/26
  • Electron emission properties of gated silicon field emitter arrays driven by laser pulses, Hidetaka Shimawaki,Masayoshi Nagao,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, Applied Physics Letters, American Institute of Physics Inc., Vol. 109, No. 18, 2016/10/31
  • Field emission from gated silicon field emitter array induced by sub-nanosecond laser pulses, Hidetaka Shimawaki,Masayoshi Nagao,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, 2016 29th International Vacuum Nanoelectronics Conference, IVNC 2016, Institute of Electrical and Electronics Engineers Inc., 2016/08/24
  • Characterization of X-ray charge neutralizer using carbon-nanotube field emitter, Shuhei Okawaki,Satoshi Abo,Fujio Wakaya,Hayato Yamashita,Masayuki Abe,Mikio Takai, Japanese Journal of Applied Physics, Japan Society of Applied Physics, Vol. 55, No. 6, 2016/06/01
  • Photoresponse of p-type silicon emitter array, Hidetaka Shimawaki,Masayoshi Nagao,Bunpei Masaoka,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, IVNC 2015 - Technical Digest: 28th International Vacuum Nanoelectronics Conference, Institute of Electrical and Electronics Engineers Inc., p. 200-201, 2015/08/26
  • X-ray source using carbon-nanotube field emitter with side-gate electrode, 2015/05
  • Maskless laser processing of graphene, 2015/04
  • Soft errors in silicon-on-insulator static random access memory induced by high-energy heavy-ion irradiation, Satoshi Abo,Masatoshi Hazama,Fujio Wakaya,Takahiro Makino,Shinobu Onoda,Takeshi Ohshima,Hidekazu Oda,Mikio Takai, Proceedings of the 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (11th-RASEDA), 11-13 November 2015, Gunma, Japan, p. 105-108, 2015
  • Analysis technique for ultra shallow junction using medium energy ion scattering time-of-flight elastic recoil detection analysis, Satoshi Abo,Ri Pei,Yao Xin Yuan,Fujio Wakaya,Mikio Takai, Surface and Interface Analysis, Vol. 46, p. 1192-1195, 2015
  • Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry, Satoshi Abo,Yasuhisa Hamada,Albert Seidl,Fujio Wakaya,Mikio Takai, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Elsevier B.V., Vol. 348, p. 29-33, 2015
  • A preparation method for atomically clean sapphire surfaces and high resolution topographic method for their imaging by non-contact atomic force microscopy, Daiki Katsube,Yutaro Takase,Hayato Yamashita,Satoshi Abo,Fujio Wakaya,Masayuki Abe, Materials Transactions, Japan Institute of Metals (JIM), Vol. 56, No. 8, p. 1310-1313, 2015
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light, Kosuke Nakahama,Michiaki Takahashi,Satoshi Abo,Fujio Wakaya,Mikio Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 32, No. 2, 2014/03
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light, Kosuke Nakahama,Michiaki Takahashi,Satoshi Abo,Fujio Wakaya,Mikio Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 32, No. 2, 2014
  • Electron emission from pyroelectric crystal excited using high power infra-red laser light and its x-ray source application, Satoshi Abo,Takahiro Uezato,Fujio Wakaya,Mikio Takai, 2014 27TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE, 2014
  • Spreading Resistance Profiling of Ultra Shallow Junction Fabricated with Low Energy As Implantation and Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy, Satoshi Abo,Hidenori Osae,Fujio Wakaya,Mikio Takai,Hidekazu Oda, 2014 20TH INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY (IIT 2014), IEEE, 2014
  • Laser-induced electron emission from p-type silicon emitters, Hidetaka Shimawaki,Masayoshi Nagao,Tomoya Yoshida,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, Technical Digest - 2014 27th International Vacuum Nanoelectronics Conference, IVNC 2014, Institute of Electrical and Electronics Engineers Inc., p. 196-197, 2014
  • Photoassisted electron emission from metal-oxide-semiconductor cathodes based on nanocrystalline silicon, H. Shimawaki,Y. Neo,H. Mimura,F. Wakaya,M. Takai, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 113, No. 15, 2013/04
  • CNT cold cathode with side-gate electrode for flat panel X-ray source, Shogo Nitta,Shuhei Okawaki,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26th International Vacuum Nanoelectronics Conference, IVNC 2013, 2013
  • Fabrication of titanium oxide field emitter array on glass substrate, Takuo Nakatani,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26th International Vacuum Nanoelectronics Conference, IVNC 2013, 2013
  • Effect of electron focusing in X-ray source using LiTaO3 crystal excited by Nd:YLF laser light, Kosuke Nakahama,Michiaki Takahashi,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, 2013
  • 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用, Vol. 2013-60, p. 41-45, 2013
  • Influence of Generated Charge by High Energy Ion Irradiation on Soft Error Rate in SOI SRAM, M. Hazama,S. Abo,F. Wakaya,T. Makino,S. Onoda,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2013-059, 2013
  • Ultra-violet laser processing of graphene on SiO2/Si, Fujio Wakaya,Tadashi Kurihara,Satoshi Abo,Mikio Takai, Microelectronic Engineering, Elsevier B.V., Vol. 110, p. 358-360, 2013
  • Fabrication of Graphene Edge Emitters and Their Field Emission Properties, MURAKAMI,Katsuhisa,YAMAGUCHI,Hisato,WAKAYA,Fujio,Takai,Mikio,CHHOWALLA,Manish, IEICE technical report. Electron devices, The Institute of Electronics, Information and Communication Engineers, Vol. 112, No. 303, p. 7-10, 2012/11
  • Effects of ultra-violet laser irradiation on graphene, Fujio Wakaya,Tsuyoshi Teraoka,Toshiya Kisa,Tomoya Manabe,Satoshi Abo,Mikio Takai, Microelectronic Engineering, Vol. 97, p. 144-146, 2012/09
  • Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling, Satoshi Abo,Hidemasa Horiuchi,Fujio Wakaya,Gabor Battistig,Tivadar Lohner,Mikio Takai, Surface and Interface Analysis, Vol. 44, No. 6, p. 732-735, 2012/06
  • Difference of soft error rates in SOI SRAM induced by various high energy ion species, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Tivadar Lohner,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 273, p. 262-265, 2012/02/15
  • Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe, Satoshi Abo,Takayuki Azuma,Tivadar Lohner,Fujio Wakaya,Mikio Takai, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 273, p. 266-269, 2012/02/15
  • Patterning of Titanium-Oxide Nanostructures on Glass Substrate and Their Field Emission Properties, Takuo Nakatani,Fujio Wakaya,Satoshi Abo,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 248-249, 2012
  • Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application, Kosuke Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 44-45, 2012
  • Development of a tiny X-ray source controlled by laser light for medical application, Mikio Takai,Kosuke Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 68-+, 2012
  • Selective-Area Growth and Field Emission Properties of Titanium-Oxide Nanowires on Glass Substrate, Takuo Nakatani,Fujio Wakaya,Satoshi Abo,Mikio Takai, IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 19, p. 1795-1798, 2012
  • Photoresponse of nanocrystalline silicon based MOS cathodes, Hidetaka Shimawaki,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 324-+, 2012
  • Photoassisted Electron Emission from MOS Cathodes based on Nanocrystalline Silicon, Hidetaka Shimawaki,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 19, p. 1811-1813, 2012
  • Field Emission Property of Carbon Nanotube Electron Source Using Side-Gate Electrode, Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 19, p. 1765-1767, 2012
  • 電子ビーム誘起堆積三極構造Pt冷陰極からの縞状電子放出パターンの観測, Vol. 2012-62, p. 41-44, 2012
  • Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes, Masatoshi Hazama,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Proceedings of the 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA), 10-12 December 2012, Ibaraki, Japan, p. 115-118, 2012
  • Active dopant profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscopy, Satoshi Abo,Naoya Ushigome,Hidenori Osae,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, AIP Conference Proceedings, Vol. 1496, p. 164-166, 2012
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition, Tomohisa Kitayama,Satoshi Abo,Fujio Wakaya,Mikio Takai, Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012, Vol. 31, p. 186-187, 2012
  • Development of planar X-ray source using gated CNT emitter, Tomoya Manabe,Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012, Vol. 31, p. 122-123, 2012
  • Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe, Satoshi Abo,Shunya Kumano,Takayuki Azuma,Ryota Sugimoto,Kohei Koresawa,Katsuhisa Murakami,Fujio Wakaya,Mikio Takai, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 269, No. 20, p. 2233-2236, 2011/10/15
  • Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 269, No. 20, p. 2360-2363, 2011/10/15
  • Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy, F. Wakaya,M. Kajiwara,K. Kubo,S. Abo,M. Takai, Microelectronic Engineering, Vol. 88, No. 8, p. 2778-2780, 2011/08
  • Field emission from atomically thin edges of reduced graphene oxide, Hisato Yamaguchi,Katsuhisa Murakami,Goki Eda,Takeshi Fujita,Pengfei Guan,Weichao Wang,Cheng Gong,Julien Boisse,Steve Miller,Muge Acik,Kyeongjae Cho,Yves J. Chabal,Mingwei Chen,Fujio Wakaya,Mikio Takai,Manish Chhowalla, ACS Nano, Vol. 5, No. 6, p. 4945-4952, 2011/06/28
  • Electron transport properties of Pt nanoarch fabricated by electron-beam-induced deposition, Fujio Wakaya,Kunio Takamoto,Tsuyoshi Teraoka,Katsuhisa Murakami,Satoshi Abo,Mikio Takai, Japanese Journal of Applied Physics, Vol. 50, No. 6, p. 06GG14-1-06GG14-3, 2011/06
  • Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray source application, Eiichi Kaga,Toshiya Kisa,Kosuke Nakahama,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2011 24TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE, p. 109-+, 2011
  • Electron emission from nanocrystalline silicon based MOS cathode under laser irradiation, Hidetaka Shimawaki,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, 2011 24TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE, p. 175-+, 2011
  • レーザ誘起焦電結晶からの電子放出とX線源への応用, Vol. 2011-70, p. 53-57, 2011
  • ゲート付電子源を用いたX線源の開発, Vol. 2011-71, p. 59-63, 2011
  • Field Emission Property of Titanium-Oxide Nanostructure Fabricated on Glass Substrate with Control of Density and Lengt, Fujio Wakaya,Takuo Nakatani,Satoshi Abo,Mikio Takai, Proceedings of the International Display Workshop 11 (IDW ’11), 16-19 November 2011, Jeju, Korea, p. 1783-1786, 2011
  • Effect of Body-tie Structure Fabricated by Partial Trench Isolation for Suppression of Soft Errors in SOI SRAM Investigated by Helium and Oxygen Ion Probes, S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2011-043, 2011
  • 11.2: Electron emission properties of coherent field emitter for electron wave interference, Katsuhisa Murakami,Toshiya Kisa,Tomohito Matsuo,Satoshi Ichikawa,Fujio Wakaya,Mikio Takai, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, p. 209-210, 2010
  • Enhanced Electron Emission from nc-Si MOS Cathode by Laser Irradiation, Hidetaka Shimawaki,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, IDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, p. 2033-2035, 2010
  • Robust Carbon Nanotube Cathode with Various CNT Diameters and Post Treatments, Takai Mikio,Takikawa Tomoaki,Oki Hiroshi,Murakami Katsuhisa,Abo Satoshi,Wakaya Fujio,ITE/SID, Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3, p. 2025-2028, 2010
  • Enhancement of Electron Field Emission from Titanium-Oxide Nanostructure by Ultraviolet Light Irradiation, Wakaya Fujio,Tatsumi Tomohiko,Murakami Katsuhisa,Abo Satoshi,Takimoto Tadahiko,Takaoka Yoichi,Takai Mikio,ITE/SID, Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3, p. 2045-2048, 2010
  • Evaluation of Soft Errors using Nuclear Probes in SOI SRAM with Body-tie Structure Fabricated by Partial Trench Isolation, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Proceedings of the 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (9th-RASEDA), 27-29 October 2010, Gunma, Japan, p. 72-75, 2010
  • Evaluation of Soft Error Rates in SOI SRAM with a Technology Node of 90 nm Using Oxygen Ion Probe, S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2010-065, 2010
  • Local resistance profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscope, Satoshi Abo,Kazuhisa Nishikawa,Naoya Ushigome,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, AIP Conference Proceedings, Vol. 1321, p. 229-232, 2010
  • P1-23: Effect of ultra-violet light irradiation on electron field emission from titanium-oxide nanostructure, Fujio Wakaya,Tomohiko Tatsumi,Katsuhisa Murakami,Satoshi Abo,Mikio Takai,Tadahiko Takimoto,Yoichi Takaoka, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, Vol. 29, p. 72-73, 2010
  • In situ transmission-electron-microscope observation of electron-beam-deposited Pt field emitter under field emission and field evaporation, K. Murakami,N. Matsubara,S. Ichikawa,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, p. 171-172, 2009
  • The electron field emission from the Si nanostructures formed by laser irradiation, A. Evtukh,A. Medvid,P. Onufrijevs,H. Mimura, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. 28, No. (num), p. 135-136, 2009
  • Local resistance profiling of ultra shallow junction with spike lamp and laser annealing using scanning spreading resistance microscopy, Satoshi Abo,Kazuhisa Nishikawa,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Proceedings of 17th International Conference on Ion Implantation Technology (IIT2008), AIP Conference Proceedings 1066, 8-13 June 2008, Monterey, California, USA, Vol. 1066, p. 83-86, 2009
  • Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser, W. S. Kim,H. Oki,A. Kinoshita,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B, Vol. 26, p. 760-763, 2008
  • Improvement of emission efficiency of nanocrystalline silicon planar cathodes, Hidetaka Shimawaki,Yoichiro Neo,Hidenori Mimura,Katsuhisa Murakami,Fujio Wakaya,Mikio Takai, Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, p. 106-107, 2007
  • Emission properties of nanocrystalline silicon planar cathodes, H. Shimawaki,Y. Neo,H. Mimura,K. Murakami,F. wakaya,M. Takai, IDW '07: PROCEEDINGS OF THE 14TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, p. 2217-+, 2007
  • The relationship between field emission characteristics and defects measured by RAMAN scattering in carbon nanotube cathode treated by plasma and laser irradiation, W. S. Kim,A. Kinishita,K. Murakami,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, p. 123-124, 2007
  • Observation of fringelike electron-emission pattern in field emission from Pt field emitter fabricated by electron-beam-induced deposition, Murakami K,Wakaya F,Takai M, Journal of Vacuum Science & Technology B, Vol. 25, No. 4, p. 1310-1314, 2007
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer laser, Kinoshita A,Kim W. S,Murakami K,Abo S,Wakaya F,Takai M,ITE, Idw '07: Proceedings of the 14th International Display Workshops, Vols 1-3, p. 2177-+, 2007
  • Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition, K. Murakami,S. Abe,S. Nishihara,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, p. 26-27, 2007
  • Detection of magnetic field for measuring current distribution in metal nanostructure, K. Tanaka,Y. Mori,H. Yamagiwa,S. Abo,F. Wakaya,M. Takai, Microelectronic Engineering, Vol. 84, p. 1416-1418, 2007
  • Improved field emission characteristics of multi-walled carbon nanotube cathode by plasma treatment with a help of krypton fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, p. 313-314, 2006
  • KrF laser surface treatment of CNT cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, p. 73-74, 2006
  • Observation of electron wave interference in field emission from two adjacent different points, K. Murakami,F. Wakaya,M. Takai, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, p. 37-38, 2006
  • Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes, Ohsumi K,Honda T,Kim W. S,Oh C. B,Murakami K,Abo S,Wakaya F,Takai M,Hosono A,Nakata S,Okuda S,ITE, Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3, p. 1837-+, 2006
  • Field emission characteristics of carbon nanotubes treated by plasma and laser, Kim W. S,Honda T,Oh C. B,Ohmmi K,Murakami K,Abo S,Wakaya F,Takai M,ITE, Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3, p. 1841-1844, 2006
  • KrF laser surface treatment of CNT cathodes, T. Honda,W. Rochanachirapar,K. Murakami,K. Ohsumi,N. Shimizu,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 300-301, 2005
  • Fabrication and characterization of Pt nanosplit emitter using electron beam induced deposition, K. Murakami,Y. Tsukatani,N. Yamasaki,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 157-158, 2005
  • Influence of the Pt cathode resistance on the field emission properties of field emitters fabricated using beam induced deposition, K. Murakami,N. Yamasaki,S. Abe,Y. Tsukatani,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 246-247, 2005
  • Ultra shallow As profiling before and after spike annealing using medium energy ion scattering, S Abo,S Ichihara,T Lohner,J Gyulai,F Wakaya,M Takai, Fifth International Workshop on Junction Technology, JAPAN SOCIETY APPLIED PHYSICS, p. 49-50, 2005
  • Transport properties of Pt nanowires fabricated by beam-induced deposition, Tsukatani Y,Yamasaki N,Murakami K,Wakaya F,Takai M, Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers, Vol. 44, No. 7B, p. 5683-5686, 2005
  • Surface treatment of CNT cathodes using KrF excimer laser for field emission displays, Honda T,Oh C. B,Murakami K,Ohsumi K,Abo S,Wakaya F,Takai M,ITE, Idw/ad '05: Proceedings of the 12th International Display Workshops in Conjunction With Asia Display 2005, Vols 1 and 2, p. 1647-1650, 2005
  • Observation of electron emission pattern from nanosplit emitter fabricated using beam assisted process, K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B, Vol. 23, p. 735-740, 2005
  • Effect of thermal annealing on emission characteristics of nanoelectron source fabricated using beam-assisted process, K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B, Vol. 23, p. 759-761, 2005
  • Influence of gas atmosphere during laser surface treatment of CNT cathode, W. Rochanachirapar,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,A. Hosono,S. Okuda, Journal of Vacuum Science and Technology B, Vol. 23, p. 762-764, 2005
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size, W. Rochanachirapar,K. Murakami,N. Yamasaki,S. Abo,F. Wakaya,M. Takai,A. Hosono,S. Okuda, Journal of Vacuum Science and Technology B, Vol. 23, p. 765-768, 2005
  • Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering, S. Abo,S. Ichihara,T. Lohner,F. Wakaya,T. Eimori,Y. Inoue,M. Takai, Nuclear Instruments and Methods in Physics Research Section B, Vol. 237, p. 72-76, 2005
  • Laser surface treatment of CNT cathodes for large diagonal FEDs, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IEEE, p. 246-247, 2004
  • Influence of gas atmosphere during laser surface treatment of CNT cathode, Rochanachirapar W,Murakami K,Yamasaki N,Abo S,Wakaya F,Takai M,Hosono A,Okuda S, Technical Digest of the 17th International Vacuum Nanoelectronics Conference, p. 144-145, 2004
  • Fabrication of a carbon nanotube device using a patterned electrode and a local electric field, F Wakaya,J Takaoka,K Fukuzumi,M Takai,Y Akasaka,K Gamo, SUPERLATTICES AND MICROSTRUCTURES, ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD, Vol. 34, No. 3-6, p. 401-405, 2003/09
  • In situ Si doping in GaAs using low-energy focused Si ion beam/molecular beam epitaxy combined system, K Kubo,J Yanagisawa,F Wakaya,Y Yuba,K Gamo, APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, AMER INST PHYSICS, Vol. 680, p. 662-665, 2003
  • Fabrication of spin-current-induced domain-wall-nucleation device in planar configuration, T Kimura,F Wakaya,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 20, No. 6, p. 2814-2818, 2002/11
  • Carrier activation in in situ Si-doped GaAs layers fabricated by a focused Si ion beam and molecular beam epitaxy combined system, T Hada,H Miyamoto,J Yanagisawa,F Wakaya,Y Yuba,K Gamo, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 175, p. 751-755, 2001/04
  • Carrier distribution profiles in Si-doped layers in GaAs formed by focused ion beam implantation and successive overlayer growth, T Hada,T Goto,J Yanagisawa,F Wakaya,Y Yuba,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 18, No. 6, p. 3158-3161, 2000/11
  • Transport of coupled double quantum dots in series, N Fujita,F Wakaya,Y Yuba,K Gamo, PHYSICA E, ELSEVIER SCIENCE BV, Vol. 7, No. 3-4, p. 420-424, 2000/05
  • Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system, J Yanagisawa,T Goto,T Hada,M Nakai,F Wakaya,Y Yuba,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 17, No. 6, p. 3072-3074, 1999/11
  • Focused ion beam etching of resist Ni multilayer films and applications to metal island structure formation, M Nakayama,F Wakaya,J Yanagisawa,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 16, No. 4, p. 2511-2514, 1998/07
  • Interface states induced in GaAs by growth interruption during an in situ process, F Wakaya,T Matsubara,M Nakayama,J Yanagisawa,Y Yuba,S Takaoka,K Murase,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 16, No. 4, p. 2313-2316, 1998/07
  • Effects of growth interruption in in situ process for buried quantum structures, F Wakaya,T Matsubara,M Nakayama,J Yanagisawa,Y Yuba,S Takaoka,K Murase,K Gamo, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 42, p. 591-594, 1998/03
  • Electron-beam-induced oxidation for single-electron devices, M Matsutani,F Wakaya,S Takaoka,K Murase,K Gamo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, JAPAN J APPLIED PHYSICS, Vol. 36, No. 12B, p. 7782-7785, 1997/12
  • Characterization of Si-doped layer in GaAs fabricated by a focused ion beam molecular beam epitaxy combined system, J Yanagisawa,H Nakayama,K Oka,M Nakai,F Wakaya,Y Yuba,S Takaoka,K Murase,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 15, No. 6, p. 2930-2933, 1997/11
  • Characterization of laterally selected Si doped layer formed in GaAs using a low-energy FIB-MBE combined system, H Nakayama,J Yanagisawa,F Wakaya,Y Yuba,S Takaoka,K Murase,K Gamo, MATERIALS MODIFICATION AND SYNTHESIS BY ION BEAM PROCESSING, MATERIALS RESEARCH SOCIETY, Vol. 438, p. 187-192, 1997
  • Fabrication of laterally selected Si doped layer in GaAs using a low-energy focused ion beam molecular beam epitaxy combined system, J Yanagisawa,H Nakayama,F Wakaya,Y Yuba,K Gamo, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 14, No. 6, p. 3938-3941, 1996/11
  • Novel class of low molecular-weight organic resists for nanometer lithography, M Yoshiwa,H Kageyama,Y Shirota,F Wakaya,K Gamo,M Takai, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 69, No. 17, p. 2605-2607, 1996/10
  • Effects of growth interruption and FIB implantation in the UHV total vacuum process for the buried mesoscopic structures, F Wakaya,T Matsubara,H Nakayama,J Yanagisawa,Y Yuba,S Takaoka,K Murase,K Gamo, PHYSICA B, ELSEVIER SCIENCE BV, Vol. 227, No. 1-4, p. 268-270, 1996/09
  • Confinement potential in an asymmetrically biased quantum point contact, F Wakaya,J Takahara,S Takaoka,K Murase,K Gamo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, JAPAN J APPLIED PHYSICS, Vol. 35, No. 2B, p. 1329-1332, 1996/02
  • Formation of buried two-dimensional electron gas in GaAs by Si ion doping using MBE-FIB combined system, J Yanagisawa,H Nakayama,F Wakaya,Y Yuba,K Gamo, ION-SOLID INTERACTIONS FOR MATERIALS MODIFICATION AND PROCESSING, MATERIALS RESEARCH SOC, Vol. 396, p. 701-705, 1996
  • LOW-ENERGY FOCUSED ION-BEAM AND BURIED ELECTRON WAVE-GUIDES FABRICATION, F WAKAYA,A NOZAWA,J YANAGISAWA,Y YUBA,S TAKAOKA,K MURASE,K GAMO, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 23, No. 1-4, p. 123-126, 1994/01
  • TRANSPORT-PROPERTIES OF COUPLED ELECTRON WAVE-GUIDES BURIED IN HETEROSTRUCTURE, F WAKAYA,Y YUBA,S TAKAOKA,K MURASE,K GAMO, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, JAPAN J APPLIED PHYSICS, Vol. 32, No. 12B, p. 6242-6245, 1993/12
  • ELECTRON FOCUSING EFFECTS IN THE INPLANE GATED STRUCTURES, F WAKAYA,Y TAKAGAKI,S TAKAOKA,K MURASE,Y YUBA,K GAMO,S NAMBA, SUPERLATTICES AND MICROSTRUCTURES, ACADEMIC PRESS LTD, Vol. 11, No. 3, p. 273-275, 1992
  • FABRICATION OF GAAS/GAALAS QUANTUM WIRES WITH SIDE GATES, F WAKAYA,T KAKUTA,Y TAKAGAKI,Y YUBA,S TAKAOKA,K MURASE,T SHIOKAWA,K GAMO,S NAMBA, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 8, No. 6, p. 1794-1797, 1990/11

Misc.

  • 還元した単層酸化グラフェンエッジからの電界電子放出, 山口尚登,村上勝久,江田剛輝,藤田武志,GUAN P,WANG W,GONG C,BOISSE J,MILLER S,ACIK M,CHO K,CHABAL Y. J,CHEN M,若家冨士男,高井幹夫,CHHOWALLA M, 応用物理学会学術講演会講演予稿集(CD-ROM), Vol. 72nd, 2011/08/16
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2074-2077, 2010/06
  • Study on time resolution of single event TOF-RBS measurement, Satoshi Abo,Shunya Kumano,Katsuhisa Murakami,Fujio Wakaya,Tivadar Lohner,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2019-2022, 2010/06
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2074-2077, 2010/06
  • Study on time resolution of single event TOF-RBS measurement, Satoshi Abo,Shunya Kumano,Katsuhisa Murakami,Fujio Wakaya,Tivadar Lohner,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2019-2022, 2010/06
  • Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition, K. Murakami,T. Matsuo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2A9-C2A12, 2010/03
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, F. Wakaya,M. Miki,C. Fukuyama,K. Murakami,S. Abo,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2B24-C2B26, 2010/03
  • Evaluation of emission uniformity of nanocrystalline silicon planar cathodes, Hidetaka Shimawaki,Katsuhisa Murakami,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C52, 2010
  • Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition, Vol. B 28, pp.C2A9-C2A12, 2010
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, Vol. B 28, pp.C2B24-C2B26, 2010
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, Vol. B 28, pp.C2B27-C2B29, 2010
  • In situ transmission electron microscopy observation of electron-beam-deposited Pt field emitter during field emission and field evaporation, K. Murakami,N. Matsubara,S. Ichikawa,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C15, 2010
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C44, 2010
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, J. Vac. Sci. Technol., Vol. B 28, pp.C2B27-C2B29, 2010
  • In situ transmission electron microscopy observation of electron-beam-deposited Pt field emitter during field emission and field evaporation, J. Vac. Sci. Technol., Vol. B 28, pp.C2C13-C2C15, 2010
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C44, 2010
  • Evaluation of emission uniformity of nanocrystalline silicon planar cathodes, J. Vac. Sci. Technol., Vol. B 28, pp.C2C49-C2C52, 2010
  • Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition, Katsuhisa Murakami,Naoki Matsubara,Satoshi Ichikawa,Toshiya Kisa,Takahito Nakayama,Kunio Takamoto,Fujio Wakaya,Mikio Takai,Silke Petersen,Brigitte Amon,Heiner Ryssel, JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOCIETY APPLIED PHYSICS, Vol. 48, No. 6, 2009/06
  • Transmission-Electron-Microscopy Observation of Pt Pillar Fabricated by Electron-Beam-Induced Deposition, Katsuhisa Murakami,Naoki Matsubara,Satoshi Ichikawa,Toshiya Kisa,Takahito Nakayama,Kunio Takamoto,Fujio Wakaya,Mikio Takai,Silke Petersen,Brigitte Amon,Heiner Ryssel, JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOCIETY APPLIED PHYSICS, Vol. 48, No. 6, 2009/06
  • Superposition of fringelike-electron-emission pattern from radical-oxygen-gas exposed Pt field emitter fabricated by electron-beam-induced deposition, K. Murakami,S. Nishihara,N. Matsubara,S. Ichikawa,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 721-724, 2009/03
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission, C. Fukuyama,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Takimoto,Y. Kumashiro,Y. Takaoka, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 775-777, 2009/03
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission, C. Fukuyama,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Takimoto,Y. Kumashiro,Y. Takaoka, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 775-777, 2009/03
  • Superposition of fringelike-electron-emission pattern from radical-oxygen-gas exposed Pt field emitter fabricated by electron-beam-induced deposition, K. Murakami,S. Nishihara,N. Matsubara,S. Ichikawa,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 721-724, 2009/03
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser, Vol. pp.151-152, 2009
  • Electron-wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition, K. Murakami,T. Matsuo,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.9-10, p. 9-10, 2009
  • Fabrication and electron field emission properties of titanium-oxide nanowire, F. Wakaya,M. Mild,C. Fukuyama,K. Murakami,S. Abo,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.145-146, p. 145-146, 2009
  • Emission uniformity of nanocrystalline silicon based metal-oxide- semiconductor cathodes, Hidetaka Shimawaki,Katsuhisa Murakami,Yo Kida,Yoichiro Neo,Hidenori Mimura,Fujio Wakaya,Mikio Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.307-308, p. 307-308, 2009
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics, I. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.291-202, p. 291-292, 2009
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics, Vol. pp. ???, 2009
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties, Vol. pp. ???, 2009
  • Intensity Distribution of Electron Emission from nc-Si MOS Cathode, Vol. pp. ???, 2009
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, Vol. B 27, pp.761-765, 2009
  • Electron-wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition, K. Murakami,T. Matsuo,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.9-10, p. 9-10, 2009
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser, The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan, Vol. pp.151-152, 2009
  • Fabrication and electron field emission properties of titanium-oxide nanowire, F. Wakaya,M. Mild,C. Fukuyama,K. Murakami,S. Abo,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.145-146, p. 145-146, 2009
  • Emission uniformity of nanocrystalline silicon based metal-oxide-semiconductor cathodes, The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan, Vol. pp.307-308, 2009
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics, The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan, Vol. pp.291-202, 2009
  • Intensity Distribution of Electron Emission from nc-Si MOS Cathode, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, H. Oki,A. Kinoshita,T. Takikawa,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 27, No. 2, p. 761-765, 2009
  • Electron emission from nanocrystalline silicon based metal-oxide-semiconductor cathode arrays, H. Shimawaki,Y. Kida,Y. Neo,H. Mimura,K. Murakami,F. Wakaya,M. Takai, Tech. Digest of the 21st Int. Vacuum Microelectronics Conf., Wroclaw, Poland, 2008
  • Improvement of emission efficiency of nanocrystalline silicon planar cathodes, H. Shimawaki,Y. Neo,H. Mimura,K. Murakami,F. Wakaya,M. Takai, J. Vac. Sci. Technol. B, Vol. 26, No. 2, p. 864-867, 2008
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment, Vol. 2061-2063, 2008
  • Field Emission Lifetime after Aging of CNT Cathodes, Vol. 2037-2040, 2008
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2061-2063, 2008
  • Field Emission Lifetime after Aging of CNT Cathodes, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2037-2040, 2008
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures, M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 261, No. 1-2, p. 466-469, 2007/08
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures, M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 261, No. 1-2, p. 466-469, 2007/08
  • Development of time-of-flight RBS system using multi microchannel plates, N. V. Nguyen,S. Abo,T. Lohner,H. Sawaragi,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 260, No. 1, p. 105-108, 2007/07
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 566-569, 2007/03
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai,S. Nakata,A. Hosono,S. Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 557-560, 2007/03
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai,S. Nakata,A. Hosono,S. Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 557-560, 2007/03
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 566-569, 2007/03
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser, W. S. Kim,H. Oki,A. Kinoshita,K. Murakami,S. Abo,F. Wakaya,M. Takai, IDW '07: PROCEEDINGS OF THE 14TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 2173-2176, p. 2173-+, 2007
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser, International Display Workshop (IDW'07) (Sapporo, Japan, 5-7 December, 2007), Vol. 2173-2176, 2007
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis, H. Kitano,S. Abo,M. Mizutani,J. Tsuchimoto,T. Lohner,J. Gyulai,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 249, p. 246-249, 2006/08
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy, Hiroto Yamagiwa,Satoshi Abo,Fujio Wakaya,Mikio Takai,Tadao Sakamoto,Hidetada Tokioka,Naoki Nakagawa, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 89, No. 6, 2006/08
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis, H. Kitano,S. Abo,M. Mizutani,J. Tsuchimoto,T. Lohner,J. Gyulai,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 249, p. 246-249, 2006/08
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy, Hiroto Yamagiwa,Satoshi Abo,Fujio Wakaya,Mikio Takai,Tadao Sakamoto,Hidetada Tokioka,Naoki Nakagawa, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 89, No. 6, 2006/08
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays, T Honda,CB Oh,K Murakami,WS Kim,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 24, No. 2, p. 1013-1016, 2006/03
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays, T Honda,CB Oh,K Murakami,WS Kim,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 24, No. 2, p. 1013-1016, 2006/03
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing, Vol. 1, 2006
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy, S. Abo,H. Yamagiwa,K. Tanaka,F. Wakaya,T. Sakamoto,H. Tokioka,N. Nakagawa,M. Takai, ION IMPLANTATION TECHNOLOGY, AMER INST PHYSICS, Vol. 866, p. 542-+, 2006
  • Transport properties of beam-deposited Pt nanowires, F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai, SEVENTH INTERNATIONAL CONFERENCE ON NEW PHENOMENA IN MESOSCOPIC STRUCTURES AND FIFTH INTERNATIONAL CONFERENCE ON SURFACES AND INTERFACES OF MESOSCOPIC DEVICES, 2005, IOP PUBLISHING LTD, Vol. 38, p. 120-+, 2006
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy, S. Abo,H. Yamagiwa,K. Tanaka,F. Wakaya,T. Sakamoto,H. Tokioka,N. Nakagawa,M. Takai, ION IMPLANTATION TECHNOLOGY, AMER INST PHYSICS, Vol. 866, p. 542-+, 2006
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing, Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30 – February 1, 2006, Osaka University, Vol. 1, 2006
  • Transport properties of beam-deposited Pt nanowires, F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai, SEVENTH INTERNATIONAL CONFERENCE ON NEW PHENOMENA IN MESOSCOPIC STRUCTURES AND FIFTH INTERNATIONAL CONFERENCE ON SURFACES AND INTERFACES OF MESOSCOPIC DEVICES, 2005, IOP PUBLISHING LTD, Vol. 38, p. 120-+, 2006
  • Reliability study of bulk and SOISRAMs using high energy nuclear probes, S Abo,H Yamagiwa,T Iwamatsu,S Maegawa,Y Arita,T Ipposhi,A Kinomura,F Wakaya,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 231, p. 482-485, 2005/04
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy, H. Yamagiwa,S. Abo,F. Wakaya,T. Sakatnoto,H. Tokioka,N. Nakagawa,M. Takai, IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. pp. 973 -975, p. 973-975, 2005
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy, H. Yamagiwa,S. Abo,F. Wakaya,T. Sakatnoto,H. Tokioka,N. Nakagawa,M. Takai, IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. pp. 973 -975, p. 973-975, 2005
  • Fabrication of carbon nanotube devices by electroplating with in situ observation, F Wakaya,Y Ogi,M Yoshida,S Kimura,M Takai,Y Akasaka,K Gamo, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 73-4, p. 559-563, 2004/06
  • Laser irradiation to CNT cathodes for large diagonal FEDs, 2004
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices, 2004
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices, 2004
  • Laser irradiation to CNT cathodes for large diagonal FEDs, 2004
  • Maskless Mn implantation in GaAs using focused Mn ion beam, M Itou,M Kasai,T Kimura,J Yanagisawa,F Wakaya,Y Yuba,K Gamo, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 206, p. 1013-1017, 2003/05
  • Carrier profiles and electron traps at a growth - interrupted layer in GaAs fabricated by a focused ion beam and molecular beam epitaxy combined system(共著), Vol. 159/160, p. 277-281, 2000
  • Carrier profile of the Si-doped layer in GaAs fabricated by a low-energy focused ion beam/molecular beam epitaxy combined system(共著), Vol. 17, No. 6, p. 3072-3074, 1999
  • Focused ion beam process for formation of a metal/insulator/metal double tunnel junction(共著), Masayoshi Nakayama,Junichi Yanagisawa,Fujio Wakaya,Kenji Gamo, Japanese Journal of Applied Physics, Vol. 38, No. 12B, p. 7151-7154, 1999
  • Characterization of Si-doped layer in GaAs fabricated by a focused ion beam/molecular beam epitaxy combined system(共著), Vol. 15, No. 6, p. 2930-2933, 1997
  • 1,3,5-Tris[4-(tert-Butoxycarbonylmethoxy)phenyl]benzene as a Novel Electron-beam Positive Resist for Nanometer Lithography, MOTOKO YOSHIIWA,HIROSHI KAGEYAMA,FUJIO WAKAYA,MIKIO TAKAI,KENJI GAMO,YASUHIKO SHIROTA, Journal of Photopolymer Science and Technology, Vol. 9, No. 1, p. 57-58, 1996

Publications

  • 第8回真空ナノエレクトロニクスシンポジウム 予稿集 2011年3月1日~2日 京都リサーチパーク, 独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会, 2011
  • 第6回真空ナノエレクトロニクスシンポジウム 予稿集 2009年3月3日~4日 大阪大学中之島センター, 独立行政法人日本学術振興会 真空ナノエレクトロニクスシ第158委員会, 2009
  • 第5回真空ナノエレクトロニクスシンポジウム 予稿集 2008年3月3日~4日 筑波大学東京キャンパス大塚地区, 独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会, 2008
  • 第4回真空ナノエレクトロニクスシンポジウム 予稿集 2007年3月6日~7日 大阪大学中之島センター, 独立行政法人日本学術振興会 真空ナノエレクトロニクス第158委員会, 2007
  • カーボンナノチューブFEDプロジェクト公開シンポジウム・第3回真空ナノエレクトロニクスシンポジウム 予稿集 2006年3月6日~7日 東京 コクヨホール, 独立行政法人 日本学術振興会 真空ナノエレクトロニクス第158委員会, 2006

Works

  • 非破壊3次元TOF-RBS分析装置の開発, 2004 -