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Abo Satoshi

阿保　智

Graduate School of Engineering Science　Center for Science and Technology under Extreme Conditions, Assistant Professor

keyword quantum beam，Rutherford Backscattering，Reliability，Silicon-on-Insulator

Education

  • 2001/04 - 2004/03, Osaka University
  • 1999/04 - 2001/03, Osaka University, Graduate School of Engineering Science
  • 1995/04 - 1999/03, Osaka University, School of Engineering Science Direct Affiliates

Research History

  • 2014/04 - Present, Osaka University, Graduate School of Engineering Science, Center for Science and Technology under Extreme Conditions
  • 2017/05 - 2018/03, 量子科学技術研究開発機構, 協力研究員
  • 2007/08 - 2014/03, Osaka University, Research Center for Quantum Science and Technology Under Extreme Conditions
  • 2007/04 - 2007/07, Osaka University, Research Center for Quantum Science and Technology Under Extreme Conditions
  • 2006/04 - 2007/03, Osaka University, Research Center for Quantum Science and Technology Under Extreme Conditions
  • 2005/04 - 2006/03, Osaka University
  • 2004/04 - 2005/03, Osaka University

Research Areas

  • Nanotechnology/Materials, Thin-film surfaces and interfaces
  • Nanotechnology/Materials, Nanostructure physics
  • Energy, Quantum beam science

Professional Memberships

  • MRS-J
  • 応用物理学会

Papers

  • Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry, Satoshi Abo,Albert Seidl,Fujio Wakaya,Mikio Takai, Nuclear Instruments and Methods in Physics Research Section B, Vol. 456, p. 12-15, 2019/10
  • Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data, Albert Seidl,Satoshi Abo,Mikio Takai, Nuclear Instruments and Methods in Physics Research Section B, Vol. 450, p. 163-167, 2019/07
  • Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence, Satoshi Abo,Kenichi Tani,Fujio Wakaya,Shinobu Onoda,Yuji Miyato,Hayato Yamashita,Masayuki Abe, Proceedings of 22nd International Conference on Ion Implantation Technology (IIT2018), 16-21 September 2018, Wuerzburg, Germany, The Japan Society of Applied Physics, Vol. 2019.1, p. 1570-1570, 2019
  • Characterization of X-ray charge neutralizer using carbon-nanotube field emitter, Shuhei Okawaki,Satoshi Abo,Fujio Wakaya,Hayato Yamashita,Masayuki Abe,Mikio Takai, JAPANESE JOURNAL OF APPLIED PHYSICS, IOP PUBLISHING LTD, Vol. 55, No. 6, 2016/06
  • X-ray source using carbon-nanotube field emitter with side-gate electrode, Shuhei Okawaki,Satoshi Abo,Fujio Wakaya,Masayuki Abe,Mikio Takai, JAPANESE JOURNAL OF APPLIED PHYSICS, IOP PUBLISHING LTD, Vol. 54, No. 6, 2015/06
  • Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry, Satoshi Abo,Yasuhisa Hamada,Albert Seidl,Fujio Wakaya,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 348, p. 29-33, 2015/04
  • Analysis technique for ultra shallow junction using medium energy ion scattering time-of-flight elastic recoil detection analysis, Satoshi Abo,Ri Pei,Yao Xin Yuan,Fujio Wakaya,Mikio Takai, Surface and Interface Analysis, Vol. 46, p. 1192-1195, 2015
  • Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light, Kosuke Nakahama,Michiaki Takahashi,Satoshi Abo,Fujio Wakaya,Mikio Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 32, No. 2, 2014/03
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition, Tomohisa Kitayama,Satoshi Abo,Fujio Wakaya,Mikio Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 31, No. 2, 2013/03
  • Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling, Satoshi Abo,Hidemasa Horiuchi,Fujio Wakaya,Gabor Battistig,Tivadar Lohner,Mikio Takai, SURFACE AND INTERFACE ANALYSIS, WILEY-BLACKWELL, Vol. 44, No. 6, p. 732-735, 2012/06
  • Difference of soft error rates in SOI SRAM induced by various high energy ion species, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Tivadar Lohner,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 273, p. 262-265, 2012/02
  • Dependence of graphene strain sensitivity on thickness and crystallinity, Takeuchi Yuto,Wakaya Fujio,Abo Satoshi,Nagao Masayoshi,Murakami Katsuhisa, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2021.1, p. 2827-2827, 2021/02/26
  • Development of neutron source using IR heated pyroelectric crystal, Abo Satoshi,Nomiyama Daichi,Wakaya Fujio, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2020.2, p. 338-338, 2020/08/26
  • Detection of nonmagnetic metal buried in insulator using magnetic force microscopy, Wakaya Fujio,Oosawa Kenta,Sakamoto Mizuki,Abo Satoshi,Murakami Katsuhisa,Nagao Masayoshi, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2020.2, p. 1055-1055, 2020/08/26
  • Visualization of three-dimensional structure buried in insulator using magnetic force microscope, Osawa Kenta,Wakaya Fujio,Abo Satoshi,Murakami Katsuhisa,Nagao Masayoshi, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2020.1, p. 1493-1493, 2020/02/28
  • Experimental verification of the origin of positive linear magnetoresistance in CoFe(V1-xMnx)Si Heusler alloys, S. Yamada,S. Kobayashi,A. Masago,L. S.R. Kumara,H. Tajiri,T. Fukushima,S. Abo,Y. Sakuraba,K. Hono,T. Oguchi,K. Hamaya, Physical Review B, Vol. 100, No. 19, 2019/11/25
  • Great differences between low-temperature grown Co2FeSi and Co2MnSi films on single-crystalline oxides, Kohei Kudo,Yasunari Hamazaki,Shinya Yamada,Satoshi Abo,Yoshihiro Gohda,Kohei Hamaya, ACS Applied Electronic Materials, Vol. 1, p. 2371-2379, 2019/11
  • Development of ToF-RBS and -ERDA simultaneous measurements with FIB, Abo Satoshi,Fujimoto Takuya,Wakaya Fujio, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2019.2, p. 1774-1774, 2019/09/04
  • Self-sensing cantilever using graphene strain sensor, Takeuchi Yuto,Wakaya Fujio,Abo Satoshi,Murakami Katsuhisa,Nagao Masayoshi, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2019.2, p. 3851-3851, 2019/09/04
  • Surface structure switching between (1×1) and (1×2) of rutileTiO2(110) with scanning tunneling microscopy and low energy electron diffraction, Shoki Ojima,Daiki Katsube,Hayato Yamashita,Yuji Miyato,Satoshi Abo,Masayuki Abe, Japanese Journal of Applied Physics, Vol. 58, No. SI, 2019/06
  • Significant reduction in the thermal conductivity of Si-substituted Fe2VAI epilayers, K. Kudo,S. Yamada,J. Chikada,Y. Shimanuki,T. Ishibe,S. Abo,H. Miyazaki,Y. Nishino,Y. Nakamura,K. Hamaya, Physical Review B, Vol. 99, 2019
  • Magnetic and transport properties of equiatomic quaternary Heusler CoFeVSi epitaxial films, S. Yamada,S. Kobayashi,F. Kuroda,K. Kudo,S. Abo,T. Fukushima,T. Oguchi,K. Hamaya, Physical Review Materials, Vol. 2, No. 12, 2018/12/27
  • Simulation for Electron Emission from Laser-Irradiated Pyroelectric Crystal, Komatsu Tenta,Wakaya Fujio,Abo Satoshi,Takai Mikio,Masuzawa Tomoaki,Mimura Hidenori, JSAP Annual Meetings Extended Abstracts, The Japan Society of Applied Physics, Vol. 2018.1, p. 1756-1756, 2018/03/05
  • Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films, Daiki Katsube,Hayato Yamashita,Satoshi Abo,Masayuki Abe, Beilstein Journal of Nanotechnology, Beilstein-Institut Zur Forderung der Chemischen Wissenschaften, Vol. 9, No. 1, p. 686-692, 2018
  • Detection of nonmagnetic metal thin film using magnetic force microscopy, Fujio Wakaya,Kenta Oosawa,Masahiro Kajiwara,Satoshi Abo,Mikio Takai, Applied Physics Letters, Vol. 113, 2018
  • Mask less laser processing of graphene, Fujio Wakaya,Tadashi Kurihara,Nariaki Yurugi,Satoshi Abo,Masayuki Abe,Mikio Takai, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 141, p. 203-206, 2015/06
  • Soft errors in silicon-on-insulator static random access memory induced by high-energy heavy-ion irradiation, Satoshi Abo,Masatoshi Hazama,Fujio Wakaya,Takahiro Makino,Shinobu Onoda,Takeshi Ohshima,Hidekazu Oda,Mikio Takai, Proceedings of the 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (11th-RASEDA), 11-13 November 2015, Gunma, Japan, p. 105-108, 2015
  • A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy, Daiki Katsube,Yutaro Takase,Hayato Yamashita,Satoshi Abo,Fujio Wakaya,Masayuki Abe, MATERIALS TRANSACTIONS, JAPAN INST METALS, Vol. 56, No. 8, p. 1310-1313, 2015
  • Electron emission from pyroelectric crystal excited using high power infra-red laser light and its x-ray source application, Satoshi Abo,Takahiro Uezato,Fujio Wakaya,Mikio Takai, 2014 27TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE, 2014
  • Spreading Resistance Profiling of Ultra Shallow Junction Fabricated with Low Energy As Implantation and Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy, Satoshi Abo,Hidenori Osae,Fujio Wakaya,Mikio Takai,Hidekazu Oda, 2014 20TH INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY (IIT 2014), IEEE, 2014
  • Development of planar x-ray source using gated carbon nanotube emitter, Tomoya Manabe,Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 31, No. 2, 2013/03
  • CNT cold cathode with side-gate electrode for flat panel X-ray source, Shogo Nitta,Shuhei Okawaki,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26th International Vacuum Nanoelectronics Conference, IVNC 2013, 2013
  • Fabrication of titanium oxide field emitter array on glass substrate, Takuo Nakatani,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26th International Vacuum Nanoelectronics Conference, IVNC 2013, 2013
  • Development of planar x-ray source using gated carbon nanotube emitter, Tomoya Manabe,Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 31, No. 2, 2013
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition, Tomohisa Kitayama,Satoshi Abo,Fujio Wakaya,Mikio Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 31, No. 2, 2013
  • Effect of electron focusing in X-ray source using LiTaO3 crystal excited by Nd:YLF laser light, Kosuke Nakahama,Michiaki Takahashi,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2013 26TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, 2013
  • 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用, 阿保智,中浜弘介,高橋理明,若家冨士男,高井幹夫, 信学技報 IEICE Technical Report, Vol. 2013-60, p. 41-45, 2013
  • Influence of Generated Charge by High Energy Ion Irradiation on Soft Error Rate in SOI SRAM, M. Hazama,S. Abo,F. Wakaya,T. Makino,S. Onoda,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2013-059, 2013
  • Ultra-violet laser processing of graphene on SiO2/Si, Fujio Wakaya,Tadashi Kurihara,Satoshi Abo,Mikio Takai, Microelectronic Engineering, Elsevier B.V., Vol. 110, p. 358-360, 2013
  • Effects of ultra-violet laser irradiation on graphene, Fujio Wakaya,Tsuyoshi Teraoka,Toshiya Kisa,Tomoya Manabe,Satoshi Abo,Mikio Takai, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 97, p. 144-146, 2012/09
  • Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe, Satoshi Abo,Takayuki Azuma,Tivadar Lohner,Fujio Wakaya,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 273, p. 266-269, 2012/02
  • Patterning of Titanium-Oxide Nanostructures on Glass Substrate and Their Field Emission Properties, Takuo Nakatani,Fujio Wakaya,Satoshi Abo,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 248-249, 2012
  • Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application, Kosuke Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 44-45, 2012
  • Development of a tiny X-ray source controlled by laser light for medical application, Mikio Takai,Kosuke Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, p. 68-+, 2012
  • Selective-Area Growth and Field Emission Properties of Titanium-Oxide Nanowires on Glass Substrate, Takuo Nakatani,Fujio Wakaya,Satoshi Abo,Mikio Takai, IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 19, p. 1795-1798, 2012
  • Field Emission Property of Carbon Nanotube Electron Source Using Side-Gate Electrode, Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, IDW/AD '12: PROCEEDINGS OF THE INTERNATIONAL DISPLAY WORKSHOPS, PT 3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 19, p. 1765-1767, 2012
  • 電子ビーム誘起堆積三極構造Pt冷陰極からの縞状電子放出パターンの観測, 北山智久,阿保智,若家冨士男,高井幹夫, 信学技報 IEICE Technical Report, 一般社団法人電子情報通信学会, Vol. 2012-62, No. 303, p. 41-44, 2012
  • Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes, Masatoshi Hazama,Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Proceedings of the 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA), 10-12 December 2012, Ibaraki, Japan, p. 115-118, 2012
  • Active Dopant Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy, Satoshi Abo,Naoya Ushigome,Hidenori Osae,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, ION IMPLANTATION TECHNOLOGY 2012, AMER INST PHYSICS, Vol. 1496, p. 164-166, 2012
  • Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition, Tomohisa Kitayama,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, Vol. 31, p. 186-187, 2012
  • Development of planar X-ray source using gated CNT emitter, Tomoya Manabe,Shogo Nitta,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2012 25TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE COMPUTER SOC, Vol. 31, p. 122-123, 2012
  • Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe, Satoshi Abo,Shunya Kumano,Takayuki Azuma,Ryota Sugimoto,Kohei Koresawa,Katsuhisa Murakami,Fujio Wakaya,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 269, No. 20, p. 2233-2236, 2011/10
  • Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 269, No. 20, p. 2360-2363, 2011/10
  • Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy, F. Wakaya,M. Kajiwara,K. Kubo,S. Abo,M. Takai, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 88, No. 8, p. 2778-2780, 2011/08
  • Electron Transport Properties of Pt Nanoarch Fabricated by Electron-Beam-Induced Deposition, Fujio Wakaya,Kunio Takamoto,Tsuyoshi Teraoka,Katsuhisa Murakami,Satoshi Abo,Mikio Takai, JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOC APPLIED PHYSICS, Vol. 50, No. 6, p. 06GG14-1-06GG14-3, 2011/06
  • Effect of ultraviolet light irradiation on electron field emission from titanium-oxide nanostructures, F. Wakaya,T. Tatsumi,K. Murakami,S. Abo,M. Takai,T. Takimoto,Y. Takaoka, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 29, No. 2, p. 02B110-1-02B110-4, 2011/03
  • Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray source application, Eiichi Kaga,Toshiya Kisa,Kosuke Nakahama,Satoshi Abo,Fujio Wakaya,Mikio Takai, 2011 24TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), IEEE, p. 109-+, 2011
  • レーザ誘起焦電結晶からの電子放出とX線源への応用, 加賀英一,中浜弘介,木佐俊哉,阿保智,若家冨士男,高井幹夫, 信学技報 IEICE Technical Report, Vol. 2011-70, p. 53-57, 2011
  • ゲート付電子源を用いたX線源の開発, 真鍋知哉,新田翔吾,沖宏吏,阿保智,若家冨士男,高井幹夫, 信学技報 IEICE Technical Report, Vol. 2011-71, p. 59-63, 2011
  • Field Emission Property of Titanium-Oxide Nanostructure Fabricated on Glass Substrate with Control of Density and Length, Fujio Wakaya,Takuo Nakatani,Satoshi Abo,Mikio Takai, IDW'11: PROCEEDINGS OF THE 18TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, p. 1783-1786, 2011
  • Effect of Body-tie Structure Fabricated by Partial Trench Isolation for Suppression of Soft Errors in SOI SRAM Investigated by Helium and Oxygen Ion Probes, S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2011-043, 2011
  • 4.5: Low energy electron source panel with carbon nanotube, Weijiang Zhao,Tomoya Manabe,Satoshi Abo,Mikio Takai, 23rd International Vacuum Nanoelectronics Conference, IVNC 2010, p. 28-29, 2010
  • Robust Carbon Nanotube Cathode with Various CNT Diameters and Post Treatments, Takai Mikio,Takikawa Tomoaki,Oki Hiroshi,Murakami Katsuhisa,Abo Satoshi,Wakaya Fujio,ITE/SID, Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3, p. 2025-2028, 2010
  • Enhancement of Electron Field Emission from Titanium-Oxide Nanostructure by Ultraviolet Light Irradiation, Wakaya Fujio,Tatsumi Tomohiko,Murakami Katsuhisa,Abo Satoshi,Takimoto Tadahiko,Takaoka Yoichi,Takai Mikio,ITE/SID, Idw'10: Proceedings of the 17th International Display Workshops, Vols 1-3, p. 2045-2048, 2010
  • Evaluation of Soft Errors using Nuclear Probes in SOI SRAM with Body-tie Structure Fabricated by Partial Trench Isolation, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Takahiro Makino,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, Proceedings of the 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (9th-RASEDA), 27-29 October 2010, Gunma, Japan, p. 72-75, 2010
  • Evaluation of Soft Error Rates in SOI SRAM with a Technology Node of 90 nm Using Oxygen Ion Probe, S. Abo,N. Masuda,F. Wakaya,S. Onoda,T. Makino,T. Hirao,T. Ohshima,T. Iwamatsu,H. Oda,M. Takai, JAEA Review, Vol. 2010-065, 2010
  • Local Resistance Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscope, Satoshi Abo,Kazuhisa Nishikawa,Naoya Ushigome,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, ION IMPLANTATION TECHNOLOGY 2010, AMER INST PHYSICS, Vol. 1321, p. 229-+, 2010
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, F. Wakaya,M. Miki,C. Fukuyama,K. Murakami,S. Abo,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-B26, 2010
  • Dependence on Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs, S. Abo,S. Onoda,T. Hirao,T. Ohshima,T. Iwamatsu,M. Takai, JAEA Review, Vol. 2009-041, 2009
  • Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser, W. S. Kim,H. Oki,A. Kinoshita,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 26, No. 2, p. 760-763, 2008/03
  • Evaluation of single event upsets in integrated circuits using nuclear micro probe, M. Takai,S. Abo, Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA), 15-17 December 2008, Ibaraki, Japan, p. 53-56, 2008
  • Local Resistance Profiling of Ultra-Shallow Junction with Spike Lamp and Laser Annealing Using Scanning Spreading Resistance Microscopy, Satoshi Abo,Yuji Tanaka,Kazuhisa Nishikawa,Fujio Wakaya,Toshiaki Iwamatsu,Hidekazu Oda,Mikio Takai, ION IMPLANTATION TECHNOLOGY 2008, AMER INST PHYSICS, Vol. 1066, p. 83-+, 2008
  • Development of time-of-flight RBS system using multi microchannel plates, N. V. Nguyen,S. Abo,T. Lohner,H. Sawaragi,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 260, No. 1, p. 105-108, 2007/07
  • Detection of magnetic field for measuring current distribution in metal nanostructure, K. Tanaka,Y. Mori,H. Yamagiwa,S. Abo,F. Wakaya,M. Takai, MICROELECTRONIC ENGINEERING, ELSEVIER SCIENCE BV, Vol. 84, No. 5-8, p. 1416-1418, 2007/05
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai,S. Nakata,A. Hosono,S. Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 557-560, 2007/03
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 566-569, 2007/03
  • The relationship between field emission characteristics and defects measured by RAMAN scattering in carbon nanotube cathode treated by plasma and laser irradiation, W. S. Kim,A. Kinishita,K. Murakami,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, p. 123-124, 2007
  • Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition, K. Murakami,S. Abe,S. Nishihara,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07, p. 26-27, 2007
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy, Hiroto Yamagiwa,Satoshi Abo,Fujio Wakaya,Mikio Takai,Tadao Sakamoto,Hidetada Tokioka,Naoki Nakagawa, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 89, No. 6, 2006/08
  • Improved field emission characteristics of multi-walled carbon nanotube cathode by plasma treatment with a help of krypton fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, p. 313-314, 2006
  • KrF laser surface treatment of CNT cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai, IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium, p. 73-74, 2006
  • Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes, Ohsumi K,Honda T,Kim W. S,Oh C. B,Murakami K,Abo S,Wakaya F,Takai M,Hosono A,Nakata S,Okuda S,ITE, Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3, p. 1837-+, 2006
  • Field emission characteristics of carbon nanotubes treated by plasma and laser, Kim W. S,Honda T,Oh C. B,Ohmmi K,Murakami K,Abo S,Wakaya F,Takai M,ITE, Idw '06: Proceedings of the 13th International Display Workshops, Vols 1-3, p. 1841-1844, 2006
  • Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering, S Abo,S Ichihara,T Lohner,F Wakaya,T Eimori,Y Inoue,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 237, No. 1-2, p. 72-76, 2005/08
  • Effect of thermal annealing on emission characteristics of nanoelectron source fabricated using beam-assisted process, K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 23, No. 2, p. 759-761, 2005/03
  • Influence of gas atmosphere during laser surface treatment of CNT cathode, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 23, No. 2, p. 762-764, 2005/03
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 23, No. 2, p. 765-768, 2005/03
  • KrF laser surface treatment of CNT cathodes, T. Honda,W. Rochanachirapar,K. Murakami,K. Ohsumi,N. Shimizu,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 300-301, 2005
  • Fabrication and characterization of Pt nanosplit emitter using electron beam induced deposition, K. Murakami,Y. Tsukatani,N. Yamasaki,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 157-158, 2005
  • Influence of the Pt cathode resistance on the field emission properties of field emitters fabricated using beam induced deposition, K. Murakami,N. Yamasaki,S. Abe,Y. Tsukatani,S. Abo,F. Wakaya,M. Takai, Technical Digest of the 18th International Vacuum Nanoelectronics Conference, IVNC 2005, Vol. 2005, p. 246-247, 2005
  • Ultra shallow As profiling before and after spike annealing using medium energy ion scattering, S Abo,S Ichihara,T Lohner,J Gyulai,F Wakaya,M Takai, Fifth International Workshop on Junction Technology, JAPAN SOCIETY APPLIED PHYSICS, p. 49-50, 2005
  • Surface treatment of CNT cathodes using KrF excimer laser for field emission displays, Honda T,Oh C. B,Murakami K,Ohsumi K,Abo S,Wakaya F,Takai M,ITE, Idw/ad '05: Proceedings of the 12th International Display Workshops in Conjunction With Asia Display 2005, Vols 1 and 2, p. 1647-1650, 2005
  • Laser surface treatment of CNT cathodes for large diagonal FEDs, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IEEE, p. 246-247, 2004
  • Observation of electron emission pattern from nano-split emitter fabricated using beam assisted process, K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai, TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IEEE, Vol. 23, p. 240-241, 2004
  • Effect of thermal annealing on emission characteristics of nano electron source fabricated using beam assisted process, K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai, TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IEEE, Vol. 23, p. 256-257, 2004
  • Inspection for critical issue of floating body effects in SOI-MOSFET using nuclear particles, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, MICROPROCESSES AND NANOTECHNOLOGY 2001, DIGEST OF PAPERS, JAPAN SOCIETY APPLIED PHYSICS, p. 70-71, 2001
  • Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source, M. Takai,Y. Arita,S. Abo,T. Iwamatsu,S. Maegawa,H. Sayama,Y. Yamaguchi,M. Inuishi,T. Nishimura, European Solid-State Device Research Conference, IEEE Computer Society, p. 17-24, 2001
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, 2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, IEEE, p. 285-288, 2000
  • Optical transitions in light-emitting nanocrystalline silicon thin films, T Toyama,Y Kotani,A Shimode,S Abo,H Okamoto, AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999, MATERIALS RESEARCH SOC, Vol. 557, p. 469-474, 1999

Misc.

  • 原子間力顕微鏡法における薄膜破壊プロセスの解析(II), 石原浩行,石原浩行,若家冨士男,村上勝久,長尾昌善,宮戸祐治,山下隼人,山下隼人,阿保智,阿部真之, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 66th, 2019
  • 高エネルギーイオン入射によるSiでの生成電荷分布計測(II), 阿保智,谷健一,若家冨士男,小野田忍,山下隼人,山下隼人,宮戸祐治,阿部真之, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 66th, 2019
  • Si置換したFe<sub>2</sub>VAlエピタキシャル薄膜の熱伝導率, 工藤康平,山田晋也,山田晋也,近田尋一朗,嶋貫雄太,石部貴史,阿保智,宮崎秀俊,西野洋一,中村芳明,浜屋宏平,浜屋宏平, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 66th, 2019
  • 酸化物基板上のCo<sub>2</sub>FeSiおよびCo<sub>2</sub>MnSi薄膜の成長形態の違い, 工藤康平,濱崎恭考,山田晋也,阿保智,合田義弘,浜屋宏平, 日本磁気学会学術講演概要集, Vol. 43rd, 2019
  • Maskless laser processing of graphene, Fujio Wakaya,Tadashi Kurihara,Nariaki Yurugi,Satoshi Abo,Masayuki Abe,Mikio Takai, 2018/12/24
  • 非接触原子間力顕微鏡を用いたルチル型TiO<sub>2</sub>(110)(1×2)再構成表面の原子分解能観察, 尾島章輝,勝部大樹,宮戸祐治,山下隼人,山下隼人,阿保智,阿部真之, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 65th, 2018
  • 電子ビーム誘起堆積Ptを用いた自己検出型カンチレバーの変位感度, 樫田健汰,若家冨士男,村上勝久,山下隼人,山下隼人,宮戸祐治,阿保智,阿部真之, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 65th, 2018
  • ルチル型TiO<sub>2</sub>(110)表面における(1×1)構造から(1×2)構造への構造遷移観察, 尾島章輝,勝部大樹,宮戸祐治,山下隼人,山下隼人,阿保智,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 79th, 2018
  • 原子間力顕微鏡法における薄膜破壊プロセスの解析, 石原浩行,若家冨士男,村上勝久,長尾昌善,宮戸祐治,山下隼人,阿保智,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 79th, 2018
  • 高エネルギーイオン入射によるSiでの生成電荷分布計測, 谷健一,谷健一,阿保智,阿保智,若家冨士男,小野田忍,山下隼人,山下隼人,宮戸祐治,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 78th, 2017
  • 高速原子間力顕微鏡計測における温度制御デバイスの開発, 加藤恭介,山下隼人,山下隼人,阿保智,宮戸祐治,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 78th, 2017
  • 電子ビーム誘起堆積Ptを用いた自己検出型カンチレバーの開発, 樫田健汰,若家冨士男,山下隼人,山下隼人,宮戸祐治,阿保智,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 78th, 2017
  • 非接触原子間力顕微鏡によるアナターゼ型TiO<sub>2</sub>(001)のイメージングコントラスト, 勝部大樹,宮戸祐治,山下隼人,山下隼人,阿保智,阿部真之, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 78th, 2017
  • パルスレーザー堆積/非接触原子間力顕微鏡複合装置によるLaAlO<sub>3</sub>(100)表面の原子分解能観察, 勝部大樹,山下隼人,宮戸祐治,阿保智,阿部真之, 日本金属学会講演概要(CD-ROM), Vol. 161st, 2017
  • Fabrication and Field Emission Properties of Titanium Oxide Nanostructures on Glass Substrate, WAKAYA Fujio,NAKATANI Takuo,ABO Satoshi,TAKAI Mikio, IEICE technical report. Electron devices, The Institute of Electronics, Information and Communication Engineers, Vol. 111, No. 248, p. 41-45, 2011/10/13
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2074-2077, 2010/06
  • Study on time resolution of single event TOF-RBS measurement, Satoshi Abo,Shunya Kumano,Katsuhisa Murakami,Fujio Wakaya,Tivadar Lohner,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2019-2022, 2010/06
  • Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm, Satoshi Abo,Naoyuki Masuda,Fujio Wakaya,Shinobu Onoda,Toshio Hirao,Takeshi Ohshima,Toshiaki Iwamatsu,Mikio Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 268, No. 11-12, p. 2074-2077, 2010/06
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2C41-C2C44, 2010/03
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, T. Kisa,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Ishida, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2B27-C2B29, 2010/03
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, F. Wakaya,M. Miki,C. Fukuyama,K. Murakami,S. Abo,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2B24-C2B26, 2010/03
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2C41-C2C44, 2010/03
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, F. Wakaya,M. Miki,C. Fukuyama,K. Murakami,S. Abo,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 28, No. 2, p. C2B24-C2B26, 2010/03
  • Study on time resolution of single event TOF-RBS measurement, Nuclear Instruments and Methods in Physics Research B, Vol. 268, 2019-2022, 2010
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, J. Vac. Sci. Technol., Vol. B 28, pp.C2B27-C2B29, 2010
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, J. Vac. Sci. Technol., Vol. B 28, pp.C2B24-C2B26, 2010
  • Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate, J. Vac. Sci. Technol., Vol. B 28, pp.C2B24-C2B26, 2010
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, T. Kisa,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Ishida, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-B29, 2010
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C44, 2010
  • Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics, T. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-C44, 2010
  • Electron emission from LiNbO3 crystal excited by ultraviolet laser, T. Kisa,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Ishida, Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, AVS Science and Technology Society, Vol. 28, No. 2, p. C2-B29, 2010
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, H. Oki,A. Kinoshita,T. Takikawa,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 761-765, 2009/03
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, H. Oki,A. Kinoshita,T. Takikawa,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 761-765, 2009/03
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission, C. Fukuyama,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Takimoto,Y. Kumashiro,Y. Takaoka, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 775-777, 2009/03
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, H. Oki,A. Kinoshita,T. Takikawa,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 761-765, 2009/03
  • Effect of aging on field emission lifetime for carbon nanotube cathodes, H. Oki,A. Kinoshita,T. Takikawa,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 761-765, 2009/03
  • Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission, C. Fukuyama,K. Murakami,S. Abo,F. Wakaya,M. Takai,T. Takimoto,Y. Kumashiro,Y. Takaoka, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 27, No. 2, p. 775-777, 2009/03
  • Fabrication and electron field emission properties of titanium-oxide nanowire, F. Wakaya,M. Mild,C. Fukuyama,K. Murakami,S. Abo,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.145-146, p. 145-146, 2009
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser, The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan, Vol. pp.151-152, 2009
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics, I. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.291-202, p. 291-292, 2009
  • Dependence o Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs, JAEA Review, JAEA Takasaki Annual Report 2008, Vol. 2009-041, 7, 2009
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Effects of CNT diameters of the screen-printed cathode on the field emission characteristics, I. Takikawa,H. Oki,Y. Matsuura,K. Murakami,S. Abo,F. Wakaya,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.291-202, p. 291-292, 2009
  • Electron emission from a lithium niobate crystal excited by ultra-violet laserElectron emission from a lithium niobate crystal excited by ultra-violet laser, The 22nd International Vacuum Nanoelectronics Conference, July 20 - 24, 2009, Hamamatsu Japan, Vol. pp.151-152, 2009
  • Fabrication and electron field emission properties of titanium-oxide nanowire, F. Wakaya,M. Mild,C. Fukuyama,K. Murakami,S. Abo,M. Takai, Technical Digest - 2009 22nd International Vacuum Nanoelectronics Conference, IVNC 2009, Vol. pp.145-146, p. 145-146, 2009
  • Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Dependence o Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs, JAEA Review, JAEA Takasaki Annual Report 2008, Vol. 2009-041, 7, 2009
  • Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics, International Display Workshop (IDW'09) (Miyazaki, Japan, 9-11 December, 2009), Vol. pp. ???, 2009
  • Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM, Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Vol. 183, 2008
  • Evaluation of Single Event Upsets in Integrated Circuits Using Nuclear Probe, Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Vol. 53, 2008
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2061-2063, 2008
  • Field Emission Lifetime after Aging of CNT Cathodes, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2037-2040, 2008
  • Evaluation of Single Event Upsets in Integrated Circuits Using Nuclear Probe, Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Vol. 53, 2008
  • Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM, Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Vol. 183, 2008
  • Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2061-2063, 2008
  • Field Emission Lifetime after Aging of CNT Cathodes, International Display Workshop (IDW'08) (Niigata, Japan, 3-5 December, 2008), Vol. 2037-2040, 2008
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures, M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 261, No. 1-2, p. 466-469, 2007/08
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures, M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 261, No. 1-2, p. 466-469, 2007/08
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 566-569, 2007/03
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai,S. Nakata,A. Hosono,S. Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 557-560, 2007/03
  • Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation, W. S. Kim,T. Honda,C. B. Oh,K. Ohsumi,K. Murakami,S. Abo,F. Wakaya,M. Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 566-569, 2007/03
  • KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching, K. Ohsumi,T. Honda,W. S. Kim,C. B. Oh,K. Murakami,S. Abo,F. Wakaya,M. Takai,S. Nakata,A. Hosono,S. Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 25, No. 2, p. 557-560, 2007/03
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser, W. S. Kim,H. Oki,A. Kinoshita,K. Murakami,S. Abo,F. Wakaya,M. Takai, IDW '07: PROCEEDINGS OF THE 14TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 2173-2176, p. 2173-+, 2007
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer laser, A. Kinoshita,W. S. Kim,K. Murakami,S. Abo,F. Wakaya,M. Takai, IDW '07: PROCEEDINGS OF THE 14TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. 2177-2180, p. 2177-+, 2007
  • The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser, International Display Workshop (IDW'07) (Sapporo, Japan, 5-7 December, 2007), Vol. 2173-2176, 2007
  • Field emission profiles of CNT cathodes with surface treatment using KrF eximer Laser, International Display Workshop (IDW07)(Sapporo, Japan, 5-7 December, 2007), Vol. 2177-2180, 2007
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis, H. Kitano,S. Abo,M. Mizutani,J. Tsuchimoto,T. Lohner,J. Gyulai,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 249, p. 246-249, 2006/08
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy, Hiroto Yamagiwa,Satoshi Abo,Fujio Wakaya,Mikio Takai,Tadao Sakamoto,Hidetada Tokioka,Naoki Nakagawa, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 89, No. 6, 2006/08
  • Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis, H. Kitano,S. Abo,M. Mizutani,J. Tsuchimoto,T. Lohner,J. Gyulai,F. Wakaya,M. Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 249, p. 246-249, 2006/08
  • Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy, Hiroto Yamagiwa,Satoshi Abo,Fujio Wakaya,Mikio Takai,Tadao Sakamoto,Hidetada Tokioka,Naoki Nakagawa, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 89, No. 6, 2006/08
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays, T Honda,CB Oh,K Murakami,WS Kim,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 24, No. 2, p. 1013-1016, 2006/03
  • Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays, T Honda,CB Oh,K Murakami,WS Kim,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 24, No. 2, p. 1013-1016, 2006/03
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy, S. Abo,H. Yamagiwa,K. Tanaka,F. Wakaya,T. Sakamoto,H. Tokioka,N. Nakagawa,M. Takai, ION IMPLANTATION TECHNOLOGY, AMER INST PHYSICS, Vol. 866, p. 542-+, 2006
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing, Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30 – February 1, 2006, Osaka University, Vol. 1, 2006
  • Evaluation of Soft Errors in SOI-SRAM Using Nuclear Probe, Proceedings of The 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application, Vol. pp.79-84, 2006
  • Transport properties of beam-deposited Pt nanowires, F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai, SEVENTH INTERNATIONAL CONFERENCE ON NEW PHENOMENA IN MESOSCOPIC STRUCTURES AND FIFTH INTERNATIONAL CONFERENCE ON SURFACES AND INTERFACES OF MESOSCOPIC DEVICES, 2005, IOP PUBLISHING LTD, Vol. 38, p. 120-+, 2006
  • Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy, S. Abo,H. Yamagiwa,K. Tanaka,F. Wakaya,T. Sakamoto,H. Tokioka,N. Nakagawa,M. Takai, ION IMPLANTATION TECHNOLOGY, AMER INST PHYSICS, Vol. 866, p. 542-+, 2006
  • Fabrication of Vacuum Nanoelectronics Devices Using Beam Processing, Abstracts of Handai Nanoscience and Nanotechnology International Symposium, January 30 – February 1, 2006, Osaka University, Vol. 1, 2006
  • Transport properties of beam-deposited Pt nanowires, F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai, SEVENTH INTERNATIONAL CONFERENCE ON NEW PHENOMENA IN MESOSCOPIC STRUCTURES AND FIFTH INTERNATIONAL CONFERENCE ON SURFACES AND INTERFACES OF MESOSCOPIC DEVICES, 2005, IOP PUBLISHING LTD, Vol. 38, p. 120-+, 2006
  • Reliability study of bulk and SOISRAMs using high energy nuclear probes, S Abo,H Yamagiwa,T Iwamatsu,S Maegawa,Y Arita,T Ipposhi,A Kinomura,F Wakaya,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 231, p. 482-485, 2005/04
  • Observation of electron emission pattern from nanosplit emitter fabricated using beam assisted process, K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 23, No. 2, p. 735-740, 2005/03
  • Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 23, No. 2, p. 765-768, 2005/03
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy, H. Yamagiwa,S. Abo,F. Wakaya,T. Sakatnoto,H. Tokioka,N. Nakagawa,M. Takai, IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. pp. 973 -975, p. 973-975, 2005
  • Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy, H. Yamagiwa,S. Abo,F. Wakaya,T. Sakatnoto,H. Tokioka,N. Nakagawa,M. Takai, IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2, INST IMAGE INFORMATION & TELEVISION ENGINEERS, Vol. pp. 973 -975, p. 973-975, 2005
  • Suppression of leakage current for nano electron source fabricated using beam assisted process, YAMASAKI Naoki,MURAKAMI Katsuhisa,ABO Satoshi,WAKAYA Fujio,TAKAI Mikio, IEICE technical report. Electron devices, The Institute of Electronics, Information and Communication Engineers, Vol. 104, No. 519, p. 43-46, 2004/12/16
  • Effect of laser irradiation to carbon nanotube field emission cathode, ROCHANACHIRAPAR Wasu,MURAKAMI Katsuhisa,YAMASAKI Naoki,HONDA Tomoaki,ABO Satoshi,WAKAYA Fujio,TAKAI Mikio, Vol. 104, No. 519, p. 7-10, 2004/12/16
  • TOF-RBS with medium energy heavy ion probe for semiconductor process analysis, K Hayashi,H Takayama,M Ishikawa,S Abo,T Lohner,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 219, p. 589-592, 2004/06
  • Characterization of dopant profiles produced by ultra-shallow As implantation and spike annealing using medium energy ion scattering, S Ichihara,T Nakagawa,M Nitta,S Abo,T Lohner,C Angelov,K Ohta,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 219, p. 584-588, 2004/06
  • Influence of gas atmosphere during laser surface treatment of CNT cathode, W Rochanachirapar,K Murakami,N Yamasaki,S Abo,F Wakaya,M Takai,A Hosono,S Okuda, TECHNICAL DIGEST OF THE 17TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE, IEEE, Vol. 23, 762/,, p. 144-145, 2004
  • Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe, S Abo,M Mizutani,K Ikeda,A Kinomura,T Iwamatsu,S Maegawa,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 210, p. 216-220, 2003/09
  • Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe, S Abo,M Mizutani,K Ikeda,A Kinomura,T Iwamatsu,S Maegawa,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 210, p. 216-220, 2003/09
  • Shallow arsenic profiling using medium energy ion scattering (MEIS), T Nakagawa,M Fujita,S Ichihara,S Abo,A Kinomura,Y Inoue,M Takai, IIT2002: ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, IEEE, Vol. 264 - 267, p. 264-267, 2003
  • Development of enhanced depth-resolution technique for shallow dopant profiles, M Fujita,J Tajima,T Nakagawa,S Abo,A Kinomura,F Paszti,M Takai,R Schork,L Frey,H Ryssel, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 190, p. 26-33, 2002/05
  • Suppression of floating body effects in SOI-MOSFET studied using nuclear microprobes, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 181, p. 320-323, 2001/07
  • Suppression of floating body effects in SOI-MOSFET studied using nuclear microprobes, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ELSEVIER SCIENCE BV, Vol. 181, p. 320-323, 2001/07
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, 2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, IEEE, p. 285-288, 2000
  • Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes, S Abo,M Mizutani,K Nakayama,T Takaoka,T Iwamatsu,Y Yamaguchi,S Maegawa,T Nishimura,A Kinomura,Y Horino,M Takai, 2000 INTERNATIONAL CONFERENCE ON ION IMPLANTATION TECHNOLOGY, PROCEEDINGS, IEEE, Vol. in press, p. 285-288, 2000
  • 部分空乏化SOI-MOSFETにおける基板浮遊効果抑制シミュレーション, 阿保 智,水谷 斉治,高井 幹夫, 大阪大学極限科学研究センタ-報告書, 大阪大学極限科学研究センタ-, No. 4, p. 9-11, 1999
  • Inspection of floating body effects in SOI devices using high energy nuclear microprobes, Vol. 査読中

Awards

  • 大阪大学総長による表彰, 阿保 智, 大阪大学総長, 2012/01
  • Best poster Award, S. Abo,K. Nakayama,T. Takaoka,T. Iwamatsu,Y. Yamaguchi,S. Maegawa,T. Nishimura,A. Kinomura,Y. Horino,M. Takai, IIT2000 Committee, 2000/09

Presentations

  • レーザ加熱焦電結晶を用いたポータブルX線源・中性子源の開発, 阿保智,若家冨士男,増澤智昭,三村秀典,高井幹夫, 5. 第69回応用物理学会春季学術講演会, 2022/03/22
  • イオン散乱法を用いた非破壊三次元元素分析技術, 阿保 智,若家 冨士男,高井 幹夫, 日本学術振興会 第158委員会 第131回研究会, 2020/03/03
  • Nondestructive analysis technique by ion scattering spectroscopy using 150 kV FIB, Satoshi Abo,Albert Seidl,Fujio Wakaya, 29th Annual Meeting of MRS-J, 2019/11/28
  • シングルイベント飛行時間型ラザフォード後方散乱法を用いた非破壊三次元元素分析技術の開発, 阿保 智, 日本学術振興会 第132委員会 第233回研究会, 2018/12/07
  • X-ray charge neutralizer using carbon-nanotube field emitter, S. Okawaki,S. Abo,F. Wakaya,H. Yamashita,M. Abe,M. Takai, 7th Japan-Korea Vacuum Nanoelectronics Symposium (7th-KJVNS), 2015/10
  • Development of miniature x-ray source using pyroelectric crystal excited by laser light, Satoshi Abo,Takahiro Uezato,Fujio Wakaya,Masayuki Abe,Mikio Takai, The 6th IEEE International Nanoelectronics Conference 2014 (INEC2014), 2014/07
  • LiNbO3/LiTaO3の焦電効果を使ったX線発生, 阿保智,中浜弘介,加賀英一,木佐俊哉,高橋理明,若家冨士男,高井幹夫, 2013年度 第3回光材料応用技術研究会, 2013/11/15
  • Electron emission from pyroelectric crystals excited using laser light and its X-ray source application, Satoshi Abo,Kosuke Nakahama,Michiaki Takahashi,Fujio Wakaya,Mikio Takai, 5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS), 2013/10
  • Fabrication of field emitter cathodes with nano materials and their characterization for vacuum nanoelectronics application, Mikio Takai,Satoshi Abo,Fujio Wakaya, 5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS), 2013/10
  • Development of a tiny X-ray source controlled by laser light for medical application, Mikio Takai,Kosuke, Nakahama,Eiichi Kaga,Toshiya Kisa,Satoshi Abo,Fujio Wakaya, 25th International Vacuum Nanoelectronics Conference (IVNC2012), 2012/07
  • Long-life carbon nanotube cathode with various surface treatment for backlight unit and lighting, M. Takai,T. Takikawa,H. Oki,K. Murakami,S. Abo,F. Wakaya, The 10th International Meeting on Information Display / International Display Manufacturing Conference and Asia Display 2010 (iMiD/IDMC/ASIA DISPLAY 2010), 2010/10
  • Evaluation of single event upsets in integrated circuits using nuclear probe, M. Takai,S. Abo,T. Iwamatsu, The 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA), 2008/12
  • Visualization of three dimensional nanostructures by time-of-flight RBS using nuclear nanoprobes, M. Takai,S. Abo,K. Koresawa,K. Murakami,F. Wakaya,T. Kikuchi,H. Sawaragi, 11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2008), 2008/07
  • イオンナノプローブによる3次元非破壊分析技術の開発, 阿保智,高井幹夫, 日本顕微鏡学会, 第63回学術講演会, 2007/05
  • Evaluation of soft errors in SOI-SRAM using nuclear probe, M. Takai,S. Abo,T. Iwamatsu,S. Maegawa,Y. Arita,M. Inuishi,T. Ipposhi,A. Kinomura,Y. Horino, 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (7th-RASEDA), 2006/10
  • Nuclear nanoprobe development for visualization of three-dimensional nanostructures, M. Takai,S. Abo,F. Wakaya,T. Kikuchi,H. Sawaragi, The 19th International Conference on the Application of Accelerators in Research and Industry (CAARI2006), 2006/08
  • Ultra shallow arsenic profiling in Si using highly sensitive time-of-flight RBS with nuclear nanoprobe, S. Abo,N. V. Nguyen,T. Lohner,F. Wakaya,M. Takai, 10th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2006), 2006/07
  • Electron Transport in Pt Nanowires fabricated by beam induced process, F. Wakaya,Y. Tsukatani,N. Yamasaki,K. Murakami,S. Abo,M. Takai, Hungarian Nanotechnology Symposium 2005, 2005/03
  • Laser Irradiation to CNT Cathode for Large Diagonal FEDs, K. Murakami,W. Rochanachirapar,S. Abo,F. Wakaya,M. Takai, The 11th International Display Workshop (IDW ‘04), 2004/12
  • Fabrication of nano structures using focused ion, electron and photon beams and its application to vacuum nanoelectronic devices, M. Takai,K. Murakami,W. Rochanachirapar,N. Yamasaki,T. Tsukatani,S. Abo,F. Wakaya, The International Workshop on Materials Science and Nano-Engineering, 2004/12
  • Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source, M. Takai,Y. Arita,S. Abo,T. Iwamatsu,S. Maegawa,H. Sayama,Y. Yamaguchi,M. Inuishi,T. Nishimura, The 31st European Solid-State Device Research Conference (ESSDERC 2001), 2001/09
  • Development of enhanced depth-resolution technique for shallow dopant profiling, M. Fujita,J. Tajima,T. Nakagawa,S. Abo,A. Kinomura,F. Paszti,M. Takai,R. Schork,L, Frey,H. Ryssel, The 15th International Conference on Ion Beam Analysis (IBA2001), 2001/07

Committee Memberships

  • 日本MRS, 第33回 日本MRS年次大会 シンポジウム 代表オーガナイザー, 2023/11 - 2023/11
  • 日本MRS, 第32回 日本MRS年次大会 シンポジウム 連絡オーガナイザー, 2022/12 - 2022/12
  • MRM2021, Symposium Organizer, 2021/12 - 2021/12
  • 日本MRS, 第30回日本MRS年次大会シンポジウムオーガナイザー, 2020 -
  • 第11回 宇宙用半導体素子の照射効果に関する国際講演会, 実行委員, 2015 -
  • 第10回 宇宙用半導体素子の照射効果に関する国際講演会, 実行委員, 2012 -
  • 第9回 宇宙用半導体素子の照射効果に関する国際講演会, 実行委員, 2010 -