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Application of ultra-high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells
T. Nishida, R. Yoshimura, R. Nishi, Y. Imoto, Y. Endo
Journal of Microscopy Vol. 278 No. 1 p. 42-48 2020/04 Research paper (scientific journal)
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Investigation of electromagnetic-SYLC for chromatic aberration correction
R. Nishi, S. Hoque, H. Ito, A.Takaoka
2018/10
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Spherical aberration correction with in-lens N-fold symmetric line currents
S. Hoque, R. Nishi, H. Ito, A.Takaoka
2018/10
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Spherical aberration correction with an in-lens N-fold symmetric line currents model
Shahedul Hoque, Hiroyuki Ito, Ryuji Nishi
ULTRAMICROSCOPY Vol. 187 p. 135-143 2018/04 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Automatic system for electron tomography data collection in the ultra-high voltage electron microscope
Meng Cao, Ryuji Nishi, Fang Wang
MICRON Vol. 103 p. 29-33 2017/12 Research paper (scientific journal)
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
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Axial geometrical aberration correction up to 5th order with N-SYLC
Shahedul Hoque, Hiroyuki Ito, Akio Takaoka, Ryuji Nishi
ULTRAMICROSCOPY Vol. 182 p. 68-80 2017/11 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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A Novel Method for Higher Order Aberration Correction in Electron Microscopes
Shahedul Hoque, Hiroyuki Ito, Akio Takaoka, Ryuji Nishi
Microscopy and Microanalysis Vol. 23 No. S1 p. 472-473 2017/08 Research paper (scientific journal)
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A Novel Method for Higher Order Aberration Correction in Electron Microscopes
Shahedul Hoque, Hiroyuki Ito, Akio Takaoka, Ryuji Nishi
Microscopy and Microanalysis Vol. 23 No. S1 p. 472-473 2017/08 Research paper (international conference proceedings)
Publisher: Cambridge University Press
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The influence of structure depth on image blurring of micrometres-thick specimens in MeV transmission electron imaging
Fang Wang, Ying Sun, Meng Cao, Ryuji Nishi
MICRON Vol. 83 p. 54-61 2016/04 Research paper (scientific journal)
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
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Spherical aberration correction with threefold symmetric line currents
Shahedul Hoque, Hiroyuki Ito, Ryuji Nishi, Akio Takaoka, Eric Munro
ULTRAMICROSCOPY Vol. 161 p. 74-82 2016/02 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Spherical aberration correction with threefold symmetric line currents
Shahedul Hoque, Hiroyuki Ito, Ryuji Nishi, Akio Takaoka, Eric Munro
ULTRAMICROSCOPY Vol. 161 p. 74-82 2016/02 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Double-twist cylinders in liquid crystalline cholesteric blue phases observed by transmission electron microscopy
Shu Tanaka, Hiroyuki Yoshida, Yuto Kawata, Ryusuke Kuwahara, Ryuji Nishi, Masanori Ozaki
SCIENTIFIC REPORTS Vol. 5 2015/11 Research paper (scientific journal)
Publisher: NATURE PUBLISHING GROUP
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Low-aberration optics for large-angle beam with unit core lenses
Akio Takaoka, Ryuji Nishi, Hiroyuki Ito
OPTIK Vol. 126 No. 18 p. 1666-1671 2015 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Low-aberration optics for large-angle beam with unit core lenses
Akio Takaoka, Ryuji Nishi, Hiroyuki Ito
OPTIK Vol. 126 No. 18 p. 1666-1671 2015 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscope
Ryuji Nishi, Meng Cao, Atsuko Kanaji, Tomoki Nishida, Kiyokazu Yoshida, Shigeto Isakozawa
Microscopy Vol. 63 No. S1 p. i25-i25 2014/11 Research paper (scientific journal)
Publisher: Oxford Journals
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Fast auto-acquisition tomography tilt series by using HD video camera in ultra-high voltage electron microscope
Ryuji Nishi, Meng Cao, Atsuko Kanaji, Tomoki Nishida, Kiyokazu Yoshida, Shigeto Isakozawa
Microscopy Vol. 63 No. S1 p. i25-i25 2014/11 Research paper (scientific journal)
Publisher: Oxford Journals
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HawkC: computer-aided 3D visualization and analysis software for electron tomography
2014/09 Research paper (international conference proceedings)
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HawkC: computer-aided 3D visualization and analysis software for electron tomography
2014/09 Research paper (international conference proceedings)
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Structural modifications of dentinal microcracks with human aging
Mizuho Kubo, Jiro Miura, Takao Sakata, Ryuji Nishi, Fumio Takeshige
MICROSCOPY Vol. 62 No. 6 p. 555-561 2013/12 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Ultra-high voltage electron microscopy analysis for semiconductor devices
S. Kudo, Y. Hirose, R. Nishi, Y. Midoh, N. Hattori, T. Koyama, K. Nakamae
Proc. The 33rd NANO Testing p. 225-230 2013/11 Research paper (international conference proceedings)
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Ultra-high voltage electron microscopy analysis for semiconductor devices
S. Kudo, Y. Hirose, R. Nishi, Y. Midoh, N. Hattori, T. Koyama, K. Nakamae
Proc. The 33rd NANO Testing p. 225-230 2013/11 Research paper (international conference proceedings)
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An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopy
R. Nishi, Y. Moriyama, K. Yoshida, N. Kajimura, H. Mogaki, M. Ozawa, S. Isakozawa
Journal of Electron Microscopy Vol. 62 No. 5 p. 515-519 2013/10 Research paper (scientific journal)
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Development of a contact-potential-type phase plate, Microscopy and Microanalysis
H. Tamaki, H. Kasai, K. Harada, Y. Takahashi, R. Nishi
Microscopy and Microanalysis Vol. 19 No. S2 p. 1148-1149 2013/10 Research paper (scientific journal)
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An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopy
R. Nishi, Y. Moriyama, K. Yoshida, N. Kajimura, H. Mogaki, M. Ozawa, S. Isakozawa
MICROSCOPY Vol. 62 No. 5 p. 515-519 2013/10 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Development of a contact-potential-type phase plate, Microscopy and Microanalysis
H. Tamaki, H. Kasai, K. Harada, Y. Takahashi, R. Nishi
Microscopy and Microanalysis Vol. 19 No. S2 p. 1148-1149 2013/10 Research paper (scientific journal)
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An autofocus method using quasi-Gaussian fitting of image sharpness in ultra-high-voltage electron microscopy
R. Nishi, Y. Moriyama, K. Yoshida, N. Kajimura, H. Mogaki, M. Ozawa, S. Isakozawa
MICROSCOPY Vol. 62 No. 5 p. 515-519 2013/10 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy
Yoshifumi Oshima, Ryuji Nishi, Kyoichiro Asayama, Kazuto Arakawa, Kiyokazu Yoshida, Takao Sakata, Eiji Taguchi, Hidehiro Yasuda
MICROSCOPY Vol. 62 No. 5 p. 521-531 2013/10 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Electron tomographic resolution of microns-thick specimens in the ultrahigh voltage electron microscope
Meng Cao, Fang Wang, Zhi-Wei Qiao, Hai-Bo Zhang, Ryuji Nishi
MICRON Vol. 49 p. 71-74 2013/06 Research paper (scientific journal)
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
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Electron tomographic resolution of microns-thick specimens in the ultrahigh voltage electron microscope
Meng Cao, Fang Wang, Zhi-Wei Qiao, Hai-Bo Zhang, Ryuji Nishi
MICRON Vol. 49 p. 71-74 2013/06 Research paper (scientific journal)
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
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Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy
Oshima, Yoshifumi, Nishi, Ryuji, Asayama, Kyoichiro, Arakawa, Kazuto, Yoshida, Kiyokazu, Sakata, Takao, Taguchi, Eiji, Yasuda, Hidehiro
Microscopy Vol. 62 No. 5 p. 521-531 2013 Research paper (scientific journal)
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Simplified analysis method of electrostatic core-lenses for 3D electron microscopy
R. Nishi, A. Takaoka
The 10th Asia-Pacific Microscopy Conference (APMC10) 2012/02 Research paper (international conference proceedings)
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Simplified analysis method of electrostatic core-lenses for 3D electron microscopy
R. Nishi, A. Takaoka
The 10th Asia-Pacific Microscopy Conference (APMC10) 2012/02 Research paper (international conference proceedings)
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Stigmatic condition for electrostatic core-lens by using diagram of axis intercept
R. Nishi, A. Takaoka
OPTIK Vol. 123 No. 16 p. 1492-1496 2012 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Addition of energy dispersion characteristics to the diagram of axis intercept for aberration analysis of core-lens
R. Nishi, A. Takaoka
OPTIK Vol. 123 No. 19 p. 1691-1693 2012 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Addition of energy dispersion characteristics to the diagram of axis intercept for aberration analysis of core-lens
R. Nishi, A. Takaoka
OPTIK Vol. 123 No. 19 p. 1691-1693 2012 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Stigmatic condition for electrostatic core-lens by using diagram of axis intercept
R. Nishi, A. Takaoka
OPTIK Vol. 123 No. 16 p. 1492-1496 2012 Research paper (scientific journal)
Publisher: ELSEVIER GMBH, URBAN & FISCHER VERLAG
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Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo study
Fang Wang, Hai-Bo Zhang, Meng Cao, Ryuji Nishi, Akio Takaoka
JOURNAL OF ELECTRON MICROSCOPY Vol. 60 No. 5 p. 315-320 2011/10 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Note: Direct measurement of the point-to-point resolution for microns-thick specimens in the ultrahigh-voltage electron microscope
Fang Wang, Meng Cao, Hai-Bo Zhang, Ryuji Nishi, Akio Takaoka
REVIEW OF SCIENTIFIC INSTRUMENTS Vol. 82 No. 6 2011/06 Research paper (scientific journal)
Publisher: AMER INST PHYSICS
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An automatic method of detecting and tracking fiducial markers for alignment in electron tomography
Meng Cao, Akio Takaoka, Hai-Bo Zhang, Ryuji Nishi
JOURNAL OF ELECTRON MICROSCOPY Vol. 60 No. 1 p. 39-46 2011/02 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope
Insook Yi, Ryuji Nishi, Masayuki Abe, Yoshiaki Sugimoto, Seizo Morita
JAPANESE JOURNAL OF APPLIED PHYSICS Vol. 50 No. 1 2011/01 Research paper (scientific journal)
Publisher: JAPAN SOC APPLIED PHYSICS
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Improvement of a Remote Control/Observation System for the 3MV Ultrahigh Voltage Electron Microscope
Kiyokazu Yoshida, Hidehiro Yasuda, Ryuji Nishi, Hiroaki Mogaki, Shigeto Isakozawa, Hirotaro Mori
Proc. of the 17th IFSM International Microscopy Congress 2010/09 Research paper (international conference proceedings)
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Design of Auto-Focus System using Image Sharpness for Tomography with the Ultrahigh Voltage Electron Microscope
R. Nishi, S. Isakozawa, H. Mogaki, M. Ozawa, T. Yasuda, K. Yoshida, H. Yasuda
Proc. of the 17th IFSM International Microscopy Congress 2010/09 Research paper (international conference proceedings)
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Formation and reduction of streak artefacts in electron tomography
M. Cao, H. -B. Zhang, Y. Lu, R. Nishi, A. Takaoka
JOURNAL OF MICROSCOPY Vol. 239 No. 1 p. 66-71 2010/07 Research paper (scientific journal)
Publisher: WILEY-BLACKWELL
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Multiple scattering effects of MeV electrons in very thick amorphous specimens
Fang Wang, Hai-Bo Zhang, Meng Cao, Ryuji Nishi, Akio Takaoka
ULTRAMICROSCOPY Vol. 110 No. 3 p. 259-268 2010/02 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Effect of sample structure on reconstruction quality in computed tomography
Meng Cao, Hai-Bo Zhang, Chao Li, Ryuji Nishi
REVIEW OF SCIENTIFIC INSTRUMENTS Vol. 80 No. 2 2009/02 Research paper (scientific journal)
Publisher: AMER INST PHYSICS
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Electron Transmission and Imaging Quality of a Tilted Thick Specimen in the Ultra-HVEM
Hai-Bo Zhang, Fang Wang, Zhi-Fei Xue, Ryuji Nishi, Akio Takaoka
Korean Journal of Microscopy 2008/11
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Development of automatic system on electron microscopic tomography for 3D medical examination
Akio Takaoka, Meng Cao, Yoshihiro Midoh, Tomoki Nishida, Toshiaki Hasegawa, Ryuji Nishi, Yuuki Inoue, Mitsuo Ogasawara
Korean Journal of Microscopy 2008/11 Research paper (other academic)
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SIFT特徴量を用いた電子顕微鏡トモグラフィ自動化の検討
御堂義博, 高島真彦, 鷹岡昭夫, 西 竜治, 中前幸治
2008/09 Research paper (other academic)
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Design of a Remote Control System for UHVEM with a HDTV System
Kiyokazu Yoshida, Shinji Shimojo, Eisaku Sakane, Hiroaki Mogaki, Masaru Ozawa, Tamaki Shibayama, Ryuji Nishi, Hirotaro Mori
Proc. 34th Annual meeting, Microscopical Society of Canada, 2007, Edmonton 2007/06 Research paper (international conference proceedings)
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Atomic structure of Ge clusters on Si(111)-(7x7) by non-contact AFM
Insook Yi, Yoshiaki Sugimoto, Ryuji Nishi, Masayuki Abe, Seizo Morita
NANOTECHNOLOGY Vol. 18 No. 8 2007/02 Research paper (scientific journal)
Publisher: IOP PUBLISHING LTD
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Non-contact AFM observation of the (root 3x root 3) to (3x3) phase transition on Sn/Ge(111) and Sn/Si(111) surfaces
Insook Yi, Ryuji Nishi, Yoshiaki Sugimoto, Seizo Morita
APPLIED SURFACE SCIENCE Vol. 253 No. 6 p. 3072-3076 2007/01 Research paper (scientific journal)
Publisher: ELSEVIER
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Study on topographic images of Sn/Si(111)-(root 3 x root 3)R30 degrees surface by non-contact AFM
Insook Yi, Yoshiaki Sugimoto, Ryuji Nishi, Seizo Morita
SURFACE SCIENCE Vol. 600 No. 17 p. 3382-3387 2006/09 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface
Insook Yi, Ryuji Nishi, Yoshiaki Sugimoto, Masayuki Abe, Yasuhiro Sugawara, Seizo Morita
SURFACE SCIENCE Vol. 600 No. 13 p. 2766-2770 2006/07 Research paper (scientific journal)
Publisher: ELSEVIER
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Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation
Ryuji Nishi, Daisuke Miyagawa, Yoshihide Seino, Insook Yi, Seizo Morita
Nanotechnology Vol. 17 No. 7 p. S142-S147 2006/04/14 Research paper (scientific journal)
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Functions of NC-AFM on atomic scale
S Morita, N Oyabu, T Nishimoto, R Nishi, O Custance, Yi, I, Y Sugawara
SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS Vol. 186 p. 173-+ 2005 Research paper (international conference proceedings)
Publisher: SPRINGER
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Phase detection method with positive-feedback control using a quartz resonator based atomic force microscope in a liquid environment
R Nishi, K Kitano, Yi, I, Y Sugawara, S Morita
APPLIED SURFACE SCIENCE Vol. 237 No. 1-4 p. 654-656 2004/10 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
S Morita, Y Sugimoto, N Oyabu, R Nishi, O Custance, Y Sugawara, M Abe
JOURNAL OF ELECTRON MICROSCOPY Vol. 53 No. 2 p. 163-168 2004 Research paper (scientific journal)
Publisher: OXFORD UNIV PRESS
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Atom selective imaging by NC-AFM: case of oxygen adsorbed on a Si(111) 7x7 surface
R Nishi, S Araragi, K Shirai, Y Sugawara, S Morita
APPLIED SURFACE SCIENCE Vol. 210 No. 1-2 p. 90-92 2003/03 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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A noncontact atomic force microscope in air using a quartz resonator and the FM detection method
R. Nishi, I. Houda, K. Kitano, Y. Sugawara, S. Morita
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING Vol. 72 p. S93-S95 2001/03 Research paper (scientific journal)
Publisher: SPRINGER
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Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy
R Nishi, Houda, I, T Aramata, Y Sugawara, S Morita
APPLIED SURFACE SCIENCE Vol. 157 No. 4 p. 332-336 2000/04 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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New computed tomography algorithm of electrostatic force microscopy based on the singular value decomposition combined with the discrete fourier transform
R Nishi, Y Nakao, T Ohta, Y Sugawara, S Morita, T Okada
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS Vol. 37 No. 4A p. L417-L419 1998/04 Research paper (scientific journal)
Publisher: JAPAN SOC APPLIED PHYSICS
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Simulated computed tomography for the reconstruction of vacancies using an atomic force microscope image
R Nishi, T Ohta, Y Sugawara, S Morita, T Okada
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS Vol. 36 No. 10B p. L1410-L1412 1997/10 Research paper (scientific journal)
Publisher: JAPAN SOC APPLIED PHYSICS
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Measurement and analysis of dynamic response of massive magnetic electron lenses
R Nishi, N Matsuo, A Takaoka
MEASUREMENT SCIENCE AND TECHNOLOGY Vol. 7 No. 8 p. 1124-1127 1996/08 Research paper (scientific journal)
Publisher: IOP PUBLISHING LTD
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Cross-sectional observation of luminous broadening in YAG scintillator
R Nishi, K Yoshida, H Kanzaki, A Takaoka
ULTRAMICROSCOPY Vol. 63 No. 3-4 p. 273-278 1996/07 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Measurement of luminous broadening with sandwich-structure fluorescent plates
R Nishi, K Yoshida, A Takaoka
JOURNAL OF ELECTRON MICROSCOPY Vol. 45 No. 2 p. 148-151 1996/04 Research paper (scientific journal)
Publisher: JAPANESE SOC ELECTRON MICRO BUS CENTER ACAD SOC JAPAN
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Electron energy dependence of characteristics of fluorescent plates for ultrahigh-voltage electron microscopes
R Nishi, K Yoshida, A Takaoka, T Katsuta
ULTRAMICROSCOPY Vol. 62 No. 4 p. 271-275 1996/03 Research paper (scientific journal)
Publisher: ELSEVIER SCIENCE BV
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Image forming optics with a common aperture for fast switching between TEM magnified image and selected area diffraction
R Nishi, K Yoshida, A Takaoka
JOURNAL OF ELECTRON MICROSCOPY Vol. 44 No. 6 p. 476-478 1995/12 Research paper (scientific journal)
Publisher: JAPANESE SOC ELECTRON MICRO BUS CENTER ACAD SOC JAPAN
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Measurement of thermal conductivity of thin films with TEM
A TAKAOKA, R NISHI
ELECTRON MICROSCOPY 1994, VOL 1 p. 261-262 1994 Research paper (international conference proceedings)
Publisher: EDITIONS PHYSIQUE
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Accelerating voltage dependence of characteristics of fluorescent plate for ultra-HVEM
K YOSHIDA, N MATSUO, R NISHI, A TAKAOKA
ELECTRON MICROSCOPY 1994, VOL 1 p. 225-226 1994 Research paper (international conference proceedings)
Publisher: EDITIONS PHYSIQUE
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Improvement of objective lens response by using built-in focusing lens
A TAKAOKA, R NISHI, K URA
ELECTRON MICROSCOPY 1994, VOL 1 p. 171-172 1994 Research paper (international conference proceedings)
Publisher: EDITIONS PHYSIQUE
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Optical system for simultaneous observation of magnified image and diffraction figure without exchange of aperture
R NISHI, A TAKAOKA, K URA
ELECTRON MICROSCOPY 1994, VOL 1 p. 179-180 1994 Research paper (international conference proceedings)
Publisher: EDITIONS PHYSIQUE
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Frequency Dependence of Inductance Due to Slow Flux Penetration into Magnetic Circuit of Lens
Ryuji Nishi, Akio Takaoka, Katsumi Ura
J. Electron Microsc. 1993/01 Research paper (scientific journal)
Publisher:
