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Sugawara Yasuhiro

菅原 康弘

Graduate School of Engineering Division of Precision Science & Technology and Applied Physics, Professor

Education

  • - 1987/03, Tohoku University, Graduate School, Division of Engineering

Research History

  • 2020/04/01 - Present, Osaka University Graduate School of Engineering ., Professor
  • 2002/05 - Present, 大阪大学教授
  • 1996/07 - Present, 大阪大学助教授
  • 1990/01 - Present, 広島大学助手
  • 1988/01 - Present, 岩手大学助手
  • 1987/04 - Present, 東北大学助手
  • 2005/04/01 - 2020/03/31, Osaka University Graduate School of Engineering Division of Precision Science & Technology and Applied Physics, Professor
  • 2002/05/01 - 2005/03/31, Osaka University Graduate School of Engineering, Professor
  • 1998/04/01 - 2002/04/30, Osaka University Graduate School of Engineering, Associate Professor

Research Areas

  • Nanotechnology/Materials, Nanostructure chemistry
  • Nanotechnology/Materials, Nanostructure physics

Professional Memberships

  • 真空協会
  • 日本表面科学会
  • 日本電子顕微鏡学会
  • 日本物理学会
  • 応用物理学会

Papers

  • Optical Imaging of a Single Molecule with Subnanometer Resolution by Photoinduced Force Microscopy, Tatsuya Yamamoto,Hidemasa Yamane,Nobuhiko Yokoshi,Hisaki Oka,Hajime Ishihara,Yasuhiro Sugawara, ACS Nano, American Chemical Society (ACS), Vol. 18, No. 2, p. 1724-1732, 2023/12/29
  • Study of CO molecules on Pd/Al2O3/NiAl(110) surface by atomic force microscopy and Kelvin probe force microscopy, Shanrong Zou,Jiuyan Wei,Qiang Zhu,Hongqian Sang,Yasuhiro Sugawara,Yan Jun Li, Journal of Nanoparticle Research, Springer Science and Business Media LLC, Vol. 25, No. 7, 2023/06/30
  • Improvement of excitation and collection efficiency simultaneously with integrated Au coatings for chip-scale NV magnetometer, Liu Xinyu,Zheng Doudou,Zhao Junzhi,Wang Qimeng,Liu Yankang,Guo Hao,Tang Jun,Sugawara Yasuhiro,Li Yanjun,Ma Zongmin,Liu Jun, Sensors and Actuators A: Physical, Elsevier BV, Vol. 352, p. 114206-114206, 2023/04
  • Investigation of semiconductor properties of Co/Si(111)-7 × 7 by AFM/KPFS, Zhang Qu,Yasuhiro Sugawara,Yanjun Li, Journal of Physics: Condensed Matter, IOP Publishing, Vol. 35, No. 18, p. 185001-185001, 2023/03/09
  • Adaptive filter entropy monitoring method for scalar magnetic detection using optically pumped magnetometers, Shuai Qiao,Qimeng Wang,Doudou Zheng,Qingfeng Hou,Junzhi Zhao,Jun Tang,Li Yanjun,Yasuhiro Sugawara,Zongmin Ma,Jun Liu, Measurement Science and Technology, IOP Publishing, Vol. 34, No. 5, p. 055107-055107, 2023/02/15
  • High–low Kelvin probe force spectroscopy for measuring the interface state density, Ryo Izumi,Masato Miyazaki,Yan Jun Li,Yasuhiro Sugawara, Beilstein Journal of Nanotechnology, Beilstein Institut, Vol. 14, p. 175-189, 2023/01/31
  • Near-field circular dichroism of single molecules, Hidemasa Yamane,Nobuhiko Yokoshi,Hisaki Oka,Yasuhiro Sugawara,Hajime Ishihara, Optics Express, Optica Publishing Group, Vol. 31, No. 3, p. 3415-3415, 2023/01/30
  • Exploration of CO movement characteristics on rutile TiO2(110) surface, Qiang Zhu,Yasuhiro Sugawara,Yanjun Li, Colloids and Surfaces A: Physicochemical and Engineering Aspects, Elsevier BV, Vol. 656, p. 130402-130402, 2023/01
  • Dual-bias modulation heterodyne Kelvin probe force microscopy in FM mode, Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, Applied Physics Letters, AIP Publishing, Vol. 121, No. 24, p. 241602-241602, 2022/12/12
  • Hybrid mode atomic force microscopy of phase modulation and frequency modulation, Tatsuya Yamamoto,Masato Miyazaki,Hikaru Nomura,Yan Jun Li,Yasuhiro Sugawara, Microscopy, Oxford University Press (OUP), Vol. 72, No. 3, p. 236-242, 2022/11/02
  • Atomic structure and electron distribution of Co atoms adsorbed on Si(111) surface by NC-AFM/KPFM at 78 K, Zhang Qu,Jiuyan Wei,Xiaopeng Liu,Yasuhiro Sugawara,Yanjun Li, Surface Science, Elsevier BV, Vol. 724, p. 122130-122130, 2022/10
  • Nanoscale optical imaging with photoinduced force microscopy in heterodyne amplitude modulation and heterodyne frequency modulation modes, Junsuke Yamanishi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara, Journal of Photochemistry and Photobiology C: Photochemistry Reviews, Elsevier BV, Vol. 52, p. 100532-100532, 2022/09
  • Tip-Induced Dynamic Behaviors of a Water Molecule and Hydroxyl on the Rutile TiO<sub>2</sub>(110) Surface, Qiang Zhu,Yuuki Adachi,Yasuhiro Sugawara,Yanjun Li, The Journal of Physical Chemistry C, American Chemical Society (ACS), Vol. 126, No. 31, p. 13062-13068, 2022/07/27
  • Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy, Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, Beilstein Journal of Nanotechnology, Beilstein Institut, Vol. 13, p. 712-720, 2022/07/25
  • Visualization of Strain-Engineered Nanopattern in Center-Confined Mesoscopic WS<sub>2</sub> Monolayer Flakes, Rui Xu,Yingzhuo Lun,Lan Meng,Fei Pang,Yuhao Pan,Zhiyue Zheng,Le Lei,Sabir Hussain,Yan Jun Li,Yasuhiro Sugawara,Jiawang Hong,Wei Ji,Zhihai Cheng, The Journal of Physical Chemistry C, American Chemical Society (ACS), Vol. 126, No. 16, p. 7184-7192, 2022/04/28
  • Energy dissipation during collision for anti-relaxation coatings in alkali-metal vapor cells, Cheng Dong,Xiangqian Fang,Junjun Sang,Jun Tang,Haifeng Dong,Yasuhiro Sugawara,Yanjun Li,Zongmin Ma,Jun Liu, Japanese Journal of Applied Physics, IOP Publishing, Vol. 61, No. 5, p. 055504-055504, 2022/04/25
  • Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy, Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Applied Physics Letters, AIP Publishing, Vol. 120, No. 16, p. 161601-161601, 2022/04/18
  • Study of high–low KPFM on a pn-patterned Si surface, Ryo Izumi,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara, Microscopy, Oxford University Press (OUP), Vol. 71, No. 2, p. 98-103, 2022/04/01
  • Charge State Tristability of Oxygen Adatom on a Rutile TiO<sub>2</sub>(110)–(1 × 1) Surface Controlled by Atomic Force Microscopy, Yuuki Adachi,Huan Fei Wen,Quanzhen Zhang,Masato Miyazaki,Yasuhiro Sugawara,Ján Brndiar,Lev Kantorovich,Ivan Štich,Yan Jun Li, The Journal of Physical Chemistry C, American Chemical Society (ACS), Vol. 126, No. 10, p. 5064-5069, 2022/03/17
  • Probing CO on a rutile TiO2(110) surface using atomic force microscopy and Kelvin probe force microscopy, Yuuki Adachi,Yasuhiro Sugawara,Yan Jun Li, Nano Research, Springer Science and Business Media LLC, Vol. 15, No. 3, p. 1909-1915, 2022/03
  • Unraveling the Charge States of Au Nanoclusters on an Oxygen-Rich Rutile TiO<sub>2</sub>(110) Surface and Their Triboelectrification Overturn by nc-AFM and KPFM, Quanzhen Zhang,Ján Brndiar,Martin Konôpka,Huan Fei Wen,Yuuki Adachi,Masato Miyazaki,Robert Turanský,Rui Xu,Zhi Hai Cheng,Yasuhiro Sugawara,Ivan Štich,Yan Jun Li, The Journal of Physical Chemistry C, American Chemical Society (ACS), Vol. 125, No. 50, p. 27607-27614, 2021/12/23
  • Single hydrogen atom manipulation for reversible deprotonation of water on a rutile TiO2 (110) surface, Yuuki Adachi,Hongqian Sang,Yasuhiro Sugawara,Yan Jun Li, Communications Chemistry, Springer Science and Business Media LLC, Vol. 4, No. 1, 2021/12
  • Voltage- and Redox State-Triggered Oxygen Adatom Conductance Switch, Quanzhen Zhang,Ján Brndiar,Yuuki Adachi,Martin Konôpka,Huan Fei Wen,Masato Miyazaki,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng,Hongqian Sang,Yan Jun Li,Lev Kantorovich,Ivan Štich, The Journal of Physical Chemistry C, American Chemical Society (ACS), Vol. 125, No. 48, p. 26801-26807, 2021/11/30
  • The Possibility of Integrating NV Magnetometer Array by Using Wireless Microwave Excitation and Its Application in Remote Heart Sound Records, Doudou Zheng,Qimeng Wang,Xiaocheng Wang,Xuemin Wang,Yanjun Li,Yasuhiro Sugawara,Li Qin,Xiaoming Zhang,Yunbo Shi,Jun Tang,Hao Guo,Zongmin Ma,Jun Liu, IEEE Sensors Journal, Institute of Electrical and Electronics Engineers (IEEE), Vol. 21, No. 20, p. 22587-22594, 2021/10/15
  • Exploring the nature of hydrogen of Rutile TiO2(110) at 78 K, Huan Fei Wen,Yasuhiro Sugawara,Yan Jun Li, SURFACES AND INTERFACES, ELSEVIER, Vol. 26, 2021/10
  • Detection of sub-nanotesla magnetic fields by linewidth narrowing in high-density nitrogen vacancy magnetometry with pulsed ESR method, Yangang Zhang,Xiaocheng Wang,Junqi Wang,Doudou Zheng,Liumin Niu,Xiaohan Chai,Jun Tang,Hao Guo,Li Qin,Xiaoming Zhang,Zongmin Ma,Jun Liu,Yasuhiro Sugawara,Yanjun Li, JAPANESE JOURNAL OF APPLIED PHYSICS, IOP PUBLISHING LTD, Vol. 60, No. 9, 2021/09
  • Charge Behavior of Terminal Hydroxyl on Rutile TiO<sub>2</sub>(110), Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, Langmuir, American Chemical Society (ACS), Vol. 37, No. 35, p. 10588-10593, 2021/08/26
  • Optical force mapping at the single-nanometre scale, Junsuke Yamanishi,Hidemasa Yamane,Yoshitaka Naitoh,Yan Jun Li,Nobuhiko Yokoshi,Tatsuya Kameyama,Seiya Koyama,Tsukasa Torimoto,Hajime Ishihara,Yasuhiro Sugawara, NATURE COMMUNICATIONS, NATURE RESEARCH, Vol. 12, No. 1, 2021/06
  • Homogeneity of the negatively charged assembly of nitrogen vacancy centres in diamonds using the Quasi-finite-element optical scanning position method, Doudou Zheng,Zongmin Ma,Yangang Zhang,Yueping Fu,Jiuyan Wei,Hua Yuan,Li Qin,Yunbo Shi,Jun Tang,Jun Liu,Yanjun Li,Yasuhiro Sugawara, LASER PHYSICS, IOP PUBLISHING LTD, Vol. 31, No. 4, 2021/04
  • Electrically-induced manipulation of the Au nanoclusters on oxidized rutile TiO2(110) surface by atomic force microscopy at 78K, Quanzhen Zhang,Huan Fei Wen,Rui Xu,Zhihai Cheng,Yasuhiro Sugawara,Yan Jun Li, The Journal of Physical Chemistry C, AMER CHEMICAL SOC, Vol. 124, No. 52, p. 28562-28568, 2020/12
  • Oxygen-Adsorption-Induced Charge State Change of a Pd Nanocluster on the Al2O3/NiAl(110) Surface, Shanrong Zou,Yasuhiro Sugawara,Yan Jun Li, JOURNAL OF PHYSICAL CHEMISTRY C, AMER CHEMICAL SOC, Vol. 125, No. 1, p. 446-451, 2020/12
  • Effects of subsurface charge on surface defect and adsorbate of rutile TiO2 (110), Wen Huan-Fei,Yasuhiro Sugawara,Li Yan-Jun, ACTA PHYSICA SINICA, CHINESE PHYSICAL SOC, Vol. 69, No. 21, 2020/11
  • Direct observation of the Si(110)-(16x2) surface reconstruction by atomic force microscopy, Tatsuya Yamamoto,Ryo Izumi,Kazushi Miki,Takahiro Yamasaki,Yasuhiro Sugawara,Yan Jun Li, BEILSTEIN JOURNAL OF NANOTECHNOLOGY, BEILSTEIN-INSTITUT, Vol. 11, p. 1750-1756, 2020/11
  • Theoretical analysis of optically selective imaging in photoinduced force microscopy, Hidemasa Yamane,Junsuke Yamanishi,Nobuhiko Yokoshi,Yasuhiro Sugawara,Hajime Ishihara, OPTICS EXPRESS, OPTICAL SOC AMER, Vol. 28, No. 23, p. 34787-34803, 2020/11
  • Strain-Induced Hierarchical Ripples in MoS2 Layers Investigated by Atomic Force Microscopy, Sabir Hussain,Rui Xu,Kunqi Xu,Le Lei,Lan Meng,Zhiyue Zheng,Shuya Xing,Jianfeng Guo,Haoyu Dong,Adeel Liaqat,Muhammad Iqbal,Yanjun Li,Yasuhiro Sugawara,Fei Pang,Wei Ji,Liming Xie,Zhihai Cheng, Applied Physics Letters, Vol. 117, p. 153102-1-153102-7, 2020/10
  • Atomically Asymmetric Inversion Scales up to Mesoscopic Single-Crystal Monolayer Flakes, Rui Xu,Fei Pang,Yuhao Pan,Yingzhuo Lun,Lan Meng,Zhiyue Zheng,Kunqi Xu,Le Lei,Sabir Hussain,Yan Jun Li,Yasuhiro Sugawara,Jiawang Hong,Wei Ji,Zhihai Cheng, ACS NANO, AMER CHEMICAL SOC, Vol. 14, No. 10, p. 13834-13840, 2020/09
  • Size Dependence of Charge State of Pd Nanoparticles on the Al2O3/NiAl(110) Surface by Kelvin Probe Force Microscopy, Shanrong Zou,Hirotaka Yokoyama,Yasuhiro Sugawara,Yan Jun Li, JOURNAL OF PHYSICAL CHEMISTRY C, AMER CHEMICAL SOC, Vol. 124, No. 39, p. 21641-21645, 2020/09
  • Imaging Oxygen Molecular Adsorption and Dissociation on TiO2(110) Surface with Real Configuration at 78 K by Atomic Force Microscopy, Huan Fei Wen,Hongqian Sang,Yasuhiro Sugawara,Yan Jun Li, Physical Chemistry Chemical Physics, Vol. 22, p. 19795-19801, 2020/08
  • Atomic Scale Three Dimensional Au Nanocluster on Rutile TiO2 (110) Surface Resolved by Atomic Force Microscopy, Yuuki Adachi,Yasuhiro Sugawara,Yan Jun Li, The Journal of Physical Chemistry Letters, Vol. 11, p. 7153-7158, 2020/08
  • Dynamic Behavior of OH and Its Atomic Contrast with O adatom on Ti site of TiO2(110) at 78 K by Atomic Force Microscopy Imaging, Huan Fei Wen,Hongqian Sang,Yasuhiro Sugawara,Yan Jun Li, Appled Physics Letters, Vol. 117, p. 051602-1-051602-4, 2020/07
  • Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Atomic Force Microscopy, HuanFei Wen,Yasuhiro Sugawara,Yan Jun Li, Nanomaterials, Vol. 10, p. 1506(1)-1506(9), 2020/07
  • Surface potential measurement by heterodyne frequency modulation Kelvin probe force microscopy in MHz range, Yasuhiro Sugawara,Masato Miyazaki,Yanjun Li, Journal of Physics Communications, Vol. 4, 2020/07
  • Remotely Controlling the Charge State of Oxygen Adatoms on Rutile TiO2(110) Surface using Atomic Force Microscopy, Yuuki Adachi,Yasuhiro Sugawara,Yan Jun Li, The Journal of Physical Chemistry Part C, Vol. 124, No. 22, p. 12010-12015, 2020/05
  • Elucidating Charge State of an Au Nanocluster on Oxidized/Reduced Rutile TiO2(110) Surfaces using non-contact atomic force microscopy and Kelvin probe force microscopy, Yuuki Adachi,Huan Fei Wen,Quanzhen Zhang,Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, Nanoscale Advances, Vol. 2, p. 2371-2375, 2020/03
  • A hand-held magnetometer based on an ensemble of nitrogen-vacancy centers in diamond, D. Zheng,Z. Ma,W. Guo,L. Niu,J. Wang,X. Chai,Y. J. Li,Y. Sugawara,C. Yu,Y. Shi,X. Zhang,J. Tang,H. Guo,J. Liu, J. Phys. D: Appl. Phys., IOP PUBLISHING LTD, Vol. 53, No. 15, p. 155004 (1)-155004(6), 2020/02
  • Single hydrogen atom manipulation for reversible deprotonation of water on a rutile TiO2 (110) surface, Yuuki Adachi,Hongqian Sang,Yasuhiro Sugawara,Yan Jun Li, Communications Chemistry, No. 4, p. 1-5, 2020/01
  • AFM/KPFSによる二酸化チタン表面に吸着した酸素原子・分子の電荷状態の原子レベル解析と電荷, 李 艶 君,安 達 有 輝,菅 原 康 弘, 触媒, Vol. 62, No. 1, p. 9-14, 2020/01
  • Adhesion Effect on the Hyperfine Frequency Shift of an Alkali Metal Vapor Cell with Paraffin Coating Using Peak-Force Tapping AFM, Jiuyan Wei,Zongmin Ma,Huanfei Wen,Hao Guo,Jun Tang,Jun Liu,Yanjun Li,Yasuhiro Sugawara, Coatings, Vol. 10, No. 84, p. 1-11, 2020/01
  • Electrical Engineering of the Oxygen Adatom and Vacancy on Rutile TiO2(110) by Atomic Force Microscopy at 78 K, Quanzhen Zhang,Huan Fei Wen,Yuuki Adachi,Masato Miyazaki,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng,Yan Jun Li, JOURNAL OF PHYSICAL CHEMISTRY C, AMER CHEMICAL SOC, Vol. 123, No. 47, p. 28852-28858, 2019/11
  • Identification of Atomic Defects and Adsorbates on Rutile TiO2(110)-(1×1) Surface by Atomic Force Microscopy., Huan Fei Wen,Yuuki Adachi,Quanzhen Zhang,Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, The Journal of Physical Chemistry C, Vol. 123, p. 25756-25760, 2019/09
  • Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K, Quanzhen Zhang,Huan Fei Wen,Yuuki Adachi,Masato Miyazaki,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng,Yan Jun Li, JOURNAL OF PHYSICAL CHEMISTRY C, AMER CHEMICAL SOC, Vol. 123, No. 36, p. 22595-22602, 2019/08
  • Tip-induced Control of Charge and Molecular Bonding of Oxygen Atoms on the Rutile TiO2 (110) Surface with Atomic Force Microscopy, Yuuki Adachi,Huan Fei Wen,Quanzhen Zhang,Masato Miyazaki,Yasuhiro Sugawara,Hongqian Sang,Ján Brndiar,Lev Kantorovich,Ivan Štich,Yan Jun Li, ACS Nano, Vol. 16, p. 6917-6924, 2019/06
  • Imaging of the surface potential at the steps on rutile TiO2(110) surface by Kelvin probe force microscopy, Masato Miyazaki,Huan Fei Wen,Quanzhen Zhang,Yuuki Adachi,Jan Brndiar,Ivan Štich,Yan Jun Li,Yasuhiro Sugawara, Beilstein Journal of Nanotechnology, Vol. 10, p. 1228-1236, 2019/06
  • Contrast inversion of O adatom on rutile TiO2(110)-(1×1) surface by atomic force microscopy imaging, Huan Fei Wen,Quanzhen Zhang,Yuuki Adachi,Masato Miyazaki,Yasuhiro Sugawara,Yan Jun Li, Applied Surface Science, Vol. 505, p. 144623-144627, 2019/05
  • Interfacial water intercalation-induced metal-insulator transition in NbS2/BN heterostructure, Rui Xu,Xinsheng Wang,Zhiyue Zheng,Shili Ye,Kunqi Xu,Le Lei,Sabir Hussain,Fei Pang,Xinmeng Liu,Yan Jun Li,Yasuhiro Sugawara,Wei Ji,Liming Xie,Zhihai Cheng, NANOTECHNOLOGY, IOP PUBLISHING LTD, Vol. 30, No. 20, 2019/05
  • Subatomic-scale resolution with SPM: Co adatom on p(2 x 1)Cu(110):O, Robert Turansky,Krisztian Palotas,Jan Brndiar,Yanjun Li,Yasuhiro Sugawara,Ivan Stich, Nanotechnology, Vol. 30, p. 095703(1)-095703(7), 2019/01
  • Direct observation of atomic step edges on the rutile TiO2(110)-(1× 1) surface using atomic force microscopy, Huan Fei Wen,Masato Miyazaki,Quanzhen Zhang,Yuuki Adachi,Yan Jun Li,Yasuhiro Sugawara, Phys. Chem. Chem. Phys., Vol. 20, p. 28337-28337, 2018/11
  • Measurement and Manipulation of the Charge State of an Adsorbed Oxygen Adatom on the Rutile TiO2(110)-1x1 Surface by nc-AFM and KPFM, Quanzhen Zhang,Yan Jun Li,Huan Fei Wen,Yuuki Adachi,Masato Miyazaki,Yasuhiro Sugawara,Rui Xu,Zhi Hai Cheng,Jan Brndiar,Lev Kantorovich,Ivan Stich, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, AMER CHEMICAL SOC, Vol. 140, No. 46, p. 15668-15674, 2018/10
  • Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy, Huan Fei Wen,Quanzhen Zhang,Yuuki Adachi,Masato Miyazaki,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Direct visualization of Oxygen Reaction with Paired Hydroxyl on TiO2(110) Surface at 78 K by Atomic Force Microscopy, Vol. 122, p. 17395-17399, 2018/07
  • Stable Contrast Mode on TiO2(110) Surface with Metal-Coated Tips Using AFM, Yanjun Li,Huanfei Wen,Q. Zhang,Y. Adachi,Eiji Arima,Yukinori Kinoshita,Hikaru Nomura,Zongmin Ma,Lili Kou,Yoshitaka Naitoh,Yasuhiro Sugawara,Rui Xu,Zhihai Cheng, Ultramicroscopy, Vol. 191, p. 51-55, 2018/04
  • High harmonic exploring on different materials in dynamic atomic force microscopy, ZhiYue Zheng,Rui Xu,ShiLi Ye,Sabir Hussain,Wei Ji,Peng Cheng,YanJun Li,Yasuhiro Sugawara,ZhiHai Cheng, SCIENCE CHINA-TECHNOLOGICAL SCIENCES, SCIENCE PRESS, Vol. 61, No. 3, p. 446-452, 2018/03
  • KPFM/AFM imaging on TiO2(110) surface in O2 gas, Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara, Nanotechnology, Vol. 29, p. 105504(1)-105504(8), 2018/02
  • Photoinduced Force Microscopy Imaging Using Heterodyne-FM Technique, Junsuke Yamanishi,Masaaki Tsujii,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara, OPTICAL MANIPULATION CONFERENCE, SPIE-INT SOC OPTICAL ENGINEERING, Vol. 10712, 2018
  • Magnetic resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonator, Yukinori Kinoshita,Yan Jun Li,Satoru Yoshimura,Hitoshi Saito,Yasuhiro Sugawara, Nanotechnology, Vol. 28, p. 485709(1)-485709(6), 2017/11
  • Sub-atomic-scale tip-surface force vector mapping above a Ge(001) dimer using bimodal atomic force micorscopy, Yoshitaka Naitoh,Robert Turanský,Ján Brndiar,Yan Jun Li,Ivan Štich,Yasuhiro Sugawara, nature physics, Vol. 13, No. 7, p. 663-667, 2017/04
  • Investigation of the surface potential of TiO2(110) by frequency-modulation Kelvin probe force microscopy, Lili Kou,Yan Jun Li,Takeshi Kamijo,Yoshitaka Naitoh,Yasuhiro Sugawara, Nanotechnology, 2016/11
  • Promoting atoms into delocalized long-living magnetically modified state using Atomic Force Microscopy, Y. Kinoshita,R. Turanský,J. Brndiar,Y. Naitoh,Y. J. Li,L. Kantorovich,Y. Sugawara,I. Štich, Nano Letters, Vol. 16, No. 12, p. 7490-7494, 2016/10
  • Development of Low Temperature Atomic Force Microscopy with an Optical Beam Deflection System Capable of Simultaneously Detecting the Lateral and Vertical Forces, Eiji Arima,Huanfei Wen,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Rev. Sci. Instrum., 2016/09
  • Growth models of coexisting p(2 x 1) and c(6 x 2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K, Yan Jun Li,Seung Hwan Lee,Yukinori Kinoshita,Zong Min Ma,Huanfei Wen,Hikaru Nomura,Yoshitaka Naitoh,Yasuhiro Sugawara, Nanotechnology, Institute of Physics Publishing, Vol. 27, No. 20, p. 205702-205702, 2016/04/07
  • Growth models of coexisting p(2×1) and c(6×2) phases on an oxygen-terminated Cu(110) surface studied by noncontact atomic force microscopy at 78 K, Yan Jun Li,Seung Hwan Lee,Yukinori Kinoshita,Zong Min Ma,Huanfei Wen,Hikaru Nomura,Yoshitaka Naitoh,Yasuhiro Sugawara, Nanotechnology, 2016/04
  • Distance dependence of atomic-resolution near-field imaging on alpha-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip, Junsuke Yamanishi,Takashi Tokuyama,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, NANO RESEARCH, TSINGHUA UNIV PRESS, Vol. 9, No. 2, p. 530-536, 2016/02
  • 19aAR-5 Spatial elastic property of Ge(001) at sub-atomic scale with multi-frequency atomic force microscopy, Naitoh Y.,Li Y. J.,Sugawara Y., Meeting Abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 71, p. 2484-2484, 2016
  • Development of the Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance to Image Surface Spin with Atomic Resolution, ARIMA Eiji,NAITOH Yoshitaka,YAN JUN Li,SUGAWARA Yasuhiro, Hyomen Kagaku, The Surface Science Society of Japan, Vol. 37, No. 9, p. 416-421, 2016
  • Atomic Force Microscopy identification of Al-sites on ultrathin aluminum oxide film on NiAl(110), Yan Jun Li,Jan Brndiar,Yoshitaka Naitoh,Yasuhiro Sugawara,Ivan Stich, Nanotechnology, 2015/11
  • Atomic-Resolution Imaging of the Optical Near Field Based on the Surface Photovoltage of a Silicon Probe Tip, Yasuhiro Sugawara,Junsuke Yamanishi,Takashi Tokuyama,Yoshitaka Naitoh,Yan Jun Li, Phys. Rev. Appl., 2015/04
  • Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback, Lili Kou,Zongmin Ma,Yan Jun Li,Yoshitaka Naitoh,Masaharu Komiyama,Yasuhiro Sugawara, Nanotechnology, 2015/04
  • Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance, Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Satoru Yoshimura,Hitoshi Saito,Hikaru Nomura,Ryoichi Nakatani,Yasuhiro Sugawara, Nanotechnology, Institute of Physics Publishing, Vol. 26, No. 12, p. 125701-125701, 2015/03/27
  • Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance, Eiji Arima,Yoshitaka Naitoh,Yan Jun Li,Satoru Yoshimura,Hitoshi Saito,Hikaru Nomura,Ryoichi Nakatani,Yasuhiro Sugawara, Nanotechnology, 2015/03
  • Development of nevel SPM technique for observing the surface magnetism at the atomic scale, SUAGAWARA YASUHIRO,ARIMA EIJI,NAITOH YOSHITAKA,LI YANJUN, Abstract of annual meeting of the Surface Science of Japan, The Surface Science Society of Japan, Vol. 35, p. 27-27, 2015
  • Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism, J. Bamidele,Seung-Hwan Lee,Y. Kinoshita,R. Turanský,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Štich,L. Kantorovich, Nature Communications, 2014/07
  • Image formation and contrast inversion in NC-AFM imaging of oxidized Cu(110) surfaces, Joseph Bamidele,Yukinori Kinoshita,Robert Turanský,Seung-Hwan Lee,Yoshitaka Naitoh,Yanjun Li,Yasuhiro Sugawara,Ivan Štich,Lev Kantorovich, Phys. Rev. B, 2014/07
  • The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes, Zong Min Ma,Lili Kou,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Nanotechnology, 2013/04
  • Complex design of dissipation signals in non-contact atomic force microscopy, Joseph Bamidele,Yan Jun Li,Samuel Jarvis,Yoshitaka Naitoh,Yasuhiro Sugawara,Lev Kantorovich, Physical Chemistry Chemical Physics, 2012/12
  • Quantification of Atomic-Scale Elasticity on Ge(001)-c(4×2) Surfaces via Noncontact Atomic Force Microscopy with a Tungsten-Coated Tip, Y. Naitoh,T. Kamijo,Y. J. Li,Y. Sugawara, Phys. Rev. Lett., 2012/11
  • Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface, J. Bamidele,Y. Kinoshita,R. Turanský,Seung-Hwan Lee,Y. Naitoh,Y. J. Li,Y. Sugawara,I. Štich,L. Kantorovich, Phys. Rev. B, 2012/10
  • High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy, Yasuhiro Sugawara,Lili Kou,Zongmin Ma,Takeshi Kamijo,Yoshitaka Naitoh,Yan Jun Li, Appled Physics Letters, 2012/05
  • Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K, Y. J. Li,Y. Kinoshita,K. Tenjin,Z. Ma,L. Kou,Y. Naitoh,M. Kageshima,Y. Sugawara, Japanese Journal of Applied Physics, 2012/02
  • Fabrication of Sharp Tungsten-coated Tip for Atomic Force Microscopy by Ion-beam Sputter deposition, Y. Kinoshita,Y. Naitoh,Y. J. Li,Y. Sugawara, Revew of Scientific Instrumunts, 2011/10
  • Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules, Yoshihiro Aburaya,Hikaru Nomura,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, JOURNAL OF APPLIED PHYSICS, AMER INST PHYSICS, Vol. 109, No. 6, 2011/03
  • Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules, Yoshihiro Aburaya,Hikaru Nomura,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Journal of Applied Physics, 2011/03
  • Simultaneous observation of surface topography and elasticity at atomic scale by multifrequency frequency modulation atomic force microscopy, Yoshitaka Naitoh,Zongmin Ma,Yan Jun Li,Masami Kageshima,Yasuhiro Sugawara, Journal of Vacuum Science and Technology B, 2010/10
  • High force sensitivity in Q-controlled phase-modulation atomic force microscopy, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, APPLIED PHYSICS LETTERS, AMER INST PHYSICS, Vol. 97, No. 1, 2010/07
  • High force sensitivity in Q-controlled phase-modulation atomic force microscopy, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Applied Physics Letters, 2010/07
  • Multifrequency High-Speed Phase-Modulation Atomic Force Microscopy in Liquids, Yan Jun Li,Kouhei Takahashi,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Ultramicroscopy, 2010/05
  • Step Response Measurement of AFM Cantilever for Analysis of Frequency-Resolved Viscoelasticity, Tatsuya Ogawa,Shinkichi Kurachi,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Ultramicroscopy, 2010/05
  • Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Induced by Noncontact Atomic Force Microscopy at 5 K, Yoshitaka Naitoh,Yan Jun Li,Hikaru Nomura,Masami Kageshima,Yasuhiro Sugawara, Journal of Physical Society of Japan, 2010/01
  • The influence of Si cantilever tip with/without tungsten coating on NC-AFM imaging of Ge(001) surface, Yoshitaka Naitoh,Yukinori Kinoshita,Yan Jun LI,Masami Kageshima,Yasuhiro Sugawara, Nanotechnology, 2009/05
  • Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics, Masami Kageshima,Takuma Chikamoto,Tatsuya Ogawa,Yoshiki Hirata,Takahito Inoue,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, Review of Scientific Instruments, 2009/02
  • Development of Noncontact Atomic Force Microscopy Operating at Low Temperatures, SUGAWARA Yasuhiro,NAITOH Yoshitaka,KAGESHIMA Masami,LI Yan Jun, Shinku, The Vacuum Society of Japan, Vol. 51, No. 12, p. 789-795, 2008/12/20
  • Atomic-Scale Imaging of B/Si(111)$\sqrt{3}{\times}\sqrt{3}$ Surface by Noncontact Atomic Force Microscopy, Kinoshita Masaharu,Naitoh Yoshitaka,Li Yan Jun,Kageshima Masami,Sugawara Yasuhiro, Jpn J Appl Phys, INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 47, No. 10, p. 8218-8220, 2008/10/25
  • High-Speed Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode Capable of Simultaneous Measurement of Topography and Energy Dissipation, Li Yan Jun,Kobayashi Naritaka,Nomura Hikaru,Naitoh Yoshitaka,Kageshima Masami,Sugawara Yasuhiro, Jpn J Appl Phys, INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 47, No. 7, p. 6121-6124, 2008/07/25
  • Study of Oxidized Cu(110) Surface Using Noncontact Atomic Force Microscopy, Shohei Kishimoto,Masami Kageshima,Yoshitaka Naitoh,Yan Jun Li,Yasuhiro Sugawara, 2008/05
  • Theoretical investigation on force sensitivity in Q-controlled phasemodulationatomic force microscopy in constant-amplitude mode, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, J. Appl. Phys., 2008/03
  • Phase Modulation Atomic Force Microscopy in Constant Excitation Mode Capable of Simultaneous Imaging of Topography and Energy Dissipation, Yan Jun Li,Naritaka Kobayashi,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Appl. Phys. Lett., 2008/03
  • Viscoelasticity and Dynamics of Single Biopolymer Chain Measured with Magnetically Modulated Atomic Force Microscopy, M. Kageshima,Y. Nishihara,Y. Hirata,T. Inoue,Y. Naitoh,Y. Sugawara, AIP Conference Proceedings, 2008/03
  • Q値制御法による位相変調方式原子間力顕微鏡の感度向上, 小林成貴,李艶君,内藤賀公,影島賢巳,菅原康弘, 表面科学, Vol. 28, No. 9, p. 532-535, 2007/09
  • Influence of Surface Stress on the Phase Change in a Si(001) Step Measured by LT-NC-AFM, NAITOH Yoshitaka,NOMURA Hikaru,KAGESHIMA Masami,LI Yan Jun,SUGAWARA Yasuhiro, Journal of the Surface Science Society of Japan, Vol. 28, No. 8, p. 421-427, 2007/08/10
  • Elimination of instabilities in phase shift curves in phase-modulation atomic force microscopy in constant-amplitude mode, Yasuhiro Sugawara,Naritaka Kobayashi,Masayo Kawakami,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima, 2007/05
  • Force Microscopy Imaging of Rest Atom on Si(111)$7{\times}7$ Surface under Strong Tip–Surface Interaction, Naitoh Yoshitaka,Momotani Kohji,Nomura Hikaru,Li Yan Jun,Kageshima Masami,Sugawara Yasuhiro, J Phys Soc Jpn, The Physical Society of Japan (JPS), Vol. 76, No. 3, p. 33601-033601-4, 2007/03/15
  • Dissipative force modulation Kelvin probe force microscopy applying doubled frequency ac bias voltage, H. Nomura,K. Kawasaki,T. Chikamoto,Y. J. Li,Y. Naitoh,M. Kageshima,Y. Sugawara, Appl. Phys. Lett., 2007/01
  • Wide-band and hysteresis-free regulation of piezoelectric actuator based on induced current for high-speed scanning probe microscopy, Masami Kageshima,Shinsuke Togo,Yan Jun Li,Yoshitaka Naitoh,Yasuhiro Sugawara, Review of Scientific Instruments, 2006/10
  • High-sensitivity force detection by phase-modulation atomic force microscopy, Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, JAPAN SOC APPLIED PHYSICS, Vol. 45, No. 29-32, p. L793-L795, 2006/08
  • High Sensitive Force Detection by Phase Modulation Atomic Force Microscopy (PM-AFM), Naritaka Kobayashi,Yan Jun Li,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara, Jpn. J. Appl. Phys. Lett., 2006/07
  • Discrimination of individual atoms on Ge/Si(111)-(7x7) intermixed surface, Insook Yi,Ryuji Nishi,Yoshiaki Sugimoto,Masayuki Abe,Yasuhiro Sugawara,Seizo Morita, Surface Science, Elsevier B. V., Vol. 600, No. 13, p. 2766-2770, 2006/07
  • The Origin of p(2x1) Phase on Si(001) by Noncontact Atomic Force Microscopy at 5 K, Yan Jun Li,Hikaru Nomura,Naoyuki Ozaki,Yoshitaka Naitoh,Masami Kageshima,Yasuhiro Sugawara,Chris Hobbs,Lev Kantorovich, Physical Review Letters, 2006/03
  • Functions of NC-AFM on atomic scale, S Morita,N Oyabu,T Nishimoto,R Nishi,O Custance,Yi, I,Y Sugawara, SCANNING PROBE MICROSCOPY: CHARACTERIZATION, NANOFABRICATION AND DEVICE APPLICATION OF FUNCTIONAL MATERIALS, SPRINGER, Vol. 186, p. 173-+, 2005
  • Microscale contact charging on a silicon oxide, S Morita,T Uchihashi,K Okamoto,M Abe,Y Sugawara, Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, SPRINGER, Vol. 186, p. 289-+, 2005
  • Phase detection method with a positive feedback control using a quartz resonator based atomic force microscope in liquid environment, Ryuji Nishi,Kouichi Kitano,Insook Yi,Yasuhiro Sugawara,Seizo Morita, Applied Surface Science, Elsevier B. V., 2004/10
  • Ground state of Si(001) surface revisited----Is seeing believing ?, T. Uda,H. Shigekawa,Y. Sugawara,S. Mizuno,Y. Yamashita,J. Yoshinobu,K. Nakatsuji,H. Kawai,F. Komori, Progress in Surface Science, 2004/04
  • Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope, MORITA Seizo,SUGIMOTO Yoshiaki,OYABU Noriaki,NISHI Ryuji,CUSTANCE Oscar,SUGAWARA Yasuhiro,ABE Masayuki, Oxford University Press, Vol. 53, No. 2, p. 163-168, 2004/04/01
  • Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method, Morita Seizo,Oyabu Noriaki,Nishi Ryuji,Okamoto Kenji,Abe Masayuki,Custance Óscar,Yi Insook,Seino Yoshihide,Sugawara Yasuhiro, e-J. Surf. Sci. Nanotech., The Surface Science Society of Japan, Vol. 1, p. 158-170, 2003/12
  • The Imaging Mechanism of Atomic-scale Kelvin Probe Force Microscopy and its Application to Atomic-Scale Force Mapping, Okamoto Kenji,Sugawara Yasuhiro,Morita Seizo, Jpn J Appl Phys, INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 42, No. 11, p. 7163-7168, 2003/11/15
  • Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy, N Oyabu,O Custance,IS Yi,Y Sugawara,S Morita, PHYSICAL REVIEW LETTERS, AMERICAN PHYSICAL SOC, Vol. 90, No. 17, 2003/05
  • KPFM imaging of Si(111)5 root 3 x 5 root 3-Sb surface for atom distinction using NC-AFM, K Okamoto,K Yoshimoto,Y Sugawara,S Morita, APPLIED SURFACE SCIENCE, ELSEVIER SCIENCE BV, Vol. 210, No. 1-2, p. 128-133, 2003/03
  • Atom-selective imaging by NC-AFM : case of oxygen adsorbed on a Si(111)7×7 surface, NISHI R, Appl. Surf. Sci., Elsevier Science, Vol. 210, p. 90-92, 2003/03
  • Near-Atomic Resolution Imaging with Atomic Force Near-Field Optical Microscopy(<Special Issue>For the Application of Near-field Science to the Engineering), SUGAWARA Yasuhiro, Journal of the Japan Society of Precision Engineering, The Japan Society for Precision Engineering, Vol. 69, No. 2, p. 154-157, 2003/02/05
  • 原子間力顕微鏡を使った電荷の原子レベル観察, 森田清三,岡本憲二,内橋貴之,阿部真之,菅原康弘, 静電気学会誌, Vol. 27, No. 2, p. 64-68, 2003/02
  • Characterization of semiconductor surfaces with noncontact atomic force microscopy, S Morita,Y Sugawara, NANOTECHNOLOGY AND NANO-INTERFACE CONTROLLED ELECTRONIC DEVICES, ELSEVIER SCIENCE BV, p. 429-453, 2003
  • 新規顕微鏡法の紹介 STMおよびAFM,原理と応用, 菅原 康弘, 電子顕微鏡, The Japanese Society of Microscopy, Vol. 38, No. 1, p. 13-18, 2003
  • Atomically Resolved Imaging of Si(100)2x1, 2x1:H and 1x1:2H Surface with Nonconatct Atomic Force Microscopy, S. Morita,Y. Sugawara, Japanese J. Applied. Physics, vol41, part1, no.7B (2002) 4857-4862, 2002/07
  • Mapping and control of atomic force on Si(111)root 3x root 3-Ag surface using noncontact atomic force microscope, S Morita,Y Sugawara, ULTRAMICROSCOPY, ELSEVIER SCIENCE BV, Vol. 91, No. 1-4, p. 89-96, 2002/05
  • Observation of Si(100) surface with noncontact atomic force microscpe at 5K, T. Uozumi,Y. Tomiyoshi,N. Nakata,Y. Sugawara,S. Morita, Applied Surface Science, Elsevier, 2002/03
  • The Elimination of the 'Artifact' in the Electrostatic Force Measurement using a Novel Noncontact Atomic Force Microscope/electrostatic Force Microscope, K. Okamoto,Y. Sugawara,S. Morita, Applied Surface Science, Elsevier, Vol. 188, No. 3, p. 381-385, 2002/03
  • 「走査プローブ顕微鏡によるナノ加工と評価」, 森田清三,菅原康弘, 電子情報通信学会誌, 2002/01
  • 「走査型プローブ顕微鏡による複合極限場での原子イメージング」, 森田清三,菅原康弘, 表面金属学会、まてりあ, 2002/01
  • 「非接触原子間力顕微鏡で半導体の何がどこまで見えるのか?」, 森田清三,菅原康弘, 表面科学会、表面科学, 2002/01
  • Noncontact Atomic Force Microscopy on Semiconductor Surfaces, S.Morita,Y.Sugawara, 2002/01
  • Atomic resolution imaging of Si(100)1×1 : 2H dihydride surface with noncontact atomic force microscopy (NC-AFM), ARARAGI S., Appl. Surf. Sci., Elsevier, Vol. 188, No. 3, p. 272-278, 2002/01
  • Atom manipulation and image artifact on Si(111)7×7 surface using a low temperature noncontact atomic force microscope, SUGAWARA Y., Appl. Surf. Sci., Vol. 188, p. 285-291, 2002/01
  • Molecular Orbital Interpretation of Thymine/graphite Nc-AFM Images, M. Komiyama,T. Uchihashi,Y. Sugawara,S. Morita, John Wiley & Sons, Ltd, 2001/08
  • Micoroscopic Contact Charging and Dissipation, S. Morita,Y. Sugawara, 2001/08
  • Low-temperature Noncontact Atomic Force Microscope with Quick Sample and Cantilver Exchange Mechanism, N. Suehira,Y. Tomiyoshi,Y. Sugawara,S. Morita, American Institute of Physics, 2001/07
  • Atomic Resolution Noncontact Atomic Force and Scanning Tunneling Microscopy of TiO2[100]-[1x1] and -[1x2]: Simultaneous Imaging of Surface Structure and Electronic States, M. Ashino,Y. Sugawara,S. Morita,M. Ishikawa, 2001/05
  • Load Dependence of Sticking-domain Distribution in Two-dimensional Atomic Scale Friction of NaF(100) Surface, S. Fujisawa,K. Yokoyama,Y. Sugawara,S. Morita, 2001/04
  • Artifact and Fact of Si(111)$7{\times}7$ Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM), Suehira Nobuhito,Sugawara Yasuhiro,Morita Seizo, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 40, No. 3, p. L292-L294, 2001/03/15
  • A Noncontact Atomic Force Microscope in Air using a Quartz Resonatorand the FM Detection Method, R. Nishi,I. Houda,K. Kitano,Y. Sugawara,S. Morita, Springer, 2001/03
  • Force Imaging of Optical Near Field Using Noncontact Atomic Force Microscopy, Yasuhiro Sugawara, 2001/03
  • Frictional-force imaging and friction mechanisms with a lattice periodicity, S Morita,Y Sugawara,K Yokoyama,S Fujisawa, FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES, SPRINGER, Vol. 10, p. 83-101, 2001
  • Atomic scale origins of force interaction, S Morita,Y Sugawara,K Yokoyama,T Uchihashi, FUNDAMENTALS OF TRIBOLOGY AND BRIDGING THE GAP BETWEEN THE MACRO-AND MICRO/NANOSCALES, SPRINGER, Vol. 10, p. 103-120, 2001
  • 「ノーベル賞と分光学 Ⅵ.走査型トンネル顕微鏡と原子間力顕微鏡」, 菅原康弘,森田清三, 日本分光学会、分光研究, 2001/01
  • 「走査型プローブ顕微鏡によるナノテクノロジー」, 森田清三,菅原康弘, 応用物理学会、応用物理, 2001/01
  • Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy, S.Morita,Y.Sugawara, 2001/01
  • Non-contact Atomic Force Microscope in Air with Quartz Resonator Using FM Detection Method, R.Nishi,I.Houda,K.Kitano,Y.Sugawara,S.Morita, 2001/01
  • Noncontact AFM Imaging on Si(111) 2×1-Sb Surface with Occupied Lone-Pair Orbitals, Y.Sugawara,S.Orisaka,E.Hidaka,S.Mo, 2001/01
  • Noncontact AFM and Nano-mechanics of Atoms and Molecules, Seizo Morita,Yasuhiro Sugawara, 2000/12
  • Microscopic Contact Charging and Dissipation, Seizo Morita,Yasuhiro Sugawara, 2000/12
  • 3D-Mapping and Control of Atomic Force with Noncontact Atomic Force Microscopy, Seizo Morita,Yasuhiro Sugawara, 2000/11
  • Atomically Resolved Imaging of Semiconductor Surfaces using Noncontact Atomic Force Microscopy, Seizo Morita,Yasuhiro Sugawara, 2000/09
  • Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy, Uchihashi Takayuki,Choi Nami,Tanigawa Masato,Ashino Makoto,Sugawara Yasuhiro,Nishijima Hidehiro,Akita Seiji,Nakayama Yoshikazu,Tokumoto Hiroshi,Yokoyama Kousuke,Morita Seizo,Ishikawa Mitsuru, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 39, No. 8, p. L887-L889, 2000/08/15
  • Development of a Low Temperature Noncontact Atomic Force Microscope using Optical Fiber Interferometer, Nnobuto Suehira,Yasushige Tomiyoshi,Yasuhiro Sugawara,Seizo Morita, 2000/07
  • Atomic Resolution Imaging of a Lone-pair using NC-AFM, Eiji Hidaka,Shigeki Orisaka,Yasuhiro Sugawara,Seizo Morita, 2000/07
  • Noncontact Atomic Force Microscopy of Oxygen-Deficient TiO$_2$(110) Surfaces, Makoto Ashino,Yasuhiro Sugawara,Seizo Morita,Mitsuru Ishikawa, 2000/07
  • Noncontact AFM Imaging Mechanism of Si(100)2x1 Surface Compared with Si(100)2x1:H Surface on Atomic Scale, Seizo Morita,Yasuhiro Sugawara,Kousuke Yokoyama,Taketoshi Ochi,Akira Yoshimoto, 2000/07
  • Applications of Noncontact AFM with True Atomic Resolution, Yasuhiro Sugawara,Kousuke Yokoyama,Seizo Morita, 2000/07
  • Atomic Force Mapping and Control of Atomic Force on a Si(111)√3x√3-Ag Surface using a Noncontact Atomic Force Microscopy, Seizo Morita,Yasuhiro Sugawara, 2000/07
  • Structures of an Oxygen-Deficient TiO2(110) Surface Studied by Noncontact Atomic Force Microscopy, Makoto Ashino,Takayuki Uchihashi,Kousuke Yokoyama,Yasuhiro Sugawara,Seizo Morita,Mitsuru Ishikawa, Jpn. J. Appl. Phys., Vol. 39, No. 6B, p. 3765-3768, 2000/06
  • STM and Atomic-resolution Noncontact AFM of an Oxygen-deficient TiO$_2$(110) Surface, Makoto Ashino,Takayuki Uchihashi,Kousuke Yokoyama,Yasuhiro Sugawara,Seizo Morita,Mitsuru Ishikawa, Phys. Rev. B, Vol. 61, No. 20, p. 13955-13959, 2000/05
  • Correlation of frequency shift discontinuity to atomic positions on a Si(111)7×7 surface by noncontact atomic force microscopy, MORITA S., Nanotechnology, Vol. 11, p. 120-123, 2000/05
  • Phase change detection of attractive force gradient by using a quartz resonator in noncontact atomic force microscopy, R Nishi,Houda, I,T Aramata,Y Sugawara,S Morita, APPLIED SURFACE SCIENCE, ELSEVIER SCIENCE BV, Vol. 157, No. 4, p. 332-336, 2000/04
  • Atomic and Molecular Technology Based on a Nano-Mechanics, Seizo Morita,Yasuhiro Sugawara, Vol. 52, No. 2, p. 9-14, 2000/04
  • Development of Low Temperature Ultrahigh Vacuum Noncontact Atomic Force Microscope with PZT Cantilever, Nobuhito Suehira,Yasushige Tomiyoshi,Kenji Sugiyama,Syunji Watanabe,ikon Co,Touru Fujii,Nikon Cor,Yasuhiro Sugawara,Seizo Morita, 2000/04
  • High-resolution Imaging of Organic Monolayers using Noncontact AFM, Takayuki Uchihashi (Join,Research Center,JRCAT,Takao Ishida (Join,Research Center,JRCAT,Masaharu Komiyama,Yamanashi University,Makoto Ashino,Joi,Research Center,JRCAT,Yasuhiro Sugawara,Wataru Mizutani,Join,Research Center,JRCAT,Kousuke Yokoyama,Seizo Morita,Hiroshi Tokumoto,Jo,esearch Center,JRCAT,Mitsuru Ishikawa (Joi,Research Center,JRCAT, Vol. 157, No. 4, p. 244-250, 2000/04
  • Noncontact AFM imaging on Al-adsorbed Si(111) Surface with an Empty Orbital, Yasuhiro Sugawara,Shigeki Orisaka,Seizo Morita, Appl. Surf. Sci., Vol. 157, No. 4, p. 239-143, 2000/04
  • Atomic-scale Structures on a Non-stoichiometric TiO$_2$(110) Surface Studied by Noncontact AFM, Makoto Ashino,Joi,Research Center,JRCAT,Takayuki Uchihashi (Join,Research Center,JRCAT,Kousuke Yokoyama,Yasuhiro Sugawara,Seizo Morita,Mitsuru Ishikawa (Joi,Research Center,JRCAT, Appl. Surf. Sci., Vol. 157, No. 4, p. 212-217, 2000/04
  • Identification of B-form DNA in an Ultrahigh Vacuum by Noncontact-Mode Atomic Force Microscopy, Takayuki Uchihashi,Masato Tanigawa,Makoto Ashino,Yasuhiro Sugawara,Kosuke Yokoyama,Seizo Morita,Mitsuru Ishikawa, Langmuir, Vol. 16, No. 3, p. 1349-1353, 2000/03
  • Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy, Yokoyama Kousuke,Ochi Taketoshi,Yoshimoto Akira,Sugawara Yasuhiro,Morita Seizo, Jpn. J. Appl. Phys., The Japan Society of Applied Physics, Vol. 39, No. 2, p. L113-L115, 2000/02/01
  • 「非接触原子間力顕微鏡と原子分子のナノ力学」, 森田清三,菅原康弘, 学術月報、特集, 2000/01
  • Noncontact AFM Imaging of Si(100)2´1 and Si(100)2´1:H Surfaces, Y.Sugawara,K.Yokoyama,T.Ochi,A.Yoshimoto,S.Morita, 2000/01
  • Load Dependence of Sticking-Domain Distribution in Two-Dimensional Atomic Scale Friction on NaF(100) Surface, S.Fujiwaswa,K.Yokoyama,Y.Sugawara,S.Morita, 2000/01
  • Atom-Resolved Images of Defect-Induced Structure on Non-stoichiometric TiO2 Surface by STM and Noncontact AFM, M.Ashino,T.Uchihashi,K.Yokoyama,Y.Sugawara,S.Morita,M.Ishikawa, 2000/01
  • Carbon-Nanotube Tip for the Highly-Reproducible Imaging of DNA Helical Turns by Noncontact AFM, T.Uchihashi,N.Choi,M.Tanigawa,M.Ashino,Y.Sugawara,H.Nishijima,S.Akita,Y.Nakayama,H.Tokumoto,K.Yokoyama,S.Morita,M.Ishikawa, 2000/01
  • Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism, YOKOYAMA K., Rev. Sci. Instrum., Vol. 71, No. 1, p. 128-132, 2000/01
  • Study of Elementary Process of Contact Charging by Atomic force Microscope, Seizo Morita,Yasuhiro Sugawara, Vol. 24, No. 1, p. 8-14, 2000/01
  • Atomically resolved silver imaging on the Si(111)-(root 3 x root 3)-Ag surface using a noncontact atomic force microscope, K Yokoyama,T Ochi,Y Sugawara,S Morita, PHYSICAL REVIEW LETTERS, AMERICAN PHYSICAL SOC, Vol. 83, No. 24, p. 5023-5026, 1999/12
  • Atomically Resolved Silver Imaging on Si(111)√3x√3 -Ag Surface with Noncontact Atomic Force Microscope, Kosuke Yokoyama,Takeshi Ochi,Yasuhiro Sugawara,Seizo Morita, 1999/12
  • Missing Ag Atom on Si(111)$\boldsymbol{\sqrt{\textbf{3 } } }\boldsymbol{\times}\boldsymbol{\sqrt{\textbf{3 } } }$–Ag Surface Observed by Noncontact Atomic Force Microscopy, Morita Seizo,Sugawara Yasuhiro,Orisaka Shigeki,Uchihashi Takayuki, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 38, No. 11, p. L1342-L1344, 1999/11/15
  • Analysis of Single Molecule by Noncontact Atomic Force Microscope, Yasuhiro Sugawara,Seizo Morita, 1999/11
  • Atomic Scale Characterization and Measurement of Surface by Atomic Force Microscope, MORITA Seizo,SUGAWARA Yasuhiro, The Transactions of the Institute of Electrical Engineers of Japan. C, Vol. 119, No. 10, p. 1109-1112, 1999/10/01
  • Imaging of Chemical Reactivity and Buckled Dimers on Si(100)2x1 Reconstructed Surface with Noncontact AFM, Takayuki Uchihashi,Yasuhiro Sugawara,Takayuki Tsukamoto,Tetsuya Minobe,Sigeki Orisaka,Takao Okada,Seizo Morita, Appl. Surf. Sci., Vol. 140, No. 3-4, p. 304-308, 1999/09
  • Status and Development of Atomic Force Microscopy, Seizo Morita,Yasuhiro Sugawara, Vol. 20, No. 5, p. 352-357, 1999/05
  • True atomic resolution imaging of surface structure and surface charge on the GaAs(110), Y. Sugawara,T. Uchihashi,M. Abe,S. Morita, Applied Surface Science, Applied Surface Science, Vol. 140, No. 3, p. 371-375, 1999/03
  • Near-field optical imaging using force detection with tip-electrode geometry, M. Abe,Y. Sugawara,K. Sawada,Y. Andoh,S. Morita, Applied Surface Science, 1999/03
  • What Can Noncontact Atomic Force Microscope Observe?, Seizo Morita,Yasuhiro Sugawara, 1999/03
  • Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy, MORITA S, Appl. Surf. Sci., Vol. 140, p. 406-410, 1999/02
  • Distance dependence of noncontact-AFM image contrast on Si(111)√3×√3-Ag structure, MINOBE T., Appl. Surf. Sci., Vol. 140, p. 298-303, 1999/02
  • WS07 非接触原子間力顕微鏡によるDNA観察 (原子間力顕微鏡 (AFM) : 成果・問題・展望), 内橋 貴之,芦野 慎,谷川 雅人,菅原 康弘,横山 康祐,森田 清三,石川 満,岡田 孝夫, 生物物理, 一般社団法人 日本生物物理学会, Vol. 39, 1999
  • Defects and their charge imaging on semiconductor surfaces by noncontact atomic force microscopy and spectroscopy, S. Morita,M. Abe,K. Yokoyama,Y. Sugawara, J. Crystal Growth, Vol. 210, p. 408-415, 1999/01
  • High resolution imaging of DNA and organic molecules using noncontact AFM in UHV, T.Uchihashi,M.Ashino,Y.Sugawara,M.Tanigawa,T.Ishida,N.Choi,K.Yokoyama,M.Komiyama,H.Nishijima,W.Mizutani,S.Akita,Y.Nakayama,S.Morita,H.Tokumoto,M.Ishikawa, 1999/01
  • Non-contact AFM study of TiO2 surfaces for adsorption of biomolecules, M.Ashino,T.Uchihashi,Y.Sugawara,M.Ishikawa, 1999/01
  • Atomic Resolution Imaging of Al/Si(111) Surface by Noncontact Atomic Force Microscope, S.Orisaka,T.Minobe,K.Makimoto,Y.Sugawara,S.Morita, Appl. Surf. Sci., Vol. 140, No. 3, p. 243-246, 1999/01
  • Non-contact AFM Images Measured on Si(111)√<3>×√<3>-Ag Surfaces, SUGAWARA Y., Surf. Interface Anal., Vol. 27, p. 456s-461s, 1999/01
  • The Atomic Resalution Imaging of Metallic Ag((]G0003[)) Surface by Noncontact Atomic Force Microscopy, SUGAWARA Yasuhiro, Applied Surface Science, 1999
  • Distance Dependence of Noncontact AFM Image Contrast an Si((]G0003[))┣D83┫D8×┣D83┫D8-Ag Structure, SUGAWARA Yasuhiro, Applied Surface Science, 1999
  • Self-assembled monolayer of adenine base on graphite studied by noncontact atomic force microscopy, UCHIHASHI T., Phys. Rev. B, Physical Review B, Vol. 60, No. 11, p. 8309-8313, 1999
  • (2) Noncontact atomic force microscopy with ultimate spatial-resolution, MORITA Seizo,SUGAWARA Yasuhiro, OYOBUTURI, The Japan Society of Applied Physics, Vol. 67, No. 12, p. 1402-1403, 1998/12
  • Atomic Resolution Imaging Orbital Hybridization with Noncontact Atomic Force Microsopy (AFM)*, SUGAWARA Yasuhiro,MORITA Seizo, Journal of the Vacuum Society of Japan, The Vacuum Society of Japan, Vol. 41, No. 11, p. 906-911, 1998/11/20
  • Observation of Semiconductor Surfaces by Using Noncontact Atomic Force Microscope ---Atomically Resolved Imaging of Chemical Reactivity and Charge---, Yasuhiro Sugawara, 1998/10
  • Optical Near-Field Imaging Using the Kelvin Probe Technique., Abe Masayuki,Sugawara Yasuhiro,Sawada Kazuyoshi,Andoh Yoshitake,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 37, No. 9, p. L1074-L1077, 1998/09
  • Analysis of Experimental Load Dependence of Two-Dimensional Atomic-Scale Friction, FUJISAWA S., Phys. Rev. B, Vol. 58, No. 8, p. 4909-4909, 1998/08
  • Recent Progress in Microtribology. Atomic-scale Tribology Studied by Frictional Force Microscope., FUJISAWA Satoru,MORITA Seizo,SUGAWARA Yasuhiro, J. Surf. Sci. Soc. Jpn., The Surface Science Society of Japan, Vol. 19, No. 6, p. 374-378, 1998/06
  • New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform, Nishi Ryuji,Nakao Yoshizumi,Ohta Takayuki,Sugawara Yasuhiro,Morita Seizo,Okada Takao, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 37, No. 4, p. L417-L419, 1998/04/01
  • Opening of ultrahigh vacuum non-contact mode atomic force microscopy, SUGAWARA Yasuhiro,MORITA Seizo, Electron-microscopy, Vol. 33, No. 1, p. 22-26, 1998/03/31
  • Stable operation mode for dynamic noncontact atomic force microscopy, H. Ueyama,Y. Sugawara, Appl. Phys. A., Vol. 66, p. S295-S297, 1998/03
  • Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy., Abe Masayuki,Sugawara Yasuhiro,Hara Yasuyuki,Sawada Kazuyoshi,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 37, No. 2, p. L167-L169, 1998/02
  • Load dependence of frictional-force microscopy image pattern of graphite surface, SASAKI N., Phys. Rev. B, Vol. 57, p. 3785s-3786s, 1998/02
  • Theoretical Analysis of Atomic-Scale Friction in Frictional-Force Microscopy, Naruo Sasaki,Masaru Tsukada,Satoru Fujisawa,Yasuhiro Sugawara,Seizo Morita, Tribology Letters, Vol. 4, p. 125-128, 1998/02
  • Atomic Resolution Imaging of Si(111)&Ouml;3´&Ouml;3-Ag Surface and Metallic Ag(111)Surface by Noncontact Atomic Force Microscope, S.Orisaka,T.Minobe,T.Uchihashi,Y.Sugawara,S.Morita, 1998/01
  • Development of Noncontact UHV-AFM for Imaging of Biological Samples, M.Ashino,T.Uchihashi,M.Tanigawa,Y.Sugawara,T.Okada, 1998/01
  • Development of Noncontact UHV-AFM for Imaging of Biological Samples, T.Uchihashi,M.Ashino,M.Tanigawa,Y.Sugawara,T.Okada, 1998/01
  • New computed tomography algorithm of electrostatic force microscopy based on the singular value decomposition combined with the discrete Fourier transform, R.Nishi,Y.Nakao,T.Ohta,Y.Sugawara,S.Morita,T.Okada, 1998/01
  • Status and Future of Noncontact Mode Atomic Force Microscope, Seizo Morita,Yasuhiro Sugawara, Vol. 39, No. 8, p. 612-618, 1997/12
  • Atomically-Resolved Imaging of n+-GaAs(110) Cleaved Surfaces with Noncontact Atomic Force/Electrostatic Force Microscope, Seizo Morita,Yasuhiro Sugawara,Takayuki Uchihashi,Hitoshi Ueyama,Masayuki Abe,Masayuki Suzuki, 1997/11
  • True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy, Yasuhiro Sugawara,Hitoshi Ueyama,Takayuki Uchihashi,Masahiro Ohta,Yoshio Yanase,Takashi Shigematsu,Masayuki Suzuki,Seizo Morita, 1997/11
  • Role of a covalent bonding interaction in noncontact-mode atomic force microscopy on Si(111)7*7, T. UCHIHASHI, Y. SUGAARA, Phys.Rev., Physical Revier B, Vol. 56, No. 15, p. 9834-9834, 1997/10
  • Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image., Nishi Ryuji,Ohta Takayuki,Sugawara Yasuhiro,Morita Seizo,Okada Takao, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 36, No. 10, p. L1410-L1412, 1997/10
  • Detection of Evanescent Wave with Atomic Force Microscope, Yasuhiro Sugawara,Masayuki Abe,Seizo Morita, Vol. 26, No. 10, p. 537-538, 1997/10
  • Growth of a Two-Dimensional Nucleus on a Cleaved (010) Surface of (NH 2CH 2COOH) 3&middot;H 2SO 4, Ohgami Junji,Sugawara Yasuhiro,Morita Seizo,Ozaki Tōru, J Phys Soc Jpn, The Physical Society of Japan (JPS), Vol. 66, No. 9, p. 2747-2750, 1997/09/15
  • Analysis of frictional-force image patterns of a graphite surface, SASAKI N., J. Vac. Sci. Technol. B, Vol. 15, p. 1479-1482, 1997/07
  • Detection Mechanism of an Optical Evanescent Field using a Noncontact Mode Atomic Force Microscope with a Frequency Modulation Detection Method, Masayuki Abe,Takayuki Uchihashi,Masahiro Ohta,Hitoshi Ueyama,Yasuhiro Sugawara,Seizo Morita, J. Vac. Sci. Technol. B, Vol. 15, No. 4, p. 1512-1515, 1997/07
  • Development of Ultrahigh Vacuum Atomic Force Microscopy with Frequency Modulation Detection and its Application to Electrostatic Force Measurement, Takayuki Uchihashi,Masahiro Ohta,Yasuhiro Sugawara,Yoshio Yanase,Tatsuhiko Shigematsu,Mineharu Suzuki,Seizo Morita, J. Vac. Sci. Technol. B, Vol. 15, No. 4, p. 1543-1546, 1997/07
  • Detection of Evanescent Field by Force, Yasuhiro Sugawara,Yasunori Hara,Kazuyoshi Sawada,Seizo Morita, 1997/07
  • Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air, Uchihashi Takayuki,Nakano Akihiko,Ida Tohru,Andoh Yasuko,Kaneko Reizo,Sugawara Yasuhiro,Morita Seizo, Jpn J Appl Phys, INSTITUTE OF PURE AND APPLIED PHYSICS, Vol. 36, No. 6, p. 3755-3758, 1997/06/15
  • True atomic resolution imaging with noncontact atomic force microscopy, SUGAWARA Y., Appl.Sur.Sci, Vol. 113, p. 364-364, 1997/04
  • Measurement of the Evanescent Field Using Noncontact Mode Atomic Force Microscope, Masayuki Abe,Takayuki Uchihashi,Masahiro Ohta,Hitoshi Ueyama,Yasuhiro Sugawara,Seizo Morita, Optical Review, Vol. 4, No. 1, p. 232-235, 1997/01
  • Measurement of the Evanescent Field Using Noncontact Mode Atomic Fora Microscope, SUGAWARA Yasuhiro, Optical Review, 1997
  • Characterization Of Semiconductor Surfaces With Atomic Force Microscope, Yasuhiro Sugawara,Hitoshi Ueyama,Takayuki Uchihashi,Masahiro Ohta,Seizo Morita, 1996/12
  • New Development Of Noncontact Mode Atomic Force Microscope, Seizo Morita,Yasuhiro Sugawara,Hitoshi Ueyama,Masahiro Ohta,Takayuki Uchihashi, Vol. 33, No. 1, p. 22-26, 1996/12
  • How to Obtain High Resolution Images in Atomospheric- and UHV-AFMs : The Know-how for the Construction of AFM and Image Interpretation, MORITA Seizo,SUGAWARA Yasuhiro,OHTA Masahiro, Journal of the Surface Science Society of Japan, Vol. 17, No. 11, p. 698-700, 1996/11/10
  • Density Saturation of Densely Contact-Electrified Negative Charges on a Thin Silicon Oxide Due to the Coulomb Repulsive Force, Yasuhiro Sugawara,Takeshi Tsuyuguchi,Takayuki Uchihashi,Takahiro Okusako,Yoshinobu Fukano,Yoshiki Yamanishi,Sumitomo Metal,Industries, Lt,Takahiko Oasa,umitomo Metal,Industries,Seizo Morita, 1996/11
  • Load Dependence of the Periodicity in Frictional Force Images on NaF(100) Surface, Satoru Fujisawa,Yasuhiro Sugawara,Seizo Morita, 1996/11
  • Localized Fluctuation of a Two-Dimensional Atomic-Scale Friction., Fujisawa Satoru,Sugawara Yasuhiro,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 35, No. 11, p. 5909-5913, 1996/11
  • Stability of Densely Contact-Electrified Charges on Thin Silicon Oxide in Air., Morita Seizo,Uchihashi Takayuki,Okusako Takahiro,Yamanishi Yoshiki,Oasa Takahiko,Sugawara Yasuhiro, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 35, No. 11, p. 5811-5814, 1996/11
  • How to Obtain High Resolution Images in Atomospheric-and UHV-AFMs : The Know-how for the Construction on AFM and Image Interpretation, MORITA Seizo,SUGAWARA Yasuhiro,OHTA Masahiro, Journal of the Surface Science Society of Japan, Vol. 17, No. 10, p. 617-618, 1996/10/10
  • Near-Field Single Atom Observation Method With Ultimate Spatial Resolution, Seizo Morita,Yasuhiro Sugawara,Masahiro Ohta,Hitoshi Ueyama,Takayuki Uchihashi, 1996/10
  • Time Evolution of Surface Topography around a Domain Wall in Ferroelectric (NH2CH2COOH)3&middot;H2SO4, Ohgami Junji,Sugawara Yasuhiro,Morita Seizo,Nakamura Eiji,Ozaki Tōru, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 35, No. 9, p. 5174-5177, 1996/09/30
  • Feasibility Study on a Novel Type of Computerized Tomography Based on Scanning Probe Microscope, Ohta Takayuki,Sugawara Yasuhiro,Morita Seizo, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 35, No. 9, p. L1222-L1224, 1996/09/15
  • How to Obtain High Resolution Images in Atomospheric- and UHV-AFMs : The Know-how for the Construction of AFM and Image Interpretation, MORITA Seizo,SUGAWARA Yasuhiro,OHTA Masahiro, Journal of the Surface Science Society of Japan, Vol. 17, No. 9, p. 559-561, 1996/09/10
  • Recent Development Of Atomic Force Microscope, Seizo Morita,Yasuhiro Sugawara,Masahiro Ohta,Hitoshi Ueyama,Takayuki Uchihashi, 1996/08
  • Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique, Ohgami Junji,Sugawara Yasuhiro,Morita Seizo,Nakamura Eiji,Ozaki Tōru, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 35, No. 5, p. 2734-2739, 1996/05/15
  • Phase Transition of Contact-Electrified Negative Charges on a Thin Silicon Oxide in Air, Fukano Yoshinobu,Sugawara Yasuhiro,Uchihashi Takayuki,Okusako Takahiro,Morita Seizo,Yamanishi Yoshiki,Oasa Takahiko, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 35, No. 4, p. 2394-2401, 1996/04/15
  • Proximity Effects of Negative Charge Groups Contact Electrified on Thin Silicon Oxide in Air, Takayuki Uchihashi,Takahiro Okusako,Yasuhiro Sugawara,Yoshiki Yamanishi,Sumitomo Metal,Industries, Lt,Takahiko Oasa,umitomo Metal,Industries,Seizo Morita, J. Appl. Phys., Journal of Applied Physics, Vol. 79, No. 8, p. 4171-4177, 1996/04
  • Correlation between Contact-Electrified Charge Groups on a Thin Silicon Oxide, Takayuki Uchihashi,Takahiro Okusako,Yasuhiro Sugawara,Yoshiki Yamanishi,Sumitomo Metal,Industries, Lt,Takahiko Oasa,umitomo Metal,Industries,Seizo Morita, J.Vac.Sci.Technol.B, Vol. 14, No. 2, p. 1055-1059, 1996/04
  • Atomic Resolution Imaging of InP(110) Surface Observed with Ultrahigh Vacuum Atomic Force Microscope in Noncontact Mode, Yasuhiro Sugawara,Masahiro Ohta,Hitoshi Ueyama,Seizo Morita,Fukunobu Osaka,ctronics Technology Research Laboratory,Shunsuke Ohkouchi,Optoelectronics Technology Research Laboratory,Mineharu Suzuki (NTT,Shuzo Mishima,Olympus Optical Co, J.Vac.Sci.Technol.B, Journal of Vacuum Science & Technology B, Vol. 14, No. 2, p. 953-956, 1996/04
  • Frictional Force Microscopy. Explanation of Microscopic Frictional Force.:Explanation of Microscopic Frictional Force, MORITA Seizo,SUGAWARA Yasuhiro,FUJISAWA Satoru,OHTA Masahiro,UEYAMA Hitoshi, J. Surf. Sci. Soc. Jpn., The Surface Science Society of Japan, Vol. 17, No. 1, p. 22-26, 1996/01
  • Development of 3-D Atomic Force Computer Tomography Microscope, T.Ohta,Y.Sugawara,S.Morita,T.Okada, 1996/01
  • Load dependence of the periodicity in friction force images on the NaF(100) surface, S.Fujisawa,Y.Sugawara,S.Morita, 1996/01
  • Spatially quantized friction with a lattice periodicity, S.Morita,S.Fujisawa,Y.Sugawara, 1996/01
  • Contact and non-contact mode imaging by atomic force microscopy, SUGAWARA Yasuhiro, Thin Solid Films, 1996
  • Time Evolution of Surface Topography around Domain Wall in Ferroelectric (NH┣D22┫D2CH┣D22┫D2COOH)┣D23┫D2・H┣D22┫D2SO┣D24┫D2, SUGAWARA Yasuhiro, Japanese Journal of Applied Physics, 1996
  • Density saturation of densely contact-electrified negative Charges on a thin silicon oxide sample due to the Coulomb upulsive force, SUGAWARA Yasuhiro, Philosophical Magazine A, 1996
  • Covvelation between contact-electrified change groups on a thin silicon oxide, SUGAWARA Yasuhiro, Jourmal of Vacuum Science & Technology B, 1996
  • Noncontact Ultrahigh Vacuum Atomic Force Microscope Combined with Scanning Tunneling Microscope, Seizo Morita,Yasuhiro Sugawara,Masahiro Ohta,Hitoshi Ueyama,Takayuki Uchihashi, 1995/10
  • ATOMICALLY RESOLVED IMAGE OF CLEAVED SURFACES OF COMPOUND SEMICONDUCTORS OBSERVED WITH AN ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE, M OHTA,Y SUGAWARA,F OSAKA,S OHKOUCHI,M SUZUKI,S MISHIMA,T OKADA,S MORITA, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, A V S AMER INST PHYSICS, Vol. 13, No. 3, p. 1265-1267, 1995/05
  • Atomic-resolution image of GaAs(11O) surface with an ultrahigh-vacuum atomic force microscope (UHV-AFM), Y Sugawara,H Ohta,K Hontani,S Morita,F Osaka,S Ohkouchi,M Suzuki,H Nagaoka,S Mishima,T Okada, FORCES IN SCANNING PROBE METHODS, KLUWER ACADEMIC PUBL, Vol. 286, p. 507-512, 1995
  • Time dependence and its spatial distribution of densely contact electrified electrons on a thin silicon oxide, Y Sugawara,S Morita,Y Fukano,T Uchihashi,T Okusako,A Chayahara,Y Yamanishi,T Oasa, FORCES IN SCANNING PROBE METHODS, KLUWER ACADEMIC PUBL, Vol. 286, p. 501-506, 1995
  • Two-dimensional atomic-scale friction observed with an AFM, S Fujisawa,E Kishi,Y Sugawara,S Morita, FORCES IN SCANNING PROBE METHODS, KLUWER ACADEMIC PUBL, Vol. 286, p. 313-318, 1995
  • 非接触モード原子間顕微鏡による化合物半導体表面の原子分解能観察, 菅原康弘, 真空, Vol. 38, No. 11, p. 943-943, 1995/01
  • 2次元摩擦力顕微鏡による量子トライボロジーの研究, 藤沢悟, 日本物理学会誌, Vol. 50, No. 1, p. 36-36, 1995/01
  • Noncontact UHV-AFM Imaging of InP(110) Surface with Atomic Resolution, S.Morita,M.Ohta,H.Ueyama,Y.Sugawara, 1995/01
  • Contrast of Atomic-Resolution Images from a Noncontact Ultrahigh-Vacuum Atomic Force Microscope., Ohta Masahiro,Ueyama Hitoshi,Sugawara Yasuhiro,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 34, No. 12, p. L1692-L1694, 1995/01
  • Defect motion on an InP(110) surface observed with noncontact atomic force microscopy, SUGAWARA Y., Science, Science, Vol. 270, p. 1646-1648, 1995/01
  • Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope, H.Ueyama,M.Ohta,Y.Sugawara,S.Morita, 1995/01
  • Two-dimensional quantized friction observed with two-dimensional frictional force microscope, S.Fujisawa,E.Kishi,Y.Sugawara,S.Morita, 1995/01
  • Load dependence of two-dimensionally atomic-scale friction, S.Fujisawa,E.Kishi,Y.Sugawara,S.Morita, 1995/01
  • Two-dimensionally discrete friction on NaF(100) surface with the lattice periodicity, S.Fujisawa,E.Kishi,Y.Sugawara,S.Morita, 1995/01
  • Atomic resolution image of cleaved surface of compound semiconductors observed with ultrahigh-vacuum atomic force microscope in contact and noncontact modes, OHTA Masahiro,UEYAMA Hitoshi,SUGAWARA Yasuhiro,MORITA Seizo, OYOBUTURI, The Japan Society of Applied Physics, Vol. 64, No. 6, p. 583-587, 1995/01
  • Atomic-scale friction observed with a two-dimentional friction-force microscope, FUJISAWA S., Phys. Rev. B, Vol. 51, p. 7849-7849, 1995/01
  • Atomic-Resolution Imaging of ZnSSe(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope(UHV-AFM)., Sugawara Yasuhiro,Ohta Masahiro,Ueyama Hitoshi,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 34, No. 4, p. L462-L464, 1995/01
  • Lateral force curve for atomic force/lateral force microscope calibration, S.Fujisawa,E.Kishi,Y.Sugawara,S.Morita, 1995/01
  • ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE WITH SAMPLE CLEAVING MECHANISM, M OHTA,Y SUGAWARA,S MORITA,H NAGAOKA,S MISHIMA,T OKADA, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, AMER INST PHYSICS, Vol. 12, No. 3, p. 1705-1707, 1994/05
  • Time Evolution of Contact-Electrified Electron Dissipation on Silicon Oxide Surface Investigated Using Noncontact Atomic Force Microscope, Fukano Yoshinobu,Uchihashi Takayuki,Okusako Takahiro,Chayahara Ayumi,Sugawara Yasuhiro,Yamanishi Yoshiki,Oasa Takahiko,Morita Seizo, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 33, No. 1, p. 379-382, 1994/01/30
  • SURFACE STUDY WITH ATOMIC-FORCE MICROSCOPE, S MORITA,S FUJISAWA,E KISHI,Y SUGAWARA, JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, JAPAN SOC TRIBOLOGISTS, Vol. 39, No. 11, p. 933-938, 1994
  • 「原子間力顕微鏡による表面の研究」, 森田清三,藤沢 悟,岸 栄吾,菅原康弘, 日本トライボロジー学会誌『トライボロジスト』, 1994/01
  • 「原子間力顕微鏡は何を見てる?」, 森田清三,菅原康弘, パリティ, 1994/01
  • 「半導体表面のAFM/STM観察」, 森田清三,菅原康弘,深野善信,内橋貴之, ウルトラクリーンテクノロジー[半導体基盤技術研究会], 1994/01
  • 「FFM」, 森田清三,菅原康弘,藤沢 悟, 「機械の研究」(養賢堂)1994年新年特集号, 1994/01
  • 「AFM/STM」, 森田清三,菅原康弘,深野善信, 「機械の研究」(養賢堂), 1994/01
  • Charge Storage by Contact Electrification on Thin SrTiO3 Film, T.Uchihashi,T.Okusako,T.Tsuyuguchi,Y.Sugawara,M.Igarashi,R.Kaneko,S.Morita, 1994/01
  • Local Dielectric Breakdown of Thin Silicon Oxide by Dense Contact Electrification, Y.Fukano,T.Uchihashi,T.Okusako,Y.Sugawara,Y.Yamanishi,T.Oasa,S.Morita, 1994/01
  • Observation of Positively Charged Trap Site in Silicon Oxide Layer with an Atomic Force Microscope, Y.Fukano,T.Okusako,T.Uchihashi,Y.Sugawara,Y.Yamanishi,T.Oasa,S.Morita, 1994/01
  • Investigation of Trapped Charges in Silicon Oxide Layer with an Atomic Force Microscope, Y.Fukano,Y.Uchihashi,T.Okusako,K.Hontani,A.Chayahara,Y.Sugawara,Y.Yamanishi,T.Oasa,S.Morita, 1994/01
  • Parameter Dependence of Stable State of Densely Contact-Electrified Electrons on Thin Silicon Oxide, Parameter Dependence of,Stable State of,Densely Contact-Electrified Electrons on Thin,Silicon Oxide, Vol. 33, No. 12, p. 6739-6745, 1994/01
  • Potentiometry Combined with Atomic Force Microscope, T.Uchihashi,Y.Fukano,Y.Sugawara,S.Morita,A.Nakano,T.Ida,T.Okada, 1994/01
  • Charge Storage on Thin SrTiO3 Film by Contact Electrification, T.Uchihashi,T.Okusako,T.Tsuyuguchi,Y.Sugawara,M.Igarashi,R.Kaneko,S.Morita, 1994/01
  • Ultrahigh vacuum atomic force microscope with sample cleaving mechanism, Ultrahigh vacuum,atomic force microscope,with sample cleaving mechanism, 1994/01
  • Study on the Stick-slip Phenomenon on a Cleaved Surface of the Muscovite Mica using an Atomic Force/Lateral Force Microscope, FUJISAWA S., J. Vac. Sci. Technol., Vol. 12, p. 1635-1635, 1994
  • Atomic force microscopy studies of contact-electrified charges on silicon oxide film, Y.Sugawara,Y.Fukano,T.Uchihashi,S.Morita,Y.Yamanishi,T.Oasa,T.Okada, 1994/01
  • Heat Treatment and Steaming Effects of Silicon Oxide upon Electron Dissipation on Silicon Oxide Surface., Uchihashi Takayuki,Okusako Takahiro,Sugawara Yasuhiro,Yamanishi Yoshiki,Oasa Takahiko,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 8, p. L1128-L1130, 1994/01
  • Dissipation of Contact Electrified Electrons on Dielectric Thin films with Silicon Substrate., Okusako Takahiro,Uchihashi Takayuki,Nakano Akihiko,Ida Toru,Sugawara Yasuhiro,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 7, p. L959-L961, 1994/01
  • Contact Electrification on Thin Silicon Oxide in Vacuum., Tsuyuguchi Takeshi,Uchihashi Takayuki,Okusako Takahiro,Sugawara Yasuhiro,Morita Seizo,Yamanishi Yoshiki,Oasa Takahiko, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 7, p. L1046-L1048, 1994/01
  • Time Dependent Dielectric Breakdown of Thin Silicon Oxide Using Dense Contact Electrification., Fukano Yoshinobu,Hontani Koji,Uchihashi Takayuki,Okusako Takahiro,Chayahara Ayumi,Sugawara Yasuhiro,Yamanishi Yoshiki,Oasa Takahiko,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 6, p. 3756-3760, 1994/01
  • Fluctuation in Two-Dimensional Stick-Slip Phenomenon Observed with Two-Dimensional Frictional Force Microscope., Fujisawa Satoru,Kishi Eigo,Sugawara Yasuhiro,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 6, p. 3752-3755, 1994/01
  • Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope., Sugawara Yasuhiro,Ohta Masahiro,Hontani Kouji,Morita Seizo,Osaka Fukunobu,Ohkouchi Shunsuke,Suzuki Mineharu,Nagaoka Hideki,Mishima Shuzo,Okada Takao, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 33, No. 6, p. 3739-3742, 1994/01
  • Contact Electrification on Thin SrTiO3 Film by Atomic Force Microscope, T.Uchihashi,T.Okusako,J.Yamada,Y.Fukano,Y.Sugawara,M.Igarashi,R.Kaneko,S.Morita, 1994/01
  • Dissipation of contact-electrified charge on thin Si-oxide studied by atomic force microscope, S.Morita,Y.Fukano,T.Uchihashi,Y.Sugawara,Y.Yamanishi,T.Oasa, 1994/01
  • Difference between the forces measured by an optical lever deflection and by an optical interferometer in atomic force microscope, S.Fujisawa,M.Ohta,T.Konishi,Y.Sugawara,S.Morita, 1994/01
  • Spatial Distributions of Densely Contact-Electrified Charges on a Thin Silicon Oxide, Sugawara Yasuhiro,Morita Seizo,Fukano Yoshinobu,Uchihashi Takayuki,Okusako Takahiro,Chayahara Ayumi,Yamanishi Yoshiki,Oasa Takahiko, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 33, No. 1, p. L74-L77, 1994/01/01
  • Spatial Distribution and Its Phase Transition of Densely Contact-Electrified Electrons on a Thin Silicon Oxide, Sugawara Yasuhiro,Morita Seizo,Fukano Yoshinobu,Uchihashi Takayuki,Okusako Takahiro,Chayahara Ayumi,Yamanishi Yoshiki,Oasa Takahiko, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 33, No. 1, p. L70-L73, 1994/01/01
  • Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope, Ohta Masahiro,Sugawara Yasuhiro,Hontani Kouji,Morita Seizo,Osaka Fukunobu,Suzuki Mineharu,Nagaoka Hideki,Mishima Shuzo,Okada Takao, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 33, No. 1, p. L52-L54, 1994/01/01
  • Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM), Ohta Masahiro,Konishi Takefumi,Sugawara Yasuhiro,Morita Seizo,Suzuki Mineharu,Enomoto Yuji, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 32, No. 6, p. 2980-2982, 1993/06/20
  • Scanning Force/Tunneling Microscopy as a Novel Technique for the Study of Nanometer-Scale Dielectric Breakdown of Silicon Oxide Layer, Fukano Yoshinobu,Sugawara Yasuhiro,Yamanishi Yoshiki,Oasa Takahiko,Morita Seizo, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 32, No. 1, p. 290-293, 1993/01/20
  • 「AFM/STMによる半導体の複合観察」, 森田清三,菅原康弘,深野善信, 日本結晶学会誌, 1993/01
  • Time Evolution of Electrostatic Force Induced by Contact-Electrified Charges on Thin Silicon Oxide Surface, Y.Fukano,T.Uchihashi,Y.Sugawara,Y.Yamanishi,T.Oasa,S.Morita, 1993/01
  • Time-Evolution of Contact-Eelectrified Charges on Silicon Oxide Film Studied with AFM, Y.Sugawara,Y.Fukano,T.Uchihashi,T.Okusako,S.Morita,Y.Yamanishi,T.Oasa, 1993/01
  • Origin of the Force Measured by an Atomic Force/Lateral Force Microscope(AFM/LFM), S.Fujisawa,Y.Sugawara,S.Morita, 1993/01
  • The Two-Dimensional Stick-Slip Phenomenon with Atomic Resolution, FUJISAWA S., Nanotechnology, Vol. 4, p. 138-138, 1993/01
  • Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide, Morita Seizo,Sugawara Yasuhiro,Fukano Yoshinobu,Uchihashi Takayuki,Okusako Takahiro,Chayahara Ayumi,Yamanishi Yoshiki,Oasa Takahiko, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 32, No. 12, p. L1852-L1854, 1993/01
  • Reproducible and Controllable Contact Electrification on a Thin Insulator, MORITA S., Jpn. J. Appl. Phys., Vol. 32, p. L1701-L1701, 1993/01
  • Effects of humidity and tip radius on the adhesive force measured with atomic force microscopy, Y.Sugawara,M.Ohta,T.Konishi,S.Morita,M.Suzuki,Y.Enomoto, 1993/01
  • Atomic Force Microscope Combined with Scanning Tunneling Microscope [AFM/STM], Morita Seizo,Sugawara Yasuhiro,Fukano Yoshinobu, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 32, No. 6, p. 2983-2988, 1993/01
  • Observation of atomic defect on LiF(100) surface with UHV AFM, M.Ohta,T.Konishi,Y.Sugawara,S.Morita,M.Suzuki,Y.Enomoto, 1993/01
  • Scanning Tunneling Microscopy II, WIESENDANGER R., Springer Ser Surf. Sci, Vol. 28, p. 151-151, 1992/01
  • Scanning Force Microscopy in the UHV Environment, Y.Sugawara,M.Ohta,Y.Kamihara,S.Morita,M.Suzuki,Y.Enomoto, 1992/01
  • Observation of the Surface by Using AFM/STM, Y.Sugawara,S.Morita, 1992/01
  • AFM/STM Investigation of pn Junctions Formed by Ion Implantation, Y.Sugawara,Y.Fukano,S.Morita,A.Nakano,T.Ida, 1992/01
  • Nanometer Resolution Measurement of Dielectric Breakdown of Silicon Dioxide Films with AFM/STM, Y.Fukano,Y.Sugawara,S.Morita,Y.Yamanishi,d T,O, 1992/01
  • AFM/STM investigation of polycrystalline Si surface, Y.Sugawara,Y.Fukano,Y.Kamihara,S.Morita,A.Nakano,T.Ida,R.Kaneko, 1992/01
  • Oxidation Site of Polycrystalline Silicon Surface Studied Using Scanning Force/Tunneling Microscope (AFM/STM) in Air, Sugawara Yasuhiro,Fukano Yoshinobu,Nakano Akihiko,Ida Tohru,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 31, No. 6, p. L725-L727, 1992/01
  • In Situ Imaging of Electrochemical Deposition of Ag on Au(111), K.Endo,Y.Sugawara,S.Mishima,T.Okada,S.Morita, Vol. 30, No. 10, p. 2592-2593, 1991/01
  • Scanning force tunneling microscopy of a graphite surface in air, SUGAWARA Y., J. Vac. Sci. Technol., B, Vol. 9, p. 1092-1095, 1991/01
  • Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface, Sugawara Yasuhiro,Ishizaka Tatsuya,Morita Seizo,Imai Syozo,Mikoshiba Nobuo, Jpn J Appl Phys, The Japan Society of Applied Physics, Vol. 29, No. 1, p. L157-L159, 1990/01/20
  • Origin of Anomalous Corrugation Height of STM Images of Graphite, Sugawara Yasuhiro,Ishizaka Tatsuya,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 29, No. 8, p. 1533-1538, 1990/01
  • Simultaneous Imaging of a Graphite Surface with Atomic Force/Scanning Tunneling Microscope (AFM/STM), Sugawara Yasuhiro,Ishizaka Tatsuya,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 29, No. 8, p. 1539-1543, 1990/01
  • Anomalous Force Dependence of AFM Corrugation Height of a Graphite Surface in Air, Ishizaka Tatsuya,Sugawara Yasuhiro,Kumagai Kozo,Morita Seizo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 29, No. 7, p. L1196-L1198, 1990/01
  • Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface, Sugawara Yasuhiro,Ishizaka Tatsuya,Morita Seizo,Imai Syozo,Mikoshiba Nobuo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 29, No. 3, p. L502-L504, 1990/01
  • Surface Imaging in Air with a Force Microscope, T.Ishizaka,S.Morita,Y.Sugawara,T.Okada,S.Mishima,S.Imai,N.Mikoshiba, 1990/01
  • Differential Conductance Imaging under AC Tunneling Bias, A.Yagi,S.Tsukada,Y.Takahashi,Y.Sugawara,S.Morita,T.Okada,S.Imai an,N.Mikoshiba, 1990/01
  • Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope, Morita Seizo,Ishizaka Tatsuya,Sugawara Yasuhiro,Okada Takao,Mishima Syuzo,Imai Syozo,Mikoshiba Nobuo, Japanese Journal of Applied Physics, The Japan Society of Applied Physics, Vol. 28, No. 9, p. L1634-L1636, 1989/01
  • Performance of concave transducers in acoustic microscopy, IEEE 1988 Ultrasonics Symposium proceedings, Institute of Electrical and Electronics Engineers, Vol. 1988, No. 2, p. 751-756, 1988/01
  • Theoretical analysis on acoustic fields formed by focusing devices in acoustic microscopy, IEEE 1986 Ultrasonics Symposium, Institute of Electrical and Electronics Engineers, Vol. 1986, p. 783-788, 1986/01
  • Off-centric concave transducer for acoustic microscopy, CHUBACHI N.,KUSHIBIKI Jun-ichi,SUGAWARA Yasuhiro, Jpn. J. Appl. Phys. Suppl., The Japan Society of Applied Physics, Vol. 25, p. 203-205, 1986/01

Misc.

  • Optical Force Spectro-mapping in Photoinduced Force Microscopy, 山西絢介,山根秀勝,余越伸彦,鳥本司,石原一,菅原康弘, 応用物理学会春季学術講演会講演予稿集(CD-ROM), Vol. 69th, 2022
  • Optical Force Spectro-mapping in Photoinduced Force Microscopy, 山西絢介,山根秀勝,余越伸彦,鳥本司,石原一,菅原康弘, 応用物理学会秋季学術講演会講演予稿集(CD-ROM), Vol. 82nd, 2021
  • Subatomic-scale Force Vector Mapping above a Ge(OO1) Dimer using Bimodal Atomic Force Microscopy, Vol. 69, No. 3, p. 85-88, 2017
  • Kelvin Probe Force Microscopy and Its Application to Evaluation of Thin Film Growth, SUGAWARA Yasuhiro,NOMURA Hikaru,NAITOH Yoshitaka,LI Yan Jun, Vol. 47, No. 1, p. 18-21, 2012/03/30
  • 27pYG-3 Atomic Forcer Microscopy Measurement on Bi(001) Surface, Kamimori Yasuki,Naitoh Yoshitaka,Kageshima Masami,Sugawara Yasuhiro, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 64, No. 2, p. 839-839, 2009/08/18
  • 26pTF-5 Molecular arrangement and potential of MEM(TCNQ)_2 crystal surface imaged in real space, Sugawa S.,Kageshima M.,Naitoh Y.,Sugawara Y.,Hasegawa T., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 63, No. 1, p. 847-847, 2008/02/29
  • 28pWP-7 AFM observation of Si(001) surface at low temperature, Naitoh Y.,Ozaki N.,Sugawara Y., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 59, No. 1, p. 914-914, 2004/03/03
  • Development of Photonic force microscope with near atomic resolution, SUGAWARA Yasuhiro,SEINO Yoshihide, Vol. 72, No. 8, p. 1020-1026, 2003/08/10
  • 原子間力顕微鏡を用いた新規なナノ計測技術, 菅原 康弘, 生産と技術, 生産技術振興協会, Vol. 55, No. 2, p. 47-49, 2003
  • WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE, SUGAWARA Yasuhiro,OYABU Noriaki,CUSTANCE Oscar,YI Insook,MORITA Seizo, Proceedings of ... JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE, The Japan Society of Mechanical Engineers, Vol. 2003, p. "W-5"-"W-6", 2003
  • Electrostatic Force Imaging Combined with Noncontact Atomic Force Microscope, MORITA Seizo,OKAMOTO Kenji,SUGAWARA Yasuhiro, Bulletin of the Japan Institute of Metals, The Japan Institute of Metals and Materials, Vol. 41, No. 12, p. 840-841, 2002/12/20
  • Sb/Si混在表面における非接触AFM像の探針先端原子種依存性, 西本 隆弘,日高 栄治,今井 重明,杉立 英二,菅原 康弘,森田 清三, 精密工学会大会学術講演会講演論文集, Vol. 2001, No. 2, p. 283-283, 2001/09/01
  • Noncontact atomic force microscopy of well-ordered array of half-height steps on TiO_2(110), Ashino M.,Sugawara Y.,Morita S.,Ishikawa M., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 55, No. 2, p. 788-788, 2000/09/10
  • 25pW-5 Force interaction between mctallic tip and metallic surface mesured by non-contact atomic force microscopy, Sugawara Y,Yokoyama K,Ochi T,Morita S, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 2, p. 803-803, 1999/09/03
  • 29a-PS-51 Guidelines for Spatial Resolution of Atomic Force Microscope, Morita Seizo,Sugawara Yasuhiro, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 1, p. 320-320, 1999/03/15
  • 28p-Q-1 Atomic resolution imaging of Ag atoms on Si(111)&radic;3×radic3-Ag surface with noncontact atomic force microscopy, Sugawara,Yokoyama K.,Ochi T.,Morita S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 54, No. 1, p. 301-301, 1999/03/15
  • Noncontact AFM imaging of chemical reactivity and charge on surface, SUGAWARA Yasuhiro, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 53, No. 2, p. 402-402, 1998/09/05
  • Observation of Si(111)√3X√3-Ag structure by Noncontact-mode AFM, UCHIHASHI T.,TSUKAMOTO T.,MINOBE T.,ORISAKA S.,SUGAWARA Y.,SUZUKI M.,YANASE Y.,SHIGEMATSU T.,MORITA S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 53, No. 1, p. 298-298, 1998/03/10
  • Observation of Atomic-scale Energy Dissipation with Dynamic Mode AFM, UEYAMA H.,NAKAO Y.,INUKAI Y.,SUGAWARA Y.,MORITA S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 53, No. 1, p. 298-298, 1998/03/10
  • Obsrvation of atomic-scale point defects on GaAs(110) Sunface with Electrostatic Foroe Microscope, SUGAWARA Y.,UCHIHASHI T.,ABE M.,TSUKAMOTO T.,MORITA S.,SUZUKI M.,YANASE Y.,SHIGEMATSU T., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 53, No. 1, p. 297-297, 1998/03/10
  • 5p-F-1 An AFM observation of growth and extinction of two-dimensional nuclei on a cleaved (010) surface of TGS, Ohgami J.,Sugawara Y.,Morita s.,Ozaki T., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 2, p. 118-118, 1997/09/16
  • 7a-Q-4 Evanescent field induced force imaging using noncontact mode AFM, Abe M.,Sugawara Y.,Hara Y.,Sawada K.,Morita S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 2, p. 322-322, 1997/09/16
  • 6p-B-10 Study of the Tip-Sample Interaction in a Noncontact-Mode AFM on Si(111)7×7 Surface, Sugawara Y.,Uchihashi T.,Tsukamoto T.,Minobe T.,Suzuki M.,Yanase Y.,Shigematsu T.,Morita S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 2, p. 351-351, 1997/09/16
  • 8p-B-6 High-Resolution Imaging of GaAs(110)using Electrostatic Force Microscopy, Sugawara Y.,Uchihashi T.,Ueyama H.,Abe M.,Nakao Y.,Morita S., Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 2, p. 381-381, 1997/09/16
  • Atomic-scale imaging of compound semiconductors with a noncontact atomic force microscope, MORITA Seizo,SUGAWARA Yasuhiro,UCHIHASHI Takayuki,UEYAMA Hitoshi,TSUKAMOTO Takahiro, IEICE technical report. Electron devices, The Institute of Electronics, Information and Communication Engineers, Vol. 97, No. 159, p. 7-14, 1997/07/15
  • Theoretical analysis of atomic-scale friction in frictional-force microscopy, N Sasaki,S Fujisawa,Y Sugawara,S Morita,K Kobayashi,M Tsukada, ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, AMER CHEMICAL SOC, Vol. 213, p. 59-COLL, 1997/04
  • Load dependence of atomic-scale friction on graphite surface observed with two-dimensional frictional force microscope., S Fujisawa,N Sasaki,M Tsukada,Y Sugawara,S Morita, ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, AMER CHEMICAL SOC, Vol. 213, p. 12-COLL, 1997/04
  • Half the lattice periodicity in frictional force images on NaF(100) surface., S Fujisawa,Y Sugawara,S Morita, ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, AMER CHEMICAL SOC, Vol. 213, p. 192-COLL, 1997/04
  • 31P-T-2 Theoretical analysis of atomic-scale friction on a cleaved graphite surface, Sasaki N,Fujisawa S,Sugawara Y,Morita S,Kobayashi K,Tsukada M, Meeting abstracts of the Physical Society of Japan, The Physical Society of Japan (JPS), Vol. 52, No. 1, p. 368-368, 1997/03/17
  • True Atomic Resolution Imaging of Semiconductor Surfaces Using Nocontact AFM, Sugawara Y.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1996, No. 2, p. 561-561, 1996/09/13
  • Comparison between the computer-simulation and experimental result on two-dimensionally quantized friction, Fujisawa S,Sasaki N.,Tsukada M.,Sugawara Y.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1996, No. 3, p. 711-711, 1996/09/13
  • 2p-S-2 Mechanical Detection of Evanescent Field with Noncontact AFM, Sugawara Y.,Abe M.,Ohta M.,Uchihashi T.,Ueyama H.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 51, No. 2, p. 450-450, 1996/03/15
  • 31p-PSB-9 Analysis of the forcegradient versus distance curve in a noncontact mode AFM, Ohta M,Ueyama H,Sugawara Y,Morita S, Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 51, No. 2, p. 484-484, 1996/03/15
  • 3p-K-6 Observation of Si(111)7×7 Reconstructed Surface with a Noncontact mode UHV-AFM, Morita S,Uchibashi T,Ohta M,Ueyama H,Sugawara Y,Mishima S,Suzuki M,Yanase Y,Shigematsu T, Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 51, No. 2, p. 556-556, 1996/03/15
  • Localized fluctuation in two-dimensionally quantized friction, Fujisawa S.,Sugawara Y.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1995, No. 3, p. 663-663, 1995/09/12
  • 29p-PSB-12 Atomic Resolution lmaging NaF(100) Surface with Noncontact UHV-AFM, Sugawara Y.,Ohta M.,Ueyama H.,Uchihashi T.,Morita S.,Suzuki M.,Mishima S., Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1995, No. 2, p. 494-494, 1995/09/12
  • 29p-PSB-1 Observation of Point Defects on InP(110) using a Noncontact UHV-AFM, Ohta M.,Ueyama H.,Sugawara Y.,Morita S.,Ohkouchi S.,Suzuki M.,Mishima S., Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1995, No. 2, p. 489-489, 1995/09/12
  • Observation of two-dimensionally quantized friction on ionic crystals, Fujisawa S.,Kishi E.,Sugawara Y.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 50, No. 3, p. 667-667, 1995/03/16
  • Load dependence of two-dimensionally quantized friction, Fujisawa S.,Kishi E.,Sugawara Y.,Morita S., Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 50, No. 3, p. 667-667, 1995/03/16
  • Atomic Resolution Imaging of II-VI Compound Semiconductor Surface with UHV-AFM, Sugawara Y,Ohta M,Morita S,Suzuki M,Mishima S, Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 50, No. 2, p. 493-493, 1995/03/16
  • 2a-R-9 Atomic Resolution Imaging. Of InP(100) Surface with Ultrahigh-Vacuum Atomic Force Microscope, Sugawara Y,Ohta M,Morita S,Suzuki M,Nagaoka H,Mishima S, Abstracts of the meeting of the Physical Society of Japan. Sectional meeting, The Physical Society of Japan (JPS), Vol. 1994, No. 2, p. 365-365, 1994/08/16
  • 28p-C-7 Break of fundamental law of friction on an atomic scale, Fujisawa S,Kishi E,Sugawara Y,Morita S, Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 49, No. 3, p. 515-515, 1994/03/16
  • 31a-WB-5 Atomic Resolution Imaging of GaAs(110) Surface with Ultrahigh-Vacuum Atomic Force Microscope, Sugawara Y,Ohta M,Hontani K,Morita S,Osaka F,Suzuki M,Nagaoka H,Mishima S,Okada T, Abstracts of the meeting of the Physical Society of Japan. Annual meeting, The Physical Society of Japan (JPS), Vol. 49, No. 2, p. 484-484, 1994/03/16
  • FFM (マイクロマシンとマイクロトライボロジ-<特集>) -- (マイクロトライボロジ---マイクロアナリシスツ-ル), 森田 清三,菅原 康弘,藤沢 悟, 機械の研究, 養賢堂, Vol. 46, No. 1, p. p154-157, 1994/01
  • AFM/STM (マイクロマシンとマイクロトライボロジ-<特集>) -- (マイクロトライボロジ---マイクロアナリシスツ-ル), 森田 清三,菅原 康弘,深野 善信, 機械の研究, 養賢堂, Vol. 46, No. 1, p. p150-153, 1994/01
  • Observation of Cleaved Surface of GaAs(110)with Ultrahigh Vacuum Atomic Force Microscope, Sugawara Yasuhiro,Ohta Masahiro,Morita Seizo, IEICE technical report. Electron devices, The Institute of Electronics, Information and Communication Engineers, Vol. 93, No. 325, p. 37-41, 1993/11/18
  • 30p-ZF-3 AFM observation on surface in vacuum condition, Kamihara Y,Ohta M,Sugawara Y,Morita S, The Physical Society of Japan (JPS), Vol. 47, No. 2, p. 487-487, 1992/03/12
  • 27p-ZC-3 STATE AND PROSPECT OF AFM/STM, Morita Seizo,Sugawara Yasuhiro, The Physical Society of Japan (JPS), Vol. 47, No. 2, p. 10-11, 1992/03/12

Publications

  • Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization, Yan Jun Li,Haunfei Wen,Zong Min Ma,Lili Kou,Yoshitaka Naitoh,Yasuhiro Sugawara, Springer Series in Surface Science, 2018/03
  • 新アクチュエータ開発の最前線, 菅原康弘,李艶君,内藤賀公, エヌ・ティー・エヌ, 2011/08
  • Next Generation Actuators Leading Breakthroughs, Y. Sugawara,Y. J. Li,Y. Naitoh,M. Kageshima, Springer, 2010/01
  • 走査プローブ顕微鏡, 菅原 康弘, 共立出版, 2009/03
  • ナノイメージング, 菅原 康弘, エヌ・ティー・エヌ, 2008/05
  • ナノテクノロジー入門シリーズ ナノテクのための物理入門 極限微小系のナノ物性測定:AFM, 菅原 康弘, 共立出版, 2007/04
  • 表面物性工学ハンドブック 6.3AFM 6.3.2装置と測定法 6.3.3-1観察例1 6.4.2FFM(friction force microscopy)19.4 AFMマニピュレーション, 菅原 康弘, 丸善株式会社, 2007/01
  • "Roadmap of Scanning Probe Microscopy" 3.Atomic Force Microscopy(AFM), Y.Sugawara, Springer, 2006/08
  • "Noncontact Atomic Force Microscopy"Applied Scanning Probe Methods VI Characterization, Y.Sugawara, Springer, 2006/07
  • 「走査型プローブ顕微鏡―最新技術と未来予測―」2.2原子間力顕微鏡(AFM), 菅原 康弘, 丸善株式会社, 2005/12
  • Analysis of Organic and Biological Molecules, in Scanning Probe Spectroscopy for Nanoscale Science and Technology, ed. By H. Shigekawa, M. Yoshimura, M Sakata, A. Kawazu (Shokabo, Tokyo 2005), Takuya Matsumtoo,Tomoji Kawai,H. Shigekawa,M. Yoshimura,M Sakata,A. Kawazu, Shokabo, Tokyo, 2005/11
  • 光ナノテクノロジー―近接場光学・微細加工の原理から最先端研究まで―「光と半導体」, 菅原 康弘, アドスリー, 2005/04
  • Scanning Probe Microsocopy: Chracterization, Nanofabrication and Device Application of Functional Materials, Part III Application of Scanning Techniques to Functional Materials "Microscale Contact Charging on a Silicon Oxide", S. Morita,T. Uchihashi,K. Okamoto,M. Abe,Y. Sugawara, Kluwer Academic Publishers, 2004/12
  • Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Part II Fundamentals of Scanning Probe Techniques "Functions of NC-AFM on Atomic Scale", S. Morita,N. Oyabu,T. Nishimoto,R. Nishi,O. Custance,I. Yi,Y. Sugawara, Kluwer Academic Publishers, 2004/12
  • 「新改訂・表面科学基礎と応用」2編4章表面分析法、5節ナノプローブ法、4原子間力顕微鏡(AFM), 菅原 康弘, (株)エヌ・ティー・エス, 2004/06
  • 「ナノ光工学ハンドブック」, 菅原康弘, 朝倉書店, 2002/01
  • 「ナノの光で原子を読む」, 菅原康弘, ㈱クバプロ, 2002/01
  • 「ナノテクノロジーのための走査プローブ顕微鏡」, 菅原康弘, 丸善, 2002/01
  • 「イオン工学ハンドブック」, 菅原康弘, (株)イオン工学研究所, 2002/01
  • Noncontact Atomic Force Microscopy, Y.Sugawara, Springer, 2002/01
  • Noncontact Atomic Force Microscopy, S.Morita,Y.Sugawara, Springer, 2002/01
  • Optical and Electronic Process of Nano-matters, S. Morita,Y. Sugawara, Kluwer Academic Publishers, 2001/01
  • Fundamentals of Tribology and Bridging the Gap between Micro- and Micro/Nanoscales, S. Morita,Y. Sugawara,K. Yokoyama,S. T.Uchihashi, Kluwer Academic Publishers, 2001/01
  • Fundamentals of Tribology and Bridging the Gap between Micro- and Micro/Nanoscales, S. Morita,Y. Sugawara,K. Yokoyama,S. Fujisawa, Kluwer Academic Publishers, 2001/01
  • 「近接場ナノフォトニクス入門」, 大津元一,河田聡, (株)オプトロニクス社, 2000/04
  • 「走査型プローブ顕微鏡 -基礎と未来予測-」, 菅原康弘,森田清三, 丸善(株), 2000/02
  • 「電気・電子材料のトライボロジー」, 森田清三,菅原康弘, (株)リアライズ社, 1999/03
  • 「近接場ナノフォトニクスハンドブック, 大津元一,河田聡, (株)オプトロニクス社, 1997/09
  • 「近接場ナノフォトニクスハンドブック」, 大津元一,河田聡, 株)オプトロニクス社, 1997/09
  • Forces in Scanning Probe Methods, S. Fujisawa,E. Kishi,Y. Sugawara,S. Morita, Kluwer Academic Publishers, 1995/01
  • Forces in Scanning Probe Methods, Y. Sugawara,M. Ohta,K. Hontani,S. Morita,F. Osaka,S. Ohkouchi,M. Suzuki,H. Nagaoka, Kluwer Academic Publishers, 1995/01
  • Forces in Scanning Probe Methods, Kluwer Academic Publishers, 1995/01
  • 「走査型トンネル顕微鏡/原子間力顕微鏡利用技術集成」, 森田清三,菅原康弘,深野善信, (株)ティー・アイ・シィー, 1994/07

Industrial Property Rights

  • 高速でヒシテリシスのない圧電素子の高速制御, 菅原康弘,影島賢巳, 2006-205376, 出願日:2006/07
  • 走査型プローブ顕微鏡, 菅原 康弘, 特開平10-48224, 出願日:1998/02
  • 走査型プローブ顕微鏡, 松山克宏,酒井信明,森田清三,菅原康弘, H10-48224, 出願日:1996/08
  • 走査型プローブ顕微測定法および走査型プローブ顕微鏡, 菅原 康弘, 特開平7-159155, 出願日:1995/06
  • 原子間力顕微鏡, 菅原 康弘, 特開平6-180222, 出願日:1994/06
  • 走査型プローブ顕微鏡, 菅原 康弘, 特開平04-212252, 出願日:1992/08
  • 走査型プローブ顕微鏡, 菅原 康弘, 特開平03-277903, 出願日:1991/12
  • 走査型プローブ顕微鏡, 八木明,岡田孝夫,菅原康弘, H04-212252, 出願日:1991/03
  • 走査型プローブ顕微鏡, 森田清三,菅原康弘,岡田孝夫, H03-277903, 出願日:1990/03

Awards

  • 第6回薄膜・表面物理分科会論文賞, 李艶君, 応用物理学会, 2022/03
  • ナノプローブテクノロジー賞, 菅原康弘, 日本学術振興会ナノプローブテクノロジー第167委員会, 1999/05
  • (財)安藤研究所第5回安藤博記念学術奨励賞, 菅原 康弘, 1992
  • (財)金属研究助成会第30回金属研究助成金研究奨励賞, 菅原 康弘, 1990

Academic Activities

  • The 4th International Symposium on Ubiquitous Knowledge Network Environment, 2007/03 -
  • 日本学術振興会ナノプローブテクノロジー第167委員会企画, 2006/03 -
  • CHINA-JAPAN SALC 2006, 2006/03 -
  • 光メカトロニクス公開シンポジウム, 2005/10 -
  • 日本学術振興会薄膜第131委員会基礎講座「薄幕評価技術」, 2005/10 -
  • 全科展in大阪2005およびバイオフォーラム2005大阪, 2005/10 -
  • 研究会「走査プローブ顕微鏡の最前線とシュミレータ」, 2005/03 -
  • 有機バイオSPM研究会, 2004/11 -
  • 日本物理学会2003年秋季大会, 2003/09 -
  • 社団法人新化学発展協会、新素材技術部会, 2003/09 -
  • IIP/ISPS Joint MIPE 2003, 2003/06 -
  • 平成15年度春季応用物理学関連連合講演会, 2003/03 -
  • 日本トライボロジー学界、マイクロマシンのトライボロジー研究会, 2003/03 -
  • Japan-US Symposium on Tools and Metrology for NanoTechnology, 2003/01 -
  • 電子情報通信学会東北支部学術講演会, 2002/11 -
  • NC-AFM 2002, 2002/08 -