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Yamasaki Jun

山﨑　順

Research Center for Ultra-High Voltage Electron Microscopy, Professor

yamasaki uhvem.osaka-u.ac.jp

Education

  • - 2001/03, Osaka University, Graduate School, Division of Natural Science, Physics
  • - 2001, Osaka University
  • - 1998, Osaka University
  • - 1998, Osaka University, Graduate School, Division of Engineering Science, physics

Research History

  • 2021/04 - Present, Osaka University, Research Center for Ultra-High Voltage Electron Microscopy, Professor
  • 2014/04 - 2021/03, Osaka University Research Center for Ultra-High Voltage Electron Microscopy, Research Center for Ultra-High Voltage Electron Microscopy, Associate Professor
  • 2002 - 2004, 名古屋大学理工科学総合研究センター・助手
  • 2001 - 2002, Nagoya University, Graduate School of Engineering
  • 2004 - , Nagoya University, Ecotopia Science Institute

Research Areas

  • Other, Other, Electron Microscopy
  • Nanotechnology/Materials, Thin-film surfaces and interfaces
  • Nanotechnology/Materials, Nanomaterials
  • Nanotechnology/Materials, Crystal engineering
  • Nanotechnology/Materials, Applied materials
  • Nanotechnology/Materials, Nanostructure physics

Professional Memberships

  • Microscopy and Microanalysis
  • 応用物理学会
  • 日本物理学会
  • 日本顕微鏡学会
  • The Japan Society of Applied Physics
  • The Physical Society of Japan
  • The Japanese Society of Microscopy

Papers

  • Wave field reconstruction and phase imaging by electron diffractive imaging, Jun Yamasaki, Microscopy, Oxford University Press (OUP), Vol. 70, No. 1, p. 116-130, 2021/02/01
  • Quantitative measurement of spatial coherence of electron beams emitted from a thermionic electron gun, Shuhei Hatanaka,Jun Yamasaki, Journal of the Optical Society of America A, Vol. 38, p. 1893-1900, 2021
  • Ultrafast dynamics of a photoinduced phase transition in single-crystal trititanium pentoxide, Shuhei Hatanaka,Taro Tsuchiya,Shuhei Ichikawa,Jun Yamasaki,Kazuhisa Sato, Applied Physics Letters, AIP Publishing, Vol. 123, No. 24, 2023/12/11
  • Iron phosphide nanocrystals as an air-stable heterogeneous catalyst for liquid-phase nitrile hydrogenation, Tomohiro Tsuda,Min Sheng,Hiroya Ishikawa,Seiji Yamazoe,Jun Yamasaki,Motoaki Hirayama,Sho Yamaguchi,Tomoo Mizugaki,Takato Mitsudome, Nature Communications, Springer Science and Business Media LLC, Vol. 14, No. 1, 2023/09/28
  • Phosphorus-Alloying as a Powerful Method for Designing Highly Active and Durable Metal Nanoparticle Catalysts for the Deoxygenation of Sulfoxides: Ligand and Ensemble Effects of Phosphorus, Hiroya Ishikawa,Sho Yamaguchi,Ayako Nakata,Kiyotaka Nakajima,Seiji Yamazoe,Jun Yamasaki,Tomoo Mizugaki,Takato Mitsudome, JACS Au, American Chemical Society (ACS), Vol. 2, No. 2, p. 419-427, 2022/02/28
  • A nickel phosphide nanoalloy catalyst for the C-3 alkylation of oxindoles with alcohols, Shu Fujita,Kohei Imagawa,Sho Yamaguchi,Jun Yamasaki,Seiji Yamazoe,Tomoo Mizugaki,Takato Mitsudome, Scientific Reports, Springer Science and Business Media LLC, Vol. 11, No. 1, 2021/12
  • Hydrotalcite-Supported Cobalt Phosphide Nanorods as a Highly Active and Reusable Heterogeneous Catalyst for Ammonia-Free Selective Hydrogenation of Nitriles to Primary Amines, Min Sheng,Sho Yamaguchi,Ayako Nakata,Seiji Yamazoe,Kiyotaka Nakajima,Jun Yamasaki,Tomoo Mizugaki,Takato Mitsudome, ACS Sustainable Chemistry & Engineering, American Chemical Society (ACS), Vol. 9, No. 33, p. 11238-11246, 2021/08/23
  • Support-Boosted Nickel Phosphide Nanoalloy Catalysis in the Selective Hydrogenation of Maltose to Maltitol, Sho Yamaguchi,Shu Fujita,Kiyotaka Nakajima,Seiji Yamazoe,Jun Yamasaki,Tomoo Mizugaki,Takato Mitsudome, ACS Sustainable Chemistry & Engineering, American Chemical Society (ACS), Vol. 9, No. 18, p. 6347-6354, 2021/05/10
  • Single-Crystal Cobalt Phosphide Nanorods as a High-Performance Catalyst for Reductive Amination of Carbonyl Compounds, Min Sheng,Shu Fujita,Sho Yamaguchi,Jun Yamasaki,Kiyotaka Nakajima,Seiji Yamazoe,Tomoo Mizugaki,Takato Mitsudome, JACS Au, American Chemical Society (ACS), 2021/04/07
  • Ni<inf>2</inf>P Nanoalloy as an Air-Stable and Versatile Hydrogenation Catalyst in Water: P-Alloying Strategy for Designing Smart Catalysts, Shu Fujita,Sho Yamaguchi,Jun Yamasaki,Kiyotaka Nakajima,Seiji Yamazoe,Tomoo Mizugaki,Takato Mitsudome, Chemistry - A European Journal, Vol. 27, No. 13, p. 4439-4446, 2021/03/01
  • Quasi-static 3D structure of graphene ripple measured using aberration-corrected TEM, Yuhiro Segawa,Kenji Yamazaki,Jun Yamasaki,Kazutoshi Gohara, Nanoscale, Royal Society of Chemistry (RSC), Vol. 13, No. 11, p. 5847-5856, 2021
  • Air-stable and reusable nickel phosphide nanoparticle catalyst for the highly selective hydrogenation of D-glucose to D-sorbitol, Sho Yamaguchi,Shu Fujita,Kiyotaka Nakajima,Seiji Yamazoe,Jun Yamasaki,Tomoo Mizugaki,Takato Mitsudome, Green Chemistry, Royal Society of Chemistry (RSC), 2021
  • Air-Stable and Reusable Cobalt Phosphide Nanoalloy Catalyst for Selective Hydrogenation of Furfural Derivatives, Hiroya Ishikawa,Min Sheng,Ayako Nakata,Kiyotaka Nakajima,Seiji Yamazoe,Jun Yamasaki,Sho Yamaguchi,Tomoo Mizugaki,Takato Mitsudome, ACS Catalysis, American Chemical Society (ACS), p. 750-757, 2021/01/01
  • Progress in environmental high-voltage transmission electron microscopy for nanomaterials, Nobuo Tanaka,Takeshi Fujita,Yoshimasa Takahashi,Jun Yamasaki,Kazuyoshi Murata,Shigeo Arai, PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, ROYAL SOC, Vol. 378, No. 2186, 2020/12
  • Unique Catalysis of Nickel Phosphide Nanoparticles to Promote the Selective Transformation of Biofuranic Aldehydes into Diketones in Water, Shu Fujita,Kiyotaka Nakajima,Jun Yamasaki,Tomoo Mizugaki,Koichiro Jitsukawa,Takato Mitsudome, ACS CATALYSIS, AMER CHEMICAL SOC, Vol. 10, No. 7, p. 4261-4267, 2020/04
  • Nickel phosphide nanoalloy catalyst for the selective deoxygenation of sulfoxides to sulfides under ambient H2 pressure, Shu Fujita,Sho Yamaguchi,Seiji Yamazoe,Jun Yamasaki,Tomoo Mizugaki,Takato Mitsudome, Organic & Biomolecular Chemistry, Royal Society of Chemistry (RSC), Vol. 18, No. 43, p. 8827-8833, 2020
  • A cobalt phosphide catalyst for the hydrogenation of nitriles, Takato Mitsudome,Min Sheng,Ayako Nakata,Jun Yamasaki,Tomoo Mizugaki,Koichiro Jitsukawa, Chemical Science, Royal Society of Chemistry (RSC), Vol. 11, No. 26, p. 6682-6689, 2020
  • Intensity Attenuation in TEM Images with Increasing Thickness and Its Influence on Tomography, Jun Yamasaki, Kenbikyo, Vol. 54, No. 3, p. 149-152, 2019/12
  • Phase imaging and atomic-resolution imaging by electron diffractive imaging, Jun Yamasaki,Shigeyuki Morishita,Yuki Shimaoka,Keisuke Ohta,Hirokazu Sasaki, Japanese Journal of Applied Physics, Vol. 58, p. 120502-1-120502-14, 2019/11
  • Air-stable and reusable cobalt ion-doped titanium oxide catalyst for alkene hydrosilylation, Takato Mitsudome,Shu Fujita,Min Sheng,Jun Yamasaki,Keita Kobayashi,Tomoko Yoshida,Zen Maeno,Tomoo Mizugaki,Koichiro Jitsukawa,Kiyotomi Kaneda, Green Chemistry, ROYAL SOC CHEMISTRY, Vol. 21, No. 16, p. 4566-4570, 2019/07
  • Advanced Analysis Technology for New Material and Product Development, Hirokazu Sasaki,Hideo Nishikubo,Shinsuke Nishida,Satoshi Yamazaki,Ryusuke Nakasaki,Takemi Isomatsu,Ryuichiro Minato,Kohei Kinugawa,Akihiro Imamura,Shinya Otomo,Yujin Hori,Kiyoshige Hirose,Satoshi Anada,Kazuo Yamamoto,Tsukasa Hirayama,Jun Yamasaki,Naoya Shibata,Yojiro Oba,Masato Ohnuma, Furukawa Electric Review, Vol. 50, p. 2-11, 2019/02
  • 新材料・新製品開発のための先端解析技術, 佐々木宏和,西久保英郎,西田真輔,山崎悟志,中崎竜介,磯松岳己,湊龍一郎,衣川耕平,今村明博,大友晋哉,堀祐臣,廣瀬清慈,穴田智史,山本和生,平山司,山﨑順,柴田直哉,大場洋次郎,大沼正人, 古河電工時報, Vol. 138, p. 2-12, 2019/02
  • Empirical determination of transmission attenuation curves in mass-thickness contrast TEM imaging, Jun Yamasaki,Yuya Ubata,Hidehiro Yasuda, Ultramicroscopy, Vol. 200, p. 20-27, 2019/02
  • Precise method for measuring spatial coherence in TEM beams using Airy diffraction patterns, Jun Yamasaki,Yuki Shimaoka,Hirokazu Sasaki, Microscopy, Oxford University Press, Vol. 67, No. 1, p. 1-10, 2018/02/01
  • Advanced Analytical Methods for Atomic/Nanoscopic Localized Structures Utilizing Aberration-corrected Transmission Electron Microscopy, Vol. 59, No. 2, p. 82-88, 2017/04
  • Mild Hydrogenation of Amides to Amines over a Platinum-Vanadium Bimetallic Catalyst, Takato Mitsudome,Kazuya Miyagawa,Zen Maeno,Tomoo Mizugaki,Koichiro Jitsukawa,Jun Yamasaki,Yasutaka Kitagawa,Kiyotomi Kaneda, Angewandte Chemie - International Edition, Wiley-VCH Verlag, Vol. 56, No. 32, p. 9381-9385, 2017
  • Visualization of Nano Electric Fields by Electron Diffractive Phase Imaging, Yamasaki Jun,Shimaoka Yuki,Sasaki Hirokazu, Materia Japan, The Japan Institute of Metals and Materials, Vol. 55, No. 12, p. 581-581, 2016/12
  • Si(001)上の3C-SiCエピ膜形成および積層欠陥生成過程の断面TEM解析, 山﨑 順,石田 篤志,秋山 賢輔,平林 康男, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 63rd, 2016/03
  • Design of Core-Pd/Shell-Ag Nanocomposite Catalyst for Selective Semihydrogenation of Alkynes, Takato Mitsudome,Teppei Urayama,Kenji Yamazaki,Yosuke Maehara,Jun Yamasaki,Kazutoshi Gohara,Zen Maeno,Tomoo Mizugaki,Koichiro Jitsukawa,Kiyotomi Kaneda, ACS Catalysis, American Chemical Society, Vol. 6, No. 2, p. 666-670, 2016/02/05
  • 収差補正電子顕微鏡を用いた Si(001)基板上エピタキシャル3C-SiC膜の形成過程と積層欠陥生成過程の研究, 山﨑 順,稲元 伸,玉置央和,野村優貴,石田篤志,秋山賢輔,平林康男, 2015/11
  • 超高圧電子顕微鏡を用いた電子線透過能の研究とトモグラフィー観察への応用, 山﨑 順, 2015/10
  • 透過電子顕微鏡を用いたSi(001)上の3C-SiC膜形成及び積層欠陥生成過程の研究, 山﨑 順,石田 篤志,秋山 賢輔,平林 康男, 日本物理学会講演概要集(CD-ROM), Vol. 70, No. 2, 2015/09
  • Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials, Jun Yamasaki,Michihiro Mutoh,Shigemasa Ohta,Shuichi Yuasa,Shigeo Arai,Katsuhiro Sasaki,Nobuo Tanaka, 2015/08
  • Reconstruction of Atomic Structures and Electric Fields of Nano Materials Using Electron Diffractive Imaging, Jun Yamasaki, 2015/07
  • Airyディスクを用いた電子線空間干渉性の計測と回折顕微法, 島岡 勇記,山﨑 順, 2015/05
  • 収差補正TEMによる結晶性ナノクラスターの深さ分解能結像, 山崎順,平田秋彦,弘津禎彦,平原佳織,田中信夫, 2015/05
  • Depth-resolution imaging of crystalline nanoclusters attached on and embedded in amorphous films using aberration-corrected TEM, Jun Yamasaki,Masayuki Mori,Akihiko Hirata,Yoshihiko Hirotsu,Nobuo Tanaka, ULTRAMICROSCOPY, ELSEVIER SCIENCE BV, Vol. 151, p. 224-231, 2015/04
  • 16aAB-4 電子線小角散乱を用いた回折位相イメージングの高精度化, 島岡 勇記,山崎 順, 日本物理学会講演概要集, 一般社団法人日本物理学会, Vol. 70, p. 2395-2395, 2015
  • 超高圧電顕を用いたミクロンサイズ材料の密度定量３次元トモグラフィー, 山﨑 順, 2014/12
  • Electron Diffractive Imaging of Crystalline Structures and Electric Fields in/around Nano Materials, Jun Yamasaki, 2014/12
  • Depth-Resolution Imaging of Three-Dimensional Nano Structures Using Aberration-Corrected TEM, Vol. 49, No. 3, p. 216-221, 2014/12
  • 電子回折図形に基づくナノイメージング, 山﨑 順, 2014/11
  • TEMトモグラフィー, 山﨑 順, 2014/11
  • 非結晶性物質のTEMトモグラフィーにおける密度分布3D再構成の条件, 山﨑 順, 2014/11
  • Analysis of the nonlinearity between mass-thickness and bright-field TEM intensity for quantitative tomography of micron-sized materials, J. Yamasaki,M. Mutoh,S. Ohta,S. Yuasa,S. Arai,K. Sasaki,N. Tanaka, 2014/11
  • Observation of electric field using electron diffractive imaging, J. Yamasaki,K. Ohta,H. Sasaki,N. Tanaka, 2014/09
  • Nonlinear intensity attenuation in bright-field TEM images and its influence on tomographic reconstruction of micron-sized materials, Jun Yamasaki,Michihiro Mutoh,Shigemasa Ohta,Shuich Yuasa,Shigeo Arai,Katsuhiro Sasaki,Nobuo Tanaka, 2014/09
  • 電子線の空間コヒーレンス測定と電子線回折イメージング, 山﨑 順, 2014/08
  • Electron Diffractive Imaging of Crystalline Structures and Electric Fields of Nano Materials, Jun Yamasaki, 2014/08
  • Atomic structure analysis of stacking faults and misfit dislocations at 3C-SiC/Si(001) interfaces by aberration-corrected transmission electron microscopy, J. Yamasaki,S. Inamoto,Y. Nomura,H. Tamaki,N. Tanaka, JOURNAL OF PHYSICS D-APPLIED PHYSICS, IOP PUBLISHING LTD, Vol. 45, No. 49, 2014/08
  • Phase Imaging by Electron Diffractive Imaging, Jun Yamasaki, 2014/06
  • Analysis of nonlinear intensity attenuation in bright-field TEM images for correct 3D reconstruction of the density in micron-sized materials, Jun Yamasaki,Michihiro Mutoh,Shigemasa Ohta,Syuichi Yuasa,Shigeo Arai,Katsuhiro Sasaki,Nobuo Tanaka, MICROSCOPY, OXFORD UNIV PRESS, Vol. 63, No. 5, p. 345-355, 2014/06
  • GaAs/InAsヘテロ接合ナノワイヤー界面での構造と組成の遷移, 三浦正視,山﨑 順,Peter Krogstrup,Erik Johnson,田中信夫, 2014/05
  • TEMトモグラフィーによる正しい内部強度再構成のための透過率条件, 山﨑 順,武藤道洋,大田繁正,荒井重勇,田中信夫, 2014/05
  • 制限視野ナノ電子回折を用いたアモルファスMRO構造のサイズ計測法の開発, 山﨑 順,森 雅幸,平田秋彦,弘津禎彦,田中信夫, 2014/05
  • Influence of Nonlinear Intensity Attenuation in Bright-Field TEM Images on Tomographic Reconstructions of Micron-Scaled Materials, J. Yamasaki,M. Mutoh,S. Ohta,S. Yuasa,S. Arai,K. Sasaki,N. Tanaka, 2014/05
  • 制限視野ナノ電子回折を用いたアモルファスMRO構造のサイズ計測, 山﨑 順,森 雅幸,平田秋彦,弘津禎彦,田中信夫, 2014/03
  • TEM像強度非線形減衰の解析と三次元密度の再構成, 山﨑 順, 2014/03
  • Key factors for the dynamic ETEM observation of single atoms, K. Yoshida,T. Tominaga,T. Hanatani,A. Tagami,Y. Sasaki,J. Yamasaki,K. Saitoh,N. Tanaka, Journal of Electron Microscopy, Vol. 62, No. 6, p. 571-582, 2013/12
  • Microstructure and interdiffusion behaviour of β-FeSi2 flat islands grown on Si(111) surfaces, Sung-Pyo Cho,Yoshiaki Nakamura,Jun Yamasaki,Eiji Okunishi,Masakazu Ichikawa,Nobuo Tanaka, Journal of Applied Crystallography, Vol. 46, No. 4, p. 1076-1080, 2013/08
  • Measurement of spatial coherence of electron beams by using a small selected-area aperture, Shigeyuki Morishita,Jun Yamasaki,Nobuo Tanaka, ULTRAMICROSCOPY, ELSEVIER SCIENCE BV, Vol. 129, p. 10-17, 2013/06
  • Quantitative phase imaging of electron waves using selected-area diffraction, J. Yamasaki,K. Ohta,S. Morishita,N. Tanaka, Applied Physics Letters, Vol. 101, No. 23, 2012/12/03
  • Polytype Transformation by Replication of Stacking Faults Formed by Two-Dimensional Nucleation on Spiral Steps during SiC Solution Growth, Shunta Harada,Alexander,Kazuaki Seki,Yuji Yamamoto,Can Zhu,Yuta Yamamoto,Shigeo Arai,Jun Yamasaki,Nobuo Tanaka,Toru Ujihara, CRYSTAL GROWTH & DESIGN, AMER CHEMICAL SOC, Vol. 12, No. 6, p. 3209-3214, 2012/06
  • Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy, J. Yamasaki,S. Inamoto,Y. Nomura,K. Okazaki-Maeda,N. Tanaka, Microscopy and Microanalysis, Vol. 18, No. 2, p. 514-515, 2012
  • Estimation of wave fields of incident beams in a transmission electron microscope by using a small selected-area aperture, Shigeyuki Morishita,Jun Yamasaki,Nobuo Tanaka, JOURNAL OF ELECTRON MICROSCOPY, OXFORD UNIV PRESS, Vol. 60, No. 2, p. 101-108, 2011/04
  • Electron Diffractive Imaging with Atomic Resolution by Using Selected Area Nano Diffraction, YAMASAKI Jun,TANAKA Nobuo, X-RAYS, The Crystallographic Society of Japan, Vol. 53, No. 5, p. 346-352, 2011
  • Atomic arrangement at the 3C-SiC/Si(001) interface revealed utilising aberration-corrected transmission electron microscope, Shin Inamoto,Jun Yamasaki,Hirokazu Tamaki,Nobuo Tanaka, PHILOSOPHICAL MAGAZINE LETTERS, TAYLOR & FRANCIS LTD, Vol. 91, No. 9, p. 632-639, 2011
  • Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy, S. Inamoto,J. Yamasaki,E. Okunishi,K. Kakushima,H. Iwai,N. Tanaka, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 107, No. 12, 2010/06
  • Highly Active Iron Oxide Supported Gold Catalysts for CO Oxidation: How Small Must the Gold Nanoparticles Be?, Yong Liu,Chun-Jiang Jia,Jun Yamasaki,Osamu Terasaki,Ferdi Schueth, ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, WILEY-V C H VERLAG GMBH, Vol. 49, No. 33, p. 5771-5775, 2010
  • Junctions in Axial III-V Heterostructure Nanowires Obtained via an Interchange of Group III Elements, Peter Krogstrup,Jun Yamasaki,Claus B. Sorensen,Erik Johnson,Jakob B. Wagner,Robert Pennington,Martin Aagesen,Nobuo Tanaka,Jesper Nygard, NANO LETTERS, AMER CHEMICAL SOC, Vol. 9, No. 11, p. 3689-3693, 2009/11
  • Diffractive imaging of the dumbbell structure in silicon by spherical-aberration-corrected electron diffraction, Shigeyuki Morishita,Jun Yamasaki,Keisuke Nakamura,Takeharu Kato,Nobuo Tanaka, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 93, No. 18, 2008/11
  • Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO(2) coverage, N. Tanaka,S. -P. Cho,A. A. Shklyaev,J. Yamasaki,E. Okunishi,M. Ichikawa, APPLIED SURFACE SCIENCE, ELSEVIER SCIENCE BV, Vol. 254, No. 23, p. 7569-7572, 2008/09
  • A practical solution for eliminating artificial image contrast in aberration-corrected TEM, Jun Yamasaki,Tomoyuki Kawai,Yushi Kondo,Nobuo Tanaka, MICROSCOPY AND MICROANALYSIS, CAMBRIDGE UNIV PRESS, Vol. 14, No. 1, p. 27-35, 2008/02
  • Present status of Cs-corrected HRTEM and future prospects, N. Tanaka,J. Yamasaki,K. Hirahara,K. Yoshida,K. Saitoh, Microscopy and Microanalysis, Vol. 12, No. 2, p. 158-159, 2006/08
  • Direct observation of six-membered rings in the upper and lower walls of a single-wall carbon nanotube by spherical aberration-corrected HRTEM, Kaori Hirahara,Koh Saitoh,Jun Yamasaki,Nobuo Tanaka, NANO LETTERS, AMER CHEMICAL SOC, Vol. 6, No. 8, p. 1778-1783, 2006/08
  • Oxygen release and structural changes in TiO2 films during photocatalytic oxidation, Kenta Yoshida,Takahiro Nanbara,Jun Yamasaki,Nobuo Tanaka, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 99, No. 8, 2006/04
  • High-resolution TEM/STEM analysis of SiO2/Si(100) and La 2O3/Si(100) interfaces, Nobuo Tanaka,Jun Yamasaki,Shin Inamoto,Koh Saitoh, 2006 International Workshop on Nano CMOS - Proceedings, IWNC, p. 110-124, 2006
  • First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM, J Yamasaki,H Sawada,N Tanaka, JOURNAL OF ELECTRON MICROSCOPY, OXFORD UNIV PRESS, Vol. 54, No. 2, p. 123-126, 2005/04
  • Observation of photo-decomposition process of poly-hydrocarbons on catalytic TiO2 films detected in dedicated in-situ TEM, K. Yoshida,T. Nanbara,J. Yamasaki,N. Tanaka, Microscopy and Microanalysis, Vol. 11, No. 2, p. 214-215, 2005
  • A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM, J Yamasaki,T Kawai,N Tanaka, JOURNAL OF ELECTRON MICROSCOPY, OXFORD UNIV PRESS, Vol. 54, No. 3, p. 209-214, 2005
  • Observation of Local Strain in In_xGa_<1-x>As Quantum Dots by Spherical-Aberration Corrected HRTEM, TANAKA Nobuo,YAMASAKI Jun,FUCHI Shingo,TAKEDA Yoshikazu, Materia Japan, The Japan Institute of Metals and Materials, Vol. 43, No. 12, p. 987-987, 2004/12
  • The first observation of carbon nanotubes by spherical aberration corrected high-resolution transmission electron microscopy, N Tanaka,J Yamasaki,T Kawai,HY Pan, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 15, No. 12, p. 1779-1784, 2004/12
  • Three-dimensional analysis of platinum supercrystals by transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy observations, J. Yamasaki,N. Tanaka,N. Baba,H. Kakibayashi,O. Terasaki, Philosophical Magazine, Vol. 84, No. 25-26, p. 2819-2828, 2004/09/01
  • Three-dimensional analysis of platinum supercrystals by transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy observations, J Yamasaki,N Tanaka,N Baba,H Kakibayashi,O Terasaki, PHILOSOPHICAL MAGAZINE, TAYLOR & FRANCIS LTD, Vol. 84, No. 25-26, p. 2819-2828, 2004/09
  • Development of microcapsules for electron microscopy and their application to dynamical observation of liquid crystals in transmission electron microscopy, K Nishijima,J Yamasaki,H Orihara,N Tanaka, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 15, No. 6, p. S329-S332, 2004/06
  • Microstructure change of vanadium clusters in ZnO crystalline films by heat-treatment, HY Pan,A Ohno,S Fukami,J Yamasaki,N Tanaka, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 15, No. 6, p. S420-S427, 2004/06
  • A trial for in situ quantitative TEM-EELS measurement related to the photoreaction process of TiO2 films, K Yoshida,J Yamasaki,N Tanaka, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 15, No. 6, p. S349-S354, 2004/06
  • In situ high-resolution transmission electron microscopy observation of photodecomposition process of poly-hydrocarbons on catalytic TiO2 films, K Yoshida,J Yamasaki,N Tanaka, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 84, No. 14, p. 2542-2544, 2004/04
  • First observation of InxGa1-xAs quantum dots in GaP by spherical-aberration-corrected HRTEM in comparison with ADF-STEM and conventional HRTEM, N Tanaka,J Yamasaki,S Fuchi,Y Takeda, MICROSCOPY AND MICROANALYSIS, CAMBRIDGE UNIV PRESS, Vol. 10, No. 1, p. 139-145, 2004/02
  • Electron tomography of nano-magnetic materials less than 1 nm resolution, N. Tanaka,A. Ohno,S. Fukami,J. Yamasaki, Microscopy and Microanalysis, Vol. 10, No. SUPPL. 2, p. 1176-1177, 2004
  • Three-dimensional Analysis of Platinum Super-Crystals by TEM and HAADF-STEM Observations, J.Yamasaki,N.Tanaka,N.Baba,H.kaibayashi,O.Terasaki, Philosophical Magazine, Vol. 84, p. 2819-2828, 2004
  • Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM, J Yamasaki,T Kawai,N Tanaka, JOURNAL OF ELECTRON MICROSCOPY, OXFORD UNIV PRESS, Vol. 53, No. 2, p. 129-135, 2004
  • HRTEM studies of mn-size FePd particles embedded in MgO after annealing over 920K, HY Pan,S Fukami,J Yamasaki,N Tanaka, MATERIALS TRANSACTIONS, JAPAN INST METALS, Vol. 44, No. 10, p. 2048-2054, 2003/10
  • High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co-Al-O alloys, N Tanaka,J Yamasaki,S Mitani,K Takanashi, SCRIPTA MATERIALIA, PERGAMON-ELSEVIER SCIENCE LTD, Vol. 48, No. 7, p. 909-914, 2003/04
  • Extended vacancy-type defects in silicon induced at low temperatures by electron irradiation, J. Yamasaki,Y. Ohno,S. Takeda,Y. Kimura, Philosophical Magazine, Vol. 83, No. 2, p. 151-163, 2003/01/11
  • HRTEM and EELS analysis of interfacial reactions in Ti/Si <inf>1-x</inf>Ge<inf>x</inf>/Si(100), J. Yamasaki,N. Tanaka,O. Nakatsuka,A. Sakai,S. Zaima,Y. Yasuda, Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, p. 470-471, 2003
  • Extended vacancy-type defects in silicon induced at low temperatures by electron irradiation, J Yamasaki,Y Ohno,S Takeda,Y Kimura, PHILOSOPHICAL MAGAZINE, TAYLOR & FRANCIS LTD, Vol. 83, No. 2, p. 151-163, 2003/01
  • First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy, N Tanaka,J Yamasaki,K Usuda,N Ikarashi, JOURNAL OF ELECTRON MICROSCOPY, OXFORD UNIV PRESS, Vol. 52, No. 1, p. 69-73, 2003
  • Novel amorphization process in silicon induced by electron irradiation, J. Yamasaki,Y. Ohno,H. Kohno,N. Ozaki,S. Takeda, Journal of Non-Crystalline Solids, Vol. 299-302, No. 2, p. 793-797, 2002/04
  • Elemental process of amorphization induced by electron irradiation in Si, Jun Yamasaki,Seiji Takeda,Kenji Tsuda, Physical Review B - Condensed Matter and Materials Physics, Vol. 65, No. 11, p. 1152131-11521310, 2002/03/15
  • Elemental process of amorphization induced by electron irradiation in Si, J Yamasaki,S Takeda,K Tsuda, PHYSICAL REVIEW B, AMERICAN PHYSICAL SOC, Vol. 65, No. 11, p. 115213-115222, 2002/03
  • Observation of silicon surface nanoholes by scanning tunneling microscopy, N Ozaki,Y Ohno,M Tanbara,D Hamada,J Yamasaki,S Takeda, SURFACE SCIENCE, ELSEVIER SCIENCE BV, Vol. 493, No. 1-3, p. 547-554, 2001/11
  • Interface reactions in Ti/Si1-xGex/Si(100) studied by TEM and ADF imaging on a newly installed 200kV TEM/STEM, N Tanaka,JJ Hu,J Yamasaki,Y Murooka,S Zaima,Y Yasuda, ELECTRON MICROSCOPY AND ANALYSIS 2001, IOP PUBLISHING LTD, No. 168, p. 373-376, 2001
  • Electron irradiation effects in Si observed at 4.2-25 K by means of in situ transmission electron microscopy, S Takeda,J Yamasaki,Y Kimura, PHYSICA B-CONDENSED MATTER, ELSEVIER SCIENCE BV, Vol. 273-4, p. 476-479, 1999/12
  • Structural properties of amorphous silicon produced by electron irradiation, J Yamasaki,S Takeda, AMORPHOUS AND HETEROGENEOUS SILICON THIN FILMS: FUNDAMENTALS TO DEVICES-1999, MATERIALS RESEARCH SOCIETY, Vol. 557, p. 231-236, 1999
  • Amorphization in silicon by electron irradiation, S. Takeda,J. Yamasaki, Physical Review Letters, Vol. 83, No. 2, p. 320-323, 1999/01/01
  • Extended platelets on {111} in GaAs created by He-ion implantation followed by low temperature annealing, T Nomachi,S Muto,M Hirata,H Kohno,J Yamasaki,S Takeda, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 71, No. 2, p. 255-257, 1997/07
  • Modeling of self-interstitial clusters and their formation mechanism in Si, S Takeda,N Arai,J Yamasaki, DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, TRANSTEC PUBLICATIONS LTD, Vol. 258-2, p. 535-540, 1997

Misc.

  • Development of Electron Diffractive Imaging, Jun YAMASAKI, Vacuum and Surface Science, Surface Science Society Japan, Vol. 64, No. 10, p. 466-471, 2021/10/10
  • Elimination of artificial density in electron tomography, Ubata Yuya,Yamasaki Jun,Murata Kazuyoshi,Kuwahara Ryusuke,Takahashi Kazumi,Inamoto Shin,Yasuda Hidehiro,Mori Hirotaro, Meeting Abstracts of the Physical Society of Japan, The Physical Society of Japan, Vol. 72, No. 0, p. 2693-2693, 2017
  • 21aHS-8 Influence of quantum noise on electron diffractive imaging, Morishita Shigeyuki,Yamasaki Jun,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 65, No. 1, p. 982-982, 2010/03/01
  • 21aHS-7 Three-dimensional lattice strain analysis using rocking curves of HOLZ lines II, Hamabe Maiko,Saitoh Koh,Morishita Shigeyuki,Yamasaki Jun,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 65, No. 1, p. 982-982, 2010/03/01
  • Observations of Atomic Columns in Compounds by Image Subtraction & Deconvolution Processing of Aberration-Corrected HRTEM Images, Jun Yamasaki,Shin Inamoto,Hirokazu Tamaki,Nobuo Tanaka, AMTC Letters, Vol. 2, p. 130-131, 2010
  • 26aYK-2 Precise analysis of atomic arrangement in 3C-SiC/Si(100) interface by spherical aberration corrected TEM, Inamoto S.,Yamasaki J.,Tamaki H.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 2, p. 868-868, 2009/08/18
  • 26aYK-8 Three-dimensional lattice strain analysis using rocking curves of HOLZ lines, Hamabe Maiko,Saitoh Koh,Morishita Shigeyuki,Yamasaki Jun,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 2, p. 869-869, 2009/08/18
  • 27pRE-11 Cs-corrected STEM observations of single platinum atoms moving in amorphous carbon films, Kuroshima Hikaru,Yamasaki Jun,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 1, p. 940-940, 2009/03/03
  • 27pRE-9 Precise analysis of interface roughness in La_2O_3/Si by C_s-corrected TEM/STEM, Inamoto S.,Yamasaki J.,Okunishi E.,Kakushima K.,Iwai H.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 1, p. 940-940, 2009/03/03
  • 27pRE-4 Possibility of sub-angstrom resolution in electron diffractive imaging, Morishita Shigeyuki,Yamasaki Jun,Nakamura Keisuke,Kato Takeharu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 1, p. 939-939, 2009/03/03
  • 27pRE-10 Discussion on a new definition of exact focus in Cs-corrected TEM, Yamasaki Jun,Tamaki Hirokazu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 1, p. 940-940, 2009/03/03
  • Observation of Atomic Columns by Diffractive Imaging : Reconstruction of the Si Dumbbell Structure from a Selected Area Diffraction Pattern, YAMASAKI Jun,TANAKA Nobuo,MORISHITA Shigeyuki, Bulletin of the Japan Institute of Metals, The Japan Institute of Metals and Materials, Vol. 48, No. 12, p. 604-604, 2009
  • Annealing Behavior of La<SUB>2</SUB>O<SUB>3</SUB> Thin Film Deposited on Si (001) Substrate Studied by Spherical Aberration Corrected TEM/STEM, Shin Inamoto,Jun Yamasaki,Eiji Okunishi,Kuniyuki Kakushima,Hiroshi Iwai,Nobuo Tanaka, Transactions of the Materials Research Society of Japan, The Materials Research Society of Japan, Vol. 34, No. 2, p. 297-300, 2009
  • 26aYF-7 Measurements of incident electron waves by using selected-area nano diffraction, Morishita Shigeyuki,Yamasaki Jun,Nakamura Keisuke,Kato Takeharu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 63, No. 1, p. 951-951, 2008/02/29
  • Application of spherical-aberration corrected electron microscopy to nano-materials, Nobuo Tanaka,Jun Yamasaki,Koh Saitoh, Shinku/Journal of the Vacuum Society of Japan, Vacuum Society of Japan, Vol. 51, No. 11, p. 695-699, 2008
  • Report on Microscopy and Microanalysis 2007, YAMASAKI Jun, Vol. 42, No. 3, p. 229-229, 2007/11/30
  • 23pTC-9 Structural and compositional studies of Ge nanodots grown on Si(001) surfaces with a ultrathin SiO_2 coverage, Cho S.-P.,Shklyaev Alexander A,Yamasaki J.,Okunishi E.,Ichikawa M.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 2, p. 1003-1003, 2007/08/21
  • 23pTC-13 Diffractive imaging using selected-area nano diffraction, Morishita Shigeyuki,Yamasaki Jun,Nakamura Keisuke,Kato Takeharu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 2, p. 1004-1004, 2007/08/21
  • 23pTC-11 A theory of Cs-corrected HRTEM images using a subtraction method, Tanaka N.,Yamasaki J., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 2, p. 1003-1003, 2007/08/21
  • 23pTC-12 Analysis of local structures in metallic glass by C_s-corrected TEM / nano-diffraction, Yamasaki Jun,Morishita Shigeyuki,Hirata Akihiko,Hirotsu Yoshihiko,Hasegawa Masashi,Kato Hidemi,Kato Takeharu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 2, p. 1004-1004, 2007/08/21
  • 19aXC-6 Effects of illumination condition on selected-area nano diffraction patterns, Morishita Shigeyuki,Yamasaki Jun,Kato Takeharu,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 1, p. 952-952, 2007/02/28
  • 19pXC-8 Study of semiconductor nano-materials by aberration corrected STEM/TEM, Yamasaki Jun,Cho Sung-Pyo,Hirahara Kaori,Saitoh Koh,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 62, No. 1, p. 962-962, 2007/02/28
  • UHV in-situ and C_s-corrected HRTEM Studies of Nucleation and Evolution of Ge-nanodots on Faintly Oxidized Si (111) Surfaces, CHO S.-P.,KAWANO S.,SAITOH K.,YAMASAKI J.,TANAKA N., Journal of the Japanese Association of Crystal Growth, The Japanese Association for Crystal Growth (JACG), Vol. 34, No. 3, p. 124-129, 2007
  • Structural Analysis of Reaction Surface of Titanium Oxide Photocatalysts by Transmission Electron Microtomography, YOSHIDA Kenta,MAKIHARA Masaki,NANBARA Takahiro,YAMASAKI Jun,TANAKA Nobuo, Materia Japan, The Japan Institute of Metals and Materials, Vol. 46, No. 12, p. 791-791, 2007
  • 球面収差補正TEM像の演算による非線形コントラスト除去法, 山崎順,河合智之,近藤悠史,田中信夫, 名古屋大学電子光学研究のあゆみ, Vol. 21, p. 29-32, 2007
  • 24aYK-10 Depth-resolution of Cs-corrected HRTEM of single wall carbon nanotubes, Tanaka N.,Hirahara K.,Yamasaki J.,Saitoh K., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 61, No. 2, p. 789-789, 2006/08/18
  • 25aYH-3 HRTEM and HAADF-STEM studies of β-FeSi_2 nanodots grown on Si(111) surfaces with a ultrathin SiO_2 coverage, Cho S.-P.,Nakamura Y.,Yamasaki J.,Okunishi E.,Tanaka N.,Ichikawa M., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 61, No. 2, p. 744-744, 2006/08/18
  • 24aYK-11 Direct observations of motion of individual dopant atoms in Si crystals by Cs-corrected STEM, Yamasaki J.,Okunishi E.,Sawada H.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 61, No. 2, p. 789-789, 2006/08/18
  • 28pYA-10 Possibility of observing valency of ions by Cs-corrected TEM, Yamasaki Jun,Saitoh Kou,Tanaka Nobuo,Kawai Tomoyuki, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 61, No. 1, p. 942-942, 2006/03/04
  • 半導体デバイスとナノ材料の三次元観察, 柿林博司,高口雅成,常田るり子,山崎順,田中信夫,馬場則男,岩木正哉, 材料開発のための顕微鏡法と応用写真集, 2006
  • Materials researches by spherical aberration corrected TEM, Yamasaki Jun,Tanaka Nobuo, Denshi kenbikyo, The Japanese Society of Microscopy, Vol. 41, No. 1, p. 3-6, 2006
  • 半導体界面の電子顕微鏡コンビナトリアル解析, 山崎順,田中信夫, 材料開発のための顕微鏡法と応用写真集, 2006
  • 25pYS-7 Reduction of non-linear image contrast in spherical aberration-corrected HRTEM, Yamasaki Jun,Kawai Tomoyuki,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 60, No. 1, p. 917-917, 2005/03/04
  • 25pYS-8 Direct observation of atomic structures of carbon nanotubes by Cs-corrected HRTEM, Tanaka N.,Yamasaki J.,Kawai T.,Huang Pan, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 60, No. 1, p. 917-917, 2005/03/04
  • 21aYM-9 Analysis of interfacial structures in semiconductors by Cs-corrected selected area nano-diffraction, Yamasaki Jun,Nakamura Keisuke,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), p. 821-821, 2005
  • Report on 2nd European workshop on electron holography, YAMASAKI Jun, Vol. 39, No. 3, p. 212-212, 2004/11/30
  • 28aXM-2 Imaging theory of Cs-corrected TEM and role of negative Cs, Tanaka N.,Kawai T.,Yamasaki J., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 59, No. 1, p. 957-957, 2004/03/03
  • 28aXM-3 Observation of oxygen atoms in a MgO thin film by means of spherical-aberration-corrected TEM, Yamasaki Jun,Kawai Tomoyuki,Tanaka Nobuo, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 59, No. 1, p. 958-958, 2004/03/03
  • In-situ TEM observations of photocatalysis on TiO_2, Yamasaki J.,Yoshida K.,Kimura K.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 58, No. 2, p. 780-780, 2003/08/15
  • Influence of additional metals on Ni/Si interfacial reactions and resultant nano-structures studied by HRTEM, EELS and EDX, Sugie Tsukasa,Yamasaki Jun,Tanaka Nobuo,Nakatsuka Osamu,Ohkubo Kazuya,Sakai Akira,Zaima Shigeaki,Yasuda Yukio, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 58, No. 2, p. 874-874, 2003/08/15
  • In-situ TEM observation system for photoreactions and its application, Tanaka N.,Yoshida K.,Yamasaki J.,Kimura K., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 58, No. 2, p. 873-873, 2003/08/15
  • Direct observations of SIGe{111} stacking faults by HAADF-STEM, Yamasaki J.,Kunieda H.,Mimura H.,Tanaka N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 58, No. 2, p. 873-873, 2003/08/15
  • Direct observation of interfaces of silicon by Cs-corrected TEM, Tanaka N.,Yamasaki J.,Sawada H.,Tomita K., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 58, No. 2, p. 874-874, 2003/08/15
  • High-angle annular dark-field scanning transmission electron microscopy and electron energy-loss spectroscopy of nano-granular Co-Al-O alloys (vol 48, pg 909, 2003), N Tanaka,J Yamasaki,S Mitani,K Takanashi, SCRIPTA MATERIALIA, PERGAMON-ELSEVIER SCIENCE LTD, Vol. 49, No. 1, p. 109-109, 2003/07
  • HRTEM,EELS,EDXによる半導体界面ナノ構造の研究, 田中信夫,山崎順,中塚理,杉江尚,大久保和哉,酒井朗,安田幸夫,財満鎮明, 日本金属学会講演概要, Vol. 133rd, 2003
  • Ti/Si<sub>1-x</sub>Ge<sub>x</sub>/Si(100)界面反応下ナノ構造の電子エネルギー損失分光法による研究, 山崎順,田中信夫,中塚理,酒井朗,財満鎮明,安田幸夫, 応用物理学関係連合講演会講演予稿集, Vol. 50th, No. 2, 2003
  • 三次元電顕による白金スーパー結晶のナノネットワーク構造の立体観察, 山崎順,田中信夫,馬場則男,寺崎治,柿林博司,高口雅成,常田るり子,岩木正哉,小林知洋, ナノ学会大会講演予稿集, Vol. 2003, 2003
  • Formation of extended defects in polycrystalline SiGe by electron irradiation, J Kikkawa,J Yamasaki,Y Ohno,M Kohyama,S Takeda, POLYCRYSTALLINE SEMICONDUCTORS VII, PROCEEDINGS, TRANS TECH PUBLICATIONS LTD, Vol. 93, p. 361-366, 2003
  • HRTEM and EELS analysis of interfacial reactions in Ti/Si<SUB>1-x</SUB>Ge<SUB>x</SUB>/Si(100), J. Yamasaki,N. Tanaka,O. Nakatsuka,A. Sakai,S. Zaima,Y. Yasuda, Proceedings of Microscopy and Microanalysis 2003, p. 470-471, 2003
  • Ti/Si<sub>1-x</sub>Ge<sub>x</sub>/Si(100)界面反応のHRTEMによる研究, 山崎順,田中信夫,深川征也,中塚理,酒井朗,財満鎮明,安田幸夫, 応用物理学会学術講演会講演予稿集, Vol. 63rd, No. 2, 2002
  • Amorphization and its Elemental Process Induced by Electron Irradiation in Si, YAMASAKI Jun,TAKEDA Seiji, X-RAYS, The Crystallographic Society of Japan, Vol. 44, No. 4, p. 213-224, 2002
  • Temperature dependence of radiation-induced amorphization in Si, Yamasaki J.,Takeda S.,Tsuda K., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 56, No. 2, p. 808-808, 2001/09/03
  • Observation of Si surface nanoholes by Scanning Tunneling Microscopy., Ozaki N.,Ohno Y.,Yamasaki J.,Takeda S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 56, No. 1, p. 812-812, 2001/03/09
  • Nucleation and growth process of Si surface nanoholes, Ohno Y.,Yamasaki J.,Takeda S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 2, p. 763-763, 2000/09/10
  • Elementary process of amorphization in Si, Yamasaki J.,Takeda S.,Tsuda K., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 2, p. 831-831, 2000/09/10
  • STM observation of defects created on a Si{111} surface by electron irradiation, Ozaki N.,Tanbara M.,Yamasaki J.,Hamada D.,Shirahama K.,Kohno H.,Ohno Y.,Takeda S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 2, p. 786-786, 2000/09/10
  • Nucleation and grawth of Silicon nanoholes at 4-300K., Ohno Y.,Yamasaki J.,Takeda S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 1, p. 803-803, 2000/03/10
  • Study of the photonic crystals fabricated by means of electron-irradiation-induced amorphization in Si, Yamasaki J.,Takeda S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 1, p. 660-660, 2000/03/10
  • 25aYL-1 Structural properties of amorphous Si produced by electron irradiation, Yamasaki J,Takeda S,Tsuda K, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 2, p. 882-882, 1999/09/03
  • 28p-ZA-11 In-situ HRTEM observation of electron iradiation effects in Si at 4K, Yamasaki J.,Takeda S.,Kimura N., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 1, p. 104-104, 1999/03/15
  • 28p-ZA-10 Amorphization in sillicon by electron irradiation at low temperatures, Takeda S.,Yamasaki J., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 1, p. 104-104, 1999/03/15
  • Study of electron irradiation effects in Si at low temperatures, YAMASAKI J.,TAKEDA S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 53, No. 2, p. 111-111, 1998/09/05
  • 6a-S-4 Electron-irradiation induced defects at low temperatures in Si-Ge mixed crystals, Yamasaki J.,Takeda S.,Yonenaga I., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 2, p. 101-101, 1997/09/16

Publications

  • 3D local structure and functionality design of materials, H. Daimon,Y. Sasaki,H. Ishii,D. Oka,Y. Kubozono,K. Gohara,N. Kobayashi,Y. Sasaki,H. Shiotani,H. Daimon,Y. Takano,K. Hayashi,K. Hirose,T. Fukumura,F. Matsui,T. Matsushita,Y. Morikawa,J. Yamasaki,Y. Yamada,Y. Wakabayashi, World Scientific Publishing and Maruzen Publishing, ISBN:9789813273665, 2019/03
  • Introduction to Functional Structure Science, 3D Active Sites and Materials Design, H. Daimon,Y. Sasaki,H. Ishii,D. Oka,Y. Kubozono,K. Gohara,N. Kobayashi,Y. Sasaki,H. Shiotani,H. Daimon,Y. Takano,K. Hayashi,K. Hirose,T. Fukumura,F. Matsui,T. Matsushita,Y. Morikawa,J. Yamasaki,Y. Yamada,Y. Wakabayashi, Maruzen, 2016/07

Works

  • 収差補正電子顕微鏡と第一原理計算による立方晶ＳⅰＣ／Ｓⅰ界面の三次元原子配列解析, 2011 - 2013
  • Study of three-dimensional structure of a cubic SiC/Si interface by aberration-corrected electron microscopy and ab-initio calculations, 2011 - 2013
  • 電子回折図形からの新規結像法によるサブオングストローム分解能の達成と応用への研究, 2009 - 2011
  • 収差補正ＳＴＥＭによるシリコン中ドーパント拡散及びクラスタリングの単原子直視研究, 2007 - 2009
  • 金属ガラスの局所原子構造の球面収差補正電子顕微鏡による研究, 2006 - 2008
  • Study of local atomic structures in metallic glass by spherical-aberration-corrected transmission electron microscopy, 2006 - 2008
  • 原子直視観察HAADF-STEM法によるSiGe中の自己拡散と点欠陥反応の研究, 2003 - 2005
  • Study of diffusion and reactions of self interstitials in SiGe by HAADF-STEM, 2003 - 2005

Awards

  • Excellent Presentation Awards, Tomohito Ishi,Jun Yamasaki, 13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21, 2021/10
  • Excellent Presentation Awards, Shuhei Hatanaka,Jun Yamasaki, 13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21, 2021/10
  • 日本顕微鏡学会 第63回シンポジウム 優秀ポスター発表賞, 照屋 海登,山﨑 順,加藤 丈晴,畑中 修平,馬場 則男, 日本顕微鏡学会, 2020/11
  • 日本顕微鏡学会 第75回学術講演会 優秀ポスター賞, 畑中 修平,山崎 順,保田 英洋, 公益社団法人 日本顕微鏡学会, 2019/06
  • 日本顕微鏡学会 論文賞 「顕微鏡基礎部門」, J. Yamasaki,M. Mutoh,S. Ohta,S. Yuasa,S. Arai,K. Sasaki,N. Tanaka, 日本顕微鏡学会, 2017/05
  • 大阪大学総長奨励賞2015 研究部門, 山﨑 順, 大阪大学, 2015/07
  • 日本顕微鏡学会 奨励賞, 山﨑 順, 日本顕微鏡学会, 2011/05

Presentations

  • Structural properties of amorphous silicon produced by electron irradiation
  • シリコンにおける電子線照射効果の低温(4K)その場高分解能TEM観察
  • シリコンの低温での電子線照射効果
  • 低温での電子線照射によるシリコンの微小欠陥
  • Si-Ge混晶の電子線低温照射欠陥
  • Si-Ge混晶における電子線照射欠陥
  • Si-Ge混晶における電子線照射欠陥
  • シリコンにおける粒子線照射による非晶質化のメカニズム
  • Siアモルファス化素過程のエネルギーフィルター電子回折による解析
  • シリコンにおけるアモルファス化の素過程
  • 電子線照射によるシリコンの非晶質化とその応用
  • シリコンの電子照射アモルファス化を用いたフォトニック結晶
  • シリコンにおける電子照射(4.2K)誘起の欠陥の構造と熱的安定性
  • 電子照射で生成されたアモルファス・シリコンの構造物性
  • シリコンにおける照射誘起アモルファス化の温度依存性
  • Structural properties of amorphous silicon produced by electron irradiation

Academic Activities

  • 大阪大学 微細構造解析プラットフォーム平成 28 年度 第２回地域セミナー 超高圧電子顕微鏡による微細構造解析と材料科学研究, 大阪大学 ナノテクノロジー設備供用拠点 微細構造解析プラットフォーム, 2016/12 -

Committee Memberships

  • 日本物理学会, 領域１０ X線・粒子線分科 世話人, 2006 - 2007
  • 日本顕微鏡学会, 電顕技術開発若手研究部会 幹事, 2009 -