Charge State of Au Atoms on an Oxidized Rutile TiO₂(110) Surface by AFM/KPFM at 78 K

Qiang Zhu, Yuuki Adachi, Huanfei Wen, Rui Xu, Zhihai Cheng, Yasuhiro Sugawara, Yanjun Li

Langmuir　Vol. 40　No. 2　p. 1358-1363　2024/01/04　Research paper (scientific journal)

Optical Imaging of a Single Molecule with Subnanometer Resolution by Photoinduced Force Microscopy

Tatsuya Yamamoto, Hidemasa Yamane, Nobuhiko Yokoshi, Hisaki Oka, Hajime Ishihara, Yasuhiro Sugawara

ACS Nano　Vol. 18　No. 2　p. 1724-1732　2023/12/29　Research paper (scientific journal)

Charge state of steps on anatase TiO2(1 0 1) at 78 K by AFM/KPFM

Jiuyan Wei, Sota Odani, Yasuhiro Sugawara, Yan Jun Li

Applied Surface Science　Vol. 640　p. 158352-158352　2023/12　Research paper (scientific journal)

Tip-activated single-atom catalysis: CO oxidation on Au adatom on oxidized rutile TiO ₂ surface

Yuuki Adachi, Ján Brndiar, Martin Konôpka, Robert Turanský, Qiang Zhu, Huan Fei Wen, Yasuhiro Sugawara, Lev Kantorovich, Ivan Štich, Yan Jun Li

Science Advances　Vol. 9　No. 39　2023/09/29　Research paper (scientific journal)

Effect of Preparation Processes on Structural Thermal Stability and Collision Energy Dissipation of Common Antirelaxation Coatings on Quartz Substrates

Xinxin He, Xiaoya Liu, Jun Tang, Haifeng Dong, Yasuhiro Sugawara, Yan Jun Li, Zongmin Ma, Jun Liu

Langmuir　Vol. 39　No. 36　p. 12740-12753　2023/08/31　Research paper (scientific journal)

Study of CO molecules on Pd/Al2O3/NiAl(110) surface by atomic force microscopy and Kelvin probe force microscopy

Shanrong Zou, Jiuyan Wei, Qiang Zhu, Hongqian Sang, Yasuhiro Sugawara, Yan Jun Li

Journal of Nanoparticle Research　Vol. 25　No. 7　2023/06/30　Research paper (scientific journal)

Improvement of excitation and collection efficiency simultaneously with integrated Au coatings for chip-scale NV magnetometer

Liu Xinyu, Zheng Doudou, Zhao Junzhi, Wang Qimeng, Liu Yankang, Guo Hao, Tang Jun, Sugawara Yasuhiro, Li Yanjun, Ma Zongmin, Liu Jun

Sensors and Actuators A: Physical　Vol. 352　p. 114206-114206　2023/04　Research paper (scientific journal)

Investigation of semiconductor properties of Co/Si(111)-7 × 7 by AFM/KPFS

Zhang Qu, Yasuhiro Sugawara, Yanjun Li

Journal of Physics: Condensed Matter　Vol. 35　No. 18　p. 185001-185001　2023/03/09　Research paper (scientific journal)

Adaptive filter entropy monitoring method for scalar magnetic detection using optically pumped magnetometers

Shuai Qiao, Qimeng Wang, Doudou Zheng, Qingfeng Hou, Junzhi Zhao, Jun Tang, Li Yanjun, Yasuhiro Sugawara, Zongmin Ma, Jun Liu

Measurement Science and Technology　Vol. 34　No. 5　p. 055107-055107　2023/02/15　Research paper (scientific journal)

High–low Kelvin probe force spectroscopy for measuring the interface state density

Ryo Izumi, Masato Miyazaki, Yan Jun Li, Yasuhiro Sugawara

Beilstein Journal of Nanotechnology　Vol. 14　p. 175-189　2023/01/31　Research paper (scientific journal)

Near-field circular dichroism of single molecules

Hidemasa Yamane, Nobuhiko Yokoshi, Hisaki Oka, Yasuhiro Sugawara, Hajime Ishihara

Optics Express　Vol. 31　No. 3　p. 3415-3415　2023/01/30　Research paper (scientific journal)

Exploration of CO movement characteristics on rutile TiO2(110) surface

Qiang Zhu, Yasuhiro Sugawara, Yanjun Li

Colloids and Surfaces A: Physicochemical and Engineering Aspects　Vol. 656　p. 130402-130402　2023/01　Research paper (scientific journal)

Dual-bias modulation heterodyne Kelvin probe force microscopy in FM mode

Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Applied Physics Letters　Vol. 121　No. 24　p. 241602-241602　2022/12/12　Research paper (scientific journal)

Hybrid mode atomic force microscopy of phase modulation and frequency modulation

Tatsuya Yamamoto, Masato Miyazaki, Hikaru Nomura, Yan Jun Li, Yasuhiro Sugawara

Microscopy　Vol. 72　No. 3　p. 236-242　2022/11/02　Research paper (scientific journal)

Atomic structure and electron distribution of Co atoms adsorbed on Si(111) surface by NC-AFM/KPFM at 78 K

Zhang Qu, Jiuyan Wei, Xiaopeng Liu, Yasuhiro Sugawara, Yanjun Li

Surface Science　Vol. 724　p. 122130-122130　2022/10　Research paper (scientific journal)

Nanoscale optical imaging with photoinduced force microscopy in heterodyne amplitude modulation and heterodyne frequency modulation modes

Junsuke Yamanishi, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara

Journal of Photochemistry and Photobiology C: Photochemistry Reviews　Vol. 52　p. 100532-100532　2022/09　Research paper (scientific journal)

Tip-Induced Dynamic Behaviors of a Water Molecule and Hydroxyl on the Rutile TiO₂(110) Surface

Qiang Zhu, Yuuki Adachi, Yasuhiro Sugawara, Yanjun Li

The Journal of Physical Chemistry C　Vol. 126　No. 31　p. 13062-13068　2022/07/27　Research paper (scientific journal)

Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy

Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Beilstein Journal of Nanotechnology　Vol. 13　p. 712-720　2022/07/25　Research paper (scientific journal)

Visualization of Strain-Engineered Nanopattern in Center-Confined Mesoscopic WS₂ Monolayer Flakes

Rui Xu, Yingzhuo Lun, Lan Meng, Fei Pang, Yuhao Pan, Zhiyue Zheng, Le Lei, Sabir Hussain, Yan Jun Li, Yasuhiro Sugawara, Jiawang Hong, Wei Ji, Zhihai Cheng

The Journal of Physical Chemistry C　Vol. 126　No. 16　p. 7184-7192　2022/04/28　Research paper (scientific journal)

Energy dissipation during collision for anti-relaxation coatings in alkali-metal vapor cells

Cheng Dong, Xiangqian Fang, Junjun Sang, Jun Tang, Haifeng Dong, Yasuhiro Sugawara, Yanjun Li, Zongmin Ma, Jun Liu

Japanese Journal of Applied Physics　Vol. 61　No. 5　p. 055504-055504　2022/04/25　Research paper (scientific journal)

Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy

Junsuke Yamanishi, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Applied Physics Letters　Vol. 120　No. 16　p. 161601-161601　2022/04/18　Research paper (scientific journal)

Study of high–low KPFM on a pn-patterned Si surface

Ryo Izumi, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara

Microscopy　Vol. 71　No. 2　p. 98-103　2022/04/01　Research paper (scientific journal)

Charge State Tristability of Oxygen Adatom on a Rutile TiO₂(110)–(1 × 1) Surface Controlled by Atomic Force Microscopy

Yuuki Adachi, Huan Fei Wen, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara, Ján Brndiar, Lev Kantorovich, Ivan Štich, Yan Jun Li

The Journal of Physical Chemistry C　Vol. 126　No. 10　p. 5064-5069　2022/03/17　Research paper (scientific journal)

Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy

Yuuki Adachi, Yasuhiro Sugawara, Yan Jun Li

Nano Research　Vol. 15　No. 3　p. 1909-1915　2022/03　Research paper (scientific journal)

Unraveling the Charge States of Au Nanoclusters on an Oxygen-Rich Rutile TiO₂(110) Surface and Their Triboelectrification Overturn by nc-AFM and KPFM

Quanzhen Zhang, Ján Brndiar, Martin Konôpka, Huan Fei Wen, Yuuki Adachi, Masato Miyazaki, Robert Turanský, Rui Xu, Zhi Hai Cheng, Yasuhiro Sugawara, Ivan Štich, Yan Jun Li

The Journal of Physical Chemistry C　Vol. 125　No. 50　p. 27607-27614　2021/12/23　Research paper (scientific journal)

Electron dynamics of tip-tunable oxygen species on TiO<inf>2</inf> surface

Yuuki Adachi, Ján Brndiar, Huan Fei Wen, Quanzhen Zhang, Masato Miyazaki, Sourbh Thakur, Yasuhiro Sugawara, Hongqian Sang, Yan Jun Li, Ivan Štich, Lev Kantorovich

Communications Materials　Vol. 2　No. 1　2021/12　Research paper (scientific journal)

Epitaxial fabrication of AgTe monolayer on Ag(111) and the sequential growth of Te film

Haoyu Dong, Le Lei, Shuya Xing, Jianfeng Guo, Feiyue Cao, Shangzhi Gu, Yanyan Geng, Shuo Mi, Hanxiang Wu, Yan Jun Li, Yasuhiro Sugawara, Fei Pang, Wei Ji, Rui Xu, Zhihai Cheng

Frontiers of Physics　Vol. 16　No. 6　2021/12/01　Research paper (scientific journal)

Single hydrogen atom manipulation for reversible deprotonation of water on a rutile TiO2 (110) surface

Yuuki Adachi, Hongqian Sang, Yasuhiro Sugawara, Yan Jun Li

Communications Chemistry　Vol. 4　No. 1　2021/12　Research paper (scientific journal)

Voltage- and Redox State-Triggered Oxygen Adatom Conductance Switch

Quanzhen Zhang, Ján Brndiar, Yuuki Adachi, Martin Konôpka, Huan Fei Wen, Masato Miyazaki, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng, Hongqian Sang, Yan Jun Li, Lev Kantorovich, Ivan Štich

The Journal of Physical Chemistry C　Vol. 125　No. 48　p. 26801-26807　2021/11/30　Research paper (scientific journal)

Size-dependent strain-engineered nanostructures in MoS2monolayer investigated by atomic force microscopy

Le Lei, Yingzhuo Lun, Feiyue Cao, Lan Meng, Shuya Xing, Jianfeng Guo, Haoyu Dong, Shangzhi Gu, Kunqi Xu, Sabir Hussain, Yan Jun Li, Yasuhiro Sugawara, Fei Pang, Wei Ji, Jiawang Hong, Rui Xu, Zhihai Cheng

Nanotechnology　Vol. 32　No. 46　2021/11/12　Research paper (scientific journal)

The Possibility of Integrating NV Magnetometer Array by Using Wireless Microwave Excitation and Its Application in Remote Heart Sound Records

Doudou Zheng, Qimeng Wang, Xiaocheng Wang, Xuemin Wang, Yanjun Li, Yasuhiro Sugawara, Li Qin, Xiaoming Zhang, Yunbo Shi, Jun Tang, Hao Guo, Zongmin Ma, Jun Liu

IEEE Sensors Journal　Vol. 21　No. 20　p. 22587-22594　2021/10/15　Research paper (scientific journal)

Toplayer-dependent crystallographic orientation imaging in the bilayer two-dimensional materials with transverse shear microscopy

Sabir Hussain, Rui Xu, Kunqi Xu, Le Lei, Shuya Xing, Jianfeng Guo, Haoyu Dong, Adeel Liaqat, Rashid Iqbal, Muhammad Ahsan Iqbal, Shangzhi Gu, Feiyue Cao, Yan Jun Li, Yasuhiro Sugawara, Fei Pang, Wei Ji, Liming Xie, Shanshan Chen, Zhihai Cheng

Frontiers of Physics　Vol. 16　No. 5　2021/10/01　Research paper (scientific journal)

Exploring the nature of hydrogen of Rutile TiO2(110) at 78 K

Huan Fei Wen, Yasuhiro Sugawara, Yan Jun Li

SURFACES AND INTERFACES　Vol. 26　2021/10　Research paper (scientific journal)

Detection of sub-nanotesla magnetic fields by linewidth narrowing in high-density nitrogen vacancy magnetometry with pulsed ESR method

Yangang Zhang, Xiaocheng Wang, Junqi Wang, Doudou Zheng, Liumin Niu, Xiaohan Chai, Jun Tang, Hao Guo, Li Qin, Xiaoming Zhang, Zongmin Ma, Jun Liu, Yasuhiro Sugawara, Yanjun Li

JAPANESE JOURNAL OF APPLIED PHYSICS　Vol. 60　No. 9　2021/09　Research paper (scientific journal)

Charge Behavior of Terminal Hydroxyl on Rutile TiO₂(110)

Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Langmuir　Vol. 37　No. 35　p. 10588-10593　2021/08/26　Research paper (scientific journal)

Optical force mapping at the single-nanometre scale

Junsuke Yamanishi, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, Nobuhiko Yokoshi, Tatsuya Kameyama, Seiya Koyama, Tsukasa Torimoto, Hajime Ishihara, Yasuhiro Sugawara

NATURE COMMUNICATIONS　Vol. 12　No. 1　2021/06　Research paper (scientific journal)

Strain-Engineered Rippling and Manipulation of Single-Layer WS2by Atomic Force Microscopy

Fei Pang, Feiyue Cao, Le Lei, Lan Meng, Shili Ye, Shuya Xing, Jianfeng Guo, Haoyu Dong, Sabir Hussain, Shangzhi Gu, Kunqi Xu, Yan Jun Li, Yasuhiro Sugawara, Wei Ji, Rui Xu, Zhihai Cheng

Journal of Physical Chemistry C　Vol. 125　No. 16　p. 8696-8703　2021/04/29　Research paper (scientific journal)

Homogeneity of the negatively charged assembly of nitrogen vacancy centres in diamonds using the Quasi-finite-element optical scanning position method

Doudou Zheng, Zongmin Ma, Yangang Zhang, Yueping Fu, Jiuyan Wei, Hua Yuan, Li Qin, Yunbo Shi, Jun Tang, Jun Liu, Yanjun Li, Yasuhiro Sugawara

LASER PHYSICS　Vol. 31　No. 4　2021/04　Research paper (scientific journal)

Electrically-induced manipulation of the Au nanoclusters on oxidized rutile TiO2(110) surface by atomic force microscopy at 78K

Quanzhen Zhang, Huan Fei Wen, Rui Xu, Zhihai Cheng, Yasuhiro Sugawara, Yan Jun Li

The Journal of Physical Chemistry C　Vol. 124　No. 52　p. 28562-28568　2020/12　Research paper (scientific journal)

Oxygen-Adsorption-Induced Charge State Change of a Pd Nanocluster on the Al2O3/NiAl(110) Surface

Shanrong Zou, Yasuhiro Sugawara, Yan Jun Li

JOURNAL OF PHYSICAL CHEMISTRY C　Vol. 125　No. 1　p. 446-451　2020/12　Research paper (scientific journal)

Variable-density imaging of high concentration of NV centers with three-dimensional optical scanning techniques at sub-micrometer scale in millimeter area

Zongmin Ma, Liumin Niu, Jiuyan Wei, Yunbo Shi, Li Qin, Jun Tang, Jun Liu, Yanjun Li, Yasuhiro Sugawara

Japanese Journal of Applied Physics　Vol. 59　No. 11　2020/11/01　Research paper (scientific journal)

Effects of subsurface charge on surface defect and adsorbate of rutile TiO2 (110)

Wen Huan-Fei, Yasuhiro Sugawara, Li Yan-Jun

ACTA PHYSICA SINICA　Vol. 69　No. 21　2020/11　Research paper (scientific journal)

Direct observation of the Si(110)-(16x2) surface reconstruction by atomic force microscopy

Tatsuya Yamamoto, Ryo Izumi, Kazushi Miki, Takahiro Yamasaki, Yasuhiro Sugawara, Yan Jun Li

BEILSTEIN JOURNAL OF NANOTECHNOLOGY　Vol. 11　p. 1750-1756　2020/11　Research paper (scientific journal)

Theoretical analysis of optically selective imaging in photoinduced force microscopy

Hidemasa Yamane, Junsuke Yamanishi, Nobuhiko Yokoshi, Yasuhiro Sugawara, Hajime Ishihara

OPTICS EXPRESS　Vol. 28　No. 23　p. 34787-34803　2020/11　Research paper (scientific journal)

Strain-Induced Hierarchical Ripples in MoS2 Layers Investigated by Atomic Force Microscopy

Sabir Hussain, Rui Xu, Kunqi Xu, Le Lei, Lan Meng, Zhiyue Zheng, Shuya Xing, Jianfeng Guo, Haoyu Dong, Adeel Liaqat, Muhammad Iqbal, Yanjun Li, Yasuhiro Sugawara, Fei Pang, Wei Ji, Liming Xie, Zhihai Cheng

Applied Physics Letters　Vol. 117　p. 153102-1-153102-7　2020/10　Research paper (scientific journal)

Atomically Asymmetric Inversion Scales up to Mesoscopic Single-Crystal Monolayer Flakes

Rui Xu, Fei Pang, Yuhao Pan, Yingzhuo Lun, Lan Meng, Zhiyue Zheng, Kunqi Xu, Le Lei, Sabir Hussain, Yan Jun Li, Yasuhiro Sugawara, Jiawang Hong, Wei Ji, Zhihai Cheng

ACS NANO　Vol. 14　No. 10　p. 13834-13840　2020/09　Research paper (scientific journal)

Size Dependence of Charge State of Pd Nanoparticles on the Al2O3/NiAl(110) Surface by Kelvin Probe Force Microscopy

Shanrong Zou, Hirotaka Yokoyama, Yasuhiro Sugawara, Yan Jun Li

JOURNAL OF PHYSICAL CHEMISTRY C　Vol. 124　No. 39　p. 21641-21645　2020/09　Research paper (scientific journal)

Imaging Oxygen Molecular Adsorption and Dissociation on TiO2(110) Surface with Real Configuration at 78 K by Atomic Force Microscopy

Huan Fei Wen, Hongqian Sang, Yasuhiro Sugawara, Yan Jun Li

Physical Chemistry Chemical Physics　Vol. 22　p. 19795-19801　2020/08　Research paper (scientific journal)

Atomic Scale Three Dimensional Au Nanocluster on Rutile TiO2 (110) Surface Resolved by Atomic Force Microscopy

Yuuki Adachi, Yasuhiro Sugawara, Yan Jun Li

The Journal of Physical Chemistry Letters　Vol. 11　p. 7153-7158　2020/08　Research paper (scientific journal)

Dynamic Behavior of OH and Its Atomic Contrast with O adatom on Ti site of TiO2(110) at 78 K by Atomic Force Microscopy Imaging

Huan Fei Wen, Hongqian Sang, Yasuhiro Sugawara, Yan Jun Li

Appled Physics Letters　Vol. 117　p. 051602-1-051602-4　2020/07　Research paper (scientific journal)

Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Atomic Force Microscopy

HuanFei Wen, Yasuhiro Sugawara, Yan Jun Li

Nanomaterials　Vol. 10　p. 1506(1)-1506(9)　2020/07　Research paper (scientific journal)

Surface potential measurement by heterodyne frequency modulation Kelvin probe force microscopy in MHz range

Yasuhiro Sugawara, Masato Miyazaki, Yanjun Li

Journal of Physics Communications　Vol. 4　2020/07　Research paper (scientific journal)

Remotely Controlling the Charge State of Oxygen Adatoms on Rutile TiO2(110) Surface using Atomic Force Microscopy

Yuuki Adachi, Yasuhiro Sugawara, Yan Jun Li

The Journal of Physical Chemistry Part C　Vol. 124　No. 22　p. 12010-12015　2020/05　Research paper (scientific journal)

Contrast inversion of O adatom on rutile TiO2(1 1 0)-(1 × 1) surface by atomic force microscopy imaging

Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Applied Surface Science　Vol. 505　2020/03/01　Research paper (scientific journal)

Elucidating Charge State of an Au Nanocluster on Oxidized/Reduced Rutile TiO2(110) Surfaces using non-contact atomic force microscopy and Kelvin probe force microscopy

Yuuki Adachi, Huan Fei Wen, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Nanoscale Advances　Vol. 2　p. 2371-2375　2020/03　Research paper (scientific journal)

A hand-held magnetometer based on an ensemble of nitrogen-vacancy centers in diamond

D. Zheng, Z. Ma, W. Guo, L. Niu, J. Wang, X. Chai, Y. J. Li, Y. Sugawara, C. Yu, Y. Shi, X. Zhang, J. Tang, H. Guo, J. Liu

J. Phys. D: Appl. Phys.　Vol. 53　No. 15　p. 155004 (1)-155004(6)　2020/02　Research paper (scientific journal)

Single hydrogen atom manipulation for reversible deprotonation of water on a rutile TiO2 (110) surface

Yuuki Adachi, Hongqian Sang, Yasuhiro Sugawara, Yan Jun Li

Communications Chemistry　No. 4　p. 1-5　2020/01　Research paper (scientific journal)

AFM/KPFSによる二酸化チタン表面に吸着した酸素原子・分子の電荷状態の原子レベル解析と電荷

李 艶 君, 安 達 有 輝, 菅 原 康 弘

触媒　Vol. 62　No. 1　p. 9-14　2020/01　Research paper (scientific journal)

Adhesion Effect on the Hyperfine Frequency Shift of an Alkali Metal Vapor Cell with Paraffin Coating Using Peak-Force Tapping AFM

Jiuyan Wei, Zongmin Ma, Huanfei Wen, Hao Guo, Jun Tang, Jun Liu, Yanjun Li, Yasuhiro Sugawara

Coatings　Vol. 10　No. 84　p. 1-11　2020/01　Research paper (scientific journal)

Electrical Engineering of the Oxygen Adatom and Vacancy on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

Quanzhen Zhang, Huan Fei Wen, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng, Yan Jun Li

JOURNAL OF PHYSICAL CHEMISTRY C　Vol. 123　No. 47　p. 28852-28858　2019/11　Research paper (scientific journal)

Identification of Atomic Defects and Adsorbate on Rutile TiO2(110)-(1 × 1) Surface by Atomic Force Microscopy

Huan Fei Wen, Yuuki Adachi, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Journal of Physical Chemistry C　Vol. 123　No. 42　p. 25756-25760　2019/10/24　Research paper (scientific journal)

Identification of Atomic Defects and Adsorbates on Rutile TiO2(110)-(1×1) Surface by Atomic Force Microscopy.

Huan Fei Wen, Yuuki Adachi, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

The Journal of Physical Chemistry C　Vol. 123　p. 25756-25760　2019/09　Research paper (scientific journal)

Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

Quanzhen Zhang, Huan Fei Wen, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng, Yan Jun Li

JOURNAL OF PHYSICAL CHEMISTRY C　Vol. 123　No. 36　p. 22595-22602　2019/08　Research paper (scientific journal)

Tip-induced Control of Charge and Molecular Bonding of Oxygen Atoms on the Rutile TiO2 (110) Surface with Atomic Force Microscopy

Yuuki Adachi, Huan Fei Wen, Quanzhen Zhang, Masato Miyazaki, Yasuhiro Sugawara, Hongqian Sang, Ján Brndiar, Lev Kantorovich, Ivan Štich, Yan Jun Li

ACS Nano　Vol. 16　p. 6917-6924　2019/06　Research paper (scientific journal)

Imaging of the surface potential at the steps on rutile TiO2(110) surface by Kelvin probe force microscopy

Masato Miyazaki, Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Jan Brndiar, Ivan Štich, Yan Jun Li, Yasuhiro Sugawara

Beilstein Journal of Nanotechnology　Vol. 10　p. 1228-1236　2019/06

Contrast inversion of O adatom on rutile TiO2(110)-(1×1) surface by atomic force microscopy imaging

Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li

Applied Surface Science　Vol. 505　p. 144623-144627　2019/05　Research paper (scientific journal)

Interfacial water intercalation-induced metal-insulator transition in NbS2/BN heterostructure

Rui Xu, Xinsheng Wang, Zhiyue Zheng, Shili Ye, Kunqi Xu, Le Lei, Sabir Hussain, Fei Pang, Xinmeng Liu, Yan Jun Li, Yasuhiro Sugawara, Wei Ji, Liming Xie, Zhihai Cheng

NANOTECHNOLOGY　Vol. 30　No. 20　2019/05　Research paper (scientific journal)

Atomic-scale elastic property probed by atomic force microscopy

Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Comprehensive Nanoscience and Nanotechnology　Vol. 1-5　p. 33-52　2019/01/01　Part of collection (book)

Imaging the surface potential at the steps on the rutile TiO2(110) surface by Kelvin probe force microscopy

Masato Miyazaki, Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Jan Brndiar, Ivan Štich, Yan Jun Li, Yasuhiro Sugawara

Beilstein Journal of Nanotechnology　Vol. 10　p. 1228-1236　2019　Research paper (scientific journal)

Subatomic-scale resolution with SPM: Co adatom on p(2 x 1)Cu(110):O

Robert Turansky, Krisztian Palotas, Jan Brndiar, Yanjun Li, Yasuhiro Sugawara, Ivan Stich

Nanotechnology　Vol. 30　p. 095703(1)-095703(7)　2019/01　Research paper (scientific journal)

Direct observation of atomic step edges on the rutile TiO2(110)-(1× 1) surface using atomic force microscopy

Huan Fei Wen, Masato Miyazaki, Quanzhen Zhang, Yuuki Adachi, Yan Jun Li, Yasuhiro Sugawara

Phys. Chem. Chem. Phys.　Vol. 20　p. 28337-28337　2018/11　Research paper (scientific journal)

Measurement and Manipulation of the Charge State of an Adsorbed Oxygen Adatom on the Rutile TiO2(110)-1x1 Surface by nc-AFM and KPFM

Quanzhen Zhang, Yan Jun Li, Huan Fei Wen, Yuuki Adachi, Masato Miyazaki, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng, Jan Brndiar, Lev Kantorovich, Ivan Stich

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY　Vol. 140　No. 46　p. 15668-15674　2018/10　Research paper (scientific journal)

Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy

Huan Fei Wen, Quanzhen Zhang, Yuuki Adachi, Masato Miyazaki, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy　Vol. 122　p. 17395-17399　2018/07　Research paper (scientific journal)

Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM

Yanjun Li, Huanfei Wen, Q. Zhang, Y. Adachi, Eiji Arima, Yukinori Kinoshita, Hikaru Nomura, Zongmin Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara, Rui Xu, Zhihai Cheng

Ultramicroscopy　Vol. 191　p. 51-55　2018/04　Research paper (scientific journal)

High harmonic exploring on different materials in dynamic atomic force microscopy

ZhiYue Zheng, Rui Xu, ShiLi Ye, Sabir Hussain, Wei Ji, Peng Cheng, YanJun Li, Yasuhiro Sugawara, ZhiHai Cheng

SCIENCE CHINA-TECHNOLOGICAL SCIENCES　Vol. 61　No. 3　p. 446-452　2018/03

Local characterization of mobile charge carriers by two electrical AFM modes: Multi-harmonic EFM versus sMIM

Le Lei, Rui Xu, Shili Ye, Xinsheng Wang, Kunqi Xu, Sabir Hussain, Yan Jun Li, Yasuhiro Sugawara, Liming Xie, Wei Ji, Zhihai Cheng

Journal of Physics Communications　Vol. 2　No. 2　2018/02/01　Research paper (scientific journal)

KPFM/AFM imaging on TiO2(110) surface in O2 gas

Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yanjun Li, Yasuhiro Sugawara

Nanotechnology　Vol. 29　p. 105504(1)-105504(8)　2018/02　Research paper (scientific journal)

Photoinduced Force Microscopy Imaging Using Heterodyne-FM Technique

Junsuke Yamanishi, Masaaki Tsujii, Yoshitaka Naitoh, Yanjun Li, Yasuhiro Sugawara

OPTICAL MANIPULATION CONFERENCE　Vol. 10712　2018　Research paper (international conference proceedings)

Magnetic resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonator

Yukinori Kinoshita, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Yasuhiro Sugawara

Nanotechnology　Vol. 28　p. 485709(1)-485709(6)　2017/11　Research paper (scientific journal)

Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopy

Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Journal of Physics Condensed Matter　Vol. 29　No. 40　2017/09/01　Research paper (scientific journal)

Sub-atomic-scale tip-surface force vector mapping above a Ge(001) dimer using bimodal atomic force micorscopy

Yoshitaka Naitoh, Robert Turanský, Ján Brndiar, Yan Jun Li, Ivan Štich, Yasuhiro Sugawara

nature physics　Vol. 13　No. 7　p. 663-667　2017/04　Research paper (scientific journal)

Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K

Huan Fei Wen, Yan Jun Li, Eiji Arima, Yoshitaka Naitoh, Yasuhiro Sugawara, Rui Xu, Zhi Hai Cheng

Nanotechnology　Vol. 28　No. 10　2017/02/06　Research paper (scientific journal)

Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy

Lili Kou, Yan Jun Li, Takeshi Kamijo, Yoshitaka Naitoh, Yasuhiro Sugawara

Nanotechnology　2016/11　Research paper (scientific journal)

Promoting atoms into delocalized long-living magnetically modified state using Atomic Force Microscopy

Y. Kinoshita, R. Turanský, J. Brndiar, Y. Naitoh, Y. J. Li, L. Kantorovich, Y. Sugawara, I. Štich

Nano Letters　Vol. 16　No. 12　p. 7490-7494　2016/10　Research paper (scientific journal)

Development of Low Temperature Atomic Force Microscopy with an Optical Beam Deflection System Capable of Simultaneously Detecting the Lateral and Vertical Forces

Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Rev. Sci. Instrum.　2016/09　Research paper (scientific journal)

Growth models of coexisting p(2 x 1) and c(6 x 2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K

Yan Jun Li, Seung Hwan Lee, Yukinori Kinoshita, Zong Min Ma, Huanfei Wen, Hikaru Nomura, Yoshitaka Naitoh, Yasuhiro Sugawara

Nanotechnology　Vol. 27　No. 20　p. 205702-205702　2016/04/07　Research paper (scientific journal)

Growth models of coexisting p(2×1) and c(6×2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K

Yan Jun Li, Seung Hwan Lee, Yukinori Kinoshita, Zong Min Ma, Huanfei Wen, Hikaru Nomura, Yoshitaka Naitoh, Yasuhiro Sugawara

Nanotechnology　2016/04　Research paper (scientific journal)

Distance dependence of atomic-resolution near-field imaging on alpha-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip

Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

NANO RESEARCH　Vol. 9　No. 2　p. 530-536　2016/02　Research paper (scientific journal)

19aAR-5 Spatial elastic property of Ge(001) at sub-atomic scale with multi-frequency atomic force microscopy

Naitoh Y., Li Y. J., Sugawara Y.

Meeting Abstracts of the Physical Society of Japan　Vol. 71　p. 2484-2484　2016

Development of the Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance to Image Surface Spin with Atomic Resolution

ARIMA Eiji, NAITOH Yoshitaka, YAN JUN Li, SUGAWARA Yasuhiro

Hyomen Kagaku　Vol. 37　No. 9　p. 416-421　2016

Atomic Force Microscopy identification of Al-sites on ultrathin aluminum oxide film on NiAl(110)

Yan Jun Li, Jan Brndiar, Yoshitaka Naitoh, Yasuhiro Sugawara, Ivan Stich

Nanotechnology　2015/11　Research paper (scientific journal)

Atomic-Resolution Imaging of the Optical Near Field Based on the Surface Photovoltage of a Silicon Probe Tip

Yasuhiro Sugawara, Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Yan Jun Li

Phys. Rev. Appl.　2015/04　Research paper (scientific journal)

Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

Lili Kou, Zongmin Ma, Yan Jun Li, Yoshitaka Naitoh, Masaharu Komiyama, Yasuhiro Sugawara

Nanotechnology　2015/04　Research paper (scientific journal)

Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance

Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani, Yasuhiro Sugawara

Nanotechnology　Vol. 26　No. 12　p. 125701-125701　2015/03/27　Research paper (scientific journal)

Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance

Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani, Yasuhiro Sugawara

Nanotechnology　2015/03　Research paper (scientific journal)

Development of nevel SPM technique for observing the surface magnetism at the atomic scale

SUAGAWARA YASUHIRO, ARIMA EIJI, NAITOH YOSHITAKA, LI YANJUN

Abstract of annual meeting of the Surface Science of Japan　Vol. 35　p. 27-27　2015

Image formation and contrast inversion in noncontact atomic force microscopy imaging of oxidized Cu(110) surfaces

J. Bamidele, Y. Kinoshita, R. Turanský, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Štich, L. Kantorovich

Physical Review B - Condensed Matter and Materials Physics　Vol. 90　No. 3　2014/07/10　Research paper (scientific journal)

Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism

J. Bamidele, Seung-Hwan Lee, Y. Kinoshita, R. Turanský, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Štich, L. Kantorovich

Nature Communications　2014/07　Research paper (scientific journal)

Image formation and contrast inversion in NC-AFM imaging of oxidized Cu(110) surfaces

Joseph Bamidele, Yukinori Kinoshita, Robert Turanský, Seung-Hwan Lee, Yoshitaka Naitoh, Yanjun Li, Yasuhiro Sugawara, Ivan Štich, Lev Kantorovich

Phys. Rev. B　2014/07　Research paper (scientific journal)

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes

Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Nanotechnology　2013/04　Research paper (scientific journal)

Complex design of dissipation signals in non-contact atomic force microscopy

Joseph Bamidele, Yan Jun Li, Samuel Jarvis, Yoshitaka Naitoh, Yasuhiro Sugawara, Lev Kantorovich

Physical Chemistry Chemical Physics　2012/12　Research paper (scientific journal)

Quantification of Atomic-Scale Elasticity on Ge(001)-c(4×2) Surfaces via Noncontact Atomic Force Microscopy with a Tungsten-Coated Tip

Y. Naitoh, T. Kamijo, Y. J. Li, Y. Sugawara

Phys. Rev. Lett.　2012/11　Research paper (scientific journal)

Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface

J. Bamidele, Y. Kinoshita, R. Turanský, Seung-Hwan Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Štich, L. Kantorovich

Phys. Rev. B　2012/10　Research paper (scientific journal)

High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy

Yasuhiro Sugawara, Lili Kou, Zongmin Ma, Takeshi Kamijo, Yoshitaka Naitoh, Yan Jun Li

Appled Physics Letters　2012/05　Research paper (scientific journal)

Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K

Y. J. Li, Y. Kinoshita, K. Tenjin, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima, Y. Sugawara

Japanese Journal of Applied Physics　2012/02　Research paper (scientific journal)

Fabrication of Sharp Tungsten-coated Tip for Atomic Force Microscopy by Ion-beam Sputter deposition

Y. Kinoshita, Y. Naitoh, Y. J. Li, Y. Sugawara

Revew of Scientific Instrumunts　2011/10　Research paper (scientific journal)

Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules

Yoshihiro Aburaya, Hikaru Nomura, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

JOURNAL OF APPLIED PHYSICS　Vol. 109　No. 6　2011/03　Research paper (scientific journal)

Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules

Yoshihiro Aburaya, Hikaru Nomura, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Journal of Applied Physics　2011/03　Research paper (scientific journal)

Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy

Yoshitaka Naitoh, Zongmin Ma, Yan Jun Li, Masami Kageshima, Yasuhiro Sugawara

Journal of Vacuum Science and Technology B　2010/10　Research paper (scientific journal)

High force sensitivity in Q-controlled phase-modulation atomic force microscopy

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

APPLIED PHYSICS LETTERS　Vol. 97　No. 1　2010/07　Research paper (scientific journal)

High force sensitivity in Q-controlled phase-modulation atomic force microscopy

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Applied Physics Letters　2010/07　Research paper (scientific journal)

Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in Liquids

Yan Jun Li, Kouhei Takahashi, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Ultramicroscopy　2010/05　Research paper (scientific journal)

Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity

Tatsuya Ogawa, Shinkichi Kurachi, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Ultramicroscopy　2010/05　Research paper (scientific journal)

Development of high-speed actuator for scanning probe microscopy

Yasuhiro Sugawara, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima

Next-Generation Actuators Leading Breakthroughs　p. 45-54　2010　Part of collection (book)

Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5 K

Yoshitaka Naitoh, Yan Jun Li, Hikaru Nomura, Masami Kageshima, Yasuhiro Sugawara

Journal of Physical Society of Japan　2010/01　Research paper (scientific journal)

The influence of Si cantilever tip with/without tungsten coating on NC-AFM imaging of Ge(001) surface

Yoshitaka Naitoh, Yukinori Kinoshita, Yan Jun LI, Masami Kageshima, Yasuhiro Sugawara

Nanotechnology　2009/05　Research paper (scientific journal)

Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics

Masami Kageshima, Takuma Chikamoto, Tatsuya Ogawa, Yoshiki Hirata, Takahito Inoue, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

Review of Scientific Instruments　2009/02　Research paper (scientific journal)

Development of Noncontact Atomic Force Microscopy Operating at Low Temperatures

SUGAWARA Yasuhiro, NAITOH Yoshitaka, KAGESHIMA Masami, LI Yan Jun

Shinku　Vol. 51　No. 12　p. 789-795　2008/12/20

Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy

Kinoshita Masaharu, Naitoh Yoshitaka, Li Yan Jun, Kageshima Masami, Sugawara Yasuhiro

Jpn J Appl Phys　Vol. 47　No. 10　p. 8218-8220　2008/10/25　Research paper (scientific journal)

High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation

Li Yan Jun, Kobayashi Naritaka, Nomura Hikaru, Naitoh Yoshitaka, Kageshima Masami, Sugawara Yasuhiro

Jpn J Appl Phys　Vol. 47　No. 7　p. 6121-6124　2008/07/25　Research paper (scientific journal)

Study of Oxidized Cu(110) Surface Using Noncontact Atomic Force Microscopy

Shohei Kishimoto, Masami Kageshima, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara

2008/05　Research paper (scientific journal)

Theoretical investigation on force sensitivity in Q-controlled phasemodulationatomic force microscopy in constant-amplitude mode

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

J. Appl. Phys.　2008/03　Research paper (scientific journal)

Phase Modulation Atomic Force Microscopy in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation

Yan Jun Li, Naritaka Kobayashi, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Appl. Phys. Lett.　2008/03　Research paper (scientific journal)

Viscoelasticity and Dynamics of Single Biopolymer Chain Measured with Magnetically Modulated Atomic Force Microscopy

M. Kageshima, Y. Nishihara, Y. Hirata, T. Inoue, Y. Naitoh, Y. Sugawara

AIP Conference Proceedings　2008/03　Research paper (scientific journal)

Q値制御法による位相変調方式原子間力顕微鏡の感度向上

小林成貴, 李艶君, 内藤賀公, 影島賢巳, 菅原康弘

表面科学　Vol. 28　No. 9　p. 532-535　2007/09　Research paper (scientific journal)

Influence of Surface Stress on the Phase Change in a Si(001) Step Measured by LT-NC-AFM

NAITOH Yoshitaka, NOMURA Hikaru, KAGESHIMA Masami, LI Yan Jun, SUGAWARA Yasuhiro

Journal of the Surface Science Society of Japan　Vol. 28　No. 8　p. 421-427　2007/08/10　Research paper (scientific journal)

Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode

Yasuhiro Sugawara, Naritaka Kobayashi, Masayo Kawakami, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima

2007/05　Research paper (scientific journal)

Force Microscopy Imaging of Rest Atom on Si(111)$7{\times}7$ Surface under Strong Tip–Surface Interaction

Naitoh Yoshitaka, Momotani Kohji, Nomura Hikaru, Li Yan Jun, Kageshima Masami, Sugawara Yasuhiro

J Phys Soc Jpn　Vol. 76　No. 3　p. 33601-033601-4　2007/03/15　Research paper (scientific journal)

Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage

H. Nomura, K. Kawasaki, T. Chikamoto, Y. J. Li, Y. Naitoh, M. Kageshima, Y. Sugawara

Appl. Phys. Lett.　2007/01　Research paper (scientific journal)

Wide-band and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy

Masami Kageshima, Shinsuke Togo, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara

Review of Scientific Instruments　2006/10　Research paper (scientific journal)

High-sensitivity force detection by phase-modulation atomic force microscopy

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　Vol. 45　No. 29-32　p. L793-L795　2006/08　Research paper (scientific journal)

High Sensitive Force Detection by Phase Modulation Atomic Force Microscopy (PM-AFM)

Naritaka Kobayashi, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara

Jpn. J. Appl. Phys. Lett.　2006/07　Research paper (scientific journal)

Discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface

Insook Yi, Ryuji Nishi, Yoshiaki Sugimoto, Masayuki Abe, Yasuhiro Sugawara, Seizo Morita

Surface Science　Vol. 600　No. 13　p. 2766-2770　2006/07　Research paper (scientific journal)

The Origin of p(2x1) Phase on Si(001) by Noncontact Atomic Force Microscopy at 5 K

Yan Jun Li, Hikaru Nomura, Naoyuki Ozaki, Yoshitaka Naitoh, Masami Kageshima, Yasuhiro Sugawara, Chris Hobbs, Lev Kantorovich

Physical Review Letters　2006/03　Research paper (scientific journal)

Wideband and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy

Masami Kageshima, Shinsuke Togo, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara

Review of Scientific Instruments　Vol. 77　No. 10　2006　Research paper (international conference proceedings)

Functions of NC-AFM on atomic scale

S Morita, N Oyabu, T Nishimoto, R Nishi, O Custance, Yi, I, Y Sugawara

SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS　Vol. 186　p. 173-+　2005　Research paper (international conference proceedings)

Microscale contact charging on a silicon oxide

S Morita, T Uchihashi, K Okamoto, M Abe, Y Sugawara

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials　Vol. 186　p. 289-+　2005　Research paper (international conference proceedings)

Phase detection method with a positive feedback control using a quartz resonator based atomic force microscope in liquid environment

Ryuji Nishi, Kouichi Kitano, Insook Yi, Yasuhiro Sugawara, Seizo Morita

Applied Surface Science　2004/10　Research paper (scientific journal)

Ground state of Si(001) surface revisited----Is seeing believing ?

T. Uda, H. Shigekawa, Y. Sugawara, S. Mizuno, Y. Yamashita, J. Yoshinobu, K. Nakatsuji, H. Kawai, F. Komori

Progress in Surface Science　2004/04　Research paper (scientific journal)

Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope

MORITA Seizo, SUGIMOTO Yoshiaki, OYABU Noriaki, NISHI Ryuji, CUSTANCE Oscar, SUGAWARA Yasuhiro, ABE Masayuki

Vol. 53　No. 2　p. 163-168　2004/04/01　Research paper (scientific journal)

Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method

Morita Seizo, Oyabu Noriaki, Nishi Ryuji, Okamoto Kenji, Abe Masayuki, Custance Óscar, Yi Insook, Seino Yoshihide, Sugawara Yasuhiro

e-J. Surf. Sci. Nanotech.　Vol. 1　p. 158-170　2003/12　Research paper (scientific journal)

The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping

Okamoto Kenji, Sugawara Yasuhiro, Morita Seizo

Jpn J Appl Phys　Vol. 42　No. 11　p. 7163-7168　2003/11/15

Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy

N Oyabu, O Custance, IS Yi, Y Sugawara, S Morita

PHYSICAL REVIEW LETTERS　Vol. 90　No. 17　2003/05　Research paper (scientific journal)

KPFM imaging of Si(111)5 root 3 x 5 root 3-Sb surface for atom distinction using NC-AFM

K Okamoto, K Yoshimoto, Y Sugawara, S Morita

APPLIED SURFACE SCIENCE　Vol. 210　No. 1-2　p. 128-133　2003/03　Research paper (scientific journal)

Atom-selective imaging by NC-AFM : case of oxygen adsorbed on a Si(111)7×7 surface

NISHI R

Appl. Surf. Sci.　Vol. 210　p. 90-92　2003/03　Research paper (scientific journal)

Near-Atomic Resolution Imaging with Atomic Force Near-Field Optical Microscopy(<Special Issue>For the Application of Near-field Science to the Engineering)

SUGAWARA Yasuhiro

Journal of the Japan Society of Precision Engineering　Vol. 69　No. 2　p. 154-157　2003/02/05

原子間力顕微鏡を使った電荷の原子レベル観察

森田清三, 岡本憲二, 内橋貴之, 阿部真之, 菅原康弘

静電気学会誌　Vol. 27　No. 2　p. 64-68　2003/02

Characterization of semiconductor surfaces with noncontact atomic force microscopy

S Morita, Y Sugawara

NANOTECHNOLOGY AND NANO-INTERFACE CONTROLLED ELECTRONIC DEVICES　p. 429-453　2003　Research paper (international conference proceedings)

新規顕微鏡法の紹介 ＳＴＭおよびＡＦＭ，原理と応用

菅原 康弘

電子顕微鏡　Vol. 38　No. 1　p. 13-18　2003

Atomically Resolved Imaging of Si(100)2x1, 2x1:H and 1x1:2H Surface with Nonconatct Atomic Force Microscopy

S. Morita, Y. Sugawara

Japanese J. Applied. Physics, vol41, part1, no.7B (2002) 4857-4862　2002/07　Research paper (scientific journal)

Mapping and control of atomic force on Si(111)root 3x root 3-Ag surface using noncontact atomic force microscope

S Morita, Y Sugawara

ULTRAMICROSCOPY　Vol. 91　No. 1-4　p. 89-96　2002/05　Research paper (scientific journal)

Observation of Si(100) surface with noncontact atomic force microscpe at 5K

T. Uozumi, Y. Tomiyoshi, N. Nakata, Y. Sugawara, S. Morita

Applied Surface Science　2002/03　Research paper (scientific journal)

The Elimination of the 'Artifact' in the Electrostatic Force Measurement using a Novel Noncontact Atomic Force Microscope/electrostatic Force Microscope

K. Okamoto, Y. Sugawara, S. Morita

Applied Surface Science　Vol. 188　No. 3　p. 381-385　2002/03　Research paper (scientific journal)

「走査プローブ顕微鏡によるナノ加工と評価」

森田清三, 菅原康弘

電子情報通信学会誌　2002/01

「走査型プローブ顕微鏡による複合極限場での原子イメージング」

森田清三, 菅原康弘

表面金属学会、まてりあ　2002/01

「非接触原子間力顕微鏡で半導体の何がどこまで見えるのか？」

森田清三, 菅原康弘

表面科学会、表面科学　2002/01

Noncontact Atomic Force Microscopy on Semiconductor Surfaces

S.Morita, Y.Sugawara

2002/01　Research paper (scientific journal)

Atomic resolution imaging of Si(100)1×1 : 2H dihydride surface with noncontact atomic force microscopy (NC-AFM)

ARARAGI S.

Appl. Surf. Sci.　Vol. 188　No. 3　p. 272-278　2002/01　Research paper (scientific journal)

Atom manipulation and image artifact on Si(111)7×7 surface using a low temperature noncontact atomic force microscope

SUGAWARA Y.

Appl. Surf. Sci.　Vol. 188　p. 285-291　2002/01　Research paper (scientific journal)

Molecular Orbital Interpretation of Thymine/graphite Nc-AFM Images

M. Komiyama, T. Uchihashi, Y. Sugawara, S. Morita

2001/08　Research paper (scientific journal)

Micoroscopic Contact Charging and Dissipation

S. Morita, Y. Sugawara

2001/08　Research paper (scientific journal)

Low-temperature Noncontact Atomic Force Microscope with Quick Sample and Cantilver Exchange Mechanism

N. Suehira, Y. Tomiyoshi, Y. Sugawara, S. Morita

2001/07　Research paper (scientific journal)

Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy of TiO2[100]-[1x1] and -[1x2]: Simultaneous Imaging of Surface Structure and Electronic States

M. Ashino, Y. Sugawara, S. Morita, M. Ishikawa

2001/05　Research paper (scientific journal)

Load Dependence of Sticking-domain Distribution in Two-dimensional Atomic Scale Friction of NaF(100) Surface

S. Fujisawa, K. Yokoyama, Y. Sugawara, S. Morita

2001/04　Research paper (scientific journal)

Artifact and Fact of Si(111)$7{\times}7$ Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)

Suehira Nobuhito, Sugawara Yasuhiro, Morita Seizo

Jpn J Appl Phys　Vol. 40　No. 3　p. L292-L294　2001/03/15　Research paper (scientific journal)

A Noncontact Atomic Force Microscope in Air using a Quartz Resonatorand the FM Detection Method

R. Nishi, I. Houda, K. Kitano, Y. Sugawara, S. Morita

2001/03　Research paper (scientific journal)

Force Imaging of Optical Near Field Using Noncontact Atomic Force Microscopy

Yasuhiro Sugawara

2001/03

Frictional-force imaging and friction mechanisms with a lattice periodicity

S Morita, Y Sugawara, K Yokoyama, S Fujisawa

FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES　Vol. 10　p. 83-101　2001　Research paper (international conference proceedings)

Atomic scale origins of force interaction

S Morita, Y Sugawara, K Yokoyama, T Uchihashi

FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES　Vol. 10　p. 103-120　2001　Research paper (international conference proceedings)

「ノーベル賞と分光学 Ⅵ.走査型トンネル顕微鏡と原子間力顕微鏡」

菅原康弘, 森田清三

日本分光学会、分光研究　2001/01

「走査型プローブ顕微鏡によるナノテクノロジー」

森田清三, 菅原康弘

応用物理学会、応用物理　2001/01

Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy

S.Morita, Y.Sugawara

2001/01

Non-contact Atomic Force Microscope in Air with Quartz Resonator Using FM Detection Method

R.Nishi, I.Houda, K.Kitano, Y.Sugawara, S.Morita

2001/01　Research paper (scientific journal)

Noncontact AFM Imaging on Si(111) 2×1-Sb Surface with Occupied Lone-Pair Orbitals

Y.Sugawara, S.Orisaka, E.Hidaka, S.Mo

2001/01　Research paper (scientific journal)

Noncontact AFM and Nano-mechanics of Atoms and Molecules

Seizo Morita, Yasuhiro Sugawara

2000/12

Microscopic Contact Charging and Dissipation

Seizo Morita, Yasuhiro Sugawara

2000/12

3D-Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy

Seizo Morita, Yasuhiro Sugawara

2000/11

Atomically Resolved Imaging of Semiconductor Surfaces using Noncontact Atomic Force Microscopy

Seizo Morita, Yasuhiro Sugawara

2000/09

Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy

Uchihashi Takayuki, Choi Nami, Tanigawa Masato, Ashino Makoto, Sugawara Yasuhiro, Nishijima Hidehiro, Akita Seiji, Nakayama Yoshikazu, Tokumoto Hiroshi, Yokoyama Kousuke, Morita Seizo, Ishikawa Mitsuru

Jpn J Appl Phys　Vol. 39　No. 8　p. L887-L889　2000/08/15

Development of a Low Temperature Noncontact Atomic Force Microscope using Optical Fiber Interferometer

Nnobuto Suehira, Yasushige Tomiyoshi, Yasuhiro Sugawara, Seizo Morita

2000/07

Atomic Resolution Imaging of a Lone-pair using NC-AFM

Eiji Hidaka, Shigeki Orisaka, Yasuhiro Sugawara, Seizo Morita

2000/07

Noncontact Atomic Force Microscopy of Oxygen-Deficient TiO$_2$(110) Surfaces

Makoto Ashino, Yasuhiro Sugawara, Seizo Morita, Mitsuru Ishikawa

2000/07

Noncontact AFM Imaging Mechanism of Si(100)2x1 Surface Compared with Si(100)2x1:H Surface on Atomic Scale

Seizo Morita, Yasuhiro Sugawara, Kousuke Yokoyama, Taketoshi Ochi, Akira Yoshimoto

2000/07

Applications of Noncontact AFM with True Atomic Resolution

Yasuhiro Sugawara, Kousuke Yokoyama, Seizo Morita

2000/07

Atomic Force Mapping and Control of Atomic Force on a Si(111)√3x√3-Ag Surface using a Noncontact Atomic Force Microscopy

Seizo Morita, Yasuhiro Sugawara

2000/07　Research paper (scientific journal)

Structures of an Oxygen-Deficient TiO2(110) Surface Studied by Noncontact Atomic Force Microscopy

Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, Mitsuru Ishikawa

Jpn. J. Appl. Phys.　Vol. 39　No. 6B　p. 3765-3768　2000/06　Research paper (scientific journal)

STM and Atomic-resolution Noncontact AFM of an Oxygen-deficient TiO$_2$(110) Surface

Makoto Ashino, Takayuki Uchihashi, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, Mitsuru Ishikawa

Phys. Rev. B　Vol. 61　No. 20　p. 13955-13959　2000/05　Research paper (scientific journal)

Correlation of frequency shift discontinuity to atomic positions on a Si(111)7×7 surface by noncontact atomic force microscopy

MORITA S.

Nanotechnology　Vol. 11　p. 120-123　2000/05　Research paper (scientific journal)

Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy

R Nishi, Houda, I, T Aramata, Y Sugawara, S Morita

APPLIED SURFACE SCIENCE　Vol. 157　No. 4　p. 332-336　2000/04　Research paper (scientific journal)

Atomic and Molecular Technology Based on a Nano-Mechanics

Seizo Morita, Yasuhiro Sugawara

Vol. 52　No. 2　p. 9-14　2000/04

Development of Low Temperature Ultrahigh Vacuum Noncontact Atomic Force Microscope with PZT Cantilever

Nobuhito Suehira, Yasushige Tomiyoshi, Kenji Sugiyama, Syunji Watanabe, ikon Co, Touru Fujii, Nikon Cor, Yasuhiro Sugawara, Seizo Morita

2000/04　Research paper (scientific journal)

High-resolution Imaging of Organic Monolayers using Noncontact AFM

Takayuki Uchihashi (Join, Research Center, JRCAT, Takao Ishida (Join, Research Center, JRCAT, Masaharu Komiyama, Yamanashi University, Makoto Ashino, Joi, Research Center, JRCAT, Yasuhiro Sugawara, Wataru Mizutani, Join, Research Center, JRCAT, Kousuke Yokoyama, Seizo Morita, Hiroshi Tokumoto, Jo, esearch Center, JRCAT, Mitsuru Ishikawa (Joi, Research Center, JRCAT

Vol. 157　No. 4　p. 244-250　2000/04　Research paper (scientific journal)

Noncontact AFM imaging on Al-adsorbed Si(111) Surface with an Empty Orbital

Yasuhiro Sugawara, Shigeki Orisaka, Seizo Morita

Appl. Surf. Sci.　Vol. 157　No. 4　p. 239-143　2000/04　Research paper (scientific journal)

Atomic-scale Structures on a Non-stoichiometric TiO$_2$(110) Surface Studied by Noncontact AFM

Makoto Ashino, Joi, Research Center, JRCAT, Takayuki Uchihashi (Join, Research Center, JRCAT, Kousuke Yokoyama, Yasuhiro Sugawara, Seizo Morita, Mitsuru Ishikawa (Joi, Research Center, JRCAT

Appl. Surf. Sci.　Vol. 157　No. 4　p. 212-217　2000/04　Research paper (scientific journal)

Identification of B-form DNA in an Ultrahigh Vacuum by Noncontact-Mode Atomic Force Microscopy

Takayuki Uchihashi, Masato Tanigawa, Makoto Ashino, Yasuhiro Sugawara, Kosuke Yokoyama, Seizo Morita, Mitsuru Ishikawa

Langmuir　Vol. 16　No. 3　p. 1349-1353　2000/03　Research paper (scientific journal)

Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy

Yokoyama Kousuke, Ochi Taketoshi, Yoshimoto Akira, Sugawara Yasuhiro, Morita Seizo

Jpn. J. Appl. Phys.　Vol. 39　No. 2　p. L113-L115　2000/02/01　Research paper (scientific journal)

「非接触原子間力顕微鏡と原子分子のナノ力学」

森田清三, 菅原康弘

学術月報、特集　2000/01

Noncontact AFM Imaging of Si(100)2´1 and Si(100)2´1:H Surfaces

Y.Sugawara, K.Yokoyama, T.Ochi, A.Yoshimoto, S.Morita

2000/01

Load Dependence of Sticking-Domain Distribution in Two-Dimensional Atomic Scale Friction on NaF(100) Surface

S.Fujiwaswa, K.Yokoyama, Y.Sugawara, S.Morita

2000/01　Research paper (scientific journal)

Atom-Resolved Images of Defect-Induced Structure on Non-stoichiometric TiO2 Surface by STM and Noncontact AFM

M.Ashino, T.Uchihashi, K.Yokoyama, Y.Sugawara, S.Morita, M.Ishikawa

2000/01　Research paper (scientific journal)

Carbon-Nanotube Tip for the Highly-Reproducible Imaging of DNA Helical Turns by Noncontact AFM

T.Uchihashi, N.Choi, M.Tanigawa, M.Ashino, Y.Sugawara, H.Nishijima, S.Akita, Y.Nakayama, H.Tokumoto, K.Yokoyama, S.Morita, M.Ishikawa

2000/01　Research paper (scientific journal)

Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism

YOKOYAMA K.

Rev. Sci. Instrum.　Vol. 71　No. 1　p. 128-132　2000/01　Research paper (scientific journal)

Study of Elementary Process of Contact Charging by Atomic force Microscope

Seizo Morita, Yasuhiro Sugawara

Vol. 24　No. 1　p. 8-14　2000/01

Atomically resolved silver imaging on the Si(111)-(root 3 x root 3)-Ag surface using a noncontact atomic force microscope

K Yokoyama, T Ochi, Y Sugawara, S Morita

PHYSICAL REVIEW LETTERS　Vol. 83　No. 24　p. 5023-5026　1999/12　Research paper (scientific journal)

Atomically Resolved Silver Imaging on Si(111)√3x√3 -Ag Surface with Noncontact Atomic Force Microscope

Kosuke Yokoyama, Takeshi Ochi, Yasuhiro Sugawara, Seizo Morita

1999/12　Research paper (scientific journal)

Missing Ag Atom on Si(111)$\boldsymbol{\sqrt{\textbf{3 } } }\boldsymbol{\times}\boldsymbol{\sqrt{\textbf{3 } } }$–Ag Surface Observed by Noncontact Atomic Force Microscopy

Morita Seizo, Sugawara Yasuhiro, Orisaka Shigeki, Uchihashi Takayuki

Jpn J Appl Phys　Vol. 38　No. 11　p. L1342-L1344　1999/11/15　Research paper (scientific journal)

Analysis of Single Molecule by Noncontact Atomic Force Microscope

Yasuhiro Sugawara, Seizo Morita

1999/11

Atomic Scale Characterization and Measurement of Surface by Atomic Force Microscope

MORITA Seizo, SUGAWARA Yasuhiro

The Transactions of the Institute of Electrical Engineers of Japan. C　Vol. 119　No. 10　p. 1109-1112　1999/10/01

Imaging of Chemical Reactivity and Buckled Dimers on Si(100)2x1 Reconstructed Surface with Noncontact AFM

Takayuki Uchihashi, Yasuhiro Sugawara, Takayuki Tsukamoto, Tetsuya Minobe, Sigeki Orisaka, Takao Okada, Seizo Morita

Appl. Surf. Sci.　Vol. 140　No. 3-4　p. 304-308　1999/09　Research paper (scientific journal)

Status and Development of Atomic Force Microscopy

Seizo Morita, Yasuhiro Sugawara

Vol. 20　No. 5　p. 352-357　1999/05

True atomic resolution imaging of surface structure and surface charge on the GaAs(110)

Y. Sugawara, T. Uchihashi, M. Abe, S. Morita

Applied Surface Science　Vol. 140　No. 3　p. 371-375　1999/03　Research paper (scientific journal)

Near-field optical imaging using force detection with tip-electrode geometry

M. Abe, Y. Sugawara, K. Sawada, Y. Andoh, S. Morita

Applied Surface Science　1999/03　Research paper (scientific journal)

What Can Noncontact Atomic Force Microscope Observe?

Seizo Morita, Yasuhiro Sugawara

1999/03

Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy

MORITA S

Appl. Surf. Sci.　Vol. 140　p. 406-410　1999/02　Research paper (scientific journal)

Distance dependence of noncontact-AFM image contrast on Si(111)√3×√3-Ag structure

MINOBE T.

Appl. Surf. Sci.　Vol. 140　p. 298-303　1999/02　Research paper (scientific journal)

WS07 非接触原子間力顕微鏡によるDNA観察 (原子間力顕微鏡 (AFM) : 成果・問題・展望)

内橋 貴之, 芦野 慎, 谷川 雅人, 菅原 康弘, 横山 康祐, 森田 清三, 石川 満, 岡田 孝夫

生物物理　Vol. 39　1999

Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy

S. Morita, M. Abe, K. Yokoyama, Y. Sugawara

J. Crystal Growth　Vol. 210　p. 408-415　1999/01　Research paper (scientific journal)

High resolution imaging of DNA and organic molecules using noncontact AFM in UHV

T.Uchihashi, M.Ashino, Y.Sugawara, M.Tanigawa, T.Ishida, N.Choi, K.Yokoyama, M.Komiyama, H.Nishijima, W.Mizutani, S.Akita, Y.Nakayama, S.Morita, H.Tokumoto, M.Ishikawa

1999/01　Research paper (scientific journal)

Non-contact AFM study of TiO2 surfaces for adsorption of biomolecules

M.Ashino, T.Uchihashi, Y.Sugawara, M.Ishikawa

1999/01　Research paper (scientific journal)

Atomic Resolution Imaging of Al/Si(111) Surface by Noncontact Atomic Force Microscope

S.Orisaka, T.Minobe, K.Makimoto, Y.Sugawara, S.Morita

Appl. Surf. Sci.　Vol. 140　No. 3　p. 243-246　1999/01　Research paper (scientific journal)

Non-contact AFM Images Measured on Si(111)√<3>×√<3>-Ag Surfaces

SUGAWARA Y.

Surf. Interface Anal.　Vol. 27　p. 456s-461s　1999/01　Research paper (scientific journal)

The Atomic Resalution Imaging of Metallic Ag((]G0003[)) Surface by Noncontact Atomic Force Microscopy

SUGAWARA Yasuhiro

1999　Research paper (scientific journal)

Distance Dependence of Noncontact AFM Image Contrast an Si((]G0003[))┣D83┫D8×┣D83┫D8-Ag Structure

SUGAWARA Yasuhiro

1999　Research paper (scientific journal)

Self-assembled monolayer of adenine base on graphite studied by noncontact atomic force microscopy

UCHIHASHI T.

Phys. Rev. B　Vol. 60　No. 11　p. 8309-8313　1999　Research paper (scientific journal)

(2) Noncontact atomic force microscopy with ultimate spatial-resolution

MORITA Seizo, SUGAWARA Yasuhiro

OYOBUTURI　Vol. 67　No. 12　p. 1402-1403　1998/12　Research paper (scientific journal)

Atomic Resolution Imaging Orbital Hybridization with Noncontact Atomic Force Microsopy (AFM)*

SUGAWARA Yasuhiro, MORITA Seizo

Journal of the Vacuum Society of Japan　Vol. 41　No. 11　p. 906-911　1998/11/20　Research paper (scientific journal)

Observation of Semiconductor Surfaces by Using Noncontact Atomic Force Microscope ---Atomically Resolved Imaging of Chemical Reactivity and Charge---

Yasuhiro Sugawara

1998/10

Optical Near-Field Imaging Using the Kelvin Probe Technique.

Abe Masayuki, Sugawara Yasuhiro, Sawada Kazuyoshi, Andoh Yoshitake, Morita Seizo

Japanese Journal of Applied Physics　Vol. 37　No. 9　p. L1074-L1077　1998/09　Research paper (scientific journal)

Analysis of Experimental Load Dependence of Two-Dimensional Atomic-Scale Friction

FUJISAWA S.

Phys. Rev. B　Vol. 58　No. 8　p. 4909-4909　1998/08　Research paper (scientific journal)

Recent Progress in Microtribology. Atomic-scale Tribology Studied by Frictional Force Microscope.

FUJISAWA Satoru, MORITA Seizo, SUGAWARA Yasuhiro

J. Surf. Sci. Soc. Jpn.　Vol. 19　No. 6　p. 374-378　1998/06

New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform

Nishi Ryuji, Nakao Yoshizumi, Ohta Takayuki, Sugawara Yasuhiro, Morita Seizo, Okada Takao

Jpn J Appl Phys　Vol. 37　No. 4　p. L417-L419　1998/04/01　Research paper (scientific journal)

Opening of ultrahigh vacuum non-contact mode atomic force microscopy

SUGAWARA Yasuhiro, MORITA Seizo

Electron-microscopy　Vol. 33　No. 1　p. 22-26　1998/03/31　Research paper (scientific journal)

Stable operation mode for dynamic noncontact atomic force microscopy

H. Ueyama, Y. Sugawara

Appl. Phys. A.　Vol. 66　p. S295-S297　1998/03　Research paper (scientific journal)

Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy.

Abe Masayuki, Sugawara Yasuhiro, Hara Yasuyuki, Sawada Kazuyoshi, Morita Seizo

Japanese Journal of Applied Physics　Vol. 37　No. 2　p. L167-L169　1998/02　Research paper (scientific journal)

Load dependence of frictional-force microscopy image pattern of graphite surface

SASAKI N.

Phys. Rev. B　Vol. 57　p. 3785s-3786s　1998/02　Research paper (scientific journal)

Theoretical Analysis of Atomic-Scale Friction in Frictional-Force Microscopy

Naruo Sasaki, Masaru Tsukada, Satoru Fujisawa, Yasuhiro Sugawara, Seizo Morita

Tribology Letters　Vol. 4　p. 125-128　1998/02　Research paper (scientific journal)

Atomic Resolution Imaging of Si(111)&Ouml;3´&Ouml;3-Ag Surface and Metallic Ag(111)Surface by Noncontact Atomic Force Microscope

S.Orisaka, T.Minobe, T.Uchihashi, Y.Sugawara, S.Morita

1998/01

Development of Noncontact UHV-AFM for Imaging of Biological Samples

M.Ashino, T.Uchihashi, M.Tanigawa, Y.Sugawara, T.Okada

1998/01　Research paper (scientific journal)

Development of Noncontact UHV-AFM for Imaging of Biological Samples

T.Uchihashi, M.Ashino, M.Tanigawa, Y.Sugawara, T.Okada

1998/01

New computed tomography algorithm of electrostatic force microscopy based on the singular value decomposition combined with the discrete Fourier transform

R.Nishi, Y.Nakao, T.Ohta, Y.Sugawara, S.Morita, T.Okada

1998/01　Research paper (scientific journal)

Status and Future of Noncontact Mode Atomic Force Microscope

Seizo Morita, Yasuhiro Sugawara

Vol. 39　No. 8　p. 612-618　1997/12

Atomically-Resolved Imaging of n+-GaAs(110) Cleaved Surfaces with Noncontact Atomic Force/Electrostatic Force Microscope

Seizo Morita, Yasuhiro Sugawara, Takayuki Uchihashi, Hitoshi Ueyama, Masayuki Abe, Masayuki Suzuki

1997/11

True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy

Yasuhiro Sugawara, Hitoshi Ueyama, Takayuki Uchihashi, Masahiro Ohta, Yoshio Yanase, Takashi Shigematsu, Masayuki Suzuki, Seizo Morita

1997/11

Role of a covalent bonding interaction in noncontact-mode atomic force microscopy on Si(111)7*7

T. UCHIHASHI, Y. SUGAARA

Phys.Rev.　Vol. 56　No. 15　p. 9834-9834　1997/10　Research paper (scientific journal)

Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image.

Nishi Ryuji, Ohta Takayuki, Sugawara Yasuhiro, Morita Seizo, Okada Takao

Japanese Journal of Applied Physics　Vol. 36　No. 10　p. L1410-L1412　1997/10　Research paper (scientific journal)

Detection of Evanescent Wave with Atomic Force Microscope

Yasuhiro Sugawara, Masayuki Abe, Seizo Morita

Vol. 26　No. 10　p. 537-538　1997/10　Research paper (scientific journal)

Growth of a Two-Dimensional Nucleus on a Cleaved (010) Surface of (NH 2CH 2COOH) 3&middot;H 2SO 4

Ohgami Junji, Sugawara Yasuhiro, Morita Seizo, Ozaki Tōru

J Phys Soc Jpn　Vol. 66　No. 9　p. 2747-2750　1997/09/15　Research paper (scientific journal)

Analysis of frictional-force image patterns of a graphite surface

SASAKI N.

J. Vac. Sci. Technol. B　Vol. 15　p. 1479-1482　1997/07　Research paper (scientific journal)

Detection Mechanism of an Optical Evanescent Field using a Noncontact Mode Atomic Force Microscope with a Frequency Modulation Detection Method

Masayuki Abe, Takayuki Uchihashi, Masahiro Ohta, Hitoshi Ueyama, Yasuhiro Sugawara, Seizo Morita

J. Vac. Sci. Technol. B　Vol. 15　No. 4　p. 1512-1515　1997/07　Research paper (scientific journal)

Development of Ultrahigh Vacuum Atomic Force Microscopy with Frequency Modulation Detection and its Application to Electrostatic Force Measurement

Takayuki Uchihashi, Masahiro Ohta, Yasuhiro Sugawara, Yoshio Yanase, Tatsuhiko Shigematsu, Mineharu Suzuki, Seizo Morita

J. Vac. Sci. Technol. B　Vol. 15　No. 4　p. 1543-1546　1997/07　Research paper (scientific journal)

Detection of Evanescent Field by Force

Yasuhiro Sugawara, Yasunori Hara, Kazuyoshi Sawada, Seizo Morita

1997/07

Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air

Uchihashi Takayuki, Nakano Akihiko, Ida Tohru, Andoh Yasuko, Kaneko Reizo, Sugawara Yasuhiro, Morita Seizo

Jpn J Appl Phys　Vol. 36　No. 6　p. 3755-3758　1997/06/15　Research paper (scientific journal)

True atomic resolution imaging with noncontact atomic force microscopy

SUGAWARA Y.

Appl.Sur.Sci　Vol. 113　p. 364-364　1997/04　Research paper (scientific journal)

Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope

Masayuki Abe, Takayuki Uchihashi, Masahiro Ohta, Hitoshi Ueyama, Yasuhiro Sugawara, Seizo Morita

Optical Review　Vol. 4　No. 1　p. 232-235　1997/01　Research paper (scientific journal)

Measurement of the Evanescent Field Using Noncontact Mode Atomic Fora Microscope

SUGAWARA Yasuhiro

1997　Research paper (scientific journal)

Characterization Of Semiconductor Surfaces With Atomic Force Microscope

Yasuhiro Sugawara, Hitoshi Ueyama, Takayuki Uchihashi, Masahiro Ohta, Seizo Morita

1996/12

New Development Of Noncontact Mode Atomic Force Microscope

Seizo Morita, Yasuhiro Sugawara, Hitoshi Ueyama, Masahiro Ohta, Takayuki Uchihashi

Vol. 33　No. 1　p. 22-26　1996/12

How to Obtain High Resolution Images in Atomospheric- and UHV-AFMs : The Know-how for the Construction of AFM and Image Interpretation

MORITA Seizo, SUGAWARA Yasuhiro, OHTA Masahiro

Journal of the Surface Science Society of Japan　Vol. 17　No. 11　p. 698-700　1996/11/10

Density Saturation of Densely Contact-Electrified Negative Charges on a Thin Silicon Oxide Due to the Coulomb Repulsive Force

Yasuhiro Sugawara, Takeshi Tsuyuguchi, Takayuki Uchihashi, Takahiro Okusako, Yoshinobu Fukano, Yoshiki Yamanishi, Sumitomo Metal, Industries, Lt, Takahiko Oasa, umitomo Metal, Industries, Seizo Morita

1996/11　Research paper (scientific journal)

Load Dependence of the Periodicity in Frictional Force Images on NaF(100) Surface

Satoru Fujisawa, Yasuhiro Sugawara, Seizo Morita

1996/11　Research paper (scientific journal)

Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction.

Fujisawa Satoru, Sugawara Yasuhiro, Morita Seizo

Japanese Journal of Applied Physics　Vol. 35　No. 11　p. 5909-5913　1996/11　Research paper (scientific journal)

Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air.

Morita Seizo, Uchihashi Takayuki, Okusako Takahiro, Yamanishi Yoshiki, Oasa Takahiko, Sugawara Yasuhiro

Japanese Journal of Applied Physics　Vol. 35　No. 11　p. 5811-5814　1996/11　Research paper (scientific journal)

How to Obtain High Resolution Images in Atomospheric-and UHV-AFMs : The Know-how for the Construction on AFM and Image Interpretation

MORITA Seizo, SUGAWARA Yasuhiro, OHTA Masahiro

Journal of the Surface Science Society of Japan　Vol. 17　No. 10　p. 617-618　1996/10/10

Near-Field Single Atom Observation Method With Ultimate Spatial Resolution

Seizo Morita, Yasuhiro Sugawara, Masahiro Ohta, Hitoshi Ueyama, Takayuki Uchihashi

1996/10

Time Evolution of Surface Topography around a Domain Wall in Ferroelectric (NH2CH2COOH)3&middot;H2SO4

Ohgami Junji, Sugawara Yasuhiro, Morita Seizo, Nakamura Eiji, Ozaki Tōru

Jpn J Appl Phys　Vol. 35　No. 9　p. 5174-5177　1996/09/30　Research paper (scientific journal)

Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope

Ohta Takayuki, Sugawara Yasuhiro, Morita Seizo

Jpn J Appl Phys　Vol. 35　No. 9　p. L1222-L1224　1996/09/15　Research paper (scientific journal)

How to Obtain High Resolution Images in Atomospheric- and UHV-AFMs : The Know-how for the Construction of AFM and Image Interpretation

MORITA Seizo, SUGAWARA Yasuhiro, OHTA Masahiro

Journal of the Surface Science Society of Japan　Vol. 17　No. 9　p. 559-561　1996/09/10　Research paper (scientific journal)

Recent Development Of Atomic Force Microscope

Seizo Morita, Yasuhiro Sugawara, Masahiro Ohta, Hitoshi Ueyama, Takayuki Uchihashi

1996/08

Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique

Ohgami Junji, Sugawara Yasuhiro, Morita Seizo, Nakamura Eiji, Ozaki Tōru

Jpn J Appl Phys　Vol. 35　No. 5　p. 2734-2739　1996/05/15　Research paper (scientific journal)

Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air

Fukano Yoshinobu, Sugawara Yasuhiro, Uchihashi Takayuki, Okusako Takahiro, Morita Seizo, Yamanishi Yoshiki, Oasa Takahiko

Jpn J Appl Phys　Vol. 35　No. 4　p. 2394-2401　1996/04/15　Research paper (scientific journal)

Proximity Effects of Negative Charge Groups Contact Electrified on Thin Silicon Oxide in Air

Takayuki Uchihashi, Takahiro Okusako, Yasuhiro Sugawara, Yoshiki Yamanishi, Sumitomo Metal, Industries, Lt, Takahiko Oasa, umitomo Metal, Industries, Seizo Morita

J. Appl. Phys.　Vol. 79　No. 8　p. 4171-4177　1996/04　Research paper (scientific journal)

Correlation between Contact-Electrified Charge Groups on a Thin Silicon Oxide

Takayuki Uchihashi, Takahiro Okusako, Yasuhiro Sugawara, Yoshiki Yamanishi, Sumitomo Metal, Industries, Lt, Takahiko Oasa, umitomo Metal, Industries, Seizo Morita

J.Vac.Sci.Technol.B　Vol. 14　No. 2　p. 1055-1059　1996/04　Research paper (scientific journal)

Atomic Resolution Imaging of InP(110) Surface Observed with Ultrahigh Vacuum Atomic Force Microscope in Noncontact Mode

Yasuhiro Sugawara, Masahiro Ohta, Hitoshi Ueyama, Seizo Morita, Fukunobu Osaka, ctronics Technology Research Laboratory, Shunsuke Ohkouchi, Optoelectronics Technology Research Laboratory, Mineharu Suzuki (NTT, Shuzo Mishima, Olympus Optical Co

J.Vac.Sci.Technol.B　Vol. 14　No. 2　p. 953-956　1996/04　Research paper (scientific journal)

Frictional Force Microscopy. Explanation of Microscopic Frictional Force.:Explanation of Microscopic Frictional Force

MORITA Seizo, SUGAWARA Yasuhiro, FUJISAWA Satoru, OHTA Masahiro, UEYAMA Hitoshi

J. Surf. Sci. Soc. Jpn.　Vol. 17　No. 1　p. 22-26　1996/01

Development of 3-D Atomic Force Computer Tomography Microscope

T.Ohta, Y.Sugawara, S.Morita, T.Okada

1996/01

Load dependence of the periodicity in friction force images on the NaF(100) surface

S.Fujisawa, Y.Sugawara, S.Morita

1996/01　Research paper (scientific journal)

Spatially quantized friction with a lattice periodicity

S.Morita, S.Fujisawa, Y.Sugawara

1996/01　Research paper (scientific journal)

Contact and non-contact mode imaging by atomic force microscopy

SUGAWARA Yasuhiro

1996　Research paper (scientific journal)

Time Evolution of Surface Topography around Domain Wall in Ferroelectric (NH┣D22┫D2CH┣D22┫D2COOH)┣D23┫D2・H┣D22┫D2SO┣D24┫D2

SUGAWARA Yasuhiro

1996　Research paper (scientific journal)

Density saturation of densely contact-electrified negative Charges on a thin silicon oxide sample due to the Coulomb upulsive force

SUGAWARA Yasuhiro

1996　Research paper (scientific journal)

Covvelation between contact-electrified change groups on a thin silicon oxide

SUGAWARA Yasuhiro

1996　Research paper (scientific journal)

Noncontact Ultrahigh Vacuum Atomic Force Microscope Combined with Scanning Tunneling Microscope

Seizo Morita, Yasuhiro Sugawara, Masahiro Ohta, Hitoshi Ueyama, Takayuki Uchihashi

1995/10

ATOMICALLY RESOLVED IMAGE OF CLEAVED SURFACES OF COMPOUND SEMICONDUCTORS OBSERVED WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE

M OHTA, Y SUGAWARA, F OSAKA, S OHKOUCHI, M SUZUKI, S MISHIMA, T OKADA, S MORITA

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B　Vol. 13　No. 3　p. 1265-1267　1995/05　Research paper (scientific journal)

Atomic-resolution image of GaAs(11O) surface with an ultrahigh-vacuum atomic force microscope (UHV-AFM)

Y Sugawara, H Ohta, K Hontani, S Morita, F Osaka, S Ohkouchi, M Suzuki, H Nagaoka, S Mishima, T Okada

FORCES IN SCANNING PROBE METHODS　Vol. 286　p. 507-512　1995　Research paper (international conference proceedings)

Time dependence and its spatial distribution of densely contact electrified electrons on a thin silicon oxide

Y Sugawara, S Morita, Y Fukano, T Uchihashi, T Okusako, A Chayahara, Y Yamanishi, T Oasa

FORCES IN SCANNING PROBE METHODS　Vol. 286　p. 501-506　1995　Research paper (international conference proceedings)

Two-dimensional atomic-scale friction observed with an AFM

S Fujisawa, E Kishi, Y Sugawara, S Morita

FORCES IN SCANNING PROBE METHODS　Vol. 286　p. 313-318　1995　Research paper (international conference proceedings)

非接触モード原子間顕微鏡による化合物半導体表面の原子分解能観察

菅原康弘

真空　Vol. 38　No. 11　p. 943-943　1995/01

2次元摩擦力顕微鏡による量子トライボロジーの研究

藤沢悟

日本物理学会誌　Vol. 50　No. 1　p. 36-36　1995/01

Noncontact UHV-AFM Imaging of InP(110) Surface with Atomic Resolution

S.Morita, M.Ohta, H.Ueyama, Y.Sugawara

1995/01

Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope.

Ohta Masahiro, Ueyama Hitoshi, Sugawara Yasuhiro, Morita Seizo

Japanese Journal of Applied Physics　Vol. 34　No. 12　p. L1692-L1694　1995/01　Research paper (scientific journal)

Defect motion on an InP(110) surface observed with noncontact atomic force microscopy

SUGAWARA Y.

Science　Vol. 270　p. 1646-1648　1995/01　Research paper (scientific journal)

Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope

H.Ueyama, M.Ohta, Y.Sugawara, S.Morita

1995/01　Research paper (scientific journal)

Two-dimensional quantized friction observed with two-dimensional frictional force microscope

S.Fujisawa, E.Kishi, Y.Sugawara, S.Morita

1995/01　Research paper (scientific journal)

Load dependence of two-dimensionally atomic-scale friction

S.Fujisawa, E.Kishi, Y.Sugawara, S.Morita

1995/01　Research paper (scientific journal)

Two-dimensionally discrete friction on NaF(100) surface with the lattice periodicity

S.Fujisawa, E.Kishi, Y.Sugawara, S.Morita

1995/01　Research paper (scientific journal)

Atomic resolution image of cleaved surface of compound semiconductors observed with ultrahigh-vacuum atomic force microscope in contact and noncontact modes

OHTA Masahiro, UEYAMA Hitoshi, SUGAWARA Yasuhiro, MORITA Seizo

OYOBUTURI　Vol. 64　No. 6　p. 583-587　1995/01　Research paper (scientific journal)

Atomic-scale friction observed with a two-dimentional friction-force microscope

FUJISAWA S.

Phys. Rev. B　Vol. 51　p. 7849-7849　1995/01　Research paper (scientific journal)

Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope(UHV-AFM).

Sugawara Yasuhiro, Ohta Masahiro, Ueyama Hitoshi, Morita Seizo

Japanese Journal of Applied Physics　Vol. 34　No. 4　p. L462-L464　1995/01　Research paper (scientific journal)

Lateral force curve for atomic force/lateral force microscope calibration

S.Fujisawa, E.Kishi, Y.Sugawara, S.Morita

1995/01　Research paper (scientific journal)

ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE WITH SAMPLE CLEAVING MECHANISM

M OHTA, Y SUGAWARA, S MORITA, H NAGAOKA, S MISHIMA, T OKADA

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B　Vol. 12　No. 3　p. 1705-1707　1994/05　Research paper (scientific journal)

Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope

Fukano Yoshinobu, Uchihashi Takayuki, Okusako Takahiro, Chayahara Ayumi, Sugawara Yasuhiro, Yamanishi Yoshiki, Oasa Takahiko, Morita Seizo

Jpn J Appl Phys　Vol. 33　No. 1　p. 379-382　1994/01/30　Research paper (scientific journal)

SURFACE STUDY WITH ATOMIC-FORCE MICROSCOPE

S MORITA, S FUJISAWA, E KISHI, Y SUGAWARA

JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS　Vol. 39　No. 11　p. 933-938　1994　Research paper (scientific journal)

「原子間力顕微鏡による表面の研究」

森田清三, 藤沢 悟, 岸 栄吾, 菅原康弘

日本トライボロジー学会誌『トライボロジスト』　1994/01

「原子間力顕微鏡は何を見てる？」

森田清三, 菅原康弘

パリティ　1994/01

「半導体表面のＡＦＭ／ＳＴＭ観察」

森田清三, 菅原康弘, 深野善信, 内橋貴之

ウルトラクリーンテクノロジー［半導体基盤技術研究会］　1994/01

「ＦＦＭ」

森田清三, 菅原康弘, 藤沢 悟

「機械の研究」（養賢堂）１９９４年新年特集号　1994/01

「ＡＦＭ／ＳＴＭ」

森田清三, 菅原康弘, 深野善信

「機械の研究」（養賢堂）　1994/01

Charge Storage by Contact Electrification on Thin SrTiO3 Film

T.Uchihashi, T.Okusako, T.Tsuyuguchi, Y.Sugawara, M.Igarashi, R.Kaneko, S.Morita

1994/01

Local Dielectric Breakdown of Thin Silicon Oxide by Dense Contact Electrification

Y.Fukano, T.Uchihashi, T.Okusako, Y.Sugawara, Y.Yamanishi, T.Oasa, S.Morita

1994/01

Observation of Positively Charged Trap Site in Silicon Oxide Layer with an Atomic Force Microscope

Y.Fukano, T.Okusako, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa, S.Morita

1994/01

Investigation of Trapped Charges in Silicon Oxide Layer with an Atomic Force Microscope

Y.Fukano, Y.Uchihashi, T.Okusako, K.Hontani, A.Chayahara, Y.Sugawara, Y.Yamanishi, T.Oasa, S.Morita

1994/01

Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide

Parameter Dependence of, Stable State of, Densely Contact-Electrified Electrons on Thin, Silicon Oxide

Vol. 33　No. 12　p. 6739-6745　1994/01　Research paper (scientific journal)

Potentiometry Combined with Atomic Force Microscope

T.Uchihashi, Y.Fukano, Y.Sugawara, S.Morita, A.Nakano, T.Ida, T.Okada

1994/01　Research paper (scientific journal)

Charge Storage on Thin SrTiO3 Film by Contact Electrification

T.Uchihashi, T.Okusako, T.Tsuyuguchi, Y.Sugawara, M.Igarashi, R.Kaneko, S.Morita

1994/01　Research paper (scientific journal)

Ultrahigh vacuum atomic force microscope with sample cleaving mechanism

Ultrahigh vacuum, atomic force microscope, with sample cleaving mechanism

1994/01　Research paper (scientific journal)

Study on the Stick-slip Phenomenon on a Cleaved Surface of the Muscovite Mica using an Atomic Force/Lateral Force Microscope

FUJISAWA S.

J. Vac. Sci. Technol.　Vol. 12　p. 1635-1635　1994　Research paper (scientific journal)

Atomic force microscopy studies of contact-electrified charges on silicon oxide film

Y.Sugawara, Y.Fukano, T.Uchihashi, S.Morita, Y.Yamanishi, T.Oasa, T.Okada

1994/01　Research paper (scientific journal)

Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface.

Uchihashi Takayuki, Okusako Takahiro, Sugawara Yasuhiro, Yamanishi Yoshiki, Oasa Takahiko, Morita Seizo

Japanese Journal of Applied Physics　Vol. 33　No. 8　p. L1128-L1130　1994/01　Research paper (scientific journal)

Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate.

Okusako Takahiro, Uchihashi Takayuki, Nakano Akihiko, Ida Toru, Sugawara Yasuhiro, Morita Seizo

Japanese Journal of Applied Physics　Vol. 33　No. 7　p. L959-L961　1994/01　Research paper (scientific journal)

Contact Electrification on Thin Silicon Oxide in Vacuum.

Tsuyuguchi Takeshi, Uchihashi Takayuki, Okusako Takahiro, Sugawara Yasuhiro, Morita Seizo, Yamanishi Yoshiki, Oasa Takahiko

Japanese Journal of Applied Physics　Vol. 33　No. 7　p. L1046-L1048　1994/01　Research paper (scientific journal)

Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification.

Fukano Yoshinobu, Hontani Koji, Uchihashi Takayuki, Okusako Takahiro, Chayahara Ayumi, Sugawara Yasuhiro, Yamanishi Yoshiki, Oasa Takahiko, Morita Seizo

Japanese Journal of Applied Physics　Vol. 33　No. 6　p. 3756-3760　1994/01　Research paper (scientific journal)

Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope.

Fujisawa Satoru, Kishi Eigo, Sugawara Yasuhiro, Morita Seizo

Japanese Journal of Applied Physics　Vol. 33　No. 6　p. 3752-3755　1994/01　Research paper (scientific journal)

Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope.

Sugawara Yasuhiro, Ohta Masahiro, Hontani Kouji, Morita Seizo, Osaka Fukunobu, Ohkouchi Shunsuke, Suzuki Mineharu, Nagaoka Hideki, Mishima Shuzo, Okada Takao

Japanese Journal of Applied Physics　Vol. 33　No. 6　p. 3739-3742　1994/01　Research paper (scientific journal)

Contact Electrification on Thin SrTiO3 Film by Atomic Force Microscope

T.Uchihashi, T.Okusako, J.Yamada, Y.Fukano, Y.Sugawara, M.Igarashi, R.Kaneko, S.Morita

1994/01　Research paper (scientific journal)

Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscope

S.Morita, Y.Fukano, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa

1994/01　Research paper (scientific journal)

Difference between the forces measured by an optical lever deflection and by an optical interferometer in atomic force microscope

S.Fujisawa, M.Ohta, T.Konishi, Y.Sugawara, S.Morita

1994/01　Research paper (scientific journal)

Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide

Sugawara Yasuhiro, Morita Seizo, Fukano Yoshinobu, Uchihashi Takayuki, Okusako Takahiro, Chayahara Ayumi, Yamanishi Yoshiki, Oasa Takahiko

Jpn J Appl Phys　Vol. 33　No. 1　p. L74-L77　1994/01/01　Research paper (scientific journal)

Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide

Sugawara Yasuhiro, Morita Seizo, Fukano Yoshinobu, Uchihashi Takayuki, Okusako Takahiro, Chayahara Ayumi, Yamanishi Yoshiki, Oasa Takahiko

Jpn J Appl Phys　Vol. 33　No. 1　p. L70-L73　1994/01/01　Research paper (scientific journal)

Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope

Ohta Masahiro, Sugawara Yasuhiro, Hontani Kouji, Morita Seizo, Osaka Fukunobu, Suzuki Mineharu, Nagaoka Hideki, Mishima Shuzo, Okada Takao

Jpn J Appl Phys　Vol. 33　No. 1　p. L52-L54　1994/01/01　Research paper (scientific journal)

Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)

Ohta Masahiro, Konishi Takefumi, Sugawara Yasuhiro, Morita Seizo, Suzuki Mineharu, Enomoto Yuji

Jpn J Appl Phys　Vol. 32　No. 6　p. 2980-2982　1993/06/20　Research paper (scientific journal)

Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer

Fukano Yoshinobu, Sugawara Yasuhiro, Yamanishi Yoshiki, Oasa Takahiko, Morita Seizo

Jpn J Appl Phys　Vol. 32　No. 1　p. 290-293　1993/01/20　Research paper (scientific journal)

「ＡＦＭ／ＳＴＭによる半導体の複合観察」

森田清三, 菅原康弘, 深野善信

日本結晶学会誌　1993/01

Time Evolution of Electrostatic Force Induced by Contact-Electrified Charges on Thin Silicon Oxide Surface

Y.Fukano, T.Uchihashi, Y.Sugawara, Y.Yamanishi, T.Oasa, S.Morita

1993/01　Research paper (scientific journal)

Time-Evolution of Contact-Eelectrified Charges on Silicon Oxide Film Studied with AFM

Y.Sugawara, Y.Fukano, T.Uchihashi, T.Okusako, S.Morita, Y.Yamanishi, T.Oasa

1993/01

Origin of the Force Measured by an Atomic Force/Lateral Force Microscope(AFM/LFM)

S.Fujisawa, Y.Sugawara, S.Morita

1993/01　Research paper (scientific journal)

The Two-Dimensional Stick-Slip Phenomenon with Atomic Resolution

FUJISAWA S.

Nanotechnology　Vol. 4　p. 138-138　1993/01　Research paper (scientific journal)

Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide

Morita Seizo, Sugawara Yasuhiro, Fukano Yoshinobu, Uchihashi Takayuki, Okusako Takahiro, Chayahara Ayumi, Yamanishi Yoshiki, Oasa Takahiko

Japanese Journal of Applied Physics　Vol. 32　No. 12　p. L1852-L1854　1993/01　Research paper (scientific journal)

Reproducible and Controllable Contact Electrification on a Thin Insulator

MORITA S.

Jpn. J. Appl. Phys.　Vol. 32　p. L1701-L1701　1993/01　Research paper (scientific journal)

Effects of humidity and tip radius on the adhesive force measured with atomic force microscopy

Y.Sugawara, M.Ohta, T.Konishi, S.Morita, M.Suzuki, Y.Enomoto

1993/01　Research paper (scientific journal)

Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM]

Morita Seizo, Sugawara Yasuhiro, Fukano Yoshinobu

Japanese Journal of Applied Physics　Vol. 32　No. 6　p. 2983-2988　1993/01　Research paper (scientific journal)

Observation of atomic defect on LiF(100) surface with UHV AFM

M.Ohta, T.Konishi, Y.Sugawara, S.Morita, M.Suzuki, Y.Enomoto

1993/01　Research paper (scientific journal)

Scanning Tunneling Microscopy II

WIESENDANGER R.

Springer Ser Surf. Sci　Vol. 28　p. 151-151　1992/01

Scanning Force Microscopy in the UHV Environment

Y.Sugawara, M.Ohta, Y.Kamihara, S.Morita, M.Suzuki, Y.Enomoto

1992/01

Observation of the Surface by Using AFM/STM

Y.Sugawara, S.Morita

1992/01

AFM/STM Investigation of pn Junctions Formed by Ion Implantation

Y.Sugawara, Y.Fukano, S.Morita, A.Nakano, T.Ida

1992/01

Nanometer Resolution Measurement of Dielectric Breakdown of Silicon Dioxide Films with AFM/STM

Y.Fukano, Y.Sugawara, S.Morita, Y.Yamanishi, d T, O

1992/01

AFM/STM investigation of polycrystalline Si surface

Y.Sugawara, Y.Fukano, Y.Kamihara, S.Morita, A.Nakano, T.Ida, R.Kaneko

1992/01　Research paper (scientific journal)

Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force/Tunneling Microscope (AFM/STM) in Air

Sugawara Yasuhiro, Fukano Yoshinobu, Nakano Akihiko, Ida Tohru, Morita Seizo

Japanese Journal of Applied Physics　Vol. 31　No. 6　p. L725-L727　1992/01　Research paper (scientific journal)

In Situ Imaging of Electrochemical Deposition of Ag on Au(111)

K.Endo, Y.Sugawara, S.Mishima, T.Okada, S.Morita

Vol. 30　No. 10　p. 2592-2593　1991/01　Research paper (scientific journal)

Scanning force tunneling microscopy of a graphite surface in air

SUGAWARA Y.

J. Vac. Sci. Technol., B　Vol. 9　p. 1092-1095　1991/01　Research paper (scientific journal)

Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface

Sugawara Yasuhiro, Ishizaka Tatsuya, Morita Seizo, Imai Syozo, Mikoshiba Nobuo

Jpn J Appl Phys　Vol. 29　No. 1　p. L157-L159　1990/01/20　Research paper (scientific journal)

Origin of Anomalous Corrugation Height of STM Images of Graphite

Sugawara Yasuhiro, Ishizaka Tatsuya, Morita Seizo

Japanese Journal of Applied Physics　Vol. 29　No. 8　p. 1533-1538　1990/01　Research paper (scientific journal)

Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM)

Sugawara Yasuhiro, Ishizaka Tatsuya, Morita Seizo

Japanese Journal of Applied Physics　Vol. 29　No. 8　p. 1539-1543　1990/01　Research paper (scientific journal)

Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air

Ishizaka Tatsuya, Sugawara Yasuhiro, Kumagai Kozo, Morita Seizo

Japanese Journal of Applied Physics　Vol. 29　No. 7　p. L1196-L1198　1990/01　Research paper (scientific journal)

Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface

Sugawara Yasuhiro, Ishizaka Tatsuya, Morita Seizo, Imai Syozo, Mikoshiba Nobuo

Japanese Journal of Applied Physics　Vol. 29　No. 3　p. L502-L504　1990/01　Research paper (scientific journal)

Surface Imaging in Air with a Force Microscope

T.Ishizaka, S.Morita, Y.Sugawara, T.Okada, S.Mishima, S.Imai, N.Mikoshiba

1990/01　Research paper (scientific journal)

Differential Conductance Imaging under AC Tunneling Bias

A.Yagi, S.Tsukada, Y.Takahashi, Y.Sugawara, S.Morita, T.Okada, S.Imai an, N.Mikoshiba

1990/01　Research paper (scientific journal)

Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope

Morita Seizo, Ishizaka Tatsuya, Sugawara Yasuhiro, Okada Takao, Mishima Syuzo, Imai Syozo, Mikoshiba Nobuo

Japanese Journal of Applied Physics　Vol. 28　No. 9　p. L1634-L1636　1989/01　Research paper (scientific journal)

Performance of concave transducers in acoustic microscopy

IEEE 1988 Ultrasonics Symposium proceedings　Vol. 1988　No. 2　p. 751-756　1988/01

Theoretical analysis on acoustic fields formed by focusing devices in acoustic microscopy

IEEE 1986 Ultrasonics Symposium　Vol. 1986　p. 783-788　1986/01

Off-centric concave transducer for acoustic microscopy

CHUBACHI N., KUSHIBIKI Jun-ichi, SUGAWARA Yasuhiro

Jpn. J. Appl. Phys. Suppl.　Vol. 25　p. 203-205　1986/01