EN

基本情報

研究

社会活動

その他の活動

阿保 智

Abo Satoshi

基礎工学研究科 附属極限科学センター,助教

keyword イオン散乱計測,信頼性評価,固体イオン相互作用

学歴

  • 2001年04月 ~ 2004年03月,大阪大学,基礎工学研究科,物理系専攻 博士後期(博士)過程
  • 1999年04月 ~ 2001年03月,大阪大学,大学院基礎工学研究科,物理系専攻 博士前期(修士)過程
  • 1995年04月 ~ 1999年03月,大阪大学,基礎工学部,電気工学科

経歴

  • 2014年04月 ~ 継続中,大阪大学,大学院基礎工学研究科附属極限科学センター,助教
  • 2017年05月 ~ 2018年03月,量子科学技術研究開発機構,協力研究員
  • 2007年08月 ~ 2014年03月,大阪大学,極限量子科学研究センター,助教
  • 2007年04月 ~ 2007年07月,大阪大学,極限量子科学研究センター,特任助教(常勤)
  • 2006年04月 ~ 2007年03月,大阪大学,極限量子科学研究センター,特任助手(常勤)
  • 2005年04月 ~ 2006年03月,大阪大学,極限科学研究センター,特任助手(常勤)
  • 2004年04月 ~ 2005年03月,大阪大学,極限科学研究センター,特任助手

研究内容・専門分野

  • ナノテク・材料,薄膜、表面界面物性
  • ナノテク・材料,ナノ構造物理
  • エネルギー,量子ビーム科学

論文

  • Experimental verification of the origin of positive linear magnetoresistance in CoFe(V1-xMnx)Si Heusler alloys,Vol. 100,No. 19,2019年11月25日,研究論文(学術雑誌)
  • Great differences between low-temperature grown Co2FeSi and Co2MnSi films on single-crystalline oxides,Kohei Kudo,Yasunari Hamazaki,Shinya Yamada,Satoshi Abo,Yoshihiro Gohda,Kohei Hamaya,ACS Applied Electronic Materials,Vol. 1,p. 2371-2379,2019年11月
  • Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry,Satoshi Abo,Albert Seidl,Fujio Wakaya,Mikio Takai,Nuclear Instruments and Methods in Physics Research Section B,Vol. 456,p. 12-15,2019年10月
  • Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data,Albert Seidl,Satoshi Abo,Mikio Takai,Nuclear Instruments and Methods in Physics Research Section B,Vol. 450,p. 163-167,2019年07月
  • Surface structure switching between (1×1) and (1×2) of rutileTiO2(110) with scanning tunneling microscopy and low energy electron diffraction,Shoki Ojima,Daiki Katsube,Hayato Yamashita,Yuji Miyato,Satoshi Abo,Masayuki Abe,Japanese Journal of Applied Physics,Vol. 58,2019年06月
  • Significant reduction in the thermal conductivity of Si-substituted Fe2VAI epilayers,K. Kudo,S. Yamada,J. Chikada,Y. Shimanuki,T. Ishibe,S. Abo,H. Miyazaki,Y. Nishino,Y. Nakamura,K. Hamaya,Physical Review B,Vol. 99,2019年,研究論文(学術雑誌)
  • Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence,Satoshi Abo,Kenichi Tani,Fujio Wakaya,Shinobu Onoda,Yuji Miyato,Hayato Yamashita,Masayuki Abe,Proceedings of 22nd International Conference on Ion Implantation Technology (IIT2018), 16-21 September 2018, Wuerzburg, Germany,2019年,研究論文(国際会議プロシーディングス)
  • Magnetic and transport properties of equiatomic quaternary Heusler CoFeVSi epitaxial films,Vol. 2,No. 12,2018年12月27日,研究論文(学術雑誌)
  • Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films,Vol. 9,No. 1,p. 686-692,2018年,研究論文(学術雑誌)
  • Detection of nonmagnetic metal thin film using magnetic force microscopy,Fujio Wakaya,Kenta Oosawa,Masahiro Kajiwara,Satoshi Abo,Mikio Takai,Applied Physics Letters,Vol. 113,2018年,研究論文(学術雑誌)
  • Characterization of X-ray charge neutralizer using carbon-nanotube field emitter,Vol. 55,No. 6,2016年06月,研究論文(学術雑誌)
  • Characterization of X-ray charge neutralizer using carbon-nanotube field emitter,Vol. 55,No. 6,2016年06月,研究論文(学術雑誌)
  • X-ray source using carbon-nanotube field emitter with side-gate electrode,Vol. 54,No. 6,2015年06月,研究論文(学術雑誌)
  • Mask less laser processing of graphene,Vol. 141,p. 203-206,2015年06月,研究論文(学術雑誌)
  • Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry,Vol. 348,p. 29-33,2015年04月,研究論文(学術雑誌)
  • Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry,Vol. 348,p. 29-33,2015年04月,研究論文(学術雑誌)
  • Soft errors in silicon-on-insulator static random access memory induced by high-energy heavy-ion irradiation,Satoshi Abo,Masatoshi Hazama,Fujio Wakaya,Takahiro Makino,Shinobu Onoda,Takeshi Ohshima,Hidekazu Oda,Mikio Takai,Proceedings of the 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (11th-RASEDA), 11-13 November 2015, Gunma, Japan,p. 105-108,2015年,研究論文(国際会議プロシーディングス)
  • Analysis technique for ultra shallow junction using medium energy ion scattering time-of-flight elastic recoil detection analysis,Satoshi Abo,Ri Pei,Yao Xin Yuan,Fujio Wakaya,Mikio Takai,Surface and Interface Analysis,Vol. 46,p. 1192-1195,2015年,研究論文(学術雑誌)
  • A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy,Vol. 56,No. 8,p. 1310-1313,2015年,研究論文(学術雑誌)
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light,Vol. 32,No. 2,2014年03月,研究論文(学術雑誌)
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light,Vol. 32,No. 2,2014年,研究論文(学術雑誌)
  • Electron emission from pyroelectric crystal excited using high power infra-red laser light and its x-ray source application,2014年,研究論文(国際会議プロシーディングス)
  • Spreading Resistance Profiling of Ultra Shallow Junction Fabricated with Low Energy As Implantation and Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy,2014年,研究論文(国際会議プロシーディングス)
  • Development of planar x-ray source using gated carbon nanotube emitter,Vol. 31,No. 2,2013年03月,研究論文(学術雑誌)
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition,Vol. 31,No. 2,2013年03月,研究論文(学術雑誌)
  • CNT cold cathode with side-gate electrode for flat panel X-ray source,2013年,研究論文(国際会議プロシーディングス)
  • Fabrication of titanium oxide field emitter array on glass substrate,2013年,研究論文(国際会議プロシーディングス)
  • Development of planar x-ray source using gated carbon nanotube emitter,Vol. 31,No. 2,2013年,研究論文(学術雑誌)
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition,Vol. 31,No. 2,2013年,研究論文(学術雑誌)
  • Effect of electron focusing in X-ray source using LiTaO3 crystal excited by Nd:YLF laser light,2013年,研究論文(国際会議プロシーディングス)
  • 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用,阿保智,中浜弘介,高橋理明,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2013-60,p. 41-45,2013年,研究論文(研究会,シンポジウム資料等)
  • Influence of Generated Charge by High Energy Ion Irradiation on Soft Error Rate in SOI SRAM,M. Hazama,S. Abo,F. Wakaya,T. Makino,S. Onoda,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2013-059,2013年,研究論文(大学,研究機関等紀要)
  • Ultra-violet laser processing of graphene on SiO2/Si,Vol. 110,p. 358-360,2013年,研究論文(学術雑誌)
  • Effects of ultra-violet laser irradiation on graphene,Vol. 97,p. 144-146,2012年09月,研究論文(学術雑誌)
  • Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling,Vol. 44,No. 6,p. 732-735,2012年06月,研究論文(学術雑誌)
  • Difference of soft error rates in SOI SRAM induced by various high energy ion species,Vol. 273,p. 262-265,2012年02月,研究論文(学術雑誌)
  • Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe,Vol. 273,p. 266-269,2012年02月,研究論文(学術雑誌)
  • Patterning of Titanium-Oxide Nanostructures on Glass Substrate and Their Field Emission Properties,p. 248-249,2012年,研究論文(国際会議プロシーディングス)
  • Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application,p. 44-45,2012年,研究論文(国際会議プロシーディングス)
  • Development of a tiny X-ray source controlled by laser light for medical application,p. 68-+,2012年,研究論文(国際会議プロシーディングス)
  • Selective-Area Growth and Field Emission Properties of Titanium-Oxide Nanowires on Glass Substrate,Vol. 19,p. 1795-1798,2012年,研究論文(国際会議プロシーディングス)
  • Field Emission Property of Carbon Nanotube Electron Source Using Side-Gate Electrode,Vol. 19,p. 1765-1767,2012年,研究論文(国際会議プロシーディングス)
  • 電子ビーム誘起堆積三極構造Pt冷陰極からの縞状電子放出パターンの観測,北山智久,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2012-62,p. 41-44,2012年,研究論文(研究会,シンポジウム資料等)
  • Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes,Masatoshi Hazama,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai,Proceedings of the 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA), 10-12 December 2012, Ibaraki, Japan,p. 115-118,2012年,研究論文(国際会議プロシーディングス)
  • Active Dopant Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy,Vol. 1496,p. 164-166,2012年,研究論文(国際会議プロシーディングス)
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition,Vol. 31,p. 186-187,2012年,研究論文(国際会議プロシーディングス)
  • Development of planar X-ray source using gated CNT emitter,Vol. 31,p. 122-123,2012年,研究論文(国際会議プロシーディングス)
  • Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe,Vol. 269,No. 20,p. 2233-2236,2011年10月,研究論文(学術雑誌)
  • Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes,Vol. 269,No. 20,p. 2360-2363,2011年10月,研究論文(学術雑誌)
  • Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy,Vol. 88,No. 8,p. 2778-2780,2011年08月,研究論文(学術雑誌)
  • Electron Transport Properties of Pt Nanoarch Fabricated by Electron-Beam-Induced Deposition,Vol. 50,No. 6,p. 06GG14-1-06GG14-3,2011年06月,研究論文(学術雑誌)
  • Effect of ultraviolet light irradiation on electron field emission from titanium-oxide nanostructures,Vol. 29,No. 2,p. 02B110-1-02B110-4,2011年03月,研究論文(学術雑誌)
  • Effect of ultraviolet light irradiation on electron field emission from titanium-oxide nanostructures,Vol. 29,No. 2,2011年,研究論文(学術雑誌)
  • Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray source application,p. 109-+,2011年,研究論文(国際会議プロシーディングス)
  • レーザ誘起焦電結晶からの電子放出とX線源への応用,加賀英一,中浜弘介,木佐俊哉,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2011-70,p. 53-57,2011年,研究論文(研究会,シンポジウム資料等)
  • ゲート付電子源を用いたX線源の開発,真鍋知哉,新田翔吾,沖宏吏,阿保智,若家冨士男,高井幹夫,信学技報 IEICE Technical Report,Vol. 2011-71,p. 59-63,2011年,研究論文(研究会,シンポジウム資料等)
  • Field Emission Property of Titanium-Oxide Nanostructure Fabricated on Glass Substrate with Control of Density and Length,p. 1783-1786,2011年,研究論文(国際会議プロシーディングス)
  • Effect of Body-tie Structure Fabricated by Partial Trench Isolation for Suppression of Soft Errors in SOI SRAM Investigated by Helium and Oxygen Ion Probes,S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2011-043,2011年,研究論文(大学,研究機関等紀要)
  • 4.5: Low energy electron source panel with carbon nanotube,p. 28-29,2010年,研究論文(国際会議プロシーディングス)
  • Robust Carbon Nanotube Cathode with Various CNT Diameters and Post Treatments,Takai Mikio,Takikawa Tomoaki,Oki Hiroshi,Murakami Katsuhisa,Abo Satoshi,Wakaya Fujio,ITE/SID,Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3,p. 2025-2028,2010年
  • Enhancement of Electron Field Emission from Titanium-Oxide Nanostructure by Ultraviolet Light Irradiation,Wakaya Fujio,Tatsumi Tomohiko,Murakami Katsuhisa,Abo Satoshi,Takimoto Tadahiko,Takaoka Yoichi,Takai Mikio,ITE/SID,Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3,p. 2045-2048,2010年
  • Evaluation of Soft Errors using Nuclear Probes in SOI SRAM with Body-tie Structure Fabricated by Partial Trench Isolation,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai,Proceedings of the 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (9th-RASEDA), 27-29 October 2010, Gunma, Japan,p. 72-75,2010年,研究論文(国際会議プロシーディングス)
  • Evaluation of Soft Error Rates in SOI SRAM with a Technology Node of 90 nm Using Oxygen Ion Probe,S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai,JAEA Review,Vol. 2010-065,2010年,研究論文(大学,研究機関等紀要)
  • Local Resistance Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscope,Vol. 1321,p. 229-+,2010年,研究論文(国際会議プロシーディングス)
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrat,F. Wakaya,M. Miki,C. Fukuyama,K. Murakami,S. Abo,M. Takai,Journal of Vacuum Science and Technology B,Vol. 28,p. C2B24-C2B26,2010年,研究論文(学術雑誌)
  • Dependence on Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs,S. Abo,S. Onoda,T. Hirao,T. Ohshima,T. Iwamatsu,M. Takai,JAEA Review,Vol. 2009-041,2009年,研究論文(大学,研究機関等紀要)
  • Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser,Vol. 26,No. 2,p. 760-763,2008年03月,研究論文(学術雑誌)
  • Evaluation of single event upsets in integrated circuits using nuclear micro probe,M. Takai,S. Abo,Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA), 15-17 December 2008, Ibaraki, Japan,p. 53-56,2008年,研究論文(国際会議プロシーディングス)
  • Local Resistance Profiling of Ultra-Shallow Junction with Spike Lamp and Laser Annealing Using Scanning Spreading Resistance Microscopy,Vol. 1066,p. 83-+,2008年,研究論文(国際会議プロシーディングス)
  • Development of time-of-flight RBS system using multi microchannel plates,Vol. 260,No. 1,p. 105-108,2007年07月,研究論文(学術雑誌)
  • Detection of magnetic field for measuring current distribution in metal nanostructure,Vol. 84,No. 5-8,p. 1416-1418,2007年05月,研究論文(学術雑誌)
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching,Vol. 25,No. 2,p. 557-560,2007年03月,研究論文(学術雑誌)
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation,Vol. 25,No. 2,p. 566-569,2007年03月,研究論文(学術雑誌)
  • The relationship between field emission characteristics and defects measured by RAMAN scattering in carbon nanotube cathode treated by plasma and laser irradiation,Kim W. S,Kinishita A,Murakami K,Abo S,Wakaya F,Takai M,IEEE,2007 Ieee 20th International Vacuum Nanoelectronics Conference,p. 109-+,2007年
  • Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition,Murakami K,Abe S,Nishihara S,Abo S,Wakaya F,Takai M,IEEE,2007 Ieee 20th International Vacuum Nanoelectronics Conference,p. 25-+,2007年
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy,Vol. 89,No. 6,2006年08月,研究論文(学術雑誌)
  • Improved field emission characteristics of multi-walled carbon nanotube cathode by plasma treatment with a help of krypton fluoride laser irradiation,p. 313-314,2006年,研究論文(国際会議プロシーディングス)
  • KrF laser surface treatment of CNT cathodes with and without reactive ion etching,p. 73-74,2006年,研究論文(国際会議プロシーディングス)
  • Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes,Ohsumi K,Honda T,Kim W. S,Oh C. B,Murakami K,Abo S,Wakaya F,Takai M,Hosono A,Nakata S,Okuda S,ITE,Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3,p. 1837-+,2006年
  • Field emission characteristics of carbon nanotubes treated by plasma and laser,Kim W. S,Honda T,Oh C. B,Ohmmi K,Murakami K,Abo S,Wakaya F,Takai M,ITE,Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3,p. 1841-1844,2006年
  • Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering,Vol. 237,No. 1-2,p. 72-76,2005年08月,研究論文(学術雑誌)
  • Effect of thermal annealing on emission characteristics of nanoelectron source fabricated using beam-assisted process,Vol. 23,No. 2,p. 759-761,2005年03月,研究論文(学術雑誌)
  • Influence of gas atmosphere during laser surface treatment of CNT cathode,Vol. 23,No. 2,p. 762-764,2005年03月,研究論文(学術雑誌)
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size,Vol. 23,No. 2,p. 765-768,2005年03月,研究論文(学術雑誌)
  • KrF laser surface treatment of CNT cathodes,Vol. 2005,p. 300-301,2005年,研究論文(国際会議プロシーディングス)
  • Fabrication and characterization of Pt nanosplit emitter using electron beam induced deposition,Vol. 2005,p. 157-158,2005年,研究論文(国際会議プロシーディングス)
  • Influence of the Pt cathode resistance on the field emission properties of field emitters fabricated using beam induced deposition,Vol. 2005,p. 246-247,2005年,研究論文(国際会議プロシーディングス)
  • Ultra shallow As profiling before and after spike annealing using medium energy ion scattering,p. 49-50,2005年,研究論文(国際会議プロシーディングス)
  • Surface treatment of CNT cathodes using KrF excimer laser for field emission displays,Honda T,Oh C. B,Murakami K,Ohsumi K,Abo S,Wakaya F,Takai M,ITE,Idw/ad '05: Proceedings of the 12th International Display Workshops in Conjunction With Asia Display 2005, Vols 1 and 2,p. 1647-1650,2005年
  • Laser surface treatment of CNT cathodes for large diagonal FEDs,p. 246-247,2004年,研究論文(国際会議プロシーディングス)
  • Observation of electron emission pattern from nano-split emitter fabricated using beam assisted process,Vol. 23,p. 240-241,2004年,研究論文(国際会議プロシーディングス)
  • Effect of thermal annealing on emission characteristics of nano electron source fabricated using beam assisted process,Vol. 23,p. 256-257,2004年,研究論文(国際会議プロシーディングス)
  • Inspection for critical issue of floating body effects in SOI-MOSFET using nuclear particles,p. 70-71,2001年,研究論文(国際会議プロシーディングス)
  • Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source,p. 17-24,2001年,研究論文(国際会議プロシーディングス)
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes,p. 285-288,2000年,研究論文(国際会議プロシーディングス)

MISC

  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm,Vol. 268,No. 11-12,p. 2074-2077,2010年06月
  • Study on time resolution of single event TOF-RBS measurement,Vol. 268,No. 11-12,p. 2019-2022,2010年06月
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm,Vol. 268,No. 11-12,p. 2074-2077,2010年06月
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2C41-C2C44,2010年03月
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,Vol. 28,No. 2,p. C2B27-C2B29,2010年03月
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,Vol. 28,No. 2,p. C2B24-C2B26,2010年03月
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2C41-C2C44,2010年03月
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,Vol. 28,No. 2,p. C2B24-C2B26,2010年03月
  • Study on time resolution of single event TOF-RBS measurement,Nuclear Instruments and Methods in Physics Research B,Vol. 268, 2019-2022,2010年
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,J. Vac. Sci. Technol.,Vol. B 28, pp.C2B27-C2B29,2010年
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,J. Vac. Sci. Technol.,Vol. B 28, pp.C2B24-C2B26,2010年
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate,J. Vac. Sci. Technol.,Vol. B 28, pp.C2B24-C2B26,2010年
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,Vol. 28,No. 2,p. C2-B29,2010年
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2-C44,2010年
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics,Vol. 28,No. 2,p. C2-C44,2010年
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser,Vol. 28,No. 2,p. C2-B29,2010年
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,Vol. 27,No. 2,p. 761-765,2009年03月
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,Vol. 27,No. 2,p. 761-765,2009年03月
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission,Vol. 27,No. 2,p. 775-777,2009年03月
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,Vol. 27,No. 2,p. 761-765,2009年03月
  • Effect of aging on field emission lifetime for carbon nanotube cathodes,Vol. 27,No. 2,p. 761-765,2009年03月
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission,Vol. 27,No. 2,p. 775-777,2009年03月
  • Fabrication and electron field emission properties of titanium-oxide nanowire,The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan,Vol. pp.145-146,2009年
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser,The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan,Vol. pp.151-152,2009年
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics,The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan,Vol. pp.291-202,2009年
  • Dependence o Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs,JAEA Review, JAEA Takasaki Annual Report 2008,Vol. 2009-041, 7,2009年
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties,International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009),Vol. pp. ???,2009年
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics,International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009),Vol. pp. ???,2009年
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics,Vol. pp.291-202,2009年
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser,Vol. pp.151-152,2009年
  • Fabrication and electron field emission properties of titanium-oxide nanowire,Vol. pp.145-146,2009年
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties,Vol. pp. ???,2009年
  • Dependence o Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs,Vol. 2009-041, 7,2009年
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics,Vol. pp. ???,2009年
  • Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM,Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications,Vol. 183,2008年
  • Evaluation of Single Event Upsets in Integrated Circuits Using Nuclear Probe,Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications,Vol. 53,2008年
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment,International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008),Vol. 2061-2063,2008年
  • Field Emission Lifetime after Aging of CNT Cathodes,International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008),Vol. 2037-2040,2008年
  • Evaluation of Single Event Upsets in Integrated Circuits Using Nuclear Probe,Vol. 53,2008年
  • Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM,Vol. 183,2008年
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment,Vol. 2061-2063,2008年
  • Field Emission Lifetime after Aging of CNT Cathodes,Vol. 2037-2040,2008年
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures,Vol. 261,No. 1-2,p. 466-469,2007年08月
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures,Vol. 261,No. 1-2,p. 466-469,2007年08月
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation,Vol. 25,No. 2,p. 566-569,2007年03月
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching,Vol. 25,No. 2,p. 557-560,2007年03月
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation,Vol. 25,No. 2,p. 566-569,2007年03月
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching,Vol. 25,No. 2,p. 557-560,2007年03月
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser,Vol. 2173-2176,p. 2173-+,2007年
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer laser,Vol. 2177-2180,p. 2177-+,2007年
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser,Vol. 2173-2176,2007年
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer Laser,Vol. 2177-2180,2007年
  • Compositional analysis of HfxSiyO1-x-y thin films by medium energy ion scattering (MEIS) analysis,Nucl. Instr. and Meth.,Vol. 249,p. 246-249,2006年08月
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy,Vol. 89,No. 6,2006年08月
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis,Vol. 249,p. 246-249,2006年08月
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy,Vol. 89,No. 6,2006年08月
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays,Vol. 24,No. 2,p. 1013-1016,2006年03月
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays,Vol. 24,No. 2,p. 1013-1016,2006年03月
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy,Vol. 866,p. 542-+,2006年
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing,Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30 – February 1, 2006, Osaka University,Vol. 1,2006年
  • Evaluation of Soft Errors in SOI-SRAM Using Nuclear Probe,Proceedings of The 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application,Vol. pp.79-84,2006年
  • Transport properties of beam-deposited Pt nanowires,Vol. 38,p. 120-+,2006年
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy,Vol. 866,p. 542-+,2006年
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing,Vol. 1,2006年
  • Transport properties of beam-deposited Pt nanowires,Vol. 38,p. 120-+,2006年
  • Reliability study of bulk and SOISRAMs using high energy nuclear probes,Vol. 231,p. 482-485,2005年04月
  • Observation of electron emission pattern from nanosplit emitter fabricated using beam assisted process,Vol. 23,No. 2,p. 735-740,2005年03月
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size,Vol. 23,No. 2,p. 765-768,2005年03月
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy,Vol. pp. 973 -975,p. 973-975,2005年
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy,Vol. pp. 973 -975,p. 973-975,2005年
  • TOF-RBS with medium energy heavy ion probe for semiconductor process analysis,Vol. 219,p. 589-592,2004年06月
  • Characterization of dopant profiles produced by ultra-shallow As implantation and spike annealing using medium energy ion scattering,Vol. 219,p. 584-588,2004年06月
  • Influence of gas atmosphere during laser surface treatment of CNT cathode,Vol. 23, 762/,,p. 144-145,2004年
  • Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe,Vol. 210,p. 216-220,2003年09月
  • Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe,Vol. 210,p. 216-220,2003年09月
  • Shallow arsenic profiling using medium energy ion scattering (MEIS),Vol. 264 - 267,p. 264-267,2003年
  • Development of enhanced depth-resolution technique for shallow dopant profiles,Vol. 190,p. 26-33,2002年05月
  • Suppression of floating body effects in SOI–MOSFET studied using nuclear microprobes,Nucl. Instr. and Methods B,Vol. 181,p. 320-323,2001年07月
  • Suppression of floating body effects in SOI-MOSFET studied using nuclear microprobes,Vol. 181,p. 320-323,2001年07月
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes,p. 285-288,2000年
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes,Vol. in press,p. 285-288,2000年
  • Inspection of floating body effects in SOI devices using high energy nuclear microprobes,Vol. 査読中

受賞

  • 大阪大学総長による表彰,阿保 智,大阪大学総長,2012年01月
  • Best poster Award,阿保 智,IIT2000 Committee,2000年09月

講演・口頭発表等

  • Nondestructive analysis technique by ion scattering spectroscopy using 150 kV FIB,阿保 智,1. 29th Annual Meeting of MRS-J,2019年11月28日
  • シングルイベント飛行時間型ラザフォード後方散乱法を用いた非破壊三次元元素分析技術の開発,阿保 智,日本学術振興会 第132委員会 第233回研究会,2018年12月07日
  • X-ray charge neutralizer using carbon-nanotube field emitter,S. Okawaki,S. Abo,F. Wakaya,H. Yamashita,M. Abe,M. Takai,7th Japan-Korea Vacuum Nanoelectronics Symposium (7th-KJVNS),2015年10月
  • Development of miniature x-ray source using pyroelectric crystal excited by laser light,Satoshi Abo,Takahiro Uezato,Fujio Wakaya,Masayuki Abe,Mikio Takai,The 6th IEEE International Nanoelectronics Conference 2014 (INEC2014),2014年07月
  • LiNbO3/LiTaO3の焦電効果を使ったX線発生,阿保智,中浜弘介,加賀英一,木佐俊哉,高橋理明,若家冨士男,高井幹夫,2013年度 第3回光材料応用技術研究会,2013年11月15日
  • Electron emission from pyroelectric crystals excited using laser light and its X-ray source application,Satoshi Abo,Kosuke Nakahama,Michiaki Takahashi,Fujio Wakaya,Mikio Takai,5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS),2013年10月
  • Fabrication of field emitter cathodes with nano materials and their characterization for vacuum nanoelectronics application,Mikio Takai,Satoshi Abo,Fujio Wakaya,5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS),2013年10月
  • Development of a tiny X-ray source controlled by laser light for medical application,Mikio Takai,Kosuke, Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya,25th International Vacuum Nanoelectronics Conference (IVNC2012),2012年07月
  • Long-life carbon nanotube cathode with various surface treatment for backlight unit and lighting,M. Takai,T. Takikawa,H. Oki,K. Murakami,S. Abo,F. Wakaya,The 10th International Meeting on Information Display / International Display Manufacturing Conference and Asia Display 2010 (iMiD/IDMC/ASIA DISPLAY 2010),2010年10月
  • Evaluation of single event upsets in integrated circuits using nuclear probe,M. Takai,S. Abo,T. Iwamatsu,The 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA),2008年12月
  • Visualization of three dimensional nanostructures by time-of-flight RBS using nuclear nanoprobes,M. Takai,S. Abo,K. Koresawa,K. Murakami,F. Wakaya,T. Kikuchi,H. Sawaragi,11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2008),2008年07月
  • イオンナノプローブによる3次元非破壊分析技術の開発,阿保智,高井幹夫,日本顕微鏡学会, 第63回学術講演会,2007年05月
  • Evaluation of soft errors in SOI-SRAM using nuclear probe,M. Takai,S. Abo,T. Iwamatsu,S. Maegawa,Y. Arita,M. Inuishi,T. Ipposhi,A. Kinomura,Y. Horino,7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (7th-RASEDA),2006年10月
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures,M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi,The 19th International Conference on the Application of Accelerators in Research and Industry (CAARI2006),2006年08月
  • Ultra shallow arsenic profiling in Si using highly sensitive time-of-flight RBS with nuclear nanoprobe,S. Abo,N. V. Nguyen,T. Lohner,F. Wakaya,M. Takai,10th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2006),2006年07月
  • Electron Transport in Pt Nanowires fabricated by beam induced process,F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai,Hungarian Nanotechnology Symposium 2005,2005年03月
  • Laser Irradiation to CNT Cathode for Large Diagonal FEDs,K. Murakami,W. Rochanachirapar,S. Abo,F. Wakaya,M. Takai,The 11th International Display Workshop (IDW ‘04),2004年12月
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices,M. Takai,K. Murakami,W. Rochanachirapar,N. Yamasaki,T. Tsukatani,S. Abo,F. Wakaya,The International Workshop on Materials Science and Nano-Engineering,2004年12月
  • Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source,M. Takai,Y. Arita,S. Abo,T. Iwamatsu,S. Maegawa,H. Sayama,Y. Yamaguchi,M. Inuishi,T. Nishimura,The 31st European Solid-State Device Research Conference (ESSDERC 2001),2001年09月
  • Development of enhanced depth-resolution technique for shallow dopant profiling,M. Fujita,J. Tajima,T. Nakagawa,S. Abo,A. Kinomura,F. Paszti,M. Takai,R. Schork,L, Frey,H. Ryssel,The 15th International Conference on Ion Beam Analysis (IBA2001),2001年07月

委員歴

  • 学協会,日本MRS,第30回日本MRS年次大会シンポジウムオーガナイザー,2020年 ~
  • 第11回 宇宙用半導体素子の照射効果に関する国際講演会,実行委員,2015年 ~
  • 第10回 宇宙用半導体素子の照射効果に関する国際講演会,実行委員,2012年 ~
  • 第9回 宇宙用半導体素子の照射効果に関する国際講演会,実行委員,2010年 ~