顔写真

PHOTO

Abo Satoshi
阿保 智
Abo Satoshi
阿保 智
Graduate School of Engineering Science Center for Science and Technology under Extreme Conditions, Assistant Professor

keyword quantum beam,ion scattering spectrometry,reliability,solid ion interaction

Research History 7

  1. 2014/04 - Present
    Osaka University Graduate School of Engineering Science, Center for Science and Technology under Extreme Conditions

  2. 2017/05 - 2018/03
    量子科学技術研究開発機構 協力研究員

  3. 2007/08 - 2014/03
    Osaka University Research Center for Quantum Science and Technology Under Extreme Conditions

  4. 2007/04 - 2007/07
    Osaka University Research Center for Quantum Science and Technology Under Extreme Conditions

  5. 2006/04 - 2007/03
    Osaka University Research Center for Quantum Science and Technology Under Extreme Conditions

  6. 2005/04 - 2006/03
    Osaka University

  7. 2004/04 - 2005/03
    Osaka University

Education 3

  1. Osaka University Graduate School of Engineering Science

    2001/04 - 2004/03

  2. Osaka University Graduate School of Engineering Science

    1999/04 - 2001/03

  3. Osaka University School of Engineering Science Direct Affiliates

    1995/04 - 1999/03

Professional Memberships 2

  1. MRS-J

  2. 応用物理学会

Research Areas 3

  1. Nanotechnology/Materials / Thin-film surfaces and interfaces /

  2. Nanotechnology/Materials / Nanostructure physics /

  3. Energy / Quantum beam science /

Awards 2

  1. 大阪大学総長による表彰

    阿保 智 大阪大学総長 2012/01

  2. Best poster Award

    S. Abo, K. Nakayama, T. Takaoka, T. Iwamatsu, Y. Yamaguchi, S. Maegawa, T. Nishimura, A. Kinomura, Y. Horino, M. Takai IIT2000 Committee 2000/09

Papers 69

  1. Resistivity measurement for non-magnetic materials using high-order resonance mode of MFM-cantilever oscillation

    Kazuma Okamoto, Takumi Imura, Satoshi Abo, Fujio Wakaya, Katsuhisa Murakami, Masayoshi Nagao

    Japanese Journal of Applied Physics Vol. 64 2025/04

  2. Development of a Fingertip-sized Miniature X-ray Source Using a Laser-heated Pyroelectric Crystal

    Satoshi Abo, Takahiro Uezato, Michiaki Takahashi, Fujio Wakaya

    e-Journal of Surface Science and Nanotechnology Vol. 22 No. 3 p. 236-240 2024/07/04 Research paper (scientific journal)

    Publisher: Surface Science Society Japan
  3. Simulation of Electron Transmission through Graphene with Inelastic Scattering

    Takao Koichi, Shogo Kawashima, Satoshi Abo, Fujio Wakaya, Masayoshi Nagao, Katsuhisa Murakami

    e-Journal of Surface Science and Nanotechnology Vol. 22 No. 2 p. 157-161 2024/03/16 Research paper (scientific journal)

    Publisher: Surface Science Society Japan
  4. Experimental verification of the origin of positive linear magnetoresistance in CoFe(V1-xMnx)Si Heusler alloys

    S. Yamada, S. Kobayashi, A. Masago, L. S.R. Kumara, H. Tajiri, T. Fukushima, S. Abo, Y. Sakuraba, K. Hono, T. Oguchi, K. Hamaya

    Physical Review B Vol. 100 No. 19 2019/11/25 Research paper (scientific journal)

  5. Great differences between low-temperature grown Co2FeSi and Co2MnSi films on single-crystalline oxides

    Kohei Kudo, Yasunari Hamazaki, Shinya Yamada, Satoshi Abo, Yoshihiro Gohda, Kohei Hamaya

    ACS Applied Electronic Materials Vol. 1 p. 2371-2379 2019/11

  6. Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry

    Satoshi Abo, Albert Seidl, Fujio Wakaya, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 456 p. 12-15 2019/10

  7. Measurement of the Lateral Charge Distribution in Silicon Generated by High-Energy Ion Incidence

    Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda, Yuji Miyato, Hayato Yamashita, Masayuki Abe

    Proceedings of 22nd International Conference on Ion Implantation Technology (IIT2018), IEEE-CFP Vol. 1844 p. 156-159 2019/08

  8. Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data

    Albert Seidl, Satoshi Abo, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 450 p. 163-167 2019/07

  9. Surface structure switching between (1×1) and (1×2) of rutileTiO2(110) with scanning tunneling microscopy and low energy electron diffraction

    Shoki Ojima, Daiki Katsube, Hayato Yamashita, Yuji Miyato, Satoshi Abo, Masayuki Abe

    Japanese Journal of Applied Physics Vol. 58 No. SI 2019/06

  10. Significant reduction in the thermal conductivity of Si-substituted Fe2VAI epilayers

    K. Kudo, S. Yamada, J. Chikada, Y. Shimanuki, T. Ishibe, S. Abo, H. Miyazaki, Y. Nishino, Y. Nakamura, K. Hamaya

    Physical Review B Vol. 99 2019 Research paper (scientific journal)

  11. Magnetic and transport properties of equiatomic quaternary Heusler CoFeVSi epitaxial films

    S. Yamada, S. Kobayashi, F. Kuroda, K. Kudo, S. Abo, T. Fukushima, T. Oguchi, K. Hamaya

    Physical Review Materials Vol. 2 No. 12 2018/12/27 Research paper (scientific journal)

  12. Detection of nonmagnetic metal thin film using magnetic force microscopy

    Fujio Wakaya, Kenta Oosawa, Masahiro Kajiwara, Satoshi Abo, Mikio Takai

    Applied Physics Letters Vol. 113 2018/12 Research paper (scientific journal)

  13. Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films

    Daiki Katsube, Hayato Yamashita, Satoshi Abo, Masayuki Abe

    Beilstein Journal of Nanotechnology Vol. 9 No. 1 p. 686-692 2018 Research paper (scientific journal)

    Publisher: Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
  14. Characterization of X-ray charge neutralizer using carbon-nanotube field emitter

    Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Hayato Yamashita, Masayuki Abe, Mikio Takai

    Japanese Journal of Applied Physics Vol. 55 No. 6 2016/06 Research paper (scientific journal)

  15. Maskless laser processing of graphene

    Fujio Wakaya, Tadashi Kurihara, Nariaki Yurugi, Satoshi Abo, Masayuki Abe, Mikio Takai

    Microelectronic Engineering Vol. 141 p. 203-206 2015/06

  16. X-ray source using carbon-nanotube field emitter with side-gate electrode

    Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Masayuki Abe, Mikio Takai

    Japanese Journal of Applied Physics Vol. 54 No. 6 2015/05 Research paper (scientific journal)

  17. Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry

    Satoshi Abo, Yasuhisa Hamada, Albert Seidl, Fujio Wakaya, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 348 p. 29-33 2015/04 Research paper (scientific journal)

  18. A Preparation Method for Atomically Clean Sapphire Surfaces and High Resolution Topographic Method for Their Imaging by Non-Contact Atomic Force Microscopy

    Daiki Katsube, Yutaro Takase, Hayato Yamashita, Satoshi Abo, Fujio Wakaya, Masayuki Abe

    Materials Transactions Vol. 56 No. 8 p. 1310-1313 2015/03 Research paper (scientific journal)

  19. Spreading Resistance Profiling of Ultra Shallow Junction Fabricated with Low Energy As Implantation and Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy

    Satoshi Abo, Hidenori Osae, Fujio Wakaya, Mikio Takai, Hidekazu Oda

    Proceedings of 20th International Conference on Ion Implantation Technology (IIT2014) 2014/10 Research paper (international conference proceedings)

  20. Analysis technique for ultra shallow junction using medium energy ion scattering time-of-flight elastic recoil detection analysis

    Satoshi Abo, Ri Pei, Yao Xin Yuan, Fujio Wakaya, Mikio Takai

    Surface and Interface Analysis Vol. 46 p. 1192-1195 2014/06 Research paper (scientific journal)

  21. Effect of electron focusing in x-ray sources using LiTaO3 crystals excited by neodymium-doped yttrium lithium fluoride laser light

    Kosuke Nakahama, Michiaki Takahashi, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Journal of Vacuum Science and Technology B Vol. 32 No. 2 2014/03 Research paper (scientific journal)

  22. Ultra-violet laser processing of graphene on SiO2/Si

    Fujio Wakaya, Tadashi Kurihara, Satoshi Abo, Mikio Takai

    Microelectronic Engineering Vol. 110 p. 358-360 2013/10 Research paper (scientific journal)

    Publisher: Elsevier B.V.
  23. Development of planar x-ray source using gated carbon nanotube emitter

    Tomoya Manabe, Shogo Nitta, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Journal of Vacuum Science and Technology B Vol. 31 No. 2 2013/03 Research paper (scientific journal)

  24. Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition

    Tomohisa Kitayama, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Journal of Vacuum Science and Technology B Vol. 31 No. 2 2013/03 Research paper (scientific journal)

  25. Active Dopant Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscopy

    Satoshi Abo, Naoya Ushigome, Hidenori Osae, Fujio Wakaya, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Proceedings of the 19th International Conference on Ion Implantation Technology (IIT2012) Vol. 1496 p. 164-166 2012/11 Research paper (international conference proceedings)

  26. Effects of ultra-violet laser irradiation on graphene

    Fujio Wakaya, Tsuyoshi Teraoka, Toshiya Kisa, Tomoya Manabe, Satoshi Abo, Mikio Takai

    Microelectronic Engineering Vol. 97 p. 144-146 2012/09 Research paper (scientific journal)

  27. Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling

    Satoshi Abo, Hidemasa Horiuchi, Fujio Wakaya, Gabor Battistig, Tivadar Lohner, Mikio Takai

    Surface and Interface Analysis Vol. 44 No. 6 p. 732-735 2012/06 Research paper (scientific journal)

  28. Difference of soft error rates in SOI SRAM induced by various high energy ion species

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Tivadar Lohner, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 273 p. 262-265 2012/02 Research paper (scientific journal)

  29. Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe

    Satoshi Abo, Takayuki Azuma, Tivadar Lohner, Fujio Wakaya, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 273 p. 266-269 2012/02 Research paper (scientific journal)

  30. Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe

    Satoshi Abo, Shunya Kumano, Takayuki Azuma, Ryota Sugimoto, Kohei Koresawa, Katsuhisa Murakami, Fujio Wakaya, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 269 No. 20 p. 2233-2236 2011/10 Research paper (scientific journal)

  31. Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 269 No. 20 p. 2360-2363 2011/10 Research paper (scientific journal)

  32. Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy

    F. Wakaya, M. Kajiwara, K. Kubo, S. Abo, M. Takai

    Microelectronic Engineering Vol. 88 No. 8 p. 2778-2780 2011/08 Research paper (scientific journal)

  33. Electron Transport Properties of Pt Nanoarch Fabricated by Electron-Beam-Induced Deposition

    Fujio Wakaya, Kunio Takamoto, Tsuyoshi Teraoka, Katsuhisa Murakami, Satoshi Abo, Mikio Takai

    Japanese Journal of Applied Physics Vol. 50 No. 6 p. 06GG14-1-06GG14-3 2011/06 Research paper (scientific journal)

  34. Effect of ultraviolet light irradiation on electron field emission from titanium-oxide nanostructures

    F. Wakaya, T. Tatsumi, K. Murakami, S. Abo, M. Takai, T. Takimoto, Y. Takaoka

    Journal of Vacuum Science and Technology B Vol. 29 No. 2 p. 02B110-1-02B110-4 2011/03 Research paper (scientific journal)

  35. Local Resistance Profiling of Ultra Shallow Junction Annealed with Combination of Spike Lamp and Laser Annealing Processes using Scanning Spreading Resistance Microscope

    Satoshi Abo, Kazuhisa Nishikawa, Naoya Ushigome, Fujio Wakaya, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Proceedings of the 18th International Conference on Ion Implantation Technology (IIT2010) Vol. 1321 p. 229-232 2011 Research paper (international conference proceedings)

  36. Study on time resolution of single event TOF-RBS measurement

    Satoshi Abo, Shunya Kumano, Katsuhisa Murakami, Fujio Wakaya, Tivadar Lohner, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 268 No. 11-12 p. 2019-2022 2010/06 Research paper (scientific journal)

  37. Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Mikio Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 268 No. 11-12 p. 2074-2077 2010/06 Research paper (scientific journal)

  38. Fabrication and electron field-emission properties of titanium oxide nanowire on glass substrate

    F. Wakaya, M. Miki, C. Fukuyama, K. Murakami, S. Abo, M. Takai

    Journal of Vacuum Science and Technology B Vol. 28 No. 2 p. C2-B26 2010 Research paper (international conference proceedings)

    Publisher: AVS Science and Technology Society
  39. Effects of carbon nanotube diameters of the screen printed cathode on the field emission characteristics

    T. Takikawa, H. Oki, Y. Matsuura, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Journal of Vacuum Science and Technology B Vol. 28 No. 2 p. C2-C44 2010 Research paper (international conference proceedings)

    Publisher: AVS Science and Technology Society
  40. Electron emission from LiNbO3 crystal excited by ultraviolet laser

    T. Kisa, K. Murakami, S. Abo, F. Wakaya, M. Takai, T. Ishida

    Journal of Vacuum Science and Technology B Vol. 28 No. 2 p. C2-B29 2010 Research paper (international conference proceedings)

    Publisher: AVS Science and Technology Society
  41. Effect of aging on field emission lifetime for carbon nanotube cathodes

    H. Oki, A. Kinoshita, T. Takikawa, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Journal of Vacuum Science and Technology B Vol. 27 No. 2 p. 761-765 2009/03 Research paper (scientific journal)

  42. Field enhanced surface treatment of needle-shaped TiO2 cathode for improvement in field emission

    C. Fukuyama, K. Murakami, S. Abo, F. Wakaya, M. Takai, T. Takimoto, Y. Kumashiro, Y. Takaoka

    Journal of Vacuum Science and Technology B Vol. 27 No. 2 p. 775-777 2009/03 Research paper (scientific journal)

  43. Local Resistance Profiling of Ultra-Shallow Junction with Spike Lamp and Laser Annealing Using Scanning Spreading Resistance Microscopy

    Satoshi Abo, Yuji Tanaka, Kazuhisa Nishikawa, Fujio Wakaya, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Proceedings of the 17th International Conference on Ion Implantation Technology (IIT2008) Vol. 1066 p. 83-86 2008/12 Research paper (international conference proceedings)

  44. Relationship between field-emission characteristics and defects measured by Raman scattering in carbon-nanotube cathodes treated by plasma and laser

    W. S. Kim, H. Oki, A. Kinoshita, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Journal of Vacuum Science and Technology B Vol. 26 No. 2 p. 760-763 2008/03 Research paper (scientific journal)

  45. Nuclear nanoprobe development for visualization of three-dimensional nanostructures

    M. Takai, S. Abo, F. Wakaya, T. Kikuchi, H. Sawaragi

    Nuclear Instruments and Methods in Physics Research Section B Vol. 261 No. 1-2 p. 466-469 2007/08 Research paper (scientific journal)

  46. Development of time-of-flight RBS system using multi microchannel plates

    N. V. Nguyen, S. Abo, T. Lohner, H. Sawaragi, F. Wakaya, M. Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 260 No. 1 p. 105-108 2007/07 Research paper (scientific journal)

  47. Detection of magnetic field for measuring current distribution in metal nanostructure

    K. Tanaka, Y. Mori, H. Yamagiwa, S. Abo, F. Wakaya, M. Takai

    Microelectronic Engineering Vol. 84 No. 5-8 p. 1416-1418 2007/05 Research paper (scientific journal)

  48. KrF laser surface treatment of carbon nanotube cathodes with and without reactive ion etching

    K. Ohsumi, T. Honda, W. S. Kim, C. B. Oh, K. Murakami, S. Abo, F. Wakaya, M. Takai, S. Nakata, A. Hosono, S. Okuda

    Journal of Vacuum Science and Technology B Vol. 25 No. 2 p. 557-560 2007/03 Research paper (scientific journal)

  49. Improved field-emission characteristics of a multiwalled carbon-nanotube cathode by argon plasma pretreatment and krypton-fluoride laser irradiation

    W. S. Kim, T. Honda, C. B. Oh, K. Ohsumi, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Journal of Vacuum Science and Technology B Vol. 25 No. 2 p. 566-569 2007/03 Research paper (scientific journal)

  50. Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy

    S. Abo, H. Yamagiwa, K. Tanaka, F. Wakaya, T. Sakamoto, H. Tokioka, N. Nakagawa, M. Takai

    Proceedings of the 16th International Conference on Ion Implantation Technology (IIT2006) Vol. 866 p. 542-545 2006/12 Research paper (international conference proceedings)

  51. Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy

    Hiroto Yamagiwa, Satoshi Abo, Fujio Wakaya, Mikio Takai, Tadao Sakamoto, Hidetada Tokioka, Naoki Nakagawa

    Applied Physics Letters Vol. 89 No. 6 2006/08 Research paper (scientific journal)

  52. Compositional analysis of HfxSiyO(1-x-y) thin films by medium energy ion scattering (MEIS) analysis

    H. Kitano, S. Abo, M. Mizutani, J. Tsuchimoto, T. Lohner, J. Gyulai, F. Wakaya, M. Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 249 p. 246-249 2006/08 Research paper (scientific journal)

  53. Transport properties of beam-deposited Pt nanowires

    F. Wakaya, Y. Tsukatani, N. Yamasaki, K. Murakami, S. Abo, M. Takai

    Journal of Physics: Conference Series Vol. 38 p. 120-125 2006/05 Research paper (international conference proceedings)

  54. Surface treatment of carbon nanotube cathodes with glass fillers using KrF excimer laser for field-emission displays

    T Honda, CB Oh, K Murakami, WS Kim, S Abo, F Wakaya, M Takai

    Journal of Vacuum Science and Technology Vol. 24 No. 2 p. 1013-1016 2006/03 Research paper (scientific journal)

  55. Dopant profiling of ultra shallow As implanted in Si with and without spike annealing using medium energy ion scattering

    S Abo, S Ichihara, T Lohner, F Wakaya, T Eimori, Y Inoue, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 237 No. 1-2 p. 72-76 2005/08 Research paper (scientific journal)

  56. Reliability study of bulk and SOISRAMs using high energy nuclear probes

    S Abo, H Yamagiwa, T Iwamatsu, S Maegawa, Y Arita, T Ipposhi, A Kinomura, F Wakaya, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 231 p. 482-485 2005/04 Research paper (scientific journal)

  57. Effect of thermal annealing on emission characteristics of nanoelectron source fabricated using beam-assisted process

    K Murakami, N Yamasaki, S Abo, F Wakaya, M Takai

    Journal of Vacuum Science and Technology B Vol. 23 No. 2 p. 759-761 2005/03 Research paper (scientific journal)

  58. Observation of electron emission pattern from nanosplit emitter fabricated using beam assisted process

    K Murakami, N Yamasaki, S Abo, F Wakaya, M Takai

    Journal of Vacuum Science and Technology B Vol. 23 No. 2 p. 735-740 2005/03 Research paper (scientific journal)

  59. Influence of gas atmosphere during laser surface treatment of CNT cathode

    W Rochanachirapar, K Murakami, N Yamasaki, S Abo, F Wakaya, M Takai, A Hosono, S Okuda

    Journal of Vacuum Science and Technology B Vol. 23 No. 2 p. 762-764 2005/03 Research paper (scientific journal)

  60. Laser surface treatment of carbon nanotube cathodes for field emission displays with large diagonal size

    W Rochanachirapar, K Murakami, N Yamasaki, S Abo, F Wakaya, M Takai, A Hosono, S Okuda

    Journal of Vacuum Science and Technology B Vol. 23 No. 2 p. 765-768 2005/03 Research paper (scientific journal)

  61. TOF-RBS with medium energy heavy ion probe for semiconductor process analysis

    K Hayashi, H Takayama, M Ishikawa, S Abo, T Lohner, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 219 p. 589-592 2004/06 Research paper (scientific journal)

  62. Characterization of dopant profiles produced by ultra-shallow As implantation and spike annealing using medium energy ion scattering

    S Ichihara, T Nakagawa, M Nitta, S Abo, T Lohner, C Angelov, K Ohta, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 219 p. 584-588 2004/06 Research paper (scientific journal)

  63. Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe

    S Abo, M Mizutani, K Ikeda, A Kinomura, T Iwamatsu, S Maegawa, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 210 p. 216-220 2003/09 Research paper (scientific journal)

  64. Shallow arsenic profiling using medium energy ion scattering (MEIS)

    T Nakagawa, M Fujita, S Ichihara, S Abo, A Kinomura, Y Inoue, M Takai

    Proceedings of the 14th International Conference on Ion Implantation Technology (IIT2002) Vol. 264 - 267 p. 264-267 2002/12 Research paper (international conference proceedings)

  65. Development of enhanced depth-resolution technique for shallow dopant profiles

    M Fujita, J Tajima, T Nakagawa, S Abo, A Kinomura, F Paszti, M Takai, R Schork, L Frey, H Ryssel

    Nuclear Instruments and Methods in Physics Research Section B Vol. 190 p. 26-33 2002/05 Research paper (scientific journal)

  66. Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source

    M. Takai, Y. Arita, S. Abo, T. Iwamatsu, S. Maegawa, H. Sayama, Y. Yamaguchi, M. Inuishi, T. Nishimura

    Proceedings of the 31st European Solid-State Device Research Conference (ESSDERC2001) p. 17-24 2001/12 Research paper (international conference proceedings)

    Publisher: IEEE Computer Society
  67. Suppression of floating body effects in SOI-MOSFET studied using nuclear microprobes

    S Abo, M Mizutani, K Nakayama, T Takaoka, T Iwamatsu, Y Yamaguchi, S Maegawa, T Nishimura, A Kinomura, Y Horino, M Takai

    Nuclear Instruments and Methods in Physics Research Section B Vol. 181 p. 320-323 2001/07 Research paper (scientific journal)

  68. Instability study of partially depleted SOI-MOSFET due to floating body effect using high energy nuclear microprobes

    S Abo, M Mizutani, K Nakayama, T Takaoka, T Iwamatsu, Y Yamaguchi, S Maegawa, T Nishimura, A Kinomura, Y Horino, M Takai

    Proceedings of the 13th International Conference on Ion Implantation Technology (IIT2000) p. 285-288 2000/12 Research paper (international conference proceedings)

  69. Optical transitions in light-emitting nanocrystalline silicon thin films

    T Toyama, Y Kotani, A Shimode, S Abo, H Okamoto

    MRS Online Proceedings Library Vol. 557 p. 469-474 1999/08 Research paper (international conference proceedings)

Misc. 53

  1. グラフェン層での電子回折を利用したGraphene-Insulator-Semiconductor構造電子源の研究

    小市崇央, 河嶋祥吾, 三宅広士, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    信学技報 IEICE Technical Report Vol. ED2024-52 p. 43-44 2024/12

  2. 高電界印加された層状絶縁体における電子透過率のエネルギー依存性

    河嶋祥吾, 小市崇央, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    信学技報 IEICE Technical Report Vol. ED2024-40 p. 4-5 2024/12

  3. Graphene-Insulator-Semiconductor構造電子源における多重反射の効果

    小市崇央, 河嶋祥吾, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    信学技報 IEICE Technical Report Vol. ED2023-40 p. 8-10 2023/12

  4. GIS構造電子源におけるグラフェンの電子透過のシミュレーション

    若家冨士男, 寺門大地, 河嶋祥吾, 阿保智, 長尾昌善, 村上勝久

    信学技報 IEICE Technical Report Vol. ED2022-58 p. 29-30 2022/12

  5. Soft errors in silicon-on-insulator static random access memory induced by high-energy heavy-ion irradiation

    Satoshi Abo, Masatoshi Hazama, Fujio Wakaya, Takahiro Makino, Shinobu Onoda, Takeshi Ohshima, Hidekazu Oda, Mikio Takai

    Proceedings of the 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (11th-RASEDA) p. 105-108 2015/11

  6. Electron emission from pyroelectric crystal excited using high power infra-red laser light and its x-ray source application

    Satoshi Abo, Takahiro Uezato, Fujio Wakaya, Mikio Takai

    Technical Digest of the 27th International Vacuum Nanoelectronics Conference (IVNC2014) 2014/07

  7. Influence of Generated Charge by High Energy Ion Irradiation on Soft Error Rate in SOI SRAM

    M. Hazama, S. Abo, F. Wakaya, T. Makino, S. Onoda, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    JAEA Review, JAEA Takasaki Annual Report 2013 Vol. 2013-059 2014/03

  8. Fabrication of carbon nanotube field emitter with side-gate electrode and its emission property

    Shuhei Okawaki, Shogo Nitta, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Proceedings of the 20th International Display Workshops (IDW'13) Vol. 2 p. 835-838 2013/12

    Publisher: International Display Workshops
  9. 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用

    阿保智, 中浜弘介, 高橋理明, 若家冨士男, 高井幹夫

    信学技報 IEICE Technical Report Vol. ED2013-60 p. 41-45 2013/12

  10. CNT cold cathode with side-gate electrode for flat panel X-ray source

    Shogo Nitta, Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Technical Digest of the 26th International Vacuum Nanoelectronics Conference (IVNC2013) 2013/07

  11. Fabrication of titanium oxide field emitter array on glass substrate

    Takuo Nakatani, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Technical Digest of the 26th International Vacuum Nanoelectronics Conference (IVNC2013) 2013/07

  12. Selective-area growth and field emission properties of titanium-oxide nanowires on glass substrate

    Takuo Nakatani, Fujio Wakaya, Satoshi Abo, Mikio Takai

    Proceedings of the 19th International Display Workshops (IDW'12) Vol. 2 p. 888-891 2012/12

  13. Field emission property of carbon nanotube electron source using side-gate electrode

    Shoqo Nitta, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Proceedings of the 19th International Display Workshops (IDW'12) Vol. 2 p. 858-860 2012/12

  14. 電子ビーム誘起堆積三極構造Pt冷陰極からの縞状電子放出パターンの観測

    北山智久, 阿保智, 若家冨士男, 高井幹夫

    信学技報 IEICE Technical Report Vol. ED2012-62 No. 303 p. 41-44 2012/12

    Publisher: 一般社団法人電子情報通信学会
  15. Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes

    Masatoshi Hazama, Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Proceedings of the 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA) p. 115-118 2012/12

  16. Patterning of Titanium-Oxide Nanostructures on Glass Substrate and Their Field Emission Properties

    Takuo Nakatani, Fujio Wakaya, Satoshi Abo, Mikio Takai

    Technical Digest of the 25th International Vacuum Nanoelectronics Conference (IVNC2012) p. 248-249 2012/07

  17. Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application

    Kosuke Nakahama, Eiichi Kaga, Toshiya Kisa, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Technical Digest of the 25th International Vacuum Nanoelectronics Conference (IVNC2012) p. 44-45 2012/07

  18. Development of a tiny X-ray source controlled by laser light for medical application

    Mikio Takai, Kosuke Nakahama, Eiichi Kaga, Toshiya Kisa, Satoshi Abo, Fujio Wakaya

    Technical Digest of the 25th International Vacuum Nanoelectronics Conference (IVNC2012) p. 68-69 2012/07

  19. Effect of Body-tie Structure Fabricated by Partial Trench Isolation for Suppression of Soft Errors in SOI SRAM Investigated by Helium and Oxygen Ion Probes

    S. Abo, N. Masuda, F. Wakaya, S. Onoda, T. Makino, T. Hirao, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    JAEA Review, JAEA Takasaki Annual Report 2011 Vol. 2011-043 2012

  20. レーザ誘起焦電結晶からの電子放出とX線源への応用

    加賀英一, 中浜弘介, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    信学技報 IEICE Technical Report Vol. ED2011-70 p. 53-57 2011/12

  21. ゲート付電子源を用いたX線源の開発

    真鍋知哉, 新田翔吾, 沖宏吏, 阿保智, 若家冨士男, 高井幹夫

    信学技報 IEICE Technical Report Vol. ED2011-71 p. 59-63 2011/12

  22. Field Emission Property of Titanium-Oxide Nanostructure Fabricated on Glass Substrate with Control of Density and Length

    Fujio Wakaya, Takuo Nakatani, Satoshi Abo, Mikio Takai

    Proceedings of the 18th International Display Workshops (IDW'11) p. 1783-1786 2011/12

  23. Fabrication and Field Emission Properties of Titanium Oxide Nanostructures on Glass Substrate

    WAKAYA Fujio, NAKATANI Takuo, ABO Satoshi, TAKAI Mikio

    IEICE technical report. Electron devices Vol. 111 No. 248 p. 41-45 2011/10/13

    Publisher: The Institute of Electronics, Information and Communication Engineers
  24. Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray source application

    Eiichi Kaga, Toshiya Kisa, Kosuke Nakahama, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Technical Digest of the 24th International Vacuum Nanoelectronics Conference (IVNC2011) p. 109-110 2011/07

  25. Evaluation of Soft Error Rates in SOI SRAM with a Technology Node of 90 nm Using Oxygen Ion Probe

    S. Abo, N. Masuda, F. Wakaya, S. Onoda, T. Makino, T. Hirao, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    JAEA Review, JAEA Takasaki Annual Report 2010 Vol. 2010-065 2011

  26. Long-life carbon nanotube cathode with various surface treatments for backlight unit and lighting

    Mikio Takai, Tomoaki Takikawa, Hiroshi Oki, Katsuhisa Murakami, Satoshi Abo, Fujio Wakaya

    Proceedings of the 17th International Display Workshops (IDW'10) p. 324-325 2010/12

  27. Robust Carbon Nanotube Cathode with Various CNT Diameters and Post Treatments

    Takai Mikio, Takikawa Tomoaki, Oki Hiroshi, Murakami Katsuhisa, Abo Satoshi, Wakaya Fujio

    Proceedings of the 17th International Display Workshops (IDW'10) p. 2025-2028 2010/12

  28. Enhancement of Electron Field Emission from Titanium-Oxide Nanostructure by Ultraviolet Light Irradiation

    Wakaya Fujio, Tatsumi Tomohiko, Murakami Katsuhisa, Abo Satoshi, Takimoto Tadahiko, Takaoka Yoichi, Takai Mikio

    Proceedings of the 17th International Display Workshops (IDW'10) p. 2045-2048 2010/12

  29. Evaluation of Soft Errors using Nuclear Probes in SOI SRAM with Body-tie Structure Fabricated by Partial Trench Isolation

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    Proceedings of the 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (9th-RASEDA) p. 72-75 2010/10

  30. Low energy electron source panel with carbon nanotube

    Weijiang Zhao, Tomoya Manabe, Satoshi Abo, Mikio Takai

    Technical Digest of the 23rd International Vacuum Nanoelectronics Conference (IVNC2010) p. 28-29 2010/07

  31. Fabrication of Titanium-Oxide Nanowires on Glass Substrate and Their Field-Emission Properties

    Fujio Wakaya, Tomoaki Takikawa, Masanori Miki, Chieko Fukuyama, Katsuhisa Murakami, Satoshi Abo, Mikio Takai

    Proceedings of the 16th International Display Workshops (IDW'09) 2009/12

  32. Dependence on Irradiation Energy of Soft Error Rates in Bulk and SOI SRAMs

    S. Abo, S. Onoda, T. Hirao, T. Ohshima, T. Iwamatsu, M. Takai

    JAEA Review, JAEA Takasaki Annual Report 2008 Vol. 2009-041 2009/12

  33. Influence of CNT Diameters of Screen-Printed Cathode on Field Emission Characteristics

    Tomoaki Takikawa, Hiroshi Oki, Yusuke Matsuura, Katsuhisa Murakami, Satoshi Abo, Fujio Wakaya, Mikio Takai

    Proceedings of the 16th International Display Workshops (IDW'09) 2009/12

  34. Evaluation of Single Event Upsets in Integrated Circuits Using Nuclear Probe

    M. Takai, S. Abo, T. Iwamatsu

    Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA) Vol. 53 No. 53 2008/12

  35. Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

    S. Abo, M. Takai, Y. Mokuno, A. Kinomura, S. Onoda, T. Hirao, T. Ohshima, T. Iwamatsu

    Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA) Vol. 183 No. 183 2008/12

  36. Field Emission Property of TiO2 Cathodes after Field Enhanced Surface Treatment

    C. Fukuyama, K. Murakami, S. Abo, F. Wakaya, M. Takai, T. Takimoto, Y. Kumashiro, Y. Takaoka

    Proceedings of the 15th International Display Workshops (IDW'08) Vol. 2061-2063 No. 2061 2008/12

  37. Field Emission Lifetime after Aging of CNT Cathodes

    H. Oki, A. Kinoshita, T. Takikawa, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Proceedings of the 15th International Display Workshops (IDW'08) Vol. 2037-2040 No. 2037 2008/12

  38. The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser

    W. S. Kim, H. Oki, A. Kinoshita, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Proceedings of the 14th International Display Workshops (IDW'07) p. 2173-2176 2007/12

  39. Field emission profiles of CNT cathodes with surface treatment using KrF eximer laser

    A. Kinoshita, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    Proceedings of the 14th International Display Workshops (IDW'07) p. 2177-2180 2007/12

  40. Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition

    K. Murakami, S. Abe, S. Nishihara, S. Abo, F. Wakaya, M. Takai

    Technical Digest of the 20th International Vacuum Nanoelectronics Conference (IVNC'07) p. 26-27 2007/07

  41. Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes

    K. Ohsumi, T. Honda, Kim W. S., C. B. Oh, K. Murakami, S. Abo, F. Wakaya, M. Takai, A. Hosono, S. Nakata, S. Okuda

    Proceedings of the 13th International Display Workshops (IDW'06) p. 1837-1840 2006/12

  42. Field emission characteristics of carbon nanotubes treated by plasma and laser

    Kim W. S., T. Honda, Oh C. B, Oh, K. Ohsumi, K. Murakami, S. Abo S., F. Wakaya, M. Takai

    Proceedings of the 13th International Display Workshops (IDW'06) p. 1841-1844 2006/12

  43. Evaluation of soft errors in SOI-SRAM using nuclear probe

    M. Takai, S. Abo, T. Iwamatsu, S. Maegawa, Y. Arita, M. Inuishi, T. Ipposhi, A. Kinomura, Y. Horino

    Proceedings of the 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (7th-RASEDA) p. 79-84 2006/10

  44. Surface treatment of CNT cathodes using KrF excimer laser for field emission displays

    T. Honda, C. B. Oh, K .Murakami, K. Ohsumi, S. Abo, F. Wakaya, M. Takai

    Proceedings of the 12th International Display Workshops in Conjunction with Asia Display 2005 (IDW/AD '05) p. 1647-1650 2005/12

  45. Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy

    H. Yamagiwa, S. Abo, F. Wakaya, T. Sakatnoto, H. Tokioka, N. Nakagawa, M. Takai

    Proceedings of the 12th International Display Workshops in Conjunction with Asia Display 2005 (IDW/AD '05) p. 973-975 2005/12

  46. Fabrication and characterization of Pt nanosplit emitter using electron beam induced deposition

    K. Murakami, Y. Tsukatani, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    Technical Digest of the 18th International Vacuum Nanoelectronics Conference (IVNC 2005) Vol. 2005 p. 157-158 2005/07

  47. Influence of the Pt cathode resistance on the field emission properties of field emitters fabricated using beam induced deposition

    K. Murakami, N. Yamasaki, S. Abe, Y. Tsukatani, S. Abo, F. Wakaya, M. Takai

    Technical Digest of the 18th International Vacuum Nanoelectronics Conference (IVNC 2005) Vol. 2005 p. 246-247 2005/07

  48. Ultra shallow As profiling before and after spike annealing using medium energy ion scattering

    S Abo, S Ichihara, T Lohner, J Gyulai, F Wakaya, M Takai

    Extended Abstract of the Fifth International Workshop on Junction Technology (IWJT2005) Vol. 5 p. 49-50 2005/06

  49. Suppression of leakage current for nano electron source fabricated using beam assisted process

    YAMASAKI Naoki, MURAKAMI Katsuhisa, ABO Satoshi, WAKAYA Fujio, TAKAI Mikio

    IEICE technical report. Electron devices Vol. 104 No. 519 p. 43-46 2004/12/16

    Publisher: The Institute of Electronics, Information and Communication Engineers
  50. Effect of laser irradiation to carbon nanotube field emission cathode

    ROCHANACHIRAPAR Wasu, MURAKAMI Katsuhisa, YAMASAKI Naoki, HONDA Tomoaki, ABO Satoshi, WAKAYA Fujio, TAKAI Mikio

    Vol. 104 No. 519 p. 7-10 2004/12/16

  51. Ultra-shallow arsenic profiling using enhanced depth-resolution analysis technique with medium energy ion scattering

    M. Takai, S. Ichihara, S. Abo, F. Wakaya, H. Sayama, T. Eimori, Y. Inoue

    Extended Abstracts of the Fourth International Workshop on Junction Technology (IWJT2004) Vol. 4 p. 76-80 2004/03

    Publisher: Institute of Electrical and Electronics Engineers Inc.
  52. Inspection for critical issue of floating body effects in SOI-MOSFET using nuclear particles

    S Abo, M Mizutani, K Nakayama, T Takaoka, T Iwamatsu, Y Yamaguchi, S Maegawa, T Nishimura, A Kinomura, Y Horino, M Takai

    Digest Papers of 2001 International Microprocess and Nanotechinology Conference (MNC2001) p. 70-71 2001/10

  53. 部分空乏化SOI-MOSFETにおける基板浮遊効果抑制シミュレーション

    阿保 智, 水谷 斉治, 高井 幹夫

    大阪大学極限科学研究センタ-報告書 No. 4 p. 9-11 1999

    Publisher: 大阪大学極限科学研究センタ-

Presentations 318

  1. Graphene/Insulator/Semiconductor電子源からの回折波のエネルギー分布

    小市 崇央, 河嶋祥吾, 三宅 広士, 阿保 智, 若家 冨士男, 長尾 昌善, 村上 勝久

    2025年 電子情報通信学会 総合大会 2025/03

  2. 焦電結晶を用いた小型中性子源の中性子発生プロセス

    大上 楓真, 阿保 智, 増澤 智昭, 三村 秀典, 若家 冨士男

    第72回応用物理学会春季学術講演会 2025/03

  3. Graphene/Insulator/Semiconductor電子源からの回折波の検出

    小市 崇央, 三宅 広士, 阿保 智, 若家 冨士男, 長尾 昌善, 村上 勝久

    第72回応用物理学会春季学術講演会 2025/03

  4. Calculation of neutron generation at small neutron source using pyroelectric crystal

    F. Oue, S. Abo, F. Wakaya, T. Masuzawa, H. Mimura

    34th Annual Meeting of MRS-J 2024/12

  5. Effect of Multiple Ion Scattering on Simultaneous Time-of-Flight Rutherford Backscattering Spectrometry and Elastic Recoil Detection Measurements

    S. Abo

    34th Annual Meeting of MRS-J 2024/12

  6. グラフェン層での電子回折を利用したGraphene-Insulator-Semiconductor構造電子源の研究

    小市崇央, 河嶋祥吾, 三宅広士, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    電子情報通信学会 電子デバイス研究会 2024/12

  7. 高電界印加された層状絶縁体における電子透過率のエネルギー依存性

    河嶋祥吾, 小市崇央, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    電子情報通信学会 電子デバイス研究会 2024/12

  8. Numerical Calculation of Particle Trajectory and Scattering in Small Neutron Source Using Pyroelectric Crystal

    Satoshi Abo, Fuma Oue, Tomoaki Masuzawa, Hidenori Mimura, Fujio Wakaya

    The 9th International Symposium on Biomedical Engineering 2024/12

  9. Resistivity measurement for non-magnetic material using high-order resonance mode of MFM cantilever oscillation

    Kazuma Okamoto, Takumi Imura, Satoshi Abo, Fujio Wakaya, Katuhisa Murakami, Masayoshi Nagao

    37th International Microprocesses and Nanotechnology Conference (MNC2024) 2024/11

  10. 電界印加された層状絶縁体における入射電子の干渉効果

    河島祥吾, 小市崇央, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    第85回応用物理学会秋季学術講演会 2024/09

  11. Graphene-Insulator-Semiconductor構造電子源中の単層および多層グラフェンでの電子回折を利用した単色性の向上

    小市崇央, 河嶋祥吾, 三宅広士, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    第85回応用物理学会秋季学術講演会 2024/09

  12. レーザー照射焦電結晶を用いた高強度小型中性子源設計のためのシミュレータ開発

    大上楓真, 阿保智, 若家冨士男, 増澤智昭, 三村秀典

    第85回応用物理学会秋季学術講演会 2024/09

  13. 磁気力顕微鏡を用いた非磁性体抵抗率計測の試料加振による感度の向上

    岡本一真, 大徳慎也, 居村拓弥, 若家冨士男, 阿保智, 村上勝久, 長尾昌善

    第85回応用物理学会秋季学術講演会 2024/09

  14. Enhancement in anomalous Hall conductivity of epitaxial Co2MnGa films induced by Fermi level tuning

    S. Yamada, S. Nagata, K. Yamauchi, T. Usami, S. Abo, T. Oguchi, K. Hamaya

    The 23rd International Conference on Molecular Beam Epitaxy (ICMBE2024) 2024/09

  15. Low-temperature growth of perpendicularly magnetized MnGa thin films on MgO(001) substrate using molecular beam epitaxy

    T. Usami, T. Kiire, Y. Shiratuchi, S. Abo, R. Nakatani, K. Hamaya

    The 23rd International Conference on Molecular Beam Epitaxy (ICMBE2024) 2024/09

  16. Graphene-Insulator-Semiconductor 構造電子源中のグラフェン層での電子回折を利用した単色性の向上

    小市崇央, 河島祥吾, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    第71回応用物理学会春季学術講演会 2024/03

  17. 磁気力顕微鏡の高次振動モードを用いた非磁性体抵抗率計測

    岡本一真, 居村拓弥, 阿保智, 若家冨士男, 村上勝久, 長尾昌善

    第71回応用物理学会春季学術講演会 2024/03

  18. Si置換Co2MnGa薄膜における異常ホール効果

    長田聖海, 山田晋也, 山内邦彦, 宇佐見喬政, 阿保智, 小口多美夫, 浜屋宏平

    「スピントロニクス学術研究基盤と連携ネットワーク(Spin-RNJ)」シンポジウム 2024/03

  19. Graphene-Insulator-Semiconductor構造電子源における多重反射の効果

    小市崇央, 河嶋祥吾, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    電子情報通信学会 電子デバイス研究会 2023/12

  20. 焦電結晶を用いた中性子源の中性子発生数の重水素ガス圧力依存性

    大上楓真, 野見山大地, 一柳翔馬, 阿保智, 若家冨士男

    第33回日本MRS年次大会 2023/11

  21. 飛行時間型ラザフォード後方散乱法と弾性反跳粒子検出法の同時計測

    阿保智, 若家冨士男

    第33回日本MRS年次大会 2023/11

  22. Three-Dimensional Elemental Analysis Using Time-of-Flight Rutherford Backscattering Spectrometry and Elastic Recoil Detection Simultaneous Measurements

    Satoshi Abo, Fujio Wakaya

    26th International Conference on Ion Beam Analysis 2023/10

  23. Development of fingertip-sized miniature x-ray source using laser heated pyroelectric crystal

    Satoshi Abo, Takahiro Uezato, Fujio Wakaya

    The 14th International Vacuum Electron Sources Conference (IVESC2023) 2023/09

  24. Simulation of electron transmission through graphene with inelastic scattering

    Takao Koichi, Shogo Kawashima, Satoshi Abo, Fujio Wakaya, Masayoshi Nagao, Katsuhisa Murakami

    The 14th International Vacuum Electron Sources Conference (IVESC2023) 2023/09

  25. Graphene-Insulator-Semiconductor 構造電子源におけるエネルギーフィルタ効果

    小市崇央, 河島祥吾, 阿保智, 若家冨士男, 長尾昌善, 村上勝久

    第84回応用物理学会秋季学術講演会 2023/09

  26. 磁気力顕微鏡を用いた非磁性金属検出におけるプローブ振動位相の解析解

    若家冨士男, 西出昂雅, 阿保智, 岩渕修一, 金井友希美, 村上勝久, 長尾昌善

    第70回応用物理学会春季学術講演会 2023/03

  27. GIS構造電子源におけるグラフェンの電子透過のシミュレーション

    若家冨士男, 寺門大地, 河嶋祥吾, 阿保智, 長尾昌善, 村上勝久

    電子情報通信学会 電子デバイス研究会 2022/12

  28. Development of neutron source using laser heated pyroelectric crystal

    S. Abo, F. Wakaya, T. Masuzawa, H. Mimura

    32nd Annual Meeting of MRS-J 2022/12

  29. Development of Miniature X-ray and Neutron Sources using Pyroelectric Crystal Heated by Laser Light

    Satoshi Abo, Fujio Wakaya, Tomoaki Masuzawa, Hidenori Mimura

    The 7th International Symoposium on Biomedical Engineering (ISBE2022) 2022/11

  30. Graphene-Insulator-Semiconductor 電子源の電子放出特性のシミュレーション

    若家冨士男, 寺門大地, 阿保智, 長尾昌善, 村上勝久

    第69回応用物理学会春季学術講演会 2022/03

  31. レーザ加熱焦電結晶を用いたポータブルX線源・中性子源の開発

    阿保智, 若家冨士男, 増澤智昭, 三村秀典, 高井幹夫

    第69回応用物理学会春季学術講演会 2022/03

  32. 強誘電体基板上の高配向V3Si薄膜成長

    浅尾拓斗, 山田道洋, 白土優, 阿保智, 真砂啓, 中谷亮一, 小口多美夫, 浜屋宏平

    第82回応用物理学会秋季学術講演会 2021/09

  33. Dependence of graphene strain sensitivity on thickness and crystallinity

    Takeuchi Yuto, Wakaya Fujio, Abo Satoshi, Nagao Masayoshi, Murakami Katsuhisa

    JSAP Annual Meetings Extended Abstracts 2021/03

  34. Lateral Charge Distribution in Si by High-Energy Ion Incidence

    Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda

    30th Annual Meeting of MRS-J 2020/12

  35. Ge基板のヨウ素溶液処理による表面エッチング

    森悠, 濱地 威明, 阿保 智, 酒井 朗, 金島 岳

    第81回応用物理学会秋季学術講演会 2020/09

  36. Development of neutron source using IR heated pyroelectric crystal

    Abo Satoshi, Nomiyama Daichi, Wakaya Fujio

    JSAP Annual Meetings Extended Abstracts 2020/09

  37. Detection of nonmagnetic metal buried in insulator using magnetic force microscopy

    Wakaya Fujio, Oosawa Kenta, Sakamoto Mizuki, Abo Satoshi, Murakami Katsuhisa, Nagao Masayoshi

    JSAP Annual Meetings Extended Abstracts 2020/09

  38. Visualization of three-dimensional structure buried in insulator using magnetic force microscope

    Osawa Kenta, Wakaya Fujio, Abo Satoshi, Murakami Katsuhisa, Nagao Masayoshi

    JSAP Annual Meetings Extended Abstracts 2020/03

  39. イオン散乱法を用いた非破壊三次元元素分析技術

    阿保 智, 若家 冨士男, 高井 幹夫

    日本学術振興会 第158委員会 第131回研究会 2020/03

  40. Nondestructive analysis technique by ion scattering spectroscopy using 150 kV FIB

    Satoshi Abo, Albert Seidl, Fujio Wakaya

    29th Annual Meeting of MRS-J 2019/11

  41. Self-Sensing Cantilever Using Graphene Strain Sensor

    Y. Takeuchi, F. Wakaya, S. Abo, K. Murakami, M. Nagao

    International Symposium for Nano Science 2019/11

  42. Membrane break process in atomic force microscopy

    Fujio Wakaya, Hiroyuki Ishihara, Katsuhisa Murakami, Masayoshi Nagao, Yuji Miyato, Hayato Yamashita, Satoshi Abo, Masayuki Abe

    The 4th International Symposium on Biomedical Engineering 2019/11

  43. Development of ToF-RBS and -ERDA simultaneous measurements with 150 kV FIB

    Satoshi Abo, Takuya Fujimoto, Fujio Wakaya

    24th International Conference on Ion Beam Analysis (IBA2019) 2019/10

  44. 酸化物基板上のCo2FeSiおよびCo2MnSi薄膜の成長形態の違い

    工藤康平, 濱崎恭考, 山田晋也, 阿保智, 合田義弘, 浜屋宏平

    第43回日本磁気学会学術講演会 2019/09

  45. Development of ToF-RBS and -ERDA simultaneous measurements with FIB

    Abo Satoshi, Fujimoto Takuya, Wakaya Fujio

    JSAP Annual Meetings Extended Abstracts 2019/09

  46. Self-sensing cantilever using graphene strain sensor

    Takeuchi Yuto, Wakaya Fujio, Abo Satoshi, Murakami Katsuhisa, Nagao Masayoshi

    JSAP Annual Meetings Extended Abstracts 2019/09

  47. 原子間力顕微鏡法における薄膜破壊プロセスの解析(Ⅱ)

    石原浩行, 若家冨士男, 村上勝久, 長尾昌善, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第66回応用物理学会春季学術講演会 2019/03

  48. 高エネルギーイオン入射によるSi での生成電荷分布計測 (II)

    阿保智, 谷健一, 若家冨士男, 小野田忍, 山下隼人, 宮戸祐治, 阿部真之

    第66回応用物理学会春季学術講演会 2019/03

  49. Si置換したFe2VAlエピタキシャル薄膜の熱伝導率

    工藤康平, 山田晋也, 近田尋一朗, 嶋貫雄太, 石部貴史, 阿保智, 宮崎秀俊, 西野洋一, 中村芳明, 浜屋宏平

    第66回応用物理学会春季学術講演会 2019/03

  50. シングルイベント飛行時間型ラザフォード後方散乱法を用いた非破壊三次元元素分析技術の開発

    阿保 智

    日本学術振興会 第132委員会 第233回研究会 2018/12

  51. Transition of Surface Structure from (1×1) to (1×2) of Rutile TiO2(110)

    S. Ojima, D. Katsube, H. Yamashita, Y. Miyato, S. Abo, M. Abe

    14th International Conference on Atomically Controlled Surfaces Interfaces and Nanostructures (CSIN14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) 2018/10

  52. Cleaning SrTiO3(100) surface for spin device processes

    M. Maeda, D. Katsube, S. Abo, Y. Miyato, H. Yamashita, S. Yamada, K. Hamaya, M. Abe

    14th International Conference on Atomically Controlled Surfaces Interfaces and Nanostructures (CSIN14) in conjunction with 26th International Colloquium on Scanning Probe Microscopy (ICSPM26) 2018/10

  53. ルチル型TiO2(110)表面における(1x1)構造から(1x2)構造への構造遷移観察

    尾島章輝, 勝部大樹, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第79回応用物理学会秋季学術講演会 2018/09

  54. 原子間力顕微鏡法における薄膜破壊プロセスの解析

    石原浩行, 若家冨士男, 村上勝久, 長尾昌善, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第79回応用物理学会秋季学術講演会 2018/09

  55. Measurement of charge distribution in silicon generated by high energy ion incidence

    Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda, Yuji Miyato, Hayato Yamashita, Masayuki Abe

    22nd International Conference on Ion Implantation Technology (IIT2018) 2018/09

  56. Development of combined system of pulsed laser deposition and non-contact atomic force microscopy and imaging of anatase-TiO2(001) (1×4) reconstruction surface,

    D. Katsube, H. Yamashita, S. Abo, F. Wakaya, M. Abe

    20th International Vacuum Congress (IVC-20) 2016/08

  57. Simulation of Electron Emission from Laser-Irradiated Pyroelectric Crystal

    Tenta Komatsu, Satoshi Abo, Fujio Wakaya, Mikio Takai, Tomoaki Masuzawa, Hidenori Mimura

    31st International Vacuum Nanoelectronics Conference (IVNC2018) 2018/07

  58. Tertiary Electrons in Single-Event Time-of-Flight Backscattering Spectrometry

    S. Abo, A. Seidl, F. Wakaya, M. Takai

    16th International Conference on Nuclear Microprobe Technology and Applications 2018/07

  59. Simulation for Electron Emission from Laser-Irradiated Pyroelectric Crystal

    Komatsu Tenta, Wakaya Fujio, Abo Satoshi, Takai Mikio, Masuzawa Tomoaki, Mimura Hidenori

    JSAP Annual Meetings Extended Abstracts 2018/03

  60. 非接触原子間力顕微鏡を用いたルチル型TiO2(110) (1×2)再構成表面の原子分解能観察

    尾島章輝, 勝部大樹, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第65回応用物理学会春季学術講演会 2018/03

  61. 電子ビーム誘起堆積 Pt を用いた自己検出型カンチレバーの変位感度

    樫田健太, 若家冨士男, 村上勝久, 山下隼人, 宮戸祐治, 阿保智, 阿部真之

    第65回応用物理学会春季学術講演会 2018/03

  62. Development of in-vitro experiment system of magnetic hyperthermia

    Y. Shiode, H. Yamashita, K. Fujiwara, T. Ide, S. Abo, Y. Miyato, Y. Ichiyanagi, M. Abe

    International Symposium on Nanomedicine 2017 2017/12

  63. Imaging contrasts of anatase-TiO2(001)(1×4) surface using non-contact atomic force microscopy

    Daiki Katsube, Yuji Miyato, Hayato Yamashita, Satoshi Abo, Masayuki Abe

    11th International Symposium on Atomic Level Characterization for New Materials and Devices ’17 (ALC’17) 2017/12

  64. Development of in-vitro experiment system of magnetic hyperthermia

    Y. Shiode, H. Yamashita, K. Fujiwara, T. Ide, S. Abo, Y. Miyato, Y. Ichiyanagi, M. Abe

    The Irago Conference 2017 Interdisciplinary Research and Global Outlook 2017/11

  65. Simulation of fine focus time-of-flight RBS using TRIM backscattering data

    A. Seidl, S. Abo, M. Takai

    The 23rd International Conference on Ion Beam Analysis 2017/10

  66. パルレーザー堆積/非接触原子間力顕微鏡複合装置によるLaAlO3(100)表面の原子分解能観察

    勝部大樹, 山下隼人, 宮戸祐治, 阿保智, 阿部真之

    日本金属学会2017秋季講演大会 2017/09

  67. 非接触原子間力顕微鏡によるアナターゼ型TiO2(001)のイメージングコントラスト

    勝部大樹, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第78回応用物理学会秋季学術講演会 2017/09

  68. ガラスキャピラリを用いた大気中粒子線励起X線放出

    柴田悠宇, 井澤和哉, 阿保智, 若家冨士男, 山下隼人, 阿部真之

    第78回応用物理学会秋季学術講演会 2017/09

  69. 高エネルギーイオン入射によるSiでの生成電荷分布計測

    谷健一, 阿保智, 若家冨士男, 小野田忍, 山下隼人, 宮戸祐治, 阿部真之

    第78回応用物理学会秋季学術講演会 2017/09

  70. 高速原子間力顕微鏡計測における温度制御デバイスの開発

    加藤恭介, 山下隼人, 阿保智, 宮戸祐治, 阿部真之

    第78回応用物理学会秋季学術講演会 2017/09

  71. 電子ビーム誘起堆積Ptを用いた自己検出型カンチレバーの開発

    樫田健汰, 若家冨士男, 山下隼人, 宮戸祐治, 阿保智, 阿部真之

    第78回応用物理学会秋季学術講演会 2017/09

  72. パルスレーザー堆積/非接触原子間力顕微鏡複合装置によるLaAlO3(100)表面の観察

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第64回応用物理学会春季学術講演会 2017/03

  73. 非接触原子間力顕微鏡によるアナターゼ型TiO2(001)表面の研究

    勝部大樹, 宮戸祐治, 山下隼人, 阿保智, 阿部真之

    第8回真空・表面科学若手研究会 2017/10

  74. Effect of tertiary electrons in single event time-of-flight Rutherford backscattering spectrometry

    S. Abo, A. Seidl, F. Wakaya, M. Abe, M. Takai

    The 29th International Microprocesses and Nanotechnology Conference (MNC 2016) 2016/11

  75. Development of Combined System of Pulsed Laser Deposition and Non-Contact Atomic Force Microscopy and High Resolution Imaging of Anatase-TiO2(001) Reconstructed Surface

    D. Katsube, H. Yamashita, S. Abo, F. Wakaya, M. Abe

    The 29th International Microprocesses and Nanotechnology Conference (MNC 2016) 2016/11

  76. アナターゼ型TiO2(001)表面の非接触原子間力顕微鏡測定

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第159回日本金属学会講演会 2016/09

  77. アナターゼ型TiO2(001)表面のフォースカーブ測定

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第77回応用物理学会秋季学術講演会 2016/09

  78. パルスレーザー堆積/非接触原子間力顕微鏡複合装置の開発とアナターゼ型TiO2(001)表面の高分解能測定

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第63回応用物理学会春季学術講演会 2016/03

  79. パルスレーザー堆積/原子間力顕微鏡複合装置の開発とアナターゼ型TiO2(001)表面の観察

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第11回日本表面科学会放射光科学研究部会・顕微ナノ材料科学研究会合同シンポジウム 2016/03

  80. X-ray Charge Neutralizer Using Carbon-Nanotube Field Emitter

    S. Okawaki, S. Abo, F. Wakaya, H. Yamashita, M. Abe, M. Takai

    28th International Microprocesses and Nanotechnology Conference (MNC2015) 2015/11

  81. High resolution imaging of LaAlO3(100) using non-contact atomic force microscopy

    Daiki Katsube, Yutaro Takase, Hayato Yamashita, Satoshi Abo, Fujio Wakaya, Masayuki Abe

    10th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC’15) 2015/10

  82. X-ray charge neutralizer using carbon-nanotube field emitter

    S. Okawaki, S. Abo, F. Wakaya, H. Yamashita, M. Abe, M. Takai

    7th Japan-Korea Vacuum Nanoelectronics Symposium (7th-KJVNS) 2015/10

  83. SiO2/Si基板上のグラフェンの紫外レーザによる加工のメカニズム

    萬木成彰, 若家冨士男, 阿保智, 山下隼人, 阿部真之, 高井幹夫

    第76回応用物理学会秋季学術講演会 2015/09

  84. 高エネルギー重イオン入射によるSOI-SRAMのソフトエラー発生の生成電荷分布依存性評価

    阿保智, 迫間昌俊, 若家冨士男, 小野田忍, 牧野高紘, 大島武, 尾田秀一, 高井幹夫

    第76回応用物理学会秋季学術講演会 2015/09

  85. シングルイベント三次元TOF-RBS の時間分解能評価(III)

    阿保智, 濱田靖久, Seidl Albert, 若家冨士男, 阿部真之, 高井幹夫

    第76回応用物理学会秋季学術講演会 2015/09

  86. 非接触原子間力顕微鏡を用いたLaAlO3(100)表面の原子分解能測定

    勝部大樹, 高瀬勇太郎, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    第76回応用物理学会秋季学術講演会 2015/09

  87. Dependence of soft errors in silicon-on-insulator static random access memory on distribution of energy deposition by high-energy heavy-ion incidence

    S. Abo, M. Hazama, F. Wakaya, T. Makino, S. Onoda, T. Ohshima, H. Oda, M. Takai

    22nd International Conference on Ion Beam Analysis (IBA2015) 2015/06

  88. A third electron model for simulation of electron yield for triggering in fine focused time-of-flight Rutherford backscattering spectrometry

    A. Seidl, S. Abo, Y. Hamada, F. Wakaya, M. Abe, M. Takai

    22nd International Conference on Ion Beam Analysis (IBA2015) 2015/06

  89. ビーム誘起堆積Pt電子源からの縞状電子放出パターンの起源について

    若家冨士男, 山田芳生, 村上勝久, 阿保智, 阿部真之, 高井幹夫

    第12回真空ナノエレクトロニクスシンポジウム 2015/03

  90. Observation of Fringelike Emission Pattern in Magnetic Field

    Yoshio Yamada, Satoshi Abo, Fujio Wakaya, Katsuhisa Murakami, Masayuki Abe, Mikio Takai

    The 21st International Display Workshops (IDW ’14) 2014/12

  91. X-Ray Source Using CNT Field Emitter with Side-Gate Electrode

    S. Okawaki, S. Abo, F. Wakaya, M. Abe and M. Takai

    27th International Microprocesses and Nanotechnology Conference (MNC2014) 2014/11

  92. Maskless Laser Processing of Graphene

    Fujio Wakaya, Tadashi Kurihara, Nariaki Yurugi, Satoshi Abo, Masayuki Abe, Mikio Takai

    40th Micro and Nano Engineering (MNE2014) 2014/09

  93. サイドゲート電極付CNT電子源を用いたX線源の開発

    岡脇周平, 阿保智, 若家冨士男, 高井幹夫

    第75回応用物理学会秋季学術講演会 2014/09

  94. 赤外レーザ励起タンタル酸リチウムX線源の特性評価

    上里鷹寛, 阿保智, 若家冨士男, 高井幹夫

    第75回応用物理学会秋季学術講演会 2014/09

  95. 電子ビーム誘起堆積Ptナノ電子源からの縞状電子放出パターンの磁場中での観察

    山田芳生, 阿保智, 若家冨士男, 村上勝久, 阿部真之, 高井幹夫

    第75回応用物理学会秋季学術講演会 2014/09

  96. マスクレス加工のためのグラフェンへの紫外レーザ照射(III)

    萬木成彰, 若家冨士男, 阿保智, 阿部真之, 高井幹夫

    第75回応用物理学会秋季学術講演会 2014/09

  97. 静電型分析器を用いたTOF-ERDAによる極浅原子分布分析技術の開発(II)

    阿保智, 李沛, 姚欣遠, 若家冨士男, 高井幹夫

    第75回応用物理学会秋季学術講演会 2014/09

  98. Development of miniature x-ray source using pyroelectric crystal excited by laser light

    Satoshi Abo, Takahiro Uezato, Fujio Wakaya, Masayuki Abe, Mikio Takai

    The 6th IEEE International Nanoelectronics Conference 2014 (INEC2014) 2014/07

  99. 紫外レーザによるグラフェンの層数選択的加工

    萬木成彰, 栗原正志, 若家冨士男, 阿保智, 阿部真之, 高井幹夫

    ナノ構造情報のフロンティア開拓 平成26年度 若手の会 2014/07

  100. 自己分析型 液中分子分解能AFMの開発

    二瓶恵, 阿保智, 若家冨士男, 阿部真之

    ナノ構造情報のフロンティア開拓 平成26年度 若手の会 2014/07

  101. イオンプローブを用いたナノ構造非破壊分析技術

    阿保智, 若家冨士男, 阿部真之, 高井幹夫

    ナノ構造情報のフロンティア開拓 平成26年度 若手の会 2014/07

  102. Improvement of spatial resolution and detection efficiency control of secondary-electron in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry

    Satoshi Abo, Yasuhisa Hamada, Albert Seidl, Fujio Wakaya, Mikio Takai

    14th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2014) 2014/07

  103. Electron emission from pyroelectric crystal excited using high power infra-red laser light and its X-ray source application

    Satoshi Abo, Takahiro Uezato, Fujio Wakaya, Mikio Takai

    27th International Vacuum Nanoelectronics Conference (IVNC2014) 2014/07

  104. Spreading resistance profiling of ultra shallow junction fabricated with low energy As implantation and combination of spike lamp and laser annealing processes using scanning spreading resistance microscopy

    Satoshi Abo, Hidenori Osae, Fujio Wakaya, Hidekazu Oda, Mikio Takai

    20th International Conference on Ion Implantation Technology (IIT2014) 2014/06

  105. サイドゲート電極付CNT電子源のFN plotに関する考察

    岡脇修平, 阿保智, 若家冨士男, 高井幹夫

    第61回応用物理学関係連合講演会 2014/03

  106. Nd:YLFレーザ励起による焦電結晶からの電子放出とX線源への応用

    阿保智, 上里鷹寛, 若家冨士男, 高井幹夫

    第11回真空ナノエレクトロニクスシンポジウム 2014/03

  107. Fabrication of carbon nanotube field emitter with side-gate electrode and its emission property

    S. Okawaki, S. Nitta, S. Abo, F. Wakaya, M. Takai

    The 20th International Display Workshops (IDW ’13) 2013/12

  108. Analysis technique for ultra shallow junction using medium-energy-ion-scattering time-of-flight elastic-recoil-detection-analysis

    Satoshi Abo, Per Ri, Xin Yuan Yao, Fujio Wakaya, Mikio Takai

    9th International Symposium on Atomic Level Characterization for New Materials and Devices (ALC ’13) 2013/12

  109. LiNbO3/LiTaO3の焦電効果を使ったX線発生

    阿保智, 中浜弘介, 加賀英一, 木佐俊哉, 高橋理明, 若家冨士男, 高井幹夫

    2013年度 第3回光材料応用技術研究会 2013/11

  110. Active dopant profiling using scanning probe at ultra-shallow As implanted Si activated by combination of spike lamp and laser annealing

    H. Osae, S. Abo, F. Wakaya, T. Iwamatsu, H. Oda, M. Takai

    26th International Microprocesses and Nanotechnology Conference (MNC2013) 2013/11

  111. Evaluation of soft error in silicon-on-insulator static random access memory using high-energy heavy-ion probes

    M. Hazama, S. Abo, F. Wakaya, T. Makino, S. Onoda, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    26th International Microprocesses and Nanotechnology Conference (MNC2013) 2013/11

  112. Observation for graphene using magnetic force microscopy

    K. Maruishi, F. Wakaya, S. Abo, M. Takai

    26th International Microprocesses and Nanotechnology Conference (MNC2013) 2013/11

  113. 赤外レーザ励起による焦電結晶からの電子放出とX線源への応用

    阿保智, 中浜弘介, 高橋理明, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2013/10

  114. Electron emission from pyroelectric crystals excited using laser light and its X-ray source application

    Satoshi Abo, Kosuke Nakahama, Michiaki Takahashi, Fujio Wakaya, Mikio Takai

    5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS) 2013/10

  115. Fabrication of field emitter cathodes with nano materials and their characterization for vacuum nanoelectronics application

    Mikio Takai, Satoshi Abo, Fujio Wakaya

    5th Japan-Korea Vacuum Nanoelectronics Symposium (5th-JKVNS) 2013/10

  116. SSRMを用いた極浅接合の活性化不純物分布評価(II)

    押秀徳, 阿保智, 若家冨士男, 岩松俊明, 尾田秀一, 高井幹夫

    第74回応用物理学会学術講演会 2013/09

  117. 磁気力顕微鏡によるグラフェンの観察II

    丸石宏達, 若家冨士男, 阿保智, 高井幹夫

    第74回応用物理学会学術講演会 2013/09

  118. 高エネルギーイオンプローブを用いたSOI-SRAMソフトエラー発生率のBOX下生成電荷依存性

    迫間昌俊, 阿保智, 若家冨士男, 牧野高紘, 小野田忍, 大島武, 岩松俊明, 尾田秀一, 高井幹夫

    第74回応用物理学会学術講演会 2013/09

  119. 紫外レーザー照射によるグラフェンの層数選択プロセス

    栗原正志, 若家冨士男, 阿保智, 高井幹夫

    第74回応用物理学会学術講演会 2013/09

  120. Graphene layer number selective process by ultra violet laser irradiation

    Tadashi Kurihara, Fujio Wakaya, Satoshi Abo, Mikio Takai

    39th International Conference on Micro and Nano Engineering (MNE2013) 2013/09

  121. Effect of electron focusing in x-ray source using LiTaO3 crystal excited by Nd:YLF laser light

    K. Nakahama, M. Takahashi, S. Abo, F. Wakaya, M. Takai

    26th International Vacuum Nanoelectronics Conference (IVNC2013) 2013/07

  122. Fabrication of titanium oxide field emitter array on glass substrate

    T. Nakatani, S. Abo, F. Wakaya, M. Takai

    26th International Vacuum Nanoelectronics Conference (IVNC2013) 2013/07

  123. CNT cold cathode with side-gate electrode for flat panel x-ray source

    Shogo Nitta, Shuhei Okawaki, Satoshi Abo, Fujio Wakaya, Mikio Takai

    26th International Vacuum Nanoelectronics Conference (IVNC2013) 2013/07

  124. Control of secondary-electron flight-path for time-resolution improvement in single-event three dimensional TOF-RBS

    Satoshi Abo, Yasuhisa Hamada, Albert Seidl, Fujio Wakaya, Mikio Takai

    21st International Conference on Ion Beam Analysis (IBA2013) 2013/06

  125. サイドゲート電極付CNT電子源の開発

    新田翔吾, 岡脇修平, 阿保智, 若家冨士男, 高井幹夫

    第60回応用物理学関係連合講演会 2013/03

  126. マスクレス加工のためのグラフェンへの紫外レーザー照射(II)

    栗原正志, 若家冨士男, 阿保智, 高井幹夫

    第60回応用物理学関係連合講演会 2013/03

  127. シングルイベント三次元TOF-RBSの時間分解能評価(II)

    濱田靖久, 阿保智, Albert Seidl, 若家冨士男, 高井幹夫

    第60回応用物理学関係連合講演会 2013/03

  128. 磁気力顕微鏡によるグラフェンの観察

    丸石宏達, 若家冨士男, 阿保智, 高井幹夫

    第60回応用物理学関係連合講演会 2013/03

  129. Relationship between soft error rate on SOI-SRAM and amount of generated charge by high energy ion probes

    Masatoshi Hazama, Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    The 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (10th-RASEDA) 2012/12

  130. Selective-area growth and field emission properties of titanium-oxide nanowires on glass substrate

    Takuo Nakatani, Fujio Wakaya, Satoshi Abo, Mikio Takai

    The 19th International Display Workshops in Conjunction with Asia Display 2012 (IDW ’12) 2012/12

  131. Field emission property of carbon nanotube electron source using side-gate electrode

    Shogo Nitta, Satoshi Abo, Fujio Wakaya, Mikio Takai

    The 19th International Display Workshops in Conjunction with Asia Display 2012 (IDW ’12) 2012/12

  132. 電子ビーム誘起堆積三極構造Ptナノ電子源からの縞状電子放出パターンの観測

    北山智久, 阿保智, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2012/11

  133. Contactless sheet resistivity measurement using magnetic force microscopy

    F. Wakaya, M. Kajiwara, S. Abo, M. Takai

    25th International Microprocesses and Nanotechnology Conference (MNC2012) 2012/10

  134. Ultra-violet laser processing of graphene on SiO2/Si

    Fujio Wakaya, Tadashi Kurihara, Satoshi Abo, Mikio Takai

    38th International Conference on Micro and Nano Engineering (MNE2012) 2012/09

  135. マスクレス加工のためのグラフェンへの紫外レーザー照射

    栗原正志, 若家冨士男, 阿保智, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  136. 高エネルギーイオンプローブを用いたSOI-SRAMのソフトエラー発生率の生成電荷依存性

    迫間昌俊, 阿保智, 増田直之, 若家冨士男, 小野田忍, 牧野高紘, 平尾敏雄, 大島武, 岩松俊明, 尾田秀一, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  137. SSRMを用いた極浅接合の活性化不純物の深さ分布評価

    押秀徳, 牛込直弥, 阿保智, 若家冨士男, 岩松俊明, 尾田秀一, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  138. レーザー励起によるLiTaO3からの電子放出とX線源への応用(III)

    中浜弘介, 加賀英一, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  139. ガラス基板上酸化チタンナノ構造のパターニング

    中谷卓央, 若家冨士男, 阿保智, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  140. 電子ビーム誘起堆積三極構造Ptナノ電子源からの縞状電子放出パターンの観測(II)

    北山智久, 阿保智, 若家冨士男, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  141. 静電型分析器を用いたTOF-ERDAによる極浅原子分布分析技術の開発

    李沛, 堀内英完, 阿保智, 若家冨士男, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  142. シングルイベント三次元TOF-RBSの時間分解能評価

    濱田靖久, 阿保智, 若家冨士男, 高井幹夫

    第73回応用物理学会学術講演会 2012/09

  143. Improvement of time resolution in single-event three-dimensional TOF-RBS using beryllium nanoprobe

    Satoshi Abo, Yasuhisa Hamada, Fujio Wakaya, Mikio Takai

    13th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2012) 2012/07

  144. Patterning of titanium-oxide nanostructures on glass substrate and their field emission properties

    Takuo Nakatani, Fujio Wakaya, Satoshi Abo, Mikio Takai

    25th International Vacuum Nanoelectronics Conference (IVNC2012) 2012/07

  145. Observation of fringelike electron emission pattern from triode Pt nano electron source fabricated by electron-beam-induced deposition

    Tomohisa Kitayama, Fujio Wakaya, Satoshi Abo, Mikio Takai

    25th International Vacuum Nanoelectronics Conference (IVNC2012) 2012/07

  146. Electron emission from LiTaO3 crystal excited by Nd:YLF laser light and its X-ray source application

    Kosuke, Nakahama, Eiichi Kaga, Toshiya Kisa, Satoshi Abo, Fujio Wakaya, Mikio Takai

    25th International Vacuum Nanoelectronics Conference (IVNC2012) 2012/07

  147. Development of planar X-ray source using gated CNT emitter

    Tomoya Manabe, Shogo Nitta, Satoshi Abo, Fujio Wakaya, Mikio Takai

    25th International Vacuum Nanoelectronics Conference (IVNC2012) 2012/07

  148. Development of a tiny X-ray source controlled by laser light for medical application

    Mikio Takai, Kosuke, Nakahama, Eiichi Kaga, Toshiya Kisa, Satoshi Abo, Fujio Wakaya

    25th International Vacuum Nanoelectronics Conference (IVNC2012) 2012/07

  149. Active dopant profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscopy

    Satoshi Abo, Naoya Ushigome, Hidenori Osae, Fujio Wakaya, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    19th International Conference on Ion Implantation Technology (IIT2012) 2012/06

  150. ゲート付CNT電子源を用いた平面型X線源の開発

    新田翔吾, 真鍋知哉, 阿保智, 若家冨士男, 高井幹夫

    第59回応用物理学関係連合講演会 2012/03

  151. 周期的なレーザ照射によるLiTaO3からの電子放出とX線源への応用

    中浜弘介, 加賀英一, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    第59回応用物理学関係連合講演会 2012/03

  152. 集束イオンビームを用いたシングルイベント三次元TOF-RBS計測の空間分解能評価

    阿保智, 東嵩之, 熊野俊也, 若家冨士男, 高井幹夫

    第59回応用物理学関係連合講演会 2012/03

  153. CNT電子源及びレーザー励起焦電体を用いたX線源の開発

    真鍋知哉, 加賀英一, 阿保智, 若家冨士男, 高井幹夫

    第9回真空ナノエレクトロニクスシンポジウム 2012/03

  154. Contactless determination of local sheet resistivity using magnetic force microscopy

    Fujio Wakaya, Masahiro Kajiwara, Satoshi Abo, Mikio Takai

    24th International Microprocesses and Nanotechnology Conference (MNC2011) 2011/10

  155. ガラス基板上酸化チタンナノ構造の作製と電界電子放出特性

    若家冨士男, 中谷卓央, 阿保智, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2011/10

  156. ゲート付CNT電子源を用いたX線源の開発

    真鍋知哉, 新田翔吾, 沖宏吏, 阿保智, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2011/10

  157. レーザ誘起焦電結晶からの電子放出とX線源への応用

    加賀英一, 中浜弘介, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2011/10

  158. Carbon nanotube cathode with laser and high electric field treatments for field emission display

    Mikio Takai, Tomoya Manabe, Tomoaki Takikawa, Hiroshi Oki, Satoshi Abo, Fujio Wakaya

    11th International Meeting on Information Display (iMiD 2011) 2011/10

  159. 酸素イオンプローブを用いた90nmノードSOI SRAMのソフトエラー耐性評価

    阿保智, 増田直之, 若家冨士男, 高井幹夫, 平尾敏雄, 小野田忍, 牧野高紘, 大島武, 岩松俊明, 尾田秀一

    第6回高崎量子応用研究シンポジウム 2011/10

  160. Effects of ultra-violet laser irradiation on graphene

    Fujio Wakaya, Tsuyoshi Teraoka, Toshiya Kisa, Tomoya Manabe, Satoshi Abo, Mikio Takai

    37th International Conference on Micro and Nano Engineering (MNE2011) 2011/09

  161. 微小電子源のためのガラス基板酸化チタンナノ構造の作製

    中谷卓央, 若家冨士男, 阿保智, 高井幹夫

    第72回応用物理学会学術講演会 2011/08

  162. 赤外レーザ励起によるLiNbO3とLiTaO3からの電子放出とX線源への応用

    中浜弘介, 加賀英一, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    第72回応用物理学会学術講演会 2011/08

  163. 電子ビーム誘起堆積三極構造Ptナノ電子源からの縞状電子放出パターンの観測

    北山智久, 阿保智, 若家冨士男, 高井幹夫

    第72回応用物理学会学術講演会 2011/08

  164. Electron emission from pyroelectric crystals excited by Nd:YLF laser light and their X-ray source application

    E. Kaga, K. Nakahama, T. Kisa, S. Abo, F. Wakaya

    3rd Japan-Korea Vacuum Nanoelectronics Symposium (3rd-JKVNS) 2011/08

  165. Electron emission from LiTaO3 and LiNbO3 crystals excited by Nd:YLF laser light and their X-ray application

    Eiichi Kaga, Toshiya Kisa, Kosuke Nakahama, Satoshi Abo, Fujio Wakaya, Mikio Takai

    24th International Vacuum Nanoelectronics Conference (IVNC2011) 2011/07

  166. Fabrication of titanium-oxide nanostructures on glass substrate and field-emission properties

    Fujio Wakaya, Takuo Nakatani, Satoshi Abo, Mikio Takai

    24th International Vacuum Nanoelectronics Conference (IVNC2011) 2011/07

  167. Field emission property of titanium-oxide nanostructure fabricated on glass substrate with control of density and length

    Fujio Wakaya, Takuo Nakatani, Satoshi Abo, Mikio Takai

    18th International Display Workshops (IDW ’11) 2011/07

  168. Time of flight elastic recoil detection analysis with toroidal electrostatic analyzer for ultra shallow dopant profiling

    Satoshi Abo, Hidemasa Horiuchi, Fujio Wakaya, Gabor Battistig, Tivadar Lohner, Mikio Takai

    8th International Symposium on Atomic Level Characterization for New Materials and Devices (ALC11) 2011/05

  169. Three dimensional measurement of nano structures by single event TOF-RBS with nuclear nano probe

    Satoshi Abo, Shunya Kumano, Takayuki Azuma, Ryota Sugimoto, Katsuhisa Murakami, Fujio Wakaya, Mikio Takai

    20th International Conference on Ion Beam Analysis (IBA2011) 2011/04

  170. Effect of body-tie structure fabricated by partial trench isolation on suppression of soft errors in SOI SRAM induced by floating body effect using nuclear probes

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Takahiro Makino, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    20th International Conference on Ion Beam Analysis (IBA2011) 2011/04

  171. Robust carbon nanotube cathode with various CNT diameters and post treatments

    M. Takai, T. Takikawa, H. Oki, K. Murakami, S. Abo, F. Wakaya

    The 17th International Display Workshops (IDW ’10) 2010/12

  172. Electron field emission from titanium-oxide nanostructure by ultraviolet light irradiation

    F. Wakaya, T. Tatsumi, K. Murakami, S. Abo, T. Takimoto, Y. Takaoka, M. Takai

    The 17th International Display Workshops (IDW ’10) 2010/12

  173. Electron emission from LiNbO3 crystal excited by Nd:YLF laser and its X-ray source application

    T. Kisa, E. Kaga, K. Murakami, S. Abo, F. Wakaya, I. Barsony, M. Takai

    The 23rd International Microprocesses and Nanotechnology Conference (MNC2010) 2010/11

  174. Evaluation of soft errors using nuclear probes in SOI SRAM with body-tie structure fabricated by partial trench isolation

    S. Abo, N. Masuda, F. Wakaya, S. Onoda, T. Makino, T. Hirao, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    The 9th International Workshop on Radiation Effects of Semiconductor Devices for Space Applications (9th-RASEDA) 2010/10

  175. 酸素イオンプローブを用いた90nmノードSOI SRAMのソフトエラー耐性評価

    平尾敏雄, 小野田忍, 牧野高紘, 大島武, 阿保智, 増田直之, 若家冨士男, 高井幹夫, 岩松俊明, 尾田秀一

    第5回高崎量子応用研究シンポジウム 2010/10

  176. Long-life carbon nanotube cathode with various surface treatment for backlight unit and lighting

    M. Takai, T. Takikawa, H. Oki, K. Murakami, S. Abo, F. Wakaya

    The 10th International Meeting on Information Display / International Display Manufacturing Conference and Asia Display 2010 (iMiD/IDMC/ASIA DISPLAY 2010) 2010/10

  177. Improvement of current sensitivity in detecting current-induced magnetic field using magnetic force microscopy

    Fujio Wakaya, Masahiro Kajiwara, Kazuya Kubo, Satoshi Abo, Mikio Takai

    The 36th International Conference on Micro and Nano Engineering (MNE2010) 2010/09

  178. イオンプローブを用いたBulk/SOI-SRAMのソフトエラー発生率評価

    阿保智, 増田直之, 若家冨士男, 小野田忍, 牧野高紘, 平尾敏雄, 大島武, 高井幹夫

    第71回応用物理学会学術講演会 2010/09

  179. SSRMを用いたスパイクアニールとレーザーアニールの組み合わせによる不純物活性化の比較

    牛込直弥, 西川和久, 阿保智, 若家冨士男, 岩松俊明, 尾田秀一, 高井幹夫

    第71回応用物理学会学術講演会 2010/09

  180. 大面積CNT冷陰極を用いた低エネルギー電子源の開発

    真鍋知哉, 趙維江, 滝川友章, 阿保智, 若家冨士男, 高井幹夫

    第71回応用物理学会学術講演会 2010/09

  181. Nd:YLFレーザー誘起LiNbO3結晶からの電子放出とX線発生

    加賀英一, 木佐俊哉, 阿保智, 若家冨士男, 高井幹夫

    第71回応用物理学会学術講演会 2010/09

  182. TEAを用いたTOF-ERDAによる極浅原子分布解析法の開発研究

    堀内英完, 阿保智, 若家冨士男, 高井幹夫

    第71回応用物理学会学術講演会 2010/09

  183. Three dimensional measurement of nano structure by single event TOF RBS with nuclear nano probe

    S. Abo, S. Kumano, T. Azuma, R. Sugimoto, K. Murakami, F. Wakaya, M. Takai

    The 12th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2010) 2010/07

  184. Effect of body-tie structure fabricated by partial trench isolation on suppression of soft errors in SOI SRAM induce by floating body effect using nuclear probes

    S. Abo, N. Masuda, F. Wakaya, S. Onoda, T. Makino, T. Hirao, T. Ohshima, T. Iwamatsu, H. Oda, M. Takai

    The 12th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2010) 2010/07

  185. Low energy electron source panel with carbon nanotube

    W. Zhao, T. Manabe, S. Abo, M. Takai

    The 23rd International Vacuum Nanoelectronics Conference (IVNC2010) 2010/07

  186. Effect of ultra-violet light irradiation on electron field emission from titanium-oxide nanostructure

    F. Wakaya, T. Tatsumi, K. Murakami, S. Abo, M. Takai, T. Takimoto, T. Takaoka

    The 23rd International Vacuum Nanoelectronics Conference (IVNC2010) 2010/07

  187. Local resistance profiling of ultra shallow junction annealed with combination of spike lamp and laser annealing processes using scanning spreading resistance microscope

    Satoshi Abo, Kazuhisa Nishikawa, Naoya Ushigome, Fujio Wakaya, Toshiaki Iwamatsu, Hidekazu Oda, Mikio Takai

    The 18th International Conference on Ion Implantation Technology (IIT2010) 2010/06

  188. 電流誘起磁場検出のためのMFMプローブの最適化

    梶原正裕, 久保一哉, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第57回応用物理学関係連合講演会 2010/03

  189. ビーム誘起堆積Pt冷陰極の電気伝導特性と電界表出電子の可干渉性

    高本邦生, 寺岡剛, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第57回応用物理学関係連合講演会 2010/03

  190. 酸化チタンナノ構造の作製と電界放出特性

    辰巳智彦, 三木真徳, 福山知恵子, 村上勝久, 阿保智, 若家冨士男, 高井幹夫, 滝本理人, 高岡陽一

    第57回応用物理学関係連合講演会 2010/03

  191. Nd:YAGレーザー誘起によるLiNbO3結晶からの電子放出

    木佐俊哉, 村上勝久, 阿保智, 若家冨士男, 石田稔幸, 高井幹夫

    第57回応用物理学関係連合講演会 2010/03

  192. Influence of CNT diameters of screen-printed cathode on field emission characteristics

    T. Takikawa, H. Oki, Y. Matsuura, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 16th International Display Workshop (IDW ’09) 2009/12

  193. Fabrication of titanium-oxide nanowires on glass substrate and their field-emission properties

    F. Wakaya, T. Takikawa, M. Miki, C. Fukuyama, K. Murakami, S. Abo. M. Takai

    The 16th International Display Workshop (IDW ’09) 2009/12

  194. Fabrication of field emitter cathodes and their characterization for vacuum nanoelectronics application

    M. Takai, T. Takikawa, H. Oki, C. Fukuyama, K. Murakami, S. Abo, F. Wakaya

    The 1st Korea-Japan Vacuum Nanoelectronics Workshop (1st-KJVNW) 2009/11

  195. 電子ビーム誘起堆積Ptナノワイヤーの電気伝導に対する電流の効果

    寺岡剛, 高本邦生, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第70回応用物理学会学術講演会 2009/09

  196. 集束イオンビームを用いたTOF-RBS法の時間分解能改良

    熊野俊也, 阿保智, 村上勝久, 若家冨士男, 菊池隆広, 澤良木宏, 高井幹夫

    第70回応用物理学会学術講演会 2009/09

  197. TOF-RBS法を用いた三次元構造分析技術のための自動イオンビーム集束法

    東嵩之, 熊野俊也, 阿保智, 村上勝久, 若家冨士男, 菊池隆広, 澤良木宏, 高井幹夫

    第70回応用物理学会学術講演会 2009/09

  198. 赤外光レーザー照射によるLiNbO3結晶からの電子放出

    木佐俊哉, 村上勝久, 阿保智, 若家冨士男, 石田稔幸, 高井幹夫

    第70回応用物理学会学術講演会 2009/09

  199. Study on time resolution of single event TOF-RBS measurement

    Satoshi Abo, Shunya Kumano, Katsuhisa Murakami, Fujio Wakaya, Tivadar Lohner, Mikio Takai

    19th International Conference on Ion Beam Analysis (IBA2009) 2009/09

  200. Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm

    Satoshi Abo, Naoyuki Masuda, Fujio Wakaya, Shinobu Onoda, Toshio Hirao, Takeshi Ohshima, Toshiaki Iwamatsu, Mikio Takai

    19th International Conference on Ion Beam Analysis (IBA2009) 2009/09

  201. Fabrication and electron field emission properties of titanium-oxide nanowire

    F. Wakaya, M. Miki, C. Fukuyama, K. Murakami, S. Abo, M. Takai

    The 22nd International Vacuum Nanoelectronics Conference (IVNC2009) 2009/07

  202. Electron emission from a lithium niobate crystal excited by ultra-violet laser

    T. Kisa, K. Murakami, S. Abo, F. Wakaya, T. Ishida, M. Takai

    The 22nd International Vacuum Nanoelectronics Conference (IVNC2009) 2009/07

  203. Effects of CNT diameters of the screen-printed cathode on the field emission characteristics

    T. Takikawa, H. Oki, Y. Matsuura, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 22nd International Vacuum Nanoelectronics Conference (IVNC2009) 2009/07

  204. Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

    S. Abo, Y. Mokuno, A. Kinomura, S. Onoda, T. Hirao, T. Ohshima, T. Iwamatsu, M. Takai

    The 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA) 2008/12

  205. Evaluation of single event upsets in integrated circuits using nuclear probe

    M. Takai, S. Abo, T. Iwamatsu

    The 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (8th-RASEDA) 2008/12

  206. Field emission lifetime after aging of CNT cathodes

    H. Oki, A. Kinoshita, T. Takikawa, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 15th International Display Workshops (IDW ’08) 2008/12

  207. Filed emission property of TiO2 cathodes after field enhanced surface treatment

    C. Fukuyama, K. Murakami, S. Abo, F. Wakaya, M. Takai, T. Takimoto, Y. Kumashiro, Y. Takaoka

    The 15th International Display Workshops (IDW ’08) 2008/12

  208. Electron coherence length in electron-beam-deposited Pt

    F. Wakaya, T. Nakayama, K. Takamoto, T. Takeuchi, N. Matsubara, K. Murakami, S. Ichikawa, S. Abo, M. Takai

    34th International Conference on Micro and Nano Engineering (MNE2008) 2008/09

  209. 電流誘起磁場検出のためのMFMプローブの最適化

    梶原正裕, 田中祐司, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第69回応用物理学会学術講演会 2008/09

  210. 顕微ラマン分光によるビーム誘起堆積Pt層の評価

    木佐俊哉, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第69回応用物理学会学術講演会 2008/09

  211. 電子ビーム誘起堆積Ptナノピラーの電気伝導特性

    高本邦生, 中山貴仁, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第69回応用物理学会学術講演会 2008/09

  212. CNT電子源の寿命に対する表面処理法の影響

    滝川友章, 木下晃, 沖宏吏, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第69回応用物理学会学術講演会 2008/09

  213. スパイクランプアニールとレーザアニールを行った極浅接合の局所抵抗分布

    西川和久, 田中祐司, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第69回応用物理学会学術講演会 2008/09

  214. Development of analysis technique of single event time-of-flight RBS for non-destructive three dimensional analysis

    S. Abo, K. Koresawa, M. Amano, S. Kumano, Q. K. Nguyen, T. Kikuchi, H. Sawaragi, M. Takai

    11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2008) 2008/07

  215. Visualization of three dimensional nanostructures by time-of-flight RBS using nuclear nanoprobes

    M. Takai, S. Abo, K. Koresawa, K. Murakami, F. Wakaya, T. Kikuchi, H. Sawaragi

    11th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2008) 2008/07

  216. Observation of fringelike-electron-emission pattern from radical-oxygen-gas exposed Pt field emitter fabricated by electron-beam-induced deposition

    K. Murakami, S. Nishihara, N. Matsubara, S. Abo, F. Wakaya, M. Takai

    The 21st International Vacuum Nanoelectronics Conference (IVNC2008) 2008/07

  217. Effect of DC-voltage aging on field emission lifetime for CNT cathodes

    H. Oki, A. Kinoshita, T. Takikawa, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 21st International Vacuum Nanoelectronics Conference (IVNC2008) 2008/07

  218. Field enhanced surface treatment of needle-shaped TiO2 for improvement in field emission

    C. Fukuyama, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 21st International Vacuum Nanoelectronics Conference (IVNC2008) 2008/07

  219. Local resistance profiling of ultra shallow junction with spike lamp and laser annealing using scanning spreading resistance microscopy

    S. Abo, Y. Tanaka, K. Nishikawa, F. Wakaya, T. Iwamatsu, H. Oda, M. Takai

    17th International Conference on Ion Implantation Technology (IIT2008) 2008/06

  220. 中エネルギー散乱計測システムの開発

    日夏幹人, 阿保智, 若家冨士男, 高井幹夫

    第55回応用物理学関係連合講演会 2008/03

  221. The variation of Raman spectra in carbon nanotube cathodes treated by plasma and laser

    W. S. Kim, H. Oki, A. Kinoshita, K. Murakami, S. Abo, F. Wakaya, M. Takai

    14th International Display Workshop (IDW ’07) 2007/12

  222. Field emission profiles of CNT cathodes with surface treatment using KrF excimer laser

    A. Kinoshita, W. S. Kim, K. Murakami, S. Abo, F. Wakaya, M. Takai

    14th International Display Workshop (IDW ’07) 2007/12

  223. Fabrication of nano electron source using beam induced processing for electron interference

    M. Takai, K. Murakami, S. Abo, F. Wakaya

    COE Workshop 2nd International Workshop on “Materials Science and Nano-Engineering” 2007/12

  224. Development of visualization system for nano structure using TOF-RBS with 150 keV focused ion beam

    Satoshi Abo, Kouhei Koresawa, Nguyen Quoc Khanh, Takahiro Kikuchi, Hiroshi Sawaragi, Mikio Takai

    COE Workshop 2nd International Workshop on “Materials Science and Nano-Engineering” 2007/12

  225. Laser and plasma post treatment of CNT cathodes for field emitters

    W. S. Kim, H. Oki, A. Kinoshita, K. Murakami, S. Abo, F. Wakaya, M. Takai

    COE Workshop 2nd International Workshop on “Materials Science and Nano-Engineering” 2007/12

  226. Electron transport properties in Pt Nanowires fabricated by beam-induced deposition

    F. Wakaya, T. Nakayama, T. Takeuchi, Y. Tsukatani, K. Murakami, S. Abo, M. Takai

    12th Academic Exchange Seminar between Shanghai Jiao Tong University and Osaka University 2007/10

  227. Determination of current distribution from current-induced magnetic field detected by magnetic force microscopy

    F. Wakaya, Y. Tanaka, K. Tanaka, Y. Mori, S. Abo, M. Takai

    33rd International Conference on Micro- and Nano-Engineering (MNE2007) 2007/06

  228. 電子ビーム誘起堆積Pt微小冷陰極のリーク電流抑制

    村上勝久, 阿部聡, 西原慎二, 松原直樹, 阿保智, 若家冨士男, 高井幹夫

    第68回応用物理学会学術講演会 2007/09

  229. Time of Flight RBS法による局所構造分析技術の開発

    是澤康平, 阿保智, 村上勝久, 若家冨士男, 菊池隆広, 澤良木宏, 高井幹夫

    第68回応用物理学会学術講演会 2007/09

  230. 磁気力顕微鏡を用いた電流誘起磁場検出によるナノ領域での電流分布の測定

    田中祐司, 田中宏一, 森雄哉, 阿保智, 若家冨士男, 高井幹夫

    第68回応用物理学会学術講演会 2007/09

  231. 電子ビーム誘起堆積Pt層の電気伝導特性: (I) ビーム滞留時間依存性

    中山貴仁, 竹内貴洋, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第68回応用物理学会学術講演会 2007/09

  232. KrFレーザー処理したカーボンナノチューブ電子源のエミッションプロファイル

    木下晃, 金元錫, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第68回応用物理学会学術講演会 2007/09

  233. Effect of radical oxygen gas exposure on Pt field emitter fabricated by electron-beam induced deposition

    K. Murakami, S. Abe, S. Nishihara, S. Abo, F. Wakaya, M. Takai

    20th International Vacuum Nanoelectronics Conference (IVNC2007) 2007/07

  234. The relationship between field emission characteristics and defects by Raman scattering in carbon nanotube cathode treated by plasma and laser irradiation

    W. S. Kim, A. Kinoshita, K. Murakami, S. Abo, F. Wakaya, M. Takai

    20th International Vacuum Nanoelectronics Conference (IVNC2007) 2007/07

  235. イオンナノプローブによる3次元非破壊分析技術の開発

    阿保智, 高井幹夫

    日本顕微鏡学会 第63回学術講演会 2007/05

  236. Influence of reactive ion etching on KrF laser surface treatment of CNT cathodes

    K. Ohsumi, T. Honda, W. S. Kim, C. B. Oh, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 13th International Display Workshops (IDW ’06) 2006/12

  237. Field emission characteristics of carbon nanotube treated by plasma and laser

    W. S. Kim, T. Honda, C. B. Oh, K. Ohsumi, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The 13th International Display Workshops (IDW ’06) 2006/12

  238. Local resistance measurement of carbon nanotube cathode using scanning spreading resistance microscopy

    K. Tanaka, F. Wakaya, S. Abo, M. Takai

    20th International Microprocesses and Nanotechnology Conference (MNC2006) 2006/10

  239. Evaluation of soft errors in SOI-SRAM using nuclear probe

    M. Takai, S. Abo, T. Iwamatsu, S. Maegawa, Y. Arita, M. Inuishi, T. Ipposhi, A. Kinomura, Y. Horino

    7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (7th-RASEDA) 2006/10

  240. Detection of magnetic field for measuring current distribution in poly-Si layer

    K. Tanaka, Y. Mori, H. Yamagiwa, S. Abo, F. Wakaya, M. Takai

    32nd Micro and Nano Engineering (MNE2006) 2006/09

  241. Electron transport properties of Pt Nanowires fabricated by beam-induced deposition

    F. Wakaya, Y. Tsukatani, N. Yamasaki, K. Murakami, S. Abo, M. Takai

    The 16 International Microscopy Congress (IMC2006) 2006/09

  242. マルチMCP検出器を用いたTOF-RBS法によるナノスケール積層構造分析技術の開発

    是澤康平, Nguyen Viet Nguyen, 阿保智, 若家冨士男, 高井幹夫

    第67回応用物理学会学術講演会 2006/08

  243. 低温poly-Si TFTの多結晶Si層の電流分布計測のための基礎的研究

    田中宏一, 森雄哉, 阿保智, 若家冨士男, 高井幹夫

    第67回応用物理学会学術講演会 2006/08

  244. Nuclear nanoprobe development for visualization of three-dimensional nanostructures

    M. Takai, S. Abo, F. Wakaya, T. Kikuchi, H. Sawaragi

    The 19th International Conference on the Application of Accelerators in Research and Industry (CAARI2006) 2006/08

  245. KrF laser surface treatment of CNT cathodes with and without reactive ion etching

    K. Ohsumi, T. Honda, W. S. Kim, C. B. Oh, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The Joint 19th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (IVNC2006) 2006/07

  246. Improved field emission characteristics of multi-walled carbon nanotube cathode by plasma treatment with a help of krypton fluoride laser irradiation

    W. S. Kim, T. Honda, C. B. Oh, K. Ohsumi, K. Murakami, S. Abo, F. Wakaya, M. Takai

    The Joint 19th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (IVNC2006) 2006/07

  247. Ultra shallow arsenic profiling in Si using highly sensitive time-of-flight RBS with nuclear nanoprobe

    S. Abo, N. V. Nguyen, T. Lohner, F. Wakaya, M. Takai

    10th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2006) 2006/07

  248. Development of time-of-flight RBS system using multi microchannel plates

    N.V. Nguyen, S. Abo, T. Lohner, H. Sawaragi, F. Wakaya, M. Takai

    The 10th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2006) 2006/07

  249. Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy

    S. Abo, H. Yamagiwa, K. Tanaka, F. Wakaya, T. Sakamoto, H. Tokioka, N. Nakagawa, M. Takai

    16th International Conference on Ion Implantation Technology (IIT2006) 2006/06

  250. 高エネルギーイオンプローブを用いたSOI-SRAMのソフトエラー耐性評価 (III)

    阿保智, 平田保史, 上田浩史, 若家冨士男, 岩松俊明, 一法師隆志, 杢野由明, 堀野裕治, 高井幹夫

    第53回応用物理学関係連合講演会 2006/03

  251. SSRMを用いたTFT中低温poly-Si層の局所抵抗評価

    田中宏一, 阿保智, 若家冨士男, 坂本孝雄, 時岡秀忠, 中川直紀, 高井幹夫

    第53回応用物理学関係連合講演会 2006/03

  252. RIE処理前後のCNT冷陰極カソードのKrFレーザー表面処理

    大住一也, 村上勝久, 金元錫, 呉忠奉, 阿保智, 若家冨士男, 高井幹夫

    第53回応用物理学関係連合講演会 2006/03

  253. Fabrication of vacuum nanoelectronics devices using beam processing

    M. Takai, F. Wakaya, S. Abo, K. Murakami

    Handai nanoscience and nanotechnology international symposium 2006/01

  254. Local resistance measurement on polycrystalline silicon layer in low-temperature poly-Si thin film transistor using scanning spreading resistance microscopy

    S. Abo, H. Yamagiwa, K. Tanaka, F. Wakaya, T. Sakamoto, H. Tokioka, N. Nakagawa, M. Takai

    Handai nanoscience and nanotechnology international symposium 2006/01

  255. Surface treatment of CNT cathode using KrF excimer laser for field emission displays

    T. Honda, C. B. Oh, K. Murakami, K. Ohsumi, S. Abo, F. Wakaya, M. Takai

    The 12th International Display Workshops in conjunction with Asia Display 2005 (IDW ’05) 2005/12

  256. Localized resistance across grain boundaries in poly-Si layer of TFT measured by scanning spreading resistance microscopy

    H. Yamagiwa, S. Abo, F. Wakaya, T. Sakamoto, H. Tokioka, N, Nakagawa, M. Takai

    The 12th International Display Workshops in conjunction with Asia Display 2005 (IDW ’05) 2005/12

  257. Transport properties of beam-induced-deposited Pt nanowires

    F. Wakaya, Y. Tsukatani, N. Yamasaki, K. Murakami, S. Abo, M. Takai

    The 7th New Phenomena in Mesoscopic Systems and Surfaces and The 5th Interfaces of Mesoscopic Devices (NPMS-7/SIMD-5) 2005/11

  258. FEMによるビーム誘起堆積Pt冷陰極の評価

    村上勝久, 山崎直紀, 阿保智, 若家冨士男, 高井幹夫

    第66回応用物理学会学術講演会 2005/09

  259. 高エネルギーイオンプローブを用いたSOI-SRAMのソフトエラー評価(II)

    平田保史, 阿保智, 山際優人, 岩松俊明, 前川繁登, 若家冨士男, 高井幹夫

    第66回応用物理学会学術講演会 2005/09

  260. ガラス入り大面積CNTカソードのKrFレーザー表面処理

    本多友明, 大住一也, 村上勝久, 金元錫, 呉忠奉, 阿保智, 若家冨士男, 高井幹夫

    第66回応用物理学会学術講演会 2005/09

  261. SSRMを用いたpoly-Si TFTのキャリア濃度分布評価

    山際優人, 阿保智, 若家冨士男, 坂本孝雄, 時岡秀忠, 中川直紀, 高井幹夫

    第66回応用物理学会学術講演会 2005/09

  262. Influence of Pt cathode resistance on the field emission properties of field emitters fabricated using beam-induced deposition

    K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    18th International Vacuum Nanoelectronics Conference (IVNC2005) 2005/07

  263. Fabrication and characterization of Pt nanosplit emitter using electron-beam induced deposition

    K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    18th International Vacuum Nanoelectronics Conference (IVNC2005) 2005/07

  264. KrF laser surface treatment of CNT cathodes

    T. Honda, W. Rochanachirapar, K. Murakami, K. Ohsumi, S. Abo, F. Wakaya, M. Takai

    18th International Vacuum Nanoelectronics Conference (IVNC2005) 2005/07

  265. Composition analysis of HfxSiyO1-x-y thin films by medium energy ion scattering (MEIS)

    H. Kitano, S. Abo, M. Mizutani, J. Tsuchimoto, T. Lohner, J. Gyulai, F. Wakaya, M. Takai

    17th International Conference on Ion Beam Analysis (IBA2005) 2005/06

  266. Development of a highly sensitive time-of-flight RBS system with multiple micro channel plates using a 100 keV nuclear nanoprobe

    Satoshi Abo, Nguyen Viet Nguyen, Tivadar Lohner, Jozsef Gyulai, Fujio Wakaya, Hiroshi Sawaragi, Mikio Takai

    17th International Conference on Ion Beam Analysis (IBA2005) 2005/06

  267. Ultra shallow As profiling before and after spike annealing using medium energy ion scattering

    Satoshi Abo, Satoshi Ichihara, Tivadar Lohner, Jozsef Gyulai, Fujio Wakaya, Mikio Takai

    5th International Workshop on Junction Technology (IWJT2005) 2005/06

  268. ビーム誘起堆積Pt細線の電気伝導特性 II

    塚谷陽介, 山崎直紀, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第52回応用物理学関係連合講演会 2005/03

  269. 高エネルギーイオンプローブを用いたSOI-SRAMのソフトエラー評価

    平田保史, 阿保智, 山際優人, 前川繁登, 岩松俊明, 若家冨士男, 高井幹夫

    第52回応用物理学関係連合講演会 2005/03

  270. CNT例陰極カソードのストライプビームKrFレーザー表面処理

    本多友明, Wasu Rochanachirapar, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    第52回応用物理学関係連合講演会 2005/03

  271. 電子ビーム誘起堆積ナノ間隙冷陰極の作製と評価

    村上勝久, 山崎直紀, 阿保智, 若家冨士男, 高井幹夫

    第52回応用物理学関係連合講演会 2005/03

  272. Electron Transport in Pt Nanowires fabricated by beam induced process

    F. Wakaya, Y. Tsukatani, N. Yamasaki, K. Murakami, S. Abo, M. Takai

    Hungarian Nanotechnology Symposium 2005 2005/03

  273. CNT電子源の表面処理技術と電子放出特性

    高井幹夫, Wasu Rochanachirapar, 本多友明, 村上勝久, 阿保智, 若家冨士男

    第2回真空ナノエレクトロニクスシンポジウム・カーボンナノチューブ-FEDプロジェクト公開シンポジウム 2005/03

  274. ビーム支援プロセスによるナノ電子源の作製と評価

    村上勝久, 山崎直紀, 阿保智, 若家冨士男, 高井幹夫

    第2回真空ナノエレクトロニクスシンポジウム・カーボンナノチューブ-FEDプロジェクト公開シンポジウム 2005/03

  275. Fabrication of nano structures using focused ion electron and photon beams and its application to vacuum nanoelectronic devices

    M. Takai, K. Murakami, W. Rochanachirapar, N. Yamasaki, T. Tsukatani, S. Abo, F. Wakaya

    The International Workshop on Materials Science and Nano-Engineering 2004/12

  276. Effect of thermal annealing on leakage current of field emitters fabricated using beam assisted processes

    K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    The 11th International Display Workshop (IDW ’04) 2004/12

  277. Laser Irradiation to CNT Cathode for Large Diagonal FEDs

    K. Murakami, W. Rochanachirapar, S. Abo, F. Wakaya, M. Takai

    The 11th International Display Workshop (IDW ‘04) 2004/12

  278. Dopant profiling of ultra shallow As implantation with and without spike annealing using medium energy ion scattering (MEIS)

    S. Abo, S. Ichihara, T. Lohner, F. Wakaya, T. Eimori, Y. Inoue, M. Takai

    The 15th International Conference on Ion Implantation Technology (IIT2004) 2004/10

  279. Medium energy ion-nanoprobe with TOF-RBS for semiconductor process analysis

    Y. Tate, S. Abo, K. Hayashi, F. Wakaya, M. Takai

    The 9th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2004) 2004/09

  280. Reliability study of bulk and SOI SRAMs using high energy nuclear probes

    S. Abo, H. Yamagiwa, T. Iwamatsu, S. Maegawa, Y. Arita, T. Ipposhi, A. Kinomura, F. Wakaya, M. Takai

    The 9th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2004) 2004/09

  281. 高エネルギーイオンプローブを用いたSOIデバイスの基板浮遊効果に関する研究 II

    阿保智, 岩松俊明, 前川繁登, 岩松俊明, 西村正, 高井幹夫

    第65回応用物理学会学術講演会 2004/09

  282. 高エネルギーイオンプローブを用いたSOIおよびbulk SRAMの信頼性評価

    阿保智, 山際優人, 岩松俊明, 前川繁登, 木野村淳, 高井幹夫

    第51回応用物理学関係連合講演会 2004/03

  283. 高エネルギーイオンプローブを用いたSOIデバイスの基板浮遊効果に関する研究

    阿保智, 岩松俊明, 前川繁登, 岩松俊明, 西村正, 高井幹夫

    第64回応用物理学会学術講演会 2003/08

  284. Influence of Gas Atmosphere during laser surface treatment of CNT cathode

    W. Rochanachirapar, K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai, A. Hosono, S. Okuda

    The 17th International Vacuum Nanoelectronics Conference (IVNC2003) 2003/07

  285. Laser surface treatment of CNT cathode for Large Diagonal FEDs

    W. Rochanachirapar, K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai, A. Hosono, S. Okuda

    The 17th International Vacuum Nanoelectronics Conference (IVNC2003) 2003/07

  286. Effect of thermal annealing on emission characteristics of nano electron source fabricated using beam assisted process

    K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    The 17th International Vacuum Nanoelectronics Conference (IVNC2003) 2003/07

  287. Observation of electron emission pattern from nano-split emitter fabricated using beam assisted process

    K. Murakami, N. Yamasaki, S. Abo, F. Wakaya, M. Takai

    The 17th International Vacuum Nanoelectronics Conference (IVNC2003) 2003/07

  288. Characterization of dopant profiles produced by ultra-shallow As implantation and spike annealing using medium energy ion scattering (MEIS)

    S. Ichihara, T. Nakagawa, N. Nitta, S. Abo, T. Lohner, C. Angelov, K. Ohta, M. Takai

    16th International Conference on Ion Beam Analysis (IBA2003) 2003/06

  289. Medium energy heavy ion probe with TOF-RBS for semiconductor process analysis

    K. Hayashi, H. Takayama, M. Ishikawa, S. Abo, T. Lohner, M. Takai

    16th International Conference on Ion Beam Analysis (IBA2003) 2003/06

  290. Inspection of floating body effects in SOI devices using high energy nuclear microprobes

    S. Abo, T. Lohner, M. Takai, T. Iwamatsu, S. Maegawa, Y. Arita, A. Kinomura

    16th International Conference on Ion Beam Analysis (IBA2003) 2003/06

  291. プロトンマイクロプローブを用いたPD-SOI-MOSFETの基板浮遊効果による不安定性に関する研究

    阿保智, 水谷斉治, 池田幸司, 前川繁登, 岩松俊明, 西村正, 高井幹夫

    第63回応用物理学会学術講演会 2002/09

  292. Shallow arsenic profiling using medium energy ion scattering (MEIS)

    T. Nakagawa, M. Fujita, N. Wakabayashi, S. Abo, A. Kinomura, Y. Inoue, M. Takai

    The 14th International Conference on Ion Implantation Technology (IIT2002) 2002/09

  293. Investigation of floating body effects in PD-SOI-MOSFET using proton microprobe

    S. Abo, M. Mizutani, K. Ikeda, A. Kinomura, T. Iwamatsu, S. Maegawa, M. Takai

    The 8th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2002) 2002/09

  294. SOI MOSFETにおける基板浮遊効果の抑制に関する研究

    阿保智, 水谷斉治, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    第49回応用物理学関係連合講演会 2002/03

  295. Inspection for critical issue of floating body effects in SOI-MOSFET using nuclear particles

    S. Abo, M. Mizutani, K. Nakayama, T. Takaoka, T. Iwamatsu, Y. Yamaguchi, S. Maegawa, T. Nishimura, A. Kinomura, Y. Horino, M. Takai

    2001 International Microprocesses and Nanotechnology Conference (MNC2001) 2001/10

  296. SOI-MOSFETの基板浮遊効果による不安定性に関する研究

    阿保智, 水谷斉治, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    第62回応用物理学会学術講演会 2001/09

  297. Development of enhanced depth-resolution technique for shallow dopant profiling

    M. Fujita, J. Tajima, T. Nakagawa, S. Abo, A. Kinomura, F. Paszti, M. Takai, R. Schork, L. Frey, H. Ryssel

    The 15th International Conference on Ion Beam Analysis (IBA2001) 2001/07

  298. Evaluation of soft errors in DRAM and SRAM using nuclear microprobe and neutron source

    M. Takai, Y. Arita, S. Abo, T. Iwamatsu, S. Maegawa, H. Sayama, Y. Yamaguchi, M. Inuishi, T. Nishimura

    The 31st European Solid-State Device Research Conference (ESSDERC 2001) 2001/07

  299. 部分空乏型SOI-MOSFETの基板浮遊効果による不安定性に関する研究

    阿保智, 水谷斉治, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    第48回応用物理学関係連合講演会 2001/03

  300. イオンプローブを用いたSOI MOSFETの信頼性に関する研究

    水谷斉治, 阿保智, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    第48回応用物理学関係連合講演会 2001/03

  301. Study for instability of a partially depleted SOI MOSFET due floating effect tested using high energy nuclear microprobes

    S. Abo, K. Nakayama, T. Takaoka, T. Iwamatsu, Y. Yamaguchi, S. Maegawa, T. Nishimura, A. Kinomura, Y. Horino, M. Takai

    The 13th International Conference on Ion Implantation Technology (IIT2000) 2000/09

  302. Study on the suppression of floating effects in SOI MOSFET using nuclear microprobes

    S. Abo, K. Nakayama, T. Takaoka, T. Iwamatsu, Y. Yamaguchi, S. Maegawa, T. Nishimura, A. Kinomura, Y. Horino, M. Takai

    The 7th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2000) 2000/09

  303. 部分空乏型SOI MOSFETの信頼性に関する研究

    水谷斉治, 阿保智, 岩松俊明, 前川繁登, 犬石昌秀, 西村正, 高井幹夫

    第61回応用物理学会学術講演会 2000/09

  304. イオンプローブを用いたSOI MOSFETの基板浮遊効果の抑制に関する研究

    阿保智, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    第47回応用物理学会関係連合講演会 2000/03

  305. 焦電結晶を用いた超小型中性子源の中性子発生過程

    阿保 智, 大上 楓真, 増澤 智昭, 三村 秀典, 若家 冨士男

    2024年度 生体医歯工学研究共同拠点成果報告会 2025/03

  306. 焦電結晶を用いた超小型中性子源内部の粒子軌道計算

    阿保智, 大上楓真, 若家冨士男, 増澤智明, 三村秀典

    2023年度 生体医歯工学研究共同拠点成果報告会 2024/03

  307. 焦電体を用いた中性子源とダイヤモンド中性子センサの検討

    増澤智昭, 若家冨士男, 阿保智

    令和4年度 生体医歯工学研究共同拠点成果報告会 2023/03

  308. レーザ加熱焦電結晶を用いた超小型X線源・中性子源の開発

    阿保智, 若家冨士男, 高井幹夫, 増澤智昭, 三村秀典

    令和3年度 生体医歯工学共同研究拠点成果報告会 2022/03

  309. レーザ加熱焦電結晶を用いた中性子源の開発

    阿保智, 野見山大地, 若家冨士男, 高井幹夫, 増澤智昭, 三村秀典

    令和2年度 生体医歯工学共同研究拠点成果報告会 2021/03

  310. 高速原子間力顕微鏡による膜タンパク質の動態観察のための擬似細胞環境の構築

    荒木佑進, 山下隼人, 若家冨士男, 阿保智, 宮戸祐治, 阿部真之

    応用物理学会平成30年度第2回関西支部講演会 2018/10

  311. 小型内視鏡用X線源応用のためのレーザ照射焦電結晶電子源の開発

    若家冨士男, 阿保智, 高井幹夫, 増澤智昭, 三村秀典

    日本学術振興会 真空ナノエレクトロニクス 第158委員会 第124回研究会 2018/10

  312. 焦電体へのレーザー照射によるX線発生過程の研究

    若家冨士男, 阿保智, 高井幹夫, 増澤智昭, 三村秀典

    平成29年度生体医歯工学共同研究拠点成果報告会 2018/03

  313. パルスレーザー堆積/非接触原子間力顕微鏡によるアナターゼ型TiO2(001)表面の観察

    勝部大樹, 山下隼人, 阿保智, 若家冨士男, 阿部真之

    日本表面科学会関東支部 第4回関東支部セミナー 表面・薄膜分析シリーズVol.2 走査型プローブ顕微鏡のフロンティア~実用材料表面計測入門から最新物性問題への挑戦まで~ 2016/10

  314. レーザー励起による焦電体からの電子放出と微小X線源への応用

    高井幹夫, 加賀英一, 木佐俊哉, 阿保智, 若家冨士男

    第6回励起ナノプロセス研究会 2010/11

  315. レーザー励起による焦電体からの電子放出と微小X線源への応用

    高井幹夫, 加賀英一, 木佐俊哉, 阿保智, 若家冨士男

    学振 真空ナノエレクトロニクス158委員会研究会 2010/10

  316. カーボンナノチューブ冷陰極へのレーザー照射効果

    W. Rochanachirapar, 村上勝久, 山崎直紀, 本多友明, 阿保智, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2004/12

  317. 電子ビーム誘起堆積ナノ電子源のリーク電流の抑制

    山崎直紀, 村上勝久, 阿保智, 若家冨士男, 高井幹夫

    電子情報通信学会 電子デバイス研究会 2004/12

  318. 部分空乏型SOI-MOSFETの基板浮遊効果の抑制に関する研究

    阿保智 水谷斉治, 高井幹夫, 前川繁登, 岩松俊明, 犬石昌秀, 西村正

    応用物理学会シリコンテクノロジー分科会 第4回ミニ学術講演会 2000/05

Works 2

  1. レーザ加熱焦電結晶を用いた超小型X線源

    2025 -

  2. 非破壊3次元TOF-RBS分析装置

    2008 -

Social Activities 10

  • 第60回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会

    2025/05/20 - 2025/05/23

  • 第59回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会

    2024/05/28 - 2024/05/31

  • 第58回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会

    2023/05/23 - 2023/05/26

  • 第57回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会

    2022/10/10 - 2022/10/14

  • 第55回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会・(一社)日本真空工業会・(一社)大阪府技術協会

    2019/05/21 - 2019/05/24

  • 第54回真空技術基礎講習会、実習講師

    (公社)日本表面真空学会・日本真空工業会・(一社)大阪府技術協会

    2018/05/22 - 2018/05/25

  • 第53回真空技術基礎講習会、実習講師

    (一社)日本真空学会関西支部・日本真空工業会関西支部・(一社)大阪府技術協会

    2017/05/23 - 2017/05/26

  • 第52回真空技術基礎講習会、実習講師

    (一社)日本真空学会関西支部・日本真空工業会関西支部・(一社)大阪府技術協会

    2016/05/24 - 2016/05/27

  • 第51回真空技術基礎講習会、実習講師

    (一社)日本真空学会関西支部・日本真空工業会関西支部・(一社)大阪府技術協会

    2015/05/19 - 2015/05/20

  • 第50回真空技術基礎講習会、実習講師

    (一社)日本真空学会関西支部・日本真空工業会関西支部・(一社)大阪府技術協会

    2014/05/20 - 2014/05/23

Academic Activities 10

  1. 第35回日本MRS年次大会、シンポジウム連絡オーガナイザー

    2025/11/10 - 2025/11/12

  2. 第34回日本MRS年次大会、シンポジウム連絡オーガナイザー

    2024/12/16 - 2024/12/18

  3. 第33回日本MRS年次大会、シンポジウム代表オーガナイザー

    2023/11/14 - 2023/11/16

  4. 25th International Conference on Ion Beam Analysis (IBA-2023), Executive Committee

    2023/10/07 - 2023/10/13

  5. 第32回日本MRS年次大会、シンポジウム連絡オーガナイザー

    2022/12/05 - 2022/12/07

  6. Materials Research Meeting 2021 (MRM2021), Symposium Organizer

    2021/12/13 - 2021/12/17

  7. 第30回日本MRS年次大会、シンポジウムオーガナイザー

    2020/12/09 - 2020/12/10

  8. 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Executive Committee

    2015/11/11 - 2015/11/13

  9. 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Executive Committee

    2012/12/10 - 2012/12/12

  10. 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications, Executive Committee

    2010/10/27 - 2010/10/29

Institutional Repository 3

Content Published in the University of Osaka Institutional Repository (OUKA)
  1. Resistivity measurement for non-magnetic materials using high-order resonance mode of MFM-cantilever oscillation

    Okamoto Kazuma, Imura Takumi, Abo Satoshi, Wakaya Fujio, Murakami Katsuhisa, Nagao Masayoshi

    Japanese Journal of Applied Physics Vol. 64 No. 4 2025/04/07

  2. Detection of nonmagnetic metal thin film using magnetic force microscopy

    Wakaya Fujio, Oosawa Kenta, Kajiwara Masahiro, Abo Satoshi, Takai Mikio

    Vol. 113 No. 26 2018/12/24

  3. 高エネルギーイオンプローブを用いた絶縁膜上薄膜単結晶シリコン基板に形成された素子の信頼性評価

    Abo Satoshi